PL3350580T3 - Urządzenie do emisji promieniowania elektromagnetycznego, w szczególności promieniowania UV - Google Patents

Urządzenie do emisji promieniowania elektromagnetycznego, w szczególności promieniowania UV

Info

Publication number
PL3350580T3
PL3350580T3 PL16770722.3T PL16770722T PL3350580T3 PL 3350580 T3 PL3350580 T3 PL 3350580T3 PL 16770722 T PL16770722 T PL 16770722T PL 3350580 T3 PL3350580 T3 PL 3350580T3
Authority
PL
Poland
Prior art keywords
radiation
emitting electromagnetic
electromagnetic radiation
emitting
electromagnetic
Prior art date
Application number
PL16770722.3T
Other languages
English (en)
Inventor
Marc Breit
Original Assignee
Marc Breit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/EP2015/071140 external-priority patent/WO2016041994A1/de
Application filed by Marc Breit filed Critical Marc Breit
Publication of PL3350580T3 publication Critical patent/PL3350580T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6447Fluorescence; Phosphorescence by visual observation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/91Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21LLIGHTING DEVICES OR SYSTEMS THEREOF, BEING PORTABLE OR SPECIALLY ADAPTED FOR TRANSPORTATION
    • F21L2/00Systems of electric lighting devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06146Multisources for homogeneisation, as well sequential as simultaneous operation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06146Multisources for homogeneisation, as well sequential as simultaneous operation
    • G01N2201/06153Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's
    • G01N2201/0624Compensating variation in output of LED source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/069Supply of sources

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
PL16770722.3T 2015-09-15 2016-09-15 Urządzenie do emisji promieniowania elektromagnetycznego, w szczególności promieniowania UV PL3350580T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/EP2015/071140 WO2016041994A1 (de) 2014-09-15 2015-09-15 Leuchte und verfahren zum betrieb einer leuchte
DE102015118175.4A DE102015118175A1 (de) 2015-10-23 2015-10-23 Vorrichtung zur Emission elektromagnetischer Strahlung, insbesondere UV-Strahlung
PCT/EP2016/071833 WO2017046249A1 (de) 2015-09-15 2016-09-15 Vorrichtung zur emission elektromagnetischer strahlung, insbesondere uv-strahlung

Publications (1)

Publication Number Publication Date
PL3350580T3 true PL3350580T3 (pl) 2026-03-30

Family

ID=58288148

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16770722.3T PL3350580T3 (pl) 2015-09-15 2016-09-15 Urządzenie do emisji promieniowania elektromagnetycznego, w szczególności promieniowania UV

Country Status (5)

Country Link
US (1) US10948422B2 (pl)
EP (1) EP3350580B1 (pl)
DE (2) DE102015118175A1 (pl)
PL (1) PL3350580T3 (pl)
WO (1) WO2017046249A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10264645B2 (en) * 2014-09-15 2019-04-16 Marc Breit Light and method for operating a light
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
US20200326275A1 (en) * 2019-04-09 2020-10-15 Illinois Tools Works Inc. Non-destructive testing (ndt) based setups with integrated light sensors
CN111965154A (zh) * 2020-09-15 2020-11-20 上海宏盾防伪材料有限公司 一种便携式荧光编码检测装置

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JPS57134148A (en) * 1981-02-16 1982-08-19 Olympus Optical Co Detector of leading end output of laser knife
US5334841A (en) * 1993-01-22 1994-08-02 Minnesota Mining And Manufacturing Company Method and apparatus for detecting fluorescence
WO1996031769A1 (en) * 1995-04-05 1996-10-10 Brasscorp Ltd. Fault locating device, system and method
US5803579A (en) * 1996-06-13 1998-09-08 Gentex Corporation Illuminator assembly incorporating light emitting diodes
JP2000111476A (ja) * 1998-10-01 2000-04-21 Fuji Photo Film Co Ltd 蛍光画像生成装置
JP2001070227A (ja) * 1999-07-07 2001-03-21 Fuji Photo Film Co Ltd 蛍光観察装置
US7145649B2 (en) * 2000-12-21 2006-12-05 Brasscorp Limited Method of producing an ultra-violet or near ultra-violet light source for non-destructive inspection or testing
GB2403800B (en) * 2001-12-31 2006-06-07 Brasscorp Ltd LED inspection lamp and LED spot light
JP4311607B2 (ja) * 2002-05-27 2009-08-12 富士フイルム株式会社 蛍光診断情報生成方法および装置
US7084392B2 (en) * 2002-06-04 2006-08-01 Baker Hughes Incorporated Method and apparatus for a downhole fluorescence spectrometer
ATE459869T1 (de) * 2002-09-12 2010-03-15 Trumpf Laser & Systemtechnik Vorrichtung zur überwachung der funktionalität eines optischen elements
SE526093C2 (sv) * 2002-11-22 2005-07-05 Dometic Ab System för vätskeförsörjning
DE20306789U1 (de) 2003-04-30 2003-09-04 Tiede GmbH + Co Rissprüfanlagen, 73457 Essingen Handlampe, insbesondere für die magnetische Rißprüfung
DE10326369A1 (de) 2003-06-06 2005-01-05 Biostep Labor- Und Systemtechnik Gmbh Transilluminator
CA2634475C (en) * 2003-07-07 2014-05-20 Brasscorp Limited Led-based inspection lamp with improved collimation optics
DE102004043295B4 (de) 2004-09-08 2007-04-26 Helling Gmbh Handleuchte, insbesondere zur Verwendung in der zerstörungsfreien Werkstoffprüfung
DE102006004995A1 (de) 2005-02-01 2006-10-19 Schott Ag Leuchte für zahnärztliche oder chirurgische Verwendung
US7307770B2 (en) * 2005-03-14 2007-12-11 Wilkinson Joseph N Hologram imaging device and method of using same
US7279688B2 (en) * 2005-04-04 2007-10-09 Campman James P Arson and forensic scanner having a hydrocarbon gas detector with a detachable collector cone and kit assembly
US20070061210A1 (en) 2005-09-09 2007-03-15 Li Chen Methods for reducing retail out-of-stocks using store-level RFID data
US7676061B2 (en) * 2006-05-02 2010-03-09 Telesis Technologies, Inc. Laser safety system
JP2009194519A (ja) * 2008-02-13 2009-08-27 Pfu Ltd 画像読取装置
EP2392192B1 (en) * 2009-02-02 2015-03-18 Koninklijke Philips Electronics N.V. Coded warning system for lighting units
DE102009029930B3 (de) * 2009-06-19 2010-11-25 Heraeus Noblelight Gmbh Verfahren zur Erkennung eines Ausfalls zumindest einer LED
US8278841B2 (en) * 2009-07-02 2012-10-02 Innovations In Optics, Inc. Light emitting diode light engine
US8616722B2 (en) 2009-08-26 2013-12-31 Spectronics Corporation Inspection lamp with interchangeable mount
JP5669087B2 (ja) * 2010-09-28 2015-02-12 国立大学法人九州工業大学 蛍光測定方法及び蛍光測定装置
US9030103B2 (en) 2013-02-08 2015-05-12 Cree, Inc. Solid state light emitting devices including adjustable scotopic / photopic ratio
DE202014007579U1 (de) * 2014-09-15 2014-10-21 Marc Breit Leuchten und Leuchtensysteme zur Erweiterung und Verbesserung der visuellen Auswertbarkeit und Beurteilung von Oberflächen und angeregten Fluoreszenzen

Also Published As

Publication number Publication date
US20180252653A1 (en) 2018-09-06
DE102015118175A1 (de) 2017-04-27
EP3350580C0 (de) 2025-12-03
EP3350580B1 (de) 2025-12-03
WO2017046249A1 (de) 2017-03-23
EP3350580A1 (de) 2018-07-25
DE112016002581A5 (de) 2018-05-24
US10948422B2 (en) 2021-03-16

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