PL3388868T3 - Urządzenia do kontroli oraz sposoby kontroli kontenera - Google Patents

Urządzenia do kontroli oraz sposoby kontroli kontenera

Info

Publication number
PL3388868T3
PL3388868T3 PL17204408T PL17204408T PL3388868T3 PL 3388868 T3 PL3388868 T3 PL 3388868T3 PL 17204408 T PL17204408 T PL 17204408T PL 17204408 T PL17204408 T PL 17204408T PL 3388868 T3 PL3388868 T3 PL 3388868T3
Authority
PL
Poland
Prior art keywords
inspecting
container
methods
inspection devices
inspection
Prior art date
Application number
PL17204408T
Other languages
English (en)
Inventor
Ziran Zhao
Jianping Gu
Qian Yi
Bicheng LIU
Original Assignee
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Company Limited filed Critical Nuctech Company Limited
Publication of PL3388868T3 publication Critical patent/PL3388868T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/20—Image enhancement or restoration using local operators
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/70—Denoising; Smoothing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30112—Baggage; Luggage; Suitcase

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL17204408T 2016-12-26 2017-11-29 Urządzenia do kontroli oraz sposoby kontroli kontenera PL3388868T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201611221485.2A CN108240997B (zh) 2016-12-26 2016-12-26 检查设备和对集装箱进行检查的方法
EP17204408.3A EP3388868B1 (en) 2016-12-26 2017-11-29 Inspection devices and methods for inspecting a container

Publications (1)

Publication Number Publication Date
PL3388868T3 true PL3388868T3 (pl) 2020-10-19

Family

ID=60543383

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17204408T PL3388868T3 (pl) 2016-12-26 2017-11-29 Urządzenia do kontroli oraz sposoby kontroli kontenera

Country Status (5)

Country Link
US (1) US10586324B2 (pl)
EP (1) EP3388868B1 (pl)
JP (1) JP6538811B2 (pl)
CN (1) CN108240997B (pl)
PL (1) PL3388868T3 (pl)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019174410A (ja) * 2018-03-29 2019-10-10 住友化学株式会社 画像処理装置、異物検査装置及び画像処理方法
CN109581519A (zh) * 2018-11-27 2019-04-05 中国航发沈阳黎明航空发动机有限责任公司 一种用于发动机叶片内腔异物的x射线检测装置及方法
EP3764089B1 (en) 2019-07-11 2024-11-20 Oy Varex Imaging Finland Ltd. X-ray weld inspection
US11276542B2 (en) 2019-08-21 2022-03-15 Varex Imaging Corporation Enhanced thermal transfer nozzle and system
US11733182B2 (en) * 2019-12-20 2023-08-22 Varex Imaging Corporation Radiographic inspection system for pipes and other structures using radioisotopes
WO2022183191A1 (en) 2021-02-23 2022-09-01 Rapiscan Systems, Inc. Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources
US12450719B2 (en) 2021-07-13 2025-10-21 Rapiscan Systems, Inc. Image inspection systems and methods for integrating third party artificial intelligence platforms
CN115901814B (zh) * 2021-09-30 2026-03-03 宁德时代新能源科技股份有限公司 电芯检测方法、装置、设备及计算机存储介质
CN116183639B (zh) 2021-11-26 2026-02-13 同方威视技术股份有限公司 面阵探测器、探测方法及相应的集装箱/车辆检查系统
GB2634134A (en) 2022-02-03 2025-04-02 Rapiscan Holdings Inc Systems and methods for real-time energy and dose monitoring of an X-ray linear accelerator
US12474282B2 (en) 2022-05-20 2025-11-18 Rapiscan Holdings, Inc. Systems and a method of improved material classification using energy-integrated backscatter detectors
GB2641476A (en) 2023-03-17 2025-12-03 Rapiscan Holdings Inc Systems and methods for monitoring output energy of a high-energy X-ray source
CN116661012A (zh) * 2023-06-21 2023-08-29 杭州睿影科技有限公司 基于透射射线的检测系统、检测方法以及检测装置
CN119985586B (zh) * 2025-04-11 2025-07-25 宁波伯锐锶电子束科技有限公司 一种生物样品的扫描图像获取方法

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US5638420A (en) * 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
JP2001004560A (ja) * 1999-06-16 2001-01-12 Shimadzu Corp X線検査装置
GB0903198D0 (en) 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
JP2009519471A (ja) * 2005-12-12 2009-05-14 リビール イメージング テクノロジーズ ずれた放射線によるct検査
CN101113960B (zh) * 2006-07-25 2010-07-21 上海英迈吉东影图像设备有限公司 一种利用背散射技术进行炸药检测的装置
TR200904838T1 (tr) * 2006-12-28 2009-10-21 Nuctech Company Limited Binoküler steryoskobik taramalı radyografik görüntülemeye ilişkin metot ve sistem
CN102095663B (zh) * 2007-10-05 2013-06-05 清华大学 液态物品检查方法和设备
CN101387610B (zh) * 2008-10-14 2011-02-09 重庆大学 利用双源双能量直线式安检ct装置进行安全检测的方法
US7756249B1 (en) * 2009-02-19 2010-07-13 Morpho Detection, Inc. Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
DE112009005019B4 (de) * 2009-06-30 2022-02-03 Analogic Corp. Effizienter quasi-exakter 3D Bildrekonstruktionsalgorithmus für CTScanner
CN104170051B (zh) * 2012-02-03 2017-05-31 拉皮斯坎系统股份有限公司 组合散射和透射的多视图成像系统
US9069092B2 (en) * 2012-02-22 2015-06-30 L-3 Communication Security and Detection Systems Corp. X-ray imager with sparse detector array
CN103308535B (zh) * 2012-03-09 2016-04-13 同方威视技术股份有限公司 用于射线扫描成像的设备和方法
JP2015520846A (ja) * 2012-05-01 2015-07-23 アナロジック コーポレイション Ct密度画像とスパースマルチエネルギーデータを用いてボクセルセットのz−有効値を決定する方法およびシステム{determinationofz−effectivevalueforsetofvoxelsusingctdensityimageandsparsemulti−energydata}
US10004464B2 (en) * 2013-01-31 2018-06-26 Duke University System for improved compressive tomography and method therefor
CN105982686B (zh) * 2015-01-30 2019-04-30 合肥美亚光电技术股份有限公司 计算机断层成像设备及通过其拍摄断层图像的方法
CN105784737B (zh) * 2016-03-29 2021-06-22 清华大学 集装箱ct检查系统

Also Published As

Publication number Publication date
EP3388868A1 (en) 2018-10-17
US20180182085A1 (en) 2018-06-28
US10586324B2 (en) 2020-03-10
CN108240997B (zh) 2020-09-04
CN108240997A (zh) 2018-07-03
JP6538811B2 (ja) 2019-07-03
JP2018151370A (ja) 2018-09-27
EP3388868B1 (en) 2020-06-24

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