PL3417096T3 - Sposób monitorowania całkowitej ilości wybłyszczaczy w kwaśnej kąpieli galwanicznej zawierającej miedź/stop miedzi i kontrolowany proces powlekania galwanicznego - Google Patents

Sposób monitorowania całkowitej ilości wybłyszczaczy w kwaśnej kąpieli galwanicznej zawierającej miedź/stop miedzi i kontrolowany proces powlekania galwanicznego

Info

Publication number
PL3417096T3
PL3417096T3 PL17723144T PL17723144T PL3417096T3 PL 3417096 T3 PL3417096 T3 PL 3417096T3 PL 17723144 T PL17723144 T PL 17723144T PL 17723144 T PL17723144 T PL 17723144T PL 3417096 T3 PL3417096 T3 PL 3417096T3
Authority
PL
Poland
Prior art keywords
brighteners
monitoring
copper
total amount
controlled process
Prior art date
Application number
PL17723144T
Other languages
English (en)
Inventor
Mutlu-Iskender Muglali
Torsten Voss
Andreas Kirbs
Original Assignee
Atotech Deutschland Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atotech Deutschland Gmbh filed Critical Atotech Deutschland Gmbh
Publication of PL3417096T3 publication Critical patent/PL3417096T3/pl

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • C25D21/12Process control or regulation
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416Systems
    • G01N27/42Measuring deposition or liberation of materials from an electrolyte; Coulometry, i.e. measuring coulomb-equivalent of material in an electrolyte
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416Systems
    • G01N27/4166Systems measuring a particular property of an electrolyte

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Automation & Control Theory (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
PL17723144T 2016-05-19 2017-05-17 Sposób monitorowania całkowitej ilości wybłyszczaczy w kwaśnej kąpieli galwanicznej zawierającej miedź/stop miedzi i kontrolowany proces powlekania galwanicznego PL3417096T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16170304 2016-05-19
PCT/EP2017/061858 WO2017198722A1 (en) 2016-05-19 2017-05-17 Method for monitoring the total amount of brighteners in an acidic copper/copper alloy plating bath and controlled process for plating
EP17723144.6A EP3417096B1 (en) 2016-05-19 2017-05-17 Method for monitoring the total amount of brighteners in an acidic copper/copper alloy plating bath and controlled process for plating

Publications (1)

Publication Number Publication Date
PL3417096T3 true PL3417096T3 (pl) 2019-10-31

Family

ID=56098003

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17723144T PL3417096T3 (pl) 2016-05-19 2017-05-17 Sposób monitorowania całkowitej ilości wybłyszczaczy w kwaśnej kąpieli galwanicznej zawierającej miedź/stop miedzi i kontrolowany proces powlekania galwanicznego

Country Status (8)

Country Link
US (1) US10494732B2 (pl)
EP (1) EP3417096B1 (pl)
CN (1) CN109072468B (pl)
ES (1) ES2733771T3 (pl)
MY (1) MY178768A (pl)
PH (1) PH12018502416B1 (pl)
PL (1) PL3417096T3 (pl)
WO (1) WO2017198722A1 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102318603B1 (ko) * 2016-08-23 2021-10-27 에스케이넥실리스 주식회사 이차전지의 용량 유지율을 향상시킬 수 있는 전해동박, 그것을 포함하는 전극, 그것을 포함하는 이차전지, 및 그것의 제조방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8913561D0 (en) * 1989-06-13 1989-08-02 Learonal Uk Plc Method of stabilising an organic additive in an electroplating solution
DE19653681C2 (de) * 1996-12-13 2000-04-06 Atotech Deutschland Gmbh Verfahren zur elektrolytischen Abscheidung von Kupferschichten mit gleichmäßiger Schichtdicke und guten optischen und metallphysikalischen Eigenschaften und Anwendung des Verfahrens
US6508924B1 (en) 2000-05-31 2003-01-21 Shipley Company L.L.C. Control of breakdown products in electroplating baths
US6572753B2 (en) * 2001-10-01 2003-06-03 Eci Technology, Inc. Method for analysis of three organic additives in an acid copper plating bath
US7291253B2 (en) * 2004-05-04 2007-11-06 Eci Technology, Inc. Detection of an unstable additive breakdown product in a plating bath
JP5650899B2 (ja) * 2009-09-08 2015-01-07 上村工業株式会社 電気めっき装置

Also Published As

Publication number Publication date
MY178768A (en) 2020-10-20
US20190078229A1 (en) 2019-03-14
PH12018502416A1 (en) 2019-03-11
ES2733771T3 (es) 2019-12-02
US10494732B2 (en) 2019-12-03
EP3417096B1 (en) 2019-05-01
CN109072468A (zh) 2018-12-21
EP3417096A1 (en) 2018-12-26
WO2017198722A1 (en) 2017-11-23
CN109072468B (zh) 2020-04-07
PH12018502416B1 (en) 2023-02-10

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