PL3417300T3 - Urządzenie testowe i sposób testowania jednostki sterowania urządzenia rozdzielczego rozdzielni - Google Patents

Urządzenie testowe i sposób testowania jednostki sterowania urządzenia rozdzielczego rozdzielni

Info

Publication number
PL3417300T3
PL3417300T3 PL17703757T PL17703757T PL3417300T3 PL 3417300 T3 PL3417300 T3 PL 3417300T3 PL 17703757 T PL17703757 T PL 17703757T PL 17703757 T PL17703757 T PL 17703757T PL 3417300 T3 PL3417300 T3 PL 3417300T3
Authority
PL
Poland
Prior art keywords
testing
control unit
switching device
switchgear installation
switchgear
Prior art date
Application number
PL17703757T
Other languages
English (en)
Inventor
Michael Jochum
Stephan Geiger
Rainer KÜNG
Original Assignee
Omicron Electronics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omicron Electronics Gmbh filed Critical Omicron Electronics Gmbh
Publication of PL3417300T3 publication Critical patent/PL3417300T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3275—Fault detection or status indication
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/02—Details
    • H02H3/04—Details with warning or supervision in addition to disconnection, e.g. for indicating that protective apparatus has functioned
    • H02H3/044—Checking correct functioning of protective arrangements, e.g. by simulating a fault

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
PL17703757T 2016-02-15 2017-02-08 Urządzenie testowe i sposób testowania jednostki sterowania urządzenia rozdzielczego rozdzielni PL3417300T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
ATA50094/2016A AT518368B1 (de) 2016-02-15 2016-02-15 Prüfgerät und Verfahren zum Prüfen einer Steuereinheit einer Schaltvorrichtung einer Schaltanlage
EP17703757.9A EP3417300B1 (de) 2016-02-15 2017-02-08 Prüfgerät und verfahren zum prüfen einer steuereinheit einer schaltvorrichtung einer schaltanlage
PCT/EP2017/052718 WO2017140547A1 (de) 2016-02-15 2017-02-08 Prüfgerät und verfahren zum prüfen einer steuereinheit einer schaltvorrichtung einer schaltanlage

Publications (1)

Publication Number Publication Date
PL3417300T3 true PL3417300T3 (pl) 2020-10-19

Family

ID=57984955

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17703757T PL3417300T3 (pl) 2016-02-15 2017-02-08 Urządzenie testowe i sposób testowania jednostki sterowania urządzenia rozdzielczego rozdzielni

Country Status (8)

Country Link
US (1) US10809299B2 (pl)
EP (1) EP3417300B1 (pl)
AT (1) AT518368B1 (pl)
AU (1) AU2017221058B2 (pl)
CA (1) CA3014679C (pl)
ES (1) ES2799707T3 (pl)
PL (1) PL3417300T3 (pl)
WO (1) WO2017140547A1 (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11506692B2 (en) 2020-09-17 2022-11-22 Automatic Timing & Controls, Inc. Ultra-low leakage test verification circuit
US11699998B2 (en) 2021-08-17 2023-07-11 Allison Transmission, Inc. Switch assembly with feedback signal for fault detection

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4712058A (en) * 1986-07-22 1987-12-08 Tektronix, Inc. Active load network
US4870532A (en) * 1988-08-24 1989-09-26 Westinghouse Electric Corp. Electric circuit for operating trip circuit of a circuit breaker
DE4244732C2 (de) 1992-12-09 1996-08-14 Deutsche Tiefbohr Ag Verfahren zur Steuerung eines seilgetriebenen Hebezeuges
US7259565B2 (en) * 2003-09-15 2007-08-21 General Electric Company Testing an electrical switchgear system
TWI338309B (en) * 2006-07-17 2011-03-01 Realtek Semiconductor Corp Trimmer and related trimming method
DE102008034109B4 (de) 2008-07-21 2016-10-13 Dspace Digital Signal Processing And Control Engineering Gmbh Schaltung zur Nachbildung einer elektrischen Last
US9112350B2 (en) * 2008-10-31 2015-08-18 Moog Inc. Power supplies with testable current limiters, and methods of operating same
DE102009031892B4 (de) * 2009-07-06 2015-05-13 Engberts Mess-, Steuer- Und Regelsysteme Gmbh Prüfsystem zum Prüfen einer Leitungsanordnung, Verwendung eines Adapters in einem Prüfsystem und Prüfgerät zum Prüfen einer Leitungsanordnung sowie Verfahren zum Herstellen einer Leitungsanordnung
US9330875B2 (en) * 2009-10-02 2016-05-03 Semiconductor Components Industries, Llc Method for determining a circuit element parameter
US20140312909A1 (en) * 2013-04-17 2014-10-23 Ge Intelligent Platforms, Inc. Programmable contact input apparatus and method of operating the same

Also Published As

Publication number Publication date
WO2017140547A1 (de) 2017-08-24
ES2799707T3 (es) 2020-12-21
AT518368A1 (de) 2017-09-15
CA3014679C (en) 2020-06-16
EP3417300A1 (de) 2018-12-26
CA3014679A1 (en) 2017-08-24
EP3417300B1 (de) 2020-04-08
AU2017221058A1 (en) 2018-09-13
US20190049516A1 (en) 2019-02-14
AU2017221058B2 (en) 2019-08-22
US10809299B2 (en) 2020-10-20
AT518368B1 (de) 2021-06-15

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