PL3465171T3 - System kontroli powierzchni i sposób kontroli - Google Patents
System kontroli powierzchni i sposób kontroliInfo
- Publication number
- PL3465171T3 PL3465171T3 PL17729014.5T PL17729014T PL3465171T3 PL 3465171 T3 PL3465171 T3 PL 3465171T3 PL 17729014 T PL17729014 T PL 17729014T PL 3465171 T3 PL3465171 T3 PL 3465171T3
- Authority
- PL
- Poland
- Prior art keywords
- control system
- control method
- control
- surface control
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N2021/8905—Directional selective optics, e.g. slits, spatial filters
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16172026 | 2016-05-30 | ||
| PCT/EP2017/025149 WO2017207115A1 (en) | 2016-05-30 | 2017-05-29 | Surface inspection system and inspection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3465171T3 true PL3465171T3 (pl) | 2024-10-07 |
Family
ID=56096518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL17729014.5T PL3465171T3 (pl) | 2016-05-30 | 2017-05-29 | System kontroli powierzchni i sposób kontroli |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11169095B2 (pl) |
| EP (1) | EP3465171B1 (pl) |
| CN (1) | CN109313141B (pl) |
| ES (1) | ES2986374T3 (pl) |
| PL (1) | PL3465171T3 (pl) |
| WO (1) | WO2017207115A1 (pl) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10887500B2 (en) * | 2017-01-24 | 2021-01-05 | Hong Kong Applied Science And Technology Research Institute Co., Ltd. | Optical inspection system |
| EP3719442B1 (en) * | 2017-11-27 | 2023-08-30 | Nippon Steel Corporation | Shape inspecting device and shape inspecting method |
| JP2020094879A (ja) * | 2018-12-11 | 2020-06-18 | コニカミノルタ株式会社 | 加飾印刷検査装置、加飾印刷検査システム、加飾印刷検査方法、及び、プログラム |
| CN109839387A (zh) * | 2019-03-25 | 2019-06-04 | 中国工程物理研究院激光聚变研究中心 | 快速统计大口径光学元件表面污染和损伤的方法 |
| CN110346381B (zh) * | 2019-08-12 | 2022-03-08 | 衡阳师范学院 | 一种光学元件损伤测试方法及装置 |
| DE102021210370A1 (de) * | 2021-09-17 | 2023-03-23 | QUISS Qualitäts-Inspektionssysteme und Service GmbH | Vorrichtung und Verfahren zum automatischen Überwachen von Getränke- und Lebensmitteldosen-Deckeln |
| US12529660B2 (en) * | 2023-05-08 | 2026-01-20 | Honeywell International Inc. | Integrated quality monitoring view for battery manufacturing process |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01169343A (ja) * | 1987-12-25 | 1989-07-04 | Nippon Sheet Glass Co Ltd | ガラス板の切口欠点検出装置 |
| AU8071791A (en) * | 1990-06-22 | 1992-01-23 | Alcan International Limited | Illumination system for high speed surface inspection of rolled aluminum sheet |
| US5087822A (en) * | 1990-06-22 | 1992-02-11 | Alcan International Limited | Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet |
| US5367378A (en) | 1993-06-01 | 1994-11-22 | Industrial Technology Institute | Highlighted panel inspection |
| JP3312849B2 (ja) * | 1996-06-25 | 2002-08-12 | 松下電工株式会社 | 物体表面の欠陥検出方法 |
| EP0898163B1 (en) * | 1997-08-22 | 2000-11-08 | Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. | Method and apparatus for automatic inspection of moving surfaces |
| US6327374B1 (en) * | 1999-02-18 | 2001-12-04 | Thermo Radiometrie Oy | Arrangement and method for inspection of surface quality |
| FI20000032A7 (fi) * | 2000-01-07 | 2001-10-26 | Spectra Physics Visiontech Oy | Järjestely ja menetelmä pinnan tarkistamiseksi |
| DE102005031957B4 (de) * | 2005-07-08 | 2007-03-22 | Koenig & Bauer Ag | Vorrichtung zur Inspektion eines Bedruckstoffes mit uneinheitlich reflektierenden Oberflächen |
| US7763876B2 (en) * | 2007-04-06 | 2010-07-27 | Xerox Corporation | Gloss and differential gloss measuring system |
| US8202331B2 (en) * | 2008-10-06 | 2012-06-19 | Odoreyes Technologies, Inc. | Pump purge apparatus and method |
| JP4719284B2 (ja) * | 2008-10-10 | 2011-07-06 | トヨタ自動車株式会社 | 表面検査装置 |
| EP2508870A1 (fr) * | 2011-04-05 | 2012-10-10 | Siemens Vai Metals Technologies SAS | Dispositif d'inspection de bande en défilement |
| FR2983583B1 (fr) * | 2011-12-02 | 2013-11-15 | Saint Gobain | Dispositif d'analyse des defauts d'aspect d'un substrat transparent |
| CN102654464A (zh) * | 2012-03-13 | 2012-09-05 | 浙江工业大学 | 基于多特征模糊识别的铜带表面缺陷检测系统 |
| CN203259126U (zh) * | 2013-02-05 | 2013-10-30 | 武汉巨合科技有限公司 | 一种用于对推板窑内壁面状况执行在线监控的系统 |
| WO2016194939A1 (ja) * | 2015-06-05 | 2016-12-08 | 新日鐵住金株式会社 | 金属体の形状検査装置及び金属体の形状検査方法 |
| JP2017085501A (ja) * | 2015-10-30 | 2017-05-18 | 株式会社東芝 | 画像読取装置、及び紙葉類処理装置 |
-
2017
- 2017-05-29 CN CN201780033749.8A patent/CN109313141B/zh active Active
- 2017-05-29 EP EP17729014.5A patent/EP3465171B1/en active Active
- 2017-05-29 WO PCT/EP2017/025149 patent/WO2017207115A1/en not_active Ceased
- 2017-05-29 PL PL17729014.5T patent/PL3465171T3/pl unknown
- 2017-05-29 US US16/301,024 patent/US11169095B2/en active Active
- 2017-05-29 ES ES17729014T patent/ES2986374T3/es active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US11169095B2 (en) | 2021-11-09 |
| EP3465171C0 (en) | 2024-07-24 |
| CN109313141A (zh) | 2019-02-05 |
| WO2017207115A1 (en) | 2017-12-07 |
| EP3465171A1 (en) | 2019-04-10 |
| US20190178812A1 (en) | 2019-06-13 |
| EP3465171B1 (en) | 2024-07-24 |
| CN109313141B (zh) | 2025-10-03 |
| ES2986374T3 (es) | 2024-11-11 |
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