PL3491426T3 - System kontroli ze źródłem promieniowania oraz sposób - Google Patents

System kontroli ze źródłem promieniowania oraz sposób

Info

Publication number
PL3491426T3
PL3491426T3 PL17761304T PL17761304T PL3491426T3 PL 3491426 T3 PL3491426 T3 PL 3491426T3 PL 17761304 T PL17761304 T PL 17761304T PL 17761304 T PL17761304 T PL 17761304T PL 3491426 T3 PL3491426 T3 PL 3491426T3
Authority
PL
Poland
Prior art keywords
radiation
source
inspection system
inspection
Prior art date
Application number
PL17761304T
Other languages
English (en)
Inventor
Guillaume JEGOU
Original Assignee
Smiths Detection France S.A.S.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection France S.A.S. filed Critical Smiths Detection France S.A.S.
Publication of PL3491426T3 publication Critical patent/PL3491426T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/228Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using stereoscopic means
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00X-ray tubes
    • H01J2235/08Targets (anodes) and X-ray converters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
PL17761304T 2016-07-28 2017-07-27 System kontroli ze źródłem promieniowania oraz sposób PL3491426T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1613069.2A GB2552537B (en) 2016-07-28 2016-07-28 Inspection system with source of radiation and method
EP17761304.9A EP3491426B1 (en) 2016-07-28 2017-07-27 Inspection system with source of radiation and method
PCT/GB2017/052198 WO2018020257A1 (en) 2016-07-28 2017-07-27 Inspection system with source of radiation and method

Publications (1)

Publication Number Publication Date
PL3491426T3 true PL3491426T3 (pl) 2021-03-08

Family

ID=56936828

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17761304T PL3491426T3 (pl) 2016-07-28 2017-07-27 System kontroli ze źródłem promieniowania oraz sposób

Country Status (6)

Country Link
US (1) US10962677B2 (pl)
EP (1) EP3491426B1 (pl)
CN (1) CN110121666B (pl)
GB (1) GB2552537B (pl)
PL (1) PL3491426T3 (pl)
WO (1) WO2018020257A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB202012182D0 (en) * 2020-08-05 2020-09-16 2Xsystems Ltd Boom apparatus and an article scanning system
US20220414860A1 (en) * 2021-06-25 2022-12-29 Subcom, Llc Imaging device and system for inspecting cables and cable joints
JP7535545B2 (ja) * 2022-02-17 2024-08-16 本田技研工業株式会社 車両用電池検査装置
GB2635770A (en) * 2023-11-27 2025-05-28 Smiths Detection France S A S Platform module for inspection system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB997338A (en) * 1963-12-23 1965-07-07 Atomic Energy Of Australia A method and apparatus for producing x-rays of particular wave lengths and applications therefor
US6621888B2 (en) * 1998-06-18 2003-09-16 American Science And Engineering, Inc. X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
GB2403388A (en) * 2003-06-24 2004-12-29 Secr Defence X-ray inspection system having X-ray source with compound fluorescent secondary target
US7508504B2 (en) * 2006-05-02 2009-03-24 Accretech Usa, Inc. Automatic wafer edge inspection and review system
US7840360B1 (en) * 2006-10-26 2010-11-23 Micheels Ronald H Optical system and method for inspection and characterization of liquids in vessels
CN102519988B (zh) * 2008-05-09 2014-08-20 清华大学 创建识别材料的函数曲线的方法和装置
BR112014019517B1 (pt) * 2012-02-14 2022-05-10 American Science and Engineering, Inc Detector de radiação de raio x
CN102662196B (zh) * 2012-05-09 2014-06-04 黑龙江省科学院技术物理研究所 利用蒙特卡罗方法模拟双能x射线成像进行物质识别的方法
CN105223624A (zh) * 2015-09-21 2016-01-06 安徽合创智诚安全技术有限公司 一种快速人体安全检查系统

Also Published As

Publication number Publication date
GB2552537B (en) 2020-05-27
US20190219730A1 (en) 2019-07-18
EP3491426B1 (en) 2020-09-02
CN110121666A (zh) 2019-08-13
GB201613069D0 (en) 2016-09-14
WO2018020257A1 (en) 2018-02-01
GB2552537A (en) 2018-01-31
CN110121666B (zh) 2022-04-05
EP3491426A1 (en) 2019-06-05
US10962677B2 (en) 2021-03-30

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