PL3527932T3 - Urządzenie do mierzenia grubości materiałów akumulatora - Google Patents

Urządzenie do mierzenia grubości materiałów akumulatora

Info

Publication number
PL3527932T3
PL3527932T3 PL17897792T PL17897792T PL3527932T3 PL 3527932 T3 PL3527932 T3 PL 3527932T3 PL 17897792 T PL17897792 T PL 17897792T PL 17897792 T PL17897792 T PL 17897792T PL 3527932 T3 PL3527932 T3 PL 3527932T3
Authority
PL
Poland
Prior art keywords
measuring thickness
battery materials
battery
materials
measuring
Prior art date
Application number
PL17897792T
Other languages
English (en)
Inventor
Sung-Min Hong
Original Assignee
Lg Chem, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Chem, Ltd. filed Critical Lg Chem, Ltd.
Publication of PL3527932T3 publication Critical patent/PL3527932T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/04—Processes of manufacture in general
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Battery Electrode And Active Subsutance (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
PL17897792T 2017-02-24 2017-08-10 Urządzenie do mierzenia grubości materiałów akumulatora PL3527932T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020170024441A KR102095358B1 (ko) 2017-02-24 2017-02-24 전지 재료의 두께 측정기
EP17897792.2A EP3527932B1 (en) 2017-02-24 2017-08-10 Apparatus for measuring thickness of battery materials
PCT/KR2017/008661 WO2018155775A1 (ko) 2017-02-24 2017-08-10 전지 재료의 두께 측정기

Publications (1)

Publication Number Publication Date
PL3527932T3 true PL3527932T3 (pl) 2021-05-04

Family

ID=63253322

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17897792T PL3527932T3 (pl) 2017-02-24 2017-08-10 Urządzenie do mierzenia grubości materiałów akumulatora

Country Status (6)

Country Link
US (1) US11493316B2 (pl)
EP (1) EP3527932B1 (pl)
KR (1) KR102095358B1 (pl)
CN (1) CN109891185B (pl)
PL (1) PL3527932T3 (pl)
WO (1) WO2018155775A1 (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102095358B1 (ko) * 2017-02-24 2020-03-31 주식회사 엘지화학 전지 재료의 두께 측정기
FR3105416B1 (fr) * 2019-12-20 2021-12-17 Commissariat Energie Atomique Banc de caracterisation mecanique d’objets minces a fiabilite augmentee
CN112325779B (zh) * 2020-10-28 2022-05-17 苏州天准科技股份有限公司 一种段差测量机构及检测设备
CN112665548B (zh) * 2020-12-14 2022-05-10 天津市捷威动力工业有限公司 定量确定电芯平整度的方法
CN114993192B (zh) * 2022-05-28 2023-05-26 楚能新能源股份有限公司 一种锂电行业自动测量厚度的设备

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* Cited by examiner, † Cited by third party
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JP2922376B2 (ja) * 1992-12-26 1999-07-19 キヤノン株式会社 シート厚測定装置
JP3279294B2 (ja) * 1998-08-31 2002-04-30 三菱電機株式会社 半導体装置のテスト方法、半導体装置のテスト用プローブ針とその製造方法およびそのプローブ針を備えたプローブカード
JP2000131011A (ja) * 1998-10-23 2000-05-12 Daiichi Gosei Kk 厚み測定装置及び厚み測定方法
JP2000337859A (ja) 1999-05-24 2000-12-08 Toshiba Battery Co Ltd シート状電極の厚さ測定方法および測定装置
TW541425B (en) * 2000-10-20 2003-07-11 Ebara Corp Frequency measuring device, polishing device using the same and eddy current sensor
KR100481171B1 (ko) 2002-04-24 2005-04-07 삼성전자주식회사 반도체검사장치의 포고핀 접촉장치 및 이를 이용한 접촉방법
JP4782990B2 (ja) * 2004-05-31 2011-09-28 株式会社ミツトヨ 表面倣い測定装置、表面倣い測定方法、表面倣い測定プログラムおよび記録媒体
JP4792734B2 (ja) 2004-11-30 2011-10-12 大日本印刷株式会社 接触式膜厚測定機およびその使用方法
KR101058388B1 (ko) 2007-02-08 2011-08-22 주식회사 엘지화학 이차전지 검사 장치
JP3137343U (ja) 2007-08-23 2007-11-22 久雄 高橋 反りや撓みのある板状の測定物も正確に計測できる厚さ測定器
DE102010011633B4 (de) * 2009-03-18 2020-09-24 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messstativ und Verfahren zu dessen elektrischer Ansteuerung
WO2010113250A1 (ja) * 2009-03-31 2010-10-07 トヨタ自動車株式会社 接合品質検査装置及び接合品質検査方法
WO2013118175A1 (ja) * 2012-02-09 2013-08-15 平田機工株式会社 加工システム及び制御方法
JP2013178198A (ja) * 2012-02-29 2013-09-09 Tetsuro Nogata 厚み測定装置
CN103363887A (zh) 2012-04-11 2013-10-23 北京华夏聚龙自动化股份公司 一种新型的材料厚度测量方法
CN102901438A (zh) * 2012-11-08 2013-01-30 昆山允可精密工业技术有限公司 一种smt网板厚度测量用接触式测头
KR101706287B1 (ko) * 2014-07-15 2017-02-14 주식회사 엘지화학 단차부가 형성된 전지셀의 두께 검사 장치
KR101516616B1 (ko) * 2015-02-02 2015-05-04 에이피텍(주) 반도체용 금속 기판 두께 측정기 및 두께 측정 방법
FR3034187B1 (fr) * 2015-03-27 2017-06-09 Soc Anonyme Des Eaux Minerales D'evian Et En Abrege S A E M E Procede et appareil de mesure d'epaisseur d'une paroi d'un recipient tel qu'un pot de yaourt
CN104792255B (zh) * 2015-05-06 2018-06-05 京东方科技集团股份有限公司 一种膜厚测试装置及膜厚测试方法
JP6376043B2 (ja) 2015-05-29 2018-08-22 トヨタ自動車株式会社 電極板厚み測定方法
US10209054B2 (en) * 2016-04-20 2019-02-19 Duke University Non-invasive thickness measurement using capacitance measurement
KR101691402B1 (ko) * 2016-05-31 2016-12-30 동도테크 주식회사 두께측정장치
KR102095358B1 (ko) * 2017-02-24 2020-03-31 주식회사 엘지화학 전지 재료의 두께 측정기

Also Published As

Publication number Publication date
EP3527932A1 (en) 2019-08-21
KR102095358B1 (ko) 2020-03-31
EP3527932A4 (en) 2019-12-18
US11493316B2 (en) 2022-11-08
CN109891185B (zh) 2020-12-01
CN109891185A (zh) 2019-06-14
WO2018155775A1 (ko) 2018-08-30
US20200191543A1 (en) 2020-06-18
EP3527932B1 (en) 2020-11-04
KR20180097820A (ko) 2018-09-03

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