PL3572802T3 - Method for detecting discontinuities in a translucent article - Google Patents
Method for detecting discontinuities in a translucent articleInfo
- Publication number
- PL3572802T3 PL3572802T3 PL19174368.1T PL19174368T PL3572802T3 PL 3572802 T3 PL3572802 T3 PL 3572802T3 PL 19174368 T PL19174368 T PL 19174368T PL 3572802 T3 PL3572802 T3 PL 3572802T3
- Authority
- PL
- Poland
- Prior art keywords
- detecting discontinuities
- translucent article
- translucent
- article
- discontinuities
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8812—Diffuse illumination, e.g. "sky"
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ATA50426/2018A AT521297B1 (en) | 2018-05-24 | 2018-05-24 | Method for the detection of discontinuities in a translucent workpiece |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3572802T3 true PL3572802T3 (en) | 2023-11-13 |
Family
ID=66542119
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL19174368.1T PL3572802T3 (en) | 2018-05-24 | 2019-05-14 | Method for detecting discontinuities in a translucent article |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP3572802B1 (en) |
| AT (1) | AT521297B1 (en) |
| PL (1) | PL3572802T3 (en) |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3814946A (en) | 1972-12-04 | 1974-06-04 | Asahi Glass Co Ltd | Method of detecting defects in transparent and semitransparent bodies |
| US4629319A (en) | 1984-02-14 | 1986-12-16 | Diffracto Ltd. | Panel surface flaw inspection |
| US5293538A (en) | 1990-05-25 | 1994-03-08 | Hitachi, Ltd. | Method and apparatus for the inspection of defects |
| US5237404A (en) | 1990-06-28 | 1993-08-17 | Mazda Motor Corporation | Inspection apparatus with improved detection of surface defects over large and curved surfaces |
| US5426506A (en) | 1993-03-22 | 1995-06-20 | The University Of Chicago | Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics |
| KR100267665B1 (en) | 1997-08-28 | 2001-01-15 | 하나와 요시카즈 | Surface Inspection Device |
| US6617136B2 (en) | 2001-04-24 | 2003-09-09 | 3M Innovative Properties Company | Biological sample processing methods and compositions that include surfactants |
| DE102004034167A1 (en) * | 2004-07-15 | 2006-02-09 | Byk Gardner Gmbh | Apparatus for the goniometric examination of optical surface properties |
| JP2007071803A (en) | 2005-09-09 | 2007-03-22 | Hitachi High-Technologies Corp | Defect observation method and apparatus |
| CN101887030A (en) * | 2009-05-15 | 2010-11-17 | 圣戈本玻璃法国公司 | Method and system for detecting defects on the surface and/or inside of a transparent substrate |
| JP6043188B2 (en) | 2013-01-08 | 2016-12-14 | 株式会社カネカ | Interlayer thermal connection member and interlayer thermal connection method |
| JP5825278B2 (en) * | 2013-02-21 | 2015-12-02 | オムロン株式会社 | Defect inspection apparatus and defect inspection method |
| JP2015175815A (en) * | 2014-03-18 | 2015-10-05 | 東レ株式会社 | Method and device for inspecting defect of transparent sheet |
| JP6384183B2 (en) * | 2014-08-05 | 2018-09-05 | 株式会社リコー | Sample measuring apparatus and sample measuring program |
| DE102015223853B4 (en) * | 2015-12-01 | 2025-07-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Arrangement for determining the depth of depressions formed in surfaces of a substrate on which at least one layer of a material different from the substrate material is formed |
| JP2017166903A (en) * | 2016-03-15 | 2017-09-21 | 株式会社大真空 | Defect inspection device and defect inspection method |
| JP6753184B2 (en) * | 2016-07-22 | 2020-09-09 | 大日本印刷株式会社 | Inspection system and inspection method |
-
2018
- 2018-05-24 AT ATA50426/2018A patent/AT521297B1/en not_active IP Right Cessation
-
2019
- 2019-05-14 PL PL19174368.1T patent/PL3572802T3/en unknown
- 2019-05-14 EP EP19174368.1A patent/EP3572802B1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3572802B1 (en) | 2023-06-21 |
| AT521297A1 (en) | 2019-12-15 |
| AT521297B1 (en) | 2021-06-15 |
| EP3572802A1 (en) | 2019-11-27 |
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