PL3607264T3 - Układ widzenia maszynowego - Google Patents

Układ widzenia maszynowego

Info

Publication number
PL3607264T3
PL3607264T3 PL18700940T PL18700940T PL3607264T3 PL 3607264 T3 PL3607264 T3 PL 3607264T3 PL 18700940 T PL18700940 T PL 18700940T PL 18700940 T PL18700940 T PL 18700940T PL 3607264 T3 PL3607264 T3 PL 3607264T3
Authority
PL
Poland
Prior art keywords
vision system
machine vision
machine
vision
Prior art date
Application number
PL18700940T
Other languages
English (en)
Inventor
Esa Leikas
Original Assignee
Oy Mapvision Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=61007715&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL3607264(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Oy Mapvision Ltd filed Critical Oy Mapvision Ltd
Publication of PL3607264T3 publication Critical patent/PL3607264T3/pl

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85—Stereo camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G06T2207/10012—Stereo images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
PL18700940T 2017-04-05 2018-01-11 Układ widzenia maszynowego PL3607264T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI20175318A FI127555B (en) 2017-04-05 2017-04-05 Computer vision systems that include coordinate correction
EP18700940.2A EP3607264B1 (en) 2017-04-05 2018-01-11 Machine vision system
PCT/FI2018/050016 WO2018185363A1 (en) 2017-04-05 2018-01-11 Machine vision system

Publications (1)

Publication Number Publication Date
PL3607264T3 true PL3607264T3 (pl) 2022-01-17

Family

ID=61007715

Family Applications (1)

Application Number Title Priority Date Filing Date
PL18700940T PL3607264T3 (pl) 2017-04-05 2018-01-11 Układ widzenia maszynowego

Country Status (14)

Country Link
US (1) US11087455B2 (pl)
EP (1) EP3607264B1 (pl)
JP (1) JP6789411B2 (pl)
KR (1) KR102235632B1 (pl)
CN (1) CN110573832B (pl)
ES (1) ES2882712T3 (pl)
FI (1) FI127555B (pl)
HR (1) HRP20211376T1 (pl)
HU (1) HUE055514T2 (pl)
PL (1) PL3607264T3 (pl)
PT (1) PT3607264T (pl)
RS (1) RS62264B1 (pl)
SI (1) SI3607264T1 (pl)
WO (1) WO2018185363A1 (pl)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI127555B (en) 2017-04-05 2018-08-31 Oy Mapvision Ltd Computer vision systems that include coordinate correction
JP7012965B2 (ja) * 2019-03-28 2022-01-31 株式会社AB.do 三次元データスケール付与方法及び三次元データスケール付与プログラム
CN110030928A (zh) * 2019-04-11 2019-07-19 接楚添 基于计算机视觉的空间物体定位和测量的方法和系统
CN111724434A (zh) * 2020-06-23 2020-09-29 江苏农牧科技职业学院 一种水产养殖体生长跟踪方法、装置、系统及介质
KR102737135B1 (ko) 2021-03-18 2024-12-02 주식회사 아이솔 검사부 교체식 인공지능 머신 비전 장치
DE102021121080A1 (de) 2021-08-13 2023-02-16 Inline3D GmbH Messvorrichtung und Verfahren zur Messung eines Objekts
DE102021121073A1 (de) 2021-08-13 2023-02-16 Inline3D GmbH Messvorrichtung und Verfahren zur Messung eines Objektes
DE102023106705A1 (de) 2022-03-17 2023-09-21 Inline3D GmbH Verfahren zum Abgleich von Messsystemen und Messsystemanordnung

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DE102005016955A1 (de) * 2005-04-12 2006-10-19 Universität Tübingen Verfahren und Vorrichtung zur Verarbeitung von Bild- und Volumendaten auf Basis statistischer Modelle
JP2006308500A (ja) 2005-04-28 2006-11-09 Yorozu Corp 三次元ワーク測定方法
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KR101398126B1 (ko) 2012-04-18 2014-05-27 박윤식 서랍용 슬라이드 장치
CN103424083B (zh) 2012-05-24 2016-02-10 北京数码视讯科技股份有限公司 物体深度的检测方法、装置和系统
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CN104034269B (zh) 2014-06-24 2018-04-17 深圳市赛为智能股份有限公司 一种单目视觉测量方法与装置
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JP2017116297A (ja) 2015-12-21 2017-06-29 株式会社ミツトヨ 画像測定方法及び画像測定機
CN105865335A (zh) 2016-04-21 2016-08-17 四川大学 一种基于机器视觉的定子线棒截面尺寸检测系统
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Also Published As

Publication number Publication date
EP3607264A1 (en) 2020-02-12
SI3607264T1 (sl) 2021-11-30
CN110573832A (zh) 2019-12-13
KR102235632B1 (ko) 2021-04-05
HUE055514T2 (hu) 2021-12-28
JP2020513107A (ja) 2020-04-30
KR20190137131A (ko) 2019-12-10
EP3607264B1 (en) 2021-06-09
CN110573832B (zh) 2022-07-26
WO2018185363A1 (en) 2018-10-11
HRP20211376T1 (hr) 2021-11-26
FI127555B (en) 2018-08-31
JP6789411B2 (ja) 2020-11-25
PT3607264T (pt) 2021-09-13
ES2882712T3 (es) 2021-12-02
US11087455B2 (en) 2021-08-10
US20210004944A1 (en) 2021-01-07
RS62264B1 (sr) 2021-09-30

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