PL3627206T3 - Strukturalne oświetlenie próbki - Google Patents

Strukturalne oświetlenie próbki

Info

Publication number
PL3627206T3
PL3627206T3 PL19198050.7T PL19198050T PL3627206T3 PL 3627206 T3 PL3627206 T3 PL 3627206T3 PL 19198050 T PL19198050 T PL 19198050T PL 3627206 T3 PL3627206 T3 PL 3627206T3
Authority
PL
Poland
Prior art keywords
sample
structured illumination
structured
illumination
Prior art date
Application number
PL19198050.7T
Other languages
English (en)
Inventor
Stanley S. Hong
William Mcguigan
Frank DeWitt IV
Original Assignee
Illumina, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Illumina, Inc. filed Critical Illumina, Inc.
Publication of PL3627206T3 publication Critical patent/PL3627206T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/04Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6428Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4272Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
    • G02B27/4277Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path being separated by an air space
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58Optics for apodization or superresolution; Optical synthetic aperture systems
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • G02B7/1822Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors comprising means for aligning the optical axis
    • G02B7/1827Motorised alignment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/04Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • G01N2001/068Illumination means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Devices For Use In Laboratory Experiments (AREA)
PL19198050.7T 2018-09-19 2019-09-18 Strukturalne oświetlenie próbki PL3627206T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862733330P 2018-09-19 2018-09-19
NL2022286A NL2022286B1 (en) 2018-09-19 2018-12-21 Structured illumination of a sample

Publications (1)

Publication Number Publication Date
PL3627206T3 true PL3627206T3 (pl) 2024-09-09

Family

ID=65010879

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19198050.7T PL3627206T3 (pl) 2018-09-19 2019-09-18 Strukturalne oświetlenie próbki

Country Status (18)

Country Link
EP (1) EP4180857A1 (pl)
JP (1) JP7237100B2 (pl)
KR (1) KR102633238B1 (pl)
CN (2) CN211426904U (pl)
AU (1) AU2019342317B2 (pl)
CA (1) CA3103698A1 (pl)
DK (1) DK3627206T3 (pl)
ES (1) ES2986071T3 (pl)
FI (1) FI3627206T3 (pl)
IL (2) IL298318B2 (pl)
MX (1) MX2020014074A (pl)
MY (1) MY204667A (pl)
NL (1) NL2022286B1 (pl)
PL (1) PL3627206T3 (pl)
PT (1) PT3627206T (pl)
SA (1) SA520420869B1 (pl)
SG (1) SG11202012647WA (pl)
TW (2) TWI809546B (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10901202B2 (en) 2018-09-19 2021-01-26 Illumina, Inc. Structured illumination of a sample
CN117782999B (zh) * 2024-02-27 2024-04-30 上海英盛分析仪器有限公司 一种基于激光气体分析仪用的光束方向调节装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6068314A (ja) * 1983-09-26 1985-04-18 Ricoh Co Ltd ホロスキヤナのフアセツト列切換機構
US4862468A (en) * 1987-04-27 1989-08-29 Hughes Aircraft Company Rapidly switchable line selector for pulsed lasers
JP2603409B2 (ja) * 1992-08-20 1997-04-23 株式会社椿本チエイン バーコード部材を設けた物品搬送用吊垂体
US20040035529A1 (en) * 1999-08-24 2004-02-26 Michael N. Grimbergen Monitoring a process and compensating for radiation source fluctuations
US6583873B1 (en) * 2000-09-25 2003-06-24 The Carnegie Institution Of Washington Optical devices having a wavelength-tunable dispersion assembly that has a volume dispersive diffraction grating
JP2006500776A (ja) * 2002-09-25 2006-01-05 アジレント・テクノロジーズ・インク 回転運動をする波長可変空洞共振器
JP4434882B2 (ja) * 2004-08-27 2010-03-17 オリンパス株式会社 レーザ走査型蛍光観察装置
CA2555477C (en) * 2005-10-21 2012-10-23 National Research Council Of Canada Method and apparatus for scanning optical delay line
CA2524242A1 (en) * 2005-10-21 2007-04-21 National Research Council Of Canada Method and apparatus for scanning optical delay line
US7428086B2 (en) * 2005-10-21 2008-09-23 National Research Council Of Canada Method and apparatus for scanning optical delay line
GB0618057D0 (en) * 2006-09-14 2006-10-25 Perkinelmer Ltd Improvements in and relating to scanning confocal microscopy
US20090219607A1 (en) * 2008-01-17 2009-09-03 Baylor College Of Medicine Method and apparatus for enhanced resolution microscopy of living biological nanostructures
WO2012118530A1 (en) * 2011-03-01 2012-09-07 Applied Precision, Inc. Variable orientation illumination-pattern rotator
DE102012017917B4 (de) * 2012-09-11 2023-09-21 Carl Zeiss Microscopy Gmbh Mikroskopmodul und Lichtmikroskop sowie Verfahren und Datenspeicherträger
DE102012017922B4 (de) * 2012-09-11 2024-03-14 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
DE102013002423A1 (de) * 2013-02-11 2014-08-14 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop

Also Published As

Publication number Publication date
JP2022501627A (ja) 2022-01-06
IL279569B2 (en) 2023-05-01
SA520420869B1 (ar) 2022-12-03
JP7237100B2 (ja) 2023-03-10
BR112020026322A2 (pt) 2021-03-30
NL2022286B1 (en) 2020-05-07
DK3627206T3 (da) 2024-07-29
EP4180857A1 (en) 2023-05-17
FI3627206T3 (fi) 2024-08-07
AU2019342317B2 (en) 2025-02-13
TWI747044B (zh) 2021-11-21
TW202024597A (zh) 2020-07-01
MY204667A (en) 2024-09-07
IL298318B2 (en) 2025-01-01
TWI809546B (zh) 2023-07-21
IL279569A (en) 2021-03-01
CN115657285A (zh) 2023-01-31
KR102633238B1 (ko) 2024-02-02
IL298318A (en) 2023-01-01
CN211426904U (zh) 2020-09-04
CA3103698A1 (en) 2020-03-26
PT3627206T (pt) 2024-09-06
MX2020014074A (es) 2021-05-27
IL298318B1 (en) 2024-09-01
IL279569B1 (en) 2023-01-01
AU2019342317A1 (en) 2021-01-07
ES2986071T3 (es) 2024-11-08
SG11202012647WA (en) 2021-01-28
KR20210060373A (ko) 2021-05-26
TW202208821A (zh) 2022-03-01

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