PL362826A1 - Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego - Google Patents

Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego

Info

Publication number
PL362826A1
PL362826A1 PL03362826A PL36282603A PL362826A1 PL 362826 A1 PL362826 A1 PL 362826A1 PL 03362826 A PL03362826 A PL 03362826A PL 36282603 A PL36282603 A PL 36282603A PL 362826 A1 PL362826 A1 PL 362826A1
Authority
PL
Poland
Prior art keywords
detection
electron microscope
scanning electron
scattered electrons
backward scattered
Prior art date
Application number
PL03362826A
Other languages
English (en)
Other versions
PL207238B1 (pl
Inventor
Witold Słówko
Original Assignee
Politechnika Wrocławska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Wrocławska filed Critical Politechnika Wrocławska
Priority to PL362826A priority Critical patent/PL207238B1/pl
Priority to EP04775184A priority patent/EP1673797B1/en
Priority to DE602004024559T priority patent/DE602004024559D1/de
Priority to PCT/PL2004/000078 priority patent/WO2005036583A2/en
Publication of PL362826A1 publication Critical patent/PL362826A1/pl
Priority to US11/403,823 priority patent/US7470915B2/en
Publication of PL207238B1 publication Critical patent/PL207238B1/pl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2443—Scintillation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24475—Scattered electron detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2448—Secondary particle detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2602—Details
    • H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
    • H01J2237/2608—Details operating at elevated pressures, e.g. atmosphere with environmental specimen chamber

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL362826A 2003-10-14 2003-10-14 Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego PL207238B1 (pl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
PL362826A PL207238B1 (pl) 2003-10-14 2003-10-14 Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego
EP04775184A EP1673797B1 (en) 2003-10-14 2004-10-06 Detector system of secondary and backscattered electrons for a scanning electron microscope
DE602004024559T DE602004024559D1 (de) 2003-10-14 2004-10-06 Detektorsystem von sekundären und rückgestreuten elektronen für ein rasterelektronenmikroskop
PCT/PL2004/000078 WO2005036583A2 (en) 2003-10-14 2004-10-06 Detector system of secondary and backscattered electrons for a scanning electron microscope
US11/403,823 US7470915B2 (en) 2003-10-14 2006-04-14 Detector system of secondary and backscattered electrons for a scanning electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL362826A PL207238B1 (pl) 2003-10-14 2003-10-14 Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego

Publications (2)

Publication Number Publication Date
PL362826A1 true PL362826A1 (pl) 2005-04-18
PL207238B1 PL207238B1 (pl) 2010-11-30

Family

ID=34432601

Family Applications (1)

Application Number Title Priority Date Filing Date
PL362826A PL207238B1 (pl) 2003-10-14 2003-10-14 Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego

Country Status (5)

Country Link
US (1) US7470915B2 (pl)
EP (1) EP1673797B1 (pl)
DE (1) DE602004024559D1 (pl)
PL (1) PL207238B1 (pl)
WO (1) WO2005036583A2 (pl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006043895B9 (de) 2006-09-19 2012-02-09 Carl Zeiss Nts Gmbh Elektronenmikroskop zum Inspizieren und Bearbeiten eines Objekts mit miniaturisierten Strukturen
DE102010026169B4 (de) * 2010-07-06 2014-09-04 Carl Zeiss Microscopy Gmbh Partikelstrahlsystem
CZ307557B6 (cs) * 2010-10-07 2018-12-05 Tescan Orsay Holding, A.S. Scintilační detekční jednotka pro detekci zpětně odražených elektronů pro elektronové nebo iontové mikroskopy
US9076632B2 (en) 2012-02-12 2015-07-07 El-Mul Technologies Ltd. Position sensitive STEM detector
US9478390B2 (en) * 2014-06-30 2016-10-25 Fei Company Integrated light optics and gas delivery in a charged particle lens
KR101756171B1 (ko) * 2015-12-15 2017-07-12 (주)새론테크놀로지 주사 전자 현미경
CN115662866B (zh) * 2022-11-29 2023-03-14 北京中科科仪股份有限公司 一种二次电子探测装置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5818851A (ja) * 1981-07-24 1983-02-03 Hitachi Ltd 反射電子検出装置
DE3213145A1 (de) * 1982-04-08 1983-10-20 Fa. Carl Zeiss, 7920 Heidenheim Mikroskopphotometer
US5683547A (en) * 1990-11-21 1997-11-04 Hitachi, Ltd. Processing method and apparatus using focused energy beam
JP2919170B2 (ja) * 1992-03-19 1999-07-12 株式会社日立製作所 走査電子顕微鏡
JP2927627B2 (ja) * 1992-10-20 1999-07-28 株式会社日立製作所 走査電子顕微鏡
JPH07122220A (ja) * 1993-10-21 1995-05-12 Hitachi Ltd 電子顕微鏡装置
DE69512410T2 (de) * 1994-04-12 2000-05-04 Koninklijke Philips Electronics N.V., Eindhoven Partikel-optisches Gerät mit einem Sekundärelektrodendetektor
CZ284288B6 (cs) * 1997-03-13 1998-10-14 Preciosa, A. S. Detekční systém rastrovacího elektronového mikroskopu
US5990483A (en) * 1997-10-06 1999-11-23 El-Mul Technologies Ltd. Particle detection and particle detector devices
WO1999046797A1 (de) * 1998-03-10 1999-09-16 Erik Essers Rasterelektronenmikroskop
IL124333A0 (en) * 1998-05-05 1998-12-06 El Mul Technologies Ltd Charges particle detector
PL189008B1 (pl) 1998-10-21 2005-05-31 Politechnika Wroclawska Wysokociśnieniowy skaningowy mikroskop elektronowy
US6646262B1 (en) 2000-03-31 2003-11-11 Hitachi, Ltd. Scanning electron microscope
US6847038B2 (en) * 2002-07-15 2005-01-25 Hitachi, Ltd. Scanning electron microscope
US6545277B1 (en) * 2000-08-15 2003-04-08 Applied Materials, Inc. High efficiency, enhanced detecting in-lens light guide scintillator detector for SEM
CZ20022105A3 (cs) * 2002-06-17 2004-02-18 Tescan, S. R. O. Detektor sekundárních elektronů, zejména v rastrovacím elektronovém mikroskopu
US6979822B1 (en) * 2002-09-18 2005-12-27 Fei Company Charged particle beam system
PL207199B1 (pl) 2003-04-17 2010-11-30 Politechnika Wroclawska Układ detekcyjny elektronów wtórnych do skaningowego mikroskopu elektronowego
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use

Also Published As

Publication number Publication date
US7470915B2 (en) 2008-12-30
EP1673797A2 (en) 2006-06-28
US20060249674A1 (en) 2006-11-09
WO2005036583A2 (en) 2005-04-21
EP1673797B1 (en) 2009-12-09
DE602004024559D1 (de) 2010-01-21
PL207238B1 (pl) 2010-11-30
WO2005036583A3 (en) 2005-09-09

Similar Documents

Publication Publication Date Title
AU2003231893A8 (en) A sample enclosure for a scanning electron microscope and methods of use thereof
AU2003275028A1 (en) Particle-optical device and detection means
EP1271603A4 (en) ELECTRONIQUE SCANNING MICROSCOPE
AU8689201A (en) Methods and devices for quantitative analysis of x-ray images
IL156419A0 (en) Sample dimension measuring method and scanning electron microscope
IL151865A0 (en) Compositions and methods for detecting and quantifying gene expression
MXPA03005769A (es) Politrimetilen eter ester amida y uso de la misma.
EP1280184A3 (de) Untersuchungssystem zum teilchenoptischen Abbilden eines Objekts, Ablenkvorrichtung für geladene Teilchen sowie Verfahren zum Betrieb derselben
AU2003257990A8 (en) Improved method and system for scanning apertureless fluorescence microscope
AU2001297843A1 (en) Imaging and analyzing parameters of small moving objects such as cells
AU8819801A (en) Adaptable energy-resolved detection of ionizing radiation
AU2002211696A1 (en) Specimen collection device and method
AU2883702A (en) Cytological imaging systems and methods
AU2002246568A1 (en) Biological markers and diagnostic tests for angiotensin converting enzyme inhibitor- and vasopeptidase inhibitor-associated angioedema
EP1636819A4 (en) PARTICLE DETECTOR SUITABLE FOR THE DETECTION OF IONS AND ELECTRONS
IL163568A0 (en) Sample dimension measuring method and scanning electron microscope
PL362826A1 (pl) Układ detekcyjny elektronów wtórnych i wstecznie rozproszonych do skaningowego mikroskopu elektronowego
GB0109704D0 (en) Scanning electron microscope
EP1276135A4 (en) ELECTRONIC FORCING MACHINERY AND PHOTOVERMAKER
AU2002249758A1 (en) Apparatus for collecting and condensing electromagnetic radiation
AU2003284339A1 (en) Scanning electron microscope having multiple detectors and a method for multiple detector based imaging
GB2407433B (en) Cathode and counter-cathode arrangement in an ion source
PL359748A1 (pl) Układ detekcyjny elektronów wtórnych do skaningowego mikroskopu elektronowego
GB0118981D0 (en) Electron microscope and spectroscopy system
GB0416964D0 (en) Systems and methods for scanning objects