PL3734259T3 - Urządzenie do wykrywania promieniowania rentgenowskiego i urządzenie do inspekcji rentgenowskiej produktów, w szczególności artykułów spożywczych - Google Patents
Urządzenie do wykrywania promieniowania rentgenowskiego i urządzenie do inspekcji rentgenowskiej produktów, w szczególności artykułów spożywczychInfo
- Publication number
- PL3734259T3 PL3734259T3 PL20171888.9T PL20171888T PL3734259T3 PL 3734259 T3 PL3734259 T3 PL 3734259T3 PL 20171888 T PL20171888 T PL 20171888T PL 3734259 T3 PL3734259 T3 PL 3734259T3
- Authority
- PL
- Poland
- Prior art keywords
- products
- ray
- particular food
- ray detector
- food products
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
- G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/02—Food
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
- G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
- G01N2223/501—Detectors array
- G01N2223/5015—Detectors array linear array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/618—Specific applications or type of materials food
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102019111463.2A DE102019111463A1 (de) | 2019-05-03 | 2019-05-03 | Röntgenstrahlungsdetektorvorrichtung und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3734259T3 true PL3734259T3 (pl) | 2025-04-14 |
Family
ID=70483029
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL20171888.9T PL3734259T3 (pl) | 2019-05-03 | 2020-04-28 | Urządzenie do wykrywania promieniowania rentgenowskiego i urządzenie do inspekcji rentgenowskiej produktów, w szczególności artykułów spożywczych |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11073486B2 (pl) |
| EP (1) | EP3734259B1 (pl) |
| JP (1) | JP7024007B2 (pl) |
| CN (1) | CN111474191B (pl) |
| DE (1) | DE102019111463A1 (pl) |
| ES (1) | ES3015422T3 (pl) |
| PL (1) | PL3734259T3 (pl) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11977037B2 (en) | 2018-10-22 | 2024-05-07 | Rapiscan Holdings, Inc. | Insert for screening tray |
| DE102019111567A1 (de) * | 2019-05-03 | 2020-11-05 | Wipotec Gmbh | Verfahren und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln |
| US12181422B2 (en) | 2019-09-16 | 2024-12-31 | Rapiscan Holdings, Inc. | Probabilistic image analysis |
| CN112190276B (zh) * | 2020-09-21 | 2024-02-27 | 上海联影医疗科技股份有限公司 | 探测系统及其探测方法 |
| EP4083614B1 (de) * | 2021-04-29 | 2025-10-01 | Sesotec GmbH | Verfahren zum erfassen der detektionsempfindlichkeit eines röntgengeräts |
| US11885752B2 (en) | 2021-06-30 | 2024-01-30 | Rapiscan Holdings, Inc. | Calibration method and device therefor |
| US12019035B2 (en) * | 2021-07-16 | 2024-06-25 | Rapiscan Holdings, Inc. | Material detection in x-ray security screening |
| JP2024129940A (ja) * | 2023-03-14 | 2024-09-30 | 株式会社イシダ | Ｘ線検査装置及びｘ線検査装置の感度補正方法 |
| JP2024134363A (ja) * | 2023-03-20 | 2024-10-03 | 株式会社イシダ | Ｘ線検査装置及びｘ線センサユニットの検査方法 |
| JP2025086134A (ja) * | 2023-11-27 | 2025-06-06 | 株式会社イシダ | Ｘ線検査装置 |
| CN118692035B (zh) * | 2024-08-26 | 2024-11-05 | 山东宝可信息科技有限公司 | 一种全自动轨道巡检系统的轨道质量视觉检测方法 |
| CN119470511A (zh) * | 2024-11-29 | 2025-02-18 | 同方威视技术股份有限公司 | 背散射探测器和包括该背散射探测器的背散射探测装置 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0525593D0 (en) * | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
| GB0423707D0 (en) | 2004-10-26 | 2004-11-24 | Koninkl Philips Electronics Nv | Computer tomography apparatus and method of examining an object of interest with a computer tomography apparatus |
| CN101563628A (zh) * | 2006-12-22 | 2009-10-21 | 皇家飞利浦电子股份有限公司 | 能量分辨探测系统和成像系统 |
| US20090168958A1 (en) * | 2008-01-02 | 2009-07-02 | Cristina Francesca Cozzini | Apparatus and method for identifying components in a container |
| JP5174180B2 (ja) * | 2008-10-29 | 2013-04-03 | キヤノン株式会社 | Ｘ線撮像装置およびｘ線撮像方法 |
| GB0821050D0 (en) * | 2008-11-18 | 2008-12-24 | Durham Scient Crystals Ltd | Detector apparatus and method |
| GB2503358B (en) * | 2009-05-26 | 2014-02-12 | Rapiscan Systems Inc | X-ray tomographic inspection systems for the identification of specific target items |
| JP5457118B2 (ja) * | 2009-09-18 | 2014-04-02 | 浜松ホトニクス株式会社 | 放射線検出装置 |
| JP5467830B2 (ja) * | 2009-09-18 | 2014-04-09 | 浜松ホトニクス株式会社 | 放射線検出装置 |
| WO2013033572A2 (en) * | 2011-09-01 | 2013-03-07 | Spectramet, Llc | Material sorting technology |
| CN105242322A (zh) * | 2014-06-25 | 2016-01-13 | 清华大学 | 探测器装置、双能ct系统和使用该系统的检测方法 |
| JP6740216B2 (ja) | 2015-04-20 | 2020-08-12 | 株式会社ジョブ | Ｘ線検査用のデータ処理装置及びデータ処理方法、並びに、その装置を搭載したｘ線検査装置 |
| US11243327B2 (en) * | 2016-05-30 | 2022-02-08 | Southern Innovation International Pty Ltd | System and method for material characterization |
| EP3548877B1 (en) | 2016-11-29 | 2024-07-31 | Laitram, L.L.C. | Multi-energy x-ray absorption imaging for detecting foreign objects on a conveyor |
| FR3061554A1 (fr) * | 2016-12-30 | 2018-07-06 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de traitement d’un spectre d’un rayonnement transmis par un objet |
-
2019
- 2019-05-03 DE DE102019111463.2A patent/DE102019111463A1/de active Pending
-
2020
- 2020-04-24 JP JP2020077275A patent/JP7024007B2/ja active Active
- 2020-04-27 US US16/858,853 patent/US11073486B2/en active Active
- 2020-04-28 EP EP20171888.9A patent/EP3734259B1/de active Active
- 2020-04-28 PL PL20171888.9T patent/PL3734259T3/pl unknown
- 2020-04-28 ES ES20171888T patent/ES3015422T3/es active Active
- 2020-05-05 CN CN202010375030.6A patent/CN111474191B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3734259A2 (de) | 2020-11-04 |
| EP3734259A3 (de) | 2020-11-25 |
| JP7024007B2 (ja) | 2022-02-22 |
| EP3734259B1 (de) | 2025-01-15 |
| CN111474191B (zh) | 2024-02-27 |
| JP2020183953A (ja) | 2020-11-12 |
| CN111474191A (zh) | 2020-07-31 |
| US11073486B2 (en) | 2021-07-27 |
| ES3015422T3 (en) | 2025-05-05 |
| US20200363347A1 (en) | 2020-11-19 |
| EP3734259C0 (de) | 2025-01-15 |
| DE102019111463A1 (de) | 2020-11-05 |
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