PL3775770T3 - Układ i sposób wykrywania wad powierzchni kabla - Google Patents

Układ i sposób wykrywania wad powierzchni kabla

Info

Publication number
PL3775770T3
PL3775770T3 PL19717849.4T PL19717849T PL3775770T3 PL 3775770 T3 PL3775770 T3 PL 3775770T3 PL 19717849 T PL19717849 T PL 19717849T PL 3775770 T3 PL3775770 T3 PL 3775770T3
Authority
PL
Poland
Prior art keywords
arrangement
surface defects
cable surface
detecting cable
detecting
Prior art date
Application number
PL19717849.4T
Other languages
English (en)
Inventor
Janne Harjuhahto
Jaakko Harjuhahto
Original Assignee
Maillefer S.A.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maillefer S.A. filed Critical Maillefer S.A.
Publication of PL3775770T3 publication Critical patent/PL3775770T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2408—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/0464—Convolutional networks [CNN, ConvNet]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/09—Supervised learning
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
    • H01B13/06—Insulating conductors or cables
    • H01B13/14—Insulating conductors or cables by extrusion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
    • H01B13/22—Sheathing; Armouring; Screening; Applying other protective layers
    • H01B13/24—Sheathing; Armouring; Screening; Applying other protective layers by extrusion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biophysics (AREA)
  • Molecular Biology (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Computational Linguistics (AREA)
  • Biomedical Technology (AREA)
  • Data Mining & Analysis (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
  • Processes Specially Adapted For Manufacturing Cables (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL19717849.4T 2018-04-13 2019-04-11 Układ i sposób wykrywania wad powierzchni kabla PL3775770T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20185355A FI129412B (en) 2018-04-13 2018-04-13 An arrangement and a method for surface defect detection of a cable
PCT/EP2019/059249 WO2019197530A1 (en) 2018-04-13 2019-04-11 A surface scanner, an arrangement and a method for surface defect detection of a cable

Publications (1)

Publication Number Publication Date
PL3775770T3 true PL3775770T3 (pl) 2022-12-19

Family

ID=66182557

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19717849.4T PL3775770T3 (pl) 2018-04-13 2019-04-11 Układ i sposób wykrywania wad powierzchni kabla

Country Status (8)

Country Link
US (1) US11852594B2 (pl)
EP (1) EP3775770B1 (pl)
CN (1) CN111837011A (pl)
FI (1) FI129412B (pl)
PL (1) PL3775770T3 (pl)
RU (1) RU2768517C1 (pl)
TW (1) TWI715963B (pl)
WO (1) WO2019197530A1 (pl)

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IT202100021662A1 (it) * 2021-08-10 2023-02-10 Lasertecno S R L Dispositivo per il controllo ottico di un difetto su una superficie esterna di un corpo estruso o laminato di grande lunghezza, assieme di controllo e metodo
EP4384809A1 (en) * 2021-08-10 2024-06-19 Lasertecno S.r.l. Device for optically controlling a mark or a defect on a cable or an extruded body of great lenght, control assembly and method
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CN114111562B (zh) * 2021-12-13 2024-04-02 张家港欣阳化纤有限公司 一种涤纶长丝圆整度快速检测装置
CN114359218A (zh) * 2021-12-30 2022-04-15 中天科技海缆股份有限公司 海缆表面缺陷检测方法、装置、电子设备及存储介质
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CN116698874A (zh) * 2023-07-17 2023-09-05 广东电网有限责任公司 一种电缆的缺陷检测方法、装置、设备及存储介质
US12576986B2 (en) * 2023-07-28 2026-03-17 The Boeing Company Mobile wiring harness anomaly detection system
CN117030724B (zh) * 2023-10-09 2023-12-08 诺比侃人工智能科技(成都)股份有限公司 一种基于深度学习的多模态工业缺陷分析方法及系统
NO20231396A1 (en) * 2023-12-27 2025-06-30 Nexans Method for manufacturing and inspecting a factory joint during installation
CN117593295B (zh) * 2024-01-18 2024-05-28 东莞市立时电子有限公司 一种手机数据线生产缺陷无损检测方法
CN117893103B (zh) * 2024-03-18 2024-05-24 山东阳谷恒昌电缆集团有限公司 一种基于电缆生产线的交联电缆产品质量管理控制系统
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Also Published As

Publication number Publication date
US20210041375A1 (en) 2021-02-11
TWI715963B (zh) 2021-01-11
FI20185355A1 (en) 2019-10-14
CN111837011A (zh) 2020-10-27
FI129412B (en) 2022-01-31
TW201945744A (zh) 2019-12-01
RU2768517C1 (ru) 2022-03-24
EP3775770B1 (en) 2022-06-08
EP3775770A1 (en) 2021-02-17
US11852594B2 (en) 2023-12-26
WO2019197530A1 (en) 2019-10-17

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