PL386847A1 - Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących - Google Patents

Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących

Info

Publication number
PL386847A1
PL386847A1 PL386847A PL38684708A PL386847A1 PL 386847 A1 PL386847 A1 PL 386847A1 PL 386847 A PL386847 A PL 386847A PL 38684708 A PL38684708 A PL 38684708A PL 386847 A1 PL386847 A1 PL 386847A1
Authority
PL
Poland
Prior art keywords
neutral
measurement
high temperatures
mediums
reducing
Prior art date
Application number
PL386847A
Other languages
English (en)
Inventor
Tadeusz Pełczyński
Klaudiusz Lenik
Original Assignee
Politechnika Lubelska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Lubelska filed Critical Politechnika Lubelska
Priority to PL386847A priority Critical patent/PL386847A1/pl
Publication of PL386847A1 publication Critical patent/PL386847A1/pl

Links

PL386847A 2008-12-18 2008-12-18 Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących PL386847A1 (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL386847A PL386847A1 (pl) 2008-12-18 2008-12-18 Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL386847A PL386847A1 (pl) 2008-12-18 2008-12-18 Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących

Publications (1)

Publication Number Publication Date
PL386847A1 true PL386847A1 (pl) 2010-06-21

Family

ID=42990577

Family Applications (1)

Application Number Title Priority Date Filing Date
PL386847A PL386847A1 (pl) 2008-12-18 2008-12-18 Sposób pomiaru wysokich temperatur w ośrodkach obojętnych lub redukujących

Country Status (1)

Country Link
PL (1) PL386847A1 (pl)

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Legal Events

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REFS Decisions on refusal to grant patents (taken after the publication of the particulars of the applications)