PL3891516T3 - Narzędzie i zestaw do wykonywania testów obwodów elektrycznych i/lub elektronicznych - Google Patents

Narzędzie i zestaw do wykonywania testów obwodów elektrycznych i/lub elektronicznych

Info

Publication number
PL3891516T3
PL3891516T3 PL19786394.7T PL19786394T PL3891516T3 PL 3891516 T3 PL3891516 T3 PL 3891516T3 PL 19786394 T PL19786394 T PL 19786394T PL 3891516 T3 PL3891516 T3 PL 3891516T3
Authority
PL
Poland
Prior art keywords
tool
electrical
carrying
assembly
electronic circuits
Prior art date
Application number
PL19786394.7T
Other languages
English (en)
Inventor
Bogdan Jan SKUTKIEWICZ
Original Assignee
Magicmotorsport Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Magicmotorsport Srl filed Critical Magicmotorsport Srl
Publication of PL3891516T3 publication Critical patent/PL3891516T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
PL19786394.7T 2018-09-11 2019-09-11 Narzędzie i zestaw do wykonywania testów obwodów elektrycznych i/lub elektronicznych PL3891516T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT201800008499 2018-09-11
PCT/IB2019/057650 WO2020053782A1 (en) 2018-09-11 2019-09-11 Tool and assembly for carrying out tests on electrical and/or electronic circuits

Publications (1)

Publication Number Publication Date
PL3891516T3 true PL3891516T3 (pl) 2024-11-18

Family

ID=64427059

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19786394.7T PL3891516T3 (pl) 2018-09-11 2019-09-11 Narzędzie i zestaw do wykonywania testów obwodów elektrycznych i/lub elektronicznych

Country Status (5)

Country Link
EP (1) EP3891516B1 (pl)
CN (1) CN113039443A (pl)
ES (1) ES2984215T3 (pl)
PL (1) PL3891516T3 (pl)
WO (1) WO2020053782A1 (pl)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020053784A1 (en) * 2018-09-11 2020-03-19 Magicmotorsport Di Bogdan Jan Skutkiewicz Probe for tools for carrying out tests on electrical and/or electronic circuits and assembly comprising the probe
CN114535916B (zh) * 2022-04-01 2023-12-22 长鑫存储技术有限公司 焊接对位设备以及采用该焊接设备进行焊接的方法
IT202200018534A1 (it) 2022-09-12 2024-03-12 Magicmotorsport S R L Banco prova pieghevole

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3458687A (en) * 1967-03-08 1969-07-29 Bunker Ramo Electronic component test fixture
US4460868A (en) * 1981-11-16 1984-07-17 Rca Corporation Fixture for testing semiconductor devices
IT1282829B1 (it) * 1995-12-22 1998-03-31 New System Srl Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
US9671448B2 (en) * 2012-12-28 2017-06-06 Illinois Tool Works Inc. In-tool ESD events monitoring method and apparatus
TW201500747A (zh) * 2013-06-25 2015-01-01 Hon Hai Prec Ind Co Ltd 自動化測量系統及方法
JP2018503805A (ja) * 2014-12-04 2018-02-08 テクノプローベ エス．ピー．エー． 垂直プローブを含むテストヘッド
US10168356B2 (en) * 2015-08-19 2019-01-01 Tektronix, Inc. Test and measurement probe with adjustable test point contact
CN105388336B (zh) * 2015-10-16 2018-05-08 昆山龙腾光电有限公司 示波器探头辅助测试装置
CN205450046U (zh) * 2016-01-21 2016-08-10 绍兴科盛电子有限公司 多探针测试组件
US11221349B2 (en) * 2017-02-27 2022-01-11 Posit Systems Ltd. Robot-assisted hardware testing
WO2020053784A1 (en) * 2018-09-11 2020-03-19 Magicmotorsport Di Bogdan Jan Skutkiewicz Probe for tools for carrying out tests on electrical and/or electronic circuits and assembly comprising the probe

Also Published As

Publication number Publication date
EP3891516B1 (en) 2024-05-29
WO2020053782A1 (en) 2020-03-19
ES2984215T3 (es) 2024-10-29
EP3891516A1 (en) 2021-10-13
EP3891516C0 (en) 2024-05-29
CN113039443A (zh) 2021-06-25

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