PL3935734T3 - Wykrywanie uszkodzeń w zgodnych sieciach - Google Patents

Wykrywanie uszkodzeń w zgodnych sieciach

Info

Publication number
PL3935734T3
PL3935734T3 PL20766553.0T PL20766553T PL3935734T3 PL 3935734 T3 PL3935734 T3 PL 3935734T3 PL 20766553 T PL20766553 T PL 20766553T PL 3935734 T3 PL3935734 T3 PL 3935734T3
Authority
PL
Poland
Prior art keywords
damage
detection
matching networks
networks
matching
Prior art date
Application number
PL20766553.0T
Other languages
English (en)
Inventor
Corneluis Erasmus VAN GREUNEN
Masahiro Watanabe
Original Assignee
Aes Global Holdings, Pte. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aes Global Holdings, Pte. Ltd. filed Critical Aes Global Holdings, Pte. Ltd.
Publication of PL3935734T3 publication Critical patent/PL3935734T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32926—Software, data control or modelling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32174—Circuits specially adapted for controlling the RF discharge
    • H01J37/32183—Matching circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38—Impedance-matching networks
    • H03H7/40—Automatic matching of load impedance to source impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/24—Testing of discharge tubes
    • G01R31/245—Testing of gas discharge tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24564—Measurements of electric or magnetic variables, e.g. voltage, current, frequency
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H2242/00—Auxiliary systems
    • H05H2242/20—Power circuits
    • H05H2242/24—Radiofrequency or microwave generators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H2242/00—Auxiliary systems
    • H05H2242/20—Power circuits
    • H05H2242/26—Matching networks

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma Technology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
PL20766553.0T 2019-03-04 2020-03-03 Wykrywanie uszkodzeń w zgodnych sieciach PL3935734T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/291,122 US10943770B2 (en) 2019-03-04 2019-03-04 Detection of damage in matching networks
PCT/US2020/020750 WO2020180848A1 (en) 2019-03-04 2020-03-03 Detection of damage in matching networks

Publications (1)

Publication Number Publication Date
PL3935734T3 true PL3935734T3 (pl) 2024-01-29

Family

ID=72334699

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20766553.0T PL3935734T3 (pl) 2019-03-04 2020-03-03 Wykrywanie uszkodzeń w zgodnych sieciach

Country Status (8)

Country Link
US (2) US10943770B2 (pl)
EP (1) EP3935734B1 (pl)
JP (1) JP7550780B2 (pl)
KR (2) KR20260003878A (pl)
CN (1) CN113767570A (pl)
PL (1) PL3935734T3 (pl)
TW (1) TWI851672B (pl)
WO (1) WO2020180848A1 (pl)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10431428B2 (en) * 2014-01-10 2019-10-01 Reno Technologies, Inc. System for providing variable capacitance
US12119206B2 (en) 2015-02-18 2024-10-15 Asm America, Inc. Switching circuit
US11335540B2 (en) 2015-06-29 2022-05-17 Reno Technologies, Inc. Impedance matching network and method
US12334307B2 (en) 2017-07-10 2025-06-17 Asm Ip Holding B.V. Power control for rf impedance matching network
US11476091B2 (en) 2017-07-10 2022-10-18 Reno Technologies, Inc. Impedance matching network for diagnosing plasma chamber
US11521833B2 (en) 2017-07-10 2022-12-06 Reno Technologies, Inc. Combined RF generator and RF solid-state matching network
US12272522B2 (en) 2017-07-10 2025-04-08 Asm America, Inc. Resonant filter for solid state RF impedance matching network
DE102020124839A1 (de) * 2020-09-23 2022-03-24 Endress+Hauser Process Solutions Ag Verfahren zum Diagnostizieren des Betriebs eines Edge Devices
WO2022093753A1 (en) * 2020-10-29 2022-05-05 Advanced Energy Industries, Inc. Systems and methods combining match networks and frequency tuning
WO2022103991A1 (en) 2020-11-12 2022-05-19 Advanced Energy Industries, Inc. Match efficiency-variation compensation
JP7511501B2 (ja) * 2021-02-10 2024-07-05 東京エレクトロン株式会社 プラズマ処理装置及び監視装置
US12020901B2 (en) * 2021-05-07 2024-06-25 Applied Materials, Inc. RF impedance matching networks for substrate processing platform
DE202021105492U1 (de) 2021-10-11 2021-11-25 Aurion Anlagentechnik Gesellschaft mit beschränkter Haftung Anordnung zum automatischen Abstimmen eines Hochfrequenz-Anpassungsnetzwerkes
DE102021126269A1 (de) 2021-10-11 2023-04-13 Aurion Anlagentechnik Gesellschaft mit beschränkter Haftung Verfahren und Anordnung zum automatischen Abstimmen eines Hochfrequenz-Anpassungsnetzwerkes
WO2023137215A1 (en) * 2022-01-14 2023-07-20 Advanced Energy Industries, Inc. Two-stage solid state match
DE102022108642A1 (de) * 2022-04-08 2023-10-12 TRUMPF Hüttinger GmbH + Co. KG Plasmazünderkennungsvorrichtung zum Anschluss an eine Impedanzanpassungsschaltung für ein Plasmaerzeugungssystem
US12183548B2 (en) * 2022-05-05 2024-12-31 Applied Materials, Inc. High bandwidth architecture for centralized coherent control at the edge of processing tool
US12301199B2 (en) * 2022-05-05 2025-05-13 Applied Materials, Inc. Impedance tuning utility of vector space defined by transmission line quantities
US12136537B2 (en) 2022-10-10 2024-11-05 Applied Materials, Inc. Cost effective radio frequency impedance matching networks
US20240152114A1 (en) * 2022-11-03 2024-05-09 Applied Materials, Inc. Radio frequency impedance matching network with flexible tuning algorithms
KR102801594B1 (ko) * 2023-02-06 2025-04-25 한국핵융합에너지연구원 플라즈마장치의 전류/전압/전력 측정모듈 및 그를 가지는 플라즈마장치
EP4542620A1 (en) * 2023-10-17 2025-04-23 Comet AG Method for operating an electronic system and electronic system
US12700571B2 (en) 2024-04-05 2026-08-04 Applied Materials, Inc. Solid state variable capacitors for RF matches
KR20260021379A (ko) * 2024-08-06 2026-02-13 한국핵융합에너지연구원 기판처리장치
US20260179880A1 (en) * 2024-12-20 2026-06-25 Rohde & Schwarz Gmbh & Co. Kg Impedance matching network, plasma control system, and impedance matching method

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5187454A (en) 1992-01-23 1993-02-16 Applied Materials, Inc. Electronically tuned matching network using predictor-corrector control system
JP3630931B2 (ja) * 1996-08-29 2005-03-23 富士通株式会社 プラズマ処理装置、プロセスモニタ方法及び半導体装置の製造方法
KR100525961B1 (ko) * 1996-11-04 2005-12-21 어플라이드 머티어리얼스, 인코포레이티드 플라즈마시스에서발생하는고주파를필터링하는플라즈마처리장치및방법
US6887339B1 (en) * 2000-09-20 2005-05-03 Applied Science And Technology, Inc. RF power supply with integrated matching network
JP2003197609A (ja) 2001-12-27 2003-07-11 Tokyo Electron Ltd プラズマ処理装置の監視方法及びプラズマ処理装置
JP4088499B2 (ja) * 2002-08-28 2008-05-21 株式会社ダイヘン インピーダンス整合器の出力端特性解析方法、およびインピーダンス整合器、ならびにインピーダンス整合器の出力端特性解析システム
US6946847B2 (en) 2002-02-08 2005-09-20 Daihen Corporation Impedance matching device provided with reactance-impedance table
US20040060660A1 (en) 2002-09-26 2004-04-01 Lam Research Inc., A Delaware Corporation Control of plasma density with broadband RF sensor
US6819096B2 (en) 2003-01-31 2004-11-16 Advanced Energy Industries, Inc. Power measurement mechanism for a transformer coupled plasma source
JP4411282B2 (ja) 2003-11-27 2010-02-10 株式会社ダイヘン 高周波電力供給システム
US6983215B2 (en) 2003-12-02 2006-01-03 Mks Instruments, Inc. RF metrology characterization for field installation and serviceability for the plasma processing industry
JP2007295447A (ja) 2006-04-27 2007-11-08 Daihen Corp インピーダンス整合装置
US8576013B2 (en) 2011-12-29 2013-11-05 Mks Instruments, Inc. Power distortion-based servo control systems for frequency tuning RF power sources
US9320126B2 (en) * 2012-12-17 2016-04-19 Lam Research Corporation Determining a value of a variable on an RF transmission model
US10128090B2 (en) * 2012-02-22 2018-11-13 Lam Research Corporation RF impedance model based fault detection
US9082589B2 (en) * 2012-10-09 2015-07-14 Novellus Systems, Inc. Hybrid impedance matching for inductively coupled plasma system
JP2014187678A (ja) 2013-02-20 2014-10-02 Daihen Corp 可変リアクタンス素子、その可変リアクタンス素子を用いたインピーダンス整合装置及びそのインピーダンス整合装置を内蔵した高周波電源
US9041480B2 (en) 2013-03-15 2015-05-26 Mks Instruments, Inc. Virtual RF sensor
US9837252B2 (en) * 2013-05-09 2017-12-05 Lam Research Corporation Systems and methods for using one or more fixtures and efficiency to determine parameters of a match network model
JP2015018766A (ja) 2013-07-12 2015-01-29 株式会社ダイヘン インピーダンス整合方法及びインピーダンス整合装置
US9865432B1 (en) 2014-01-10 2018-01-09 Reno Technologies, Inc. RF impedance matching network
US9594105B2 (en) * 2014-01-10 2017-03-14 Lam Research Corporation Cable power loss determination for virtual metrology
US10431428B2 (en) * 2014-01-10 2019-10-01 Reno Technologies, Inc. System for providing variable capacitance
US10950421B2 (en) 2014-04-21 2021-03-16 Lam Research Corporation Using modeling for identifying a location of a fault in an RF transmission system for a plasma system
US9306533B1 (en) 2015-02-20 2016-04-05 Reno Technologies, Inc. RF impedance matching network
KR102901060B1 (ko) * 2016-03-03 2025-12-16 램 리써치 코포레이션 매칭 네트워크 모델의 파라미터들을 결정하도록 하나 이상의 픽스처들 및 효율을 사용하기 위한 시스템들 및 방법들
US10187032B2 (en) * 2016-06-17 2019-01-22 Lam Research Corporation Combiner and distributor for adjusting impedances or power across multiple plasma processing stations
JP6773283B2 (ja) 2016-11-17 2020-10-21 株式会社ダイヘン インピーダンス整合装置

Also Published As

Publication number Publication date
US20210111009A1 (en) 2021-04-15
JP2022523807A (ja) 2022-04-26
KR102907454B1 (ko) 2026-01-02
US10943770B2 (en) 2021-03-09
JP7550780B2 (ja) 2024-09-13
KR20260003878A (ko) 2026-01-07
EP3935734B1 (en) 2023-09-13
EP3935734A1 (en) 2022-01-12
TW202103211A (zh) 2021-01-16
KR20210132191A (ko) 2021-11-03
TWI851672B (zh) 2024-08-11
US20200286720A1 (en) 2020-09-10
EP3935734A4 (en) 2022-11-09
US12272533B2 (en) 2025-04-08
CN113767570A (zh) 2021-12-07
WO2020180848A1 (en) 2020-09-10

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