PL399438A1 - Zespolony detektor kierunkowy elektronów - Google Patents
Zespolony detektor kierunkowy elektronówInfo
- Publication number
- PL399438A1 PL399438A1 PL399438A PL39943812A PL399438A1 PL 399438 A1 PL399438 A1 PL 399438A1 PL 399438 A PL399438 A PL 399438A PL 39943812 A PL39943812 A PL 39943812A PL 399438 A1 PL399438 A1 PL 399438A1
- Authority
- PL
- Poland
- Prior art keywords
- directional detector
- combined electron
- electron directional
- combined
- detector
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
- H01J2237/2003—Environmental cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2446—Position sensitive detectors
- H01J2237/24465—Sectored detectors, e.g. quadrants
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2602—Details
- H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
- H01J2237/2608—Details operating at elevated pressures, e.g. atmosphere with environmental specimen chamber
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL399438A PL224742B1 (pl) | 2012-06-06 | 2012-06-06 | Zespolony detektor kierunkowy elektronów |
| EP13460034.5A EP2672504A3 (en) | 2012-06-06 | 2013-05-27 | Combined directional electron detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL399438A PL224742B1 (pl) | 2012-06-06 | 2012-06-06 | Zespolony detektor kierunkowy elektronów |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| PL399438A1 true PL399438A1 (pl) | 2013-03-04 |
| PL224742B1 PL224742B1 (pl) | 2017-01-31 |
Family
ID=47846496
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL399438A PL224742B1 (pl) | 2012-06-06 | 2012-06-06 | Zespolony detektor kierunkowy elektronów |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP2672504A3 (pl) |
| PL (1) | PL224742B1 (pl) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106680305B (zh) * | 2016-11-23 | 2023-08-04 | 聚束科技(北京)有限公司 | 一种真空气氛处理装置、样品观测系统及方法 |
| CN113707522B (zh) * | 2021-08-26 | 2022-07-08 | 北京中科科仪股份有限公司 | 固定装置、扫描电镜和电子束曝光机 |
| CN119064640B (zh) * | 2024-09-06 | 2025-09-09 | 中国科学院近代物理研究所 | 一种提高三维原子探针图像重构精度系统和方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4897545A (en) * | 1987-05-21 | 1990-01-30 | Electroscan Corporation | Electron detector for use in a gaseous environment |
| WO2001041180A1 (de) * | 1999-11-29 | 2001-06-07 | Leo Elektronenmikroskopie Gmbh | Detektor für ein rasterelektronenmikroskop mit variablem druck und rasterelektronenmikroskop mit einem solchen detektor |
| JP4636897B2 (ja) * | 2005-02-18 | 2011-02-23 | 株式会社日立ハイテクサイエンスシステムズ | 走査電子顕微鏡 |
| PL226521B1 (pl) | 2011-08-23 | 2017-08-31 | Politechnika Wroclawska | Zespół kierunkowej detekcji elektronów |
-
2012
- 2012-06-06 PL PL399438A patent/PL224742B1/pl unknown
-
2013
- 2013-05-27 EP EP13460034.5A patent/EP2672504A3/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP2672504A3 (en) | 2015-04-15 |
| EP2672504A2 (en) | 2013-12-11 |
| PL224742B1 (pl) | 2017-01-31 |
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