PL404561A1 - Analizator do spektroskopii laserowo indukowanego rozpadu - Google Patents

Analizator do spektroskopii laserowo indukowanego rozpadu

Info

Publication number
PL404561A1
PL404561A1 PL404561A PL40456111A PL404561A1 PL 404561 A1 PL404561 A1 PL 404561A1 PL 404561 A PL404561 A PL 404561A PL 40456111 A PL40456111 A PL 40456111A PL 404561 A1 PL404561 A1 PL 404561A1
Authority
PL
Poland
Prior art keywords
laser
analyzer
optical path
sample
laser beam
Prior art date
Application number
PL404561A
Other languages
English (en)
Inventor
Michael Rutberg
Paolo Moreschini
Original Assignee
Technological Resources Pty. Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technological Resources Pty. Limited filed Critical Technological Resources Pty. Limited
Publication of PL404561A1 publication Critical patent/PL404561A1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Analizator (10) do spektroskopii laserowo indukowanego rozpadu LIBS zawiera sciezke optyczna (P) przedstawiona liniami przerywanymi (P1) i liniami punktowo-kreskowymi (P2) oraz uklad (12) automatycznego ogniskowania (lub sledzenia). Sciezka optyczna (P) ogniskuje wiazke laserowa emitowana z lasera (14) na fragment próbki (S), która ma byc analizowana przez analizator (10), oraz ogniskuje promieniowanie emitowane przez próbke (S) podczas oswietlania wiazka laserowa do detektora (16). Uklad (12) automatycznego ogniskowania jest zdolny do zmiany dlugosci sciezki optycznej (P) w celu utrzymania stalej zaleznosci przestrzennej (tj. odleglosci) miedzy ogniskiem (18) wiazki laserowej i próbka (S), jak równiez utrzymania stalego chwilowego pola widzenia IFOV detektora (16) na ognisku lasera.
PL404561A 2010-10-01 2011-09-15 Analizator do spektroskopii laserowo indukowanego rozpadu PL404561A1 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US38872210P 2010-10-01 2010-10-01

Publications (1)

Publication Number Publication Date
PL404561A1 true PL404561A1 (pl) 2014-03-17

Family

ID=45891714

Family Applications (1)

Application Number Title Priority Date Filing Date
PL404561A PL404561A1 (pl) 2010-10-01 2011-09-15 Analizator do spektroskopii laserowo indukowanego rozpadu

Country Status (12)

Country Link
US (1) US20130271761A1 (pl)
CN (1) CN103210303A (pl)
AP (1) AP2013006832A0 (pl)
AU (1) AU2011308072B2 (pl)
BR (1) BR112013007877A2 (pl)
CA (1) CA2813032C (pl)
CL (2) CL2013000883A1 (pl)
EA (1) EA201390408A1 (pl)
PE (1) PE20150791A1 (pl)
PL (1) PL404561A1 (pl)
WO (1) WO2012040769A1 (pl)
ZA (1) ZA201302942B (pl)

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CN103816976A (zh) * 2014-02-27 2014-05-28 王宏 激光诱导击穿光谱矿石智能分选方法及设备
CN107107122B (zh) * 2014-06-23 2019-07-23 Tsi公司 利用libs光谱的快速材料分析
FR3031568B1 (fr) * 2015-01-12 2018-11-16 Xyzed Source de lumiere a diodes pour projecteur
US9651424B2 (en) 2015-02-26 2017-05-16 Sciaps, Inc. LIBS analyzer sample presence detection system and method
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US10209196B2 (en) 2015-10-05 2019-02-19 Sciaps, Inc. LIBS analysis system and method for liquids
US9939383B2 (en) 2016-02-05 2018-04-10 Sciaps, Inc. Analyzer alignment, sample detection, localization, and focusing method and system
US10520445B2 (en) 2016-03-31 2019-12-31 Foss Analytical A/S System for and method of performing laser induced breakdown spectroscopy
CN105784682B (zh) * 2016-05-10 2019-02-15 中国科学院光电研究院 一种激光诱导击穿光谱检测装置及检测方法
CN106338499A (zh) * 2016-08-31 2017-01-18 徐金杰 元素激光检测分析仪器及矿物元素分析方法
CN116047707A (zh) * 2016-10-09 2023-05-02 睿励科学仪器（上海）有限公司 非垂直自动聚焦系统以及相应的光学仪器
CN106568761A (zh) * 2016-10-28 2017-04-19 段忆翔 一种远程libs探头测量装置
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CN106568762B (zh) 2016-11-07 2019-08-06 中国科学院光电研究院 扫描式激光诱导光谱面范围分析检测系统
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JP2019060831A (ja) * 2017-09-28 2019-04-18 株式会社島津製作所 レーザ誘起分析装置、および、レーザ誘起分析方法
EP3794393B1 (de) * 2018-05-14 2023-09-27 TRUMPF Lasersystems for Semiconductor Manufacturing GmbH Fokussiereinrichtung und euv-strahlungserzeugungsvorrichtung damit
CN108844926B (zh) * 2018-06-12 2020-10-16 中国科学院上海技术物理研究所 磁光光致发光光调制反射和光调制透射光谱联合测试系统
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AU2021103159A4 (en) 2020-09-22 2021-07-22 Foss Analytical A/S Preparing a pellet for laser induced breakdown spectroscopy
CN112304898B (zh) * 2020-10-23 2023-03-24 西安智光物联科技有限公司 一种车载前置式激光气体检测仪
CN112496860B (zh) * 2020-11-27 2022-12-06 广东佩斯智能装备有限公司 一种车削刀具寿命实时监测方法
EP4009037B1 (en) * 2020-12-02 2025-08-27 DTE ehf. Method and apparatus for quantitative chemical analysis of liquid metals and alloys with laser induced breakdown spectroscopy
CN112964695B (zh) * 2021-02-05 2022-08-23 江苏奥文仪器科技有限公司 一种可自动对焦、多激光光源的激光诱导光谱仪及工作方法
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Also Published As

Publication number Publication date
CA2813032A1 (en) 2012-04-05
ZA201302942B (en) 2014-06-25
BR112013007877A2 (pt) 2016-06-14
AP2013006832A0 (en) 2013-04-30
AU2011308072A1 (en) 2013-05-02
WO2012040769A1 (en) 2012-04-05
CL2015002828A1 (es) 2016-10-07
CL2013000883A1 (es) 2013-10-18
US20130271761A1 (en) 2013-10-17
PE20150791A1 (es) 2015-06-19
AU2011308072B2 (en) 2015-01-22
CN103210303A (zh) 2013-07-17
EA201390408A1 (ru) 2013-10-30
CA2813032C (en) 2019-05-07

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