PL443248A1 - Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder - Google Patents

Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder

Info

Publication number
PL443248A1
PL443248A1 PL443248A PL44324822A PL443248A1 PL 443248 A1 PL443248 A1 PL 443248A1 PL 443248 A PL443248 A PL 443248A PL 44324822 A PL44324822 A PL 44324822A PL 443248 A1 PL443248 A1 PL 443248A1
Authority
PL
Poland
Prior art keywords
electron microscopy
specimen holder
transmission electron
microscopy specimen
producing
Prior art date
Application number
PL443248A
Other languages
Polish (pl)
Other versions
PL247646B1 (en
Inventor
Andrzej Żak
Jakub Grzęda
Original Assignee
Politechnika Wrocławska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Wrocławska filed Critical Politechnika Wrocławska
Priority to PL443248A priority Critical patent/PL247646B1/en
Publication of PL443248A1 publication Critical patent/PL443248A1/en
Publication of PL247646B1 publication Critical patent/PL247646B1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

Przedmiotem zgłoszenia jest uchwyt preparatowy do transmisyjnej mikroskopii elektronowej, znajdujący zastosowanie w dziedzinie nauk inżynieryjno-technicznych oraz ścisłych i przyrodniczych, składający się z korpusu (2) oraz części wewnętrznej (1), w której znajdują się otwory (3), w których umiejscowione są przewody elektryczne (4) sięgające do miejsca mocowania próbki (5), charakteryzujący się tym, że korpus (2) oraz część wewnętrzna (1), w której znajdują się otwory (3) wykonane są z materiału kształtowanego w technice przyrostowej, a przewody elektryczne (4) są połączone z częścią wewnętrzną (1) przez uszczelnienie próżniowe (6) i w korpusie (2) poprowadzone są przewody elektryczne dodatkowe (7), łączące przewody elektryczne (4) z zewnętrznymi złączami (8) dla urządzeń. Przedmiotem zgłoszenia jest również sposób wytwarzania uchwytu preparatowego do transmisyjnej mikroskopii elektronowej znajdujący zastosowanie w dziedzinie nauk inżynieryjno-technicznych oraz ścisłych i przyrodniczych.The subject of the application is a preparation holder for transmission electron microscopy, used in the field of engineering and technical sciences as well as exact and natural sciences, consisting of a body (2) and an internal part (1), in which there are holes (3) in which the electric cables (4) reaching to the place of mounting the sample (5), characterized in that the body (2) and the internal part (1), in which the holes (3) are located, are made of material shaped using the additive technique, and the electric cables (4) are connected to the inner part (1) by a vacuum seal (6) and additional electrical cables (7) are routed in the body (2), connecting the electrical cables (4) with the external connectors (8) for the devices. The subject of the application is also a method of producing a specimen holder for transmission electron microscopy, applicable in the field of engineering and technical sciences as well as exact and natural sciences.

PL443248A 2022-12-22 2022-12-22 Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder PL247646B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL443248A PL247646B1 (en) 2022-12-22 2022-12-22 Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL443248A PL247646B1 (en) 2022-12-22 2022-12-22 Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder

Publications (2)

Publication Number Publication Date
PL443248A1 true PL443248A1 (en) 2024-06-24
PL247646B1 PL247646B1 (en) 2025-08-18

Family

ID=91618281

Family Applications (1)

Application Number Title Priority Date Filing Date
PL443248A PL247646B1 (en) 2022-12-22 2022-12-22 Transmission electron microscopy specimen holder and method of producing an electron microscopy specimen holder

Country Status (1)

Country Link
PL (1) PL247646B1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060025002A1 (en) * 2004-07-28 2006-02-02 The Board Of Trustees Of The University Of Illinois TEM MEMS device holder and method of fabrication
WO2009086319A2 (en) * 2007-12-21 2009-07-09 Protochips, Inc. Specimen mount for microscopy
US20110248165A1 (en) * 2010-04-12 2011-10-13 Protochips, Inc. Sample holder providing interface to semiconductor device with high density connections
US20150185461A1 (en) * 2012-09-14 2015-07-02 Denssolutions B.V. Holder and Multicontact Device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060025002A1 (en) * 2004-07-28 2006-02-02 The Board Of Trustees Of The University Of Illinois TEM MEMS device holder and method of fabrication
WO2009086319A2 (en) * 2007-12-21 2009-07-09 Protochips, Inc. Specimen mount for microscopy
US20110248165A1 (en) * 2010-04-12 2011-10-13 Protochips, Inc. Sample holder providing interface to semiconductor device with high density connections
US20150185461A1 (en) * 2012-09-14 2015-07-02 Denssolutions B.V. Holder and Multicontact Device

Also Published As

Publication number Publication date
PL247646B1 (en) 2025-08-18

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