PL444104A1 - Standard for identifying materials in computed tomography examinations - Google Patents

Standard for identifying materials in computed tomography examinations

Info

Publication number
PL444104A1
PL444104A1 PL444104A PL44410423A PL444104A1 PL 444104 A1 PL444104 A1 PL 444104A1 PL 444104 A PL444104 A PL 444104A PL 44410423 A PL44410423 A PL 44410423A PL 444104 A1 PL444104 A1 PL 444104A1
Authority
PL
Poland
Prior art keywords
lower base
upper cover
millings
standard
computed tomography
Prior art date
Application number
PL444104A
Other languages
Polish (pl)
Other versions
PL246904B1 (en
Inventor
Piotr Młynarczyk
Damian Bańkowski
Wojciech Depczyński
Kazimierz Bolanowski
Albert Bilski
Original Assignee
Politechnika Świętokrzyska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Świętokrzyska filed Critical Politechnika Świętokrzyska
Priority to PL444104A priority Critical patent/PL246904B1/en
Publication of PL444104A1 publication Critical patent/PL444104A1/en
Publication of PL246904B1 publication Critical patent/PL246904B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/02—Collecting means for receiving or storing samples to be investigated and possibly directly transporting the samples to the measuring arrangement; particularly for investigating radioactive fluids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Wzorzec do identyfikacji materiałów w badaniach tomografii komputerowej, służący do oceny wpływu rodzaju materiału i jego grubości na dokładność wymiarowo kształtową przedmiotów zamkniętych, charakteryzuje się tym, że zbudowany jest z podstawy dolnej (1) i pokrywy górnej (2) w kształcie kwadratu oraz kątowych wsporników (3), zamocowanych w narożach podstawy dolnej (1) i pokrywy górnej (2), przy czym w podstawie dolnej (1) oraz w wewnętrznych powierzchniach wsporników (3) wykonane są podfrezowania o szerokości od 1 mm do 5 mm i głębokościach odpowiednio 1, 2, 3, 4 i 5 mm, przy czym w pokrywie górnej (2) wykonane są otwory przelotowe odpowiadające rozmieszczeniu i wymiarom podfrezowań podstawy dolnej (1). Pomiędzy podstawą dolną (1), a pokrywą górną (2) osadzone są ścianki boczne w postaci kwadratowych płyt o grubościach 1 mm - 5 mm i krawędziach bocznych odpowiadających wykonanym podfrezowaniom w podstawie dolnej (1) oraz płycie górnej (2), które wsunięte są pomiędzy wsporniki (3), ponadto, w podstawie dolnej (1) wykonanych jest dziewięć okrągłych gniazd o średnicy 6 mm i głębokości 4 mm, rozmieszczonych w jednakowych odstępach od siebie i od ścianek bocznych wzorca, przy czym stopy (4) mają postać ściętych stożków o różnych wysokościach, a na powierzchniach szczytowych mają wykonane kuliste wgłębienia o promieniu zaokrąglenia 1 mm - 4 mm, współpracujące z kulistymi wzornikami (5).The standard for identifying materials in computed tomography tests, used to assess the impact of the type of material and its thickness on the dimensional accuracy of closed objects, is characterized by the fact that it is composed of a lower base (1) and an upper cover (2) in the shape of a square and angular supports (3), mounted in the corners of the lower base (1) and upper cover (2), with millings ranging from 1 mm to 5 mm wide and 1 mm deep respectively in the inner surfaces of the brackets (3). , 2, 3, 4 and 5 mm, with through holes made in the upper cover (2) corresponding to the arrangement and dimensions of the millings of the lower base (1). Between the lower base (1) and the upper cover (2) there are side walls in the form of square plates with a thickness of 1 mm - 5 mm and side edges corresponding to the millings made in the lower base (1) and the upper plate (2), which are inserted between the supports (3), moreover, nine round sockets with a diameter of 6 mm and a depth of 4 mm are made in the lower base (1), placed at equal distances from each other and from the side walls of the pattern, with the feet (4) having the form of truncated cones of different heights, and on their top surfaces they have spherical recesses with a rounding radius of 1 mm - 4 mm, cooperating with spherical formers (5).

PL444104A 2023-03-16 2023-03-16 A pattern for identifying materials in computed tomography studies PL246904B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL444104A PL246904B1 (en) 2023-03-16 2023-03-16 A pattern for identifying materials in computed tomography studies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL444104A PL246904B1 (en) 2023-03-16 2023-03-16 A pattern for identifying materials in computed tomography studies

Publications (2)

Publication Number Publication Date
PL444104A1 true PL444104A1 (en) 2023-09-25
PL246904B1 PL246904B1 (en) 2025-03-31

Family

ID=88144654

Family Applications (1)

Application Number Title Priority Date Filing Date
PL444104A PL246904B1 (en) 2023-03-16 2023-03-16 A pattern for identifying materials in computed tomography studies

Country Status (1)

Country Link
PL (1) PL246904B1 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL221210B1 (en) * 2012-12-05 2016-03-31 Śląski Univ Medyczny W Katowicach Stabilizer measuring the micro-computer tomography
CN108449984A (en) * 2015-10-23 2018-08-24 海克斯康测量技术有限公司 Three-dimensional computed tomography gauge
EP3203219B1 (en) * 2016-02-02 2018-09-05 Commissariat A L'energie Atomique Et Aux Energies Alternatives Method for characterising a sample combining x-ray tomography with secondary ion mass spectrometry
WO2021209048A1 (en) * 2020-04-17 2021-10-21 Master Dynamic Limited Imaging process and system
US20220042930A1 (en) * 2020-08-05 2022-02-10 Faro Technologies, Inc. Part inspection method using computed tomography
FR3116619A1 (en) * 2020-11-26 2022-05-27 Safran SPECIMEN SUPPORT TOOLS FOR CONTROL BY TOMOGRAPHY

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL221210B1 (en) * 2012-12-05 2016-03-31 Śląski Univ Medyczny W Katowicach Stabilizer measuring the micro-computer tomography
CN108449984A (en) * 2015-10-23 2018-08-24 海克斯康测量技术有限公司 Three-dimensional computed tomography gauge
EP3203219B1 (en) * 2016-02-02 2018-09-05 Commissariat A L'energie Atomique Et Aux Energies Alternatives Method for characterising a sample combining x-ray tomography with secondary ion mass spectrometry
WO2021209048A1 (en) * 2020-04-17 2021-10-21 Master Dynamic Limited Imaging process and system
US20220042930A1 (en) * 2020-08-05 2022-02-10 Faro Technologies, Inc. Part inspection method using computed tomography
FR3116619A1 (en) * 2020-11-26 2022-05-27 Safran SPECIMEN SUPPORT TOOLS FOR CONTROL BY TOMOGRAPHY

Also Published As

Publication number Publication date
PL246904B1 (en) 2025-03-31

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