PL446175A1 - Measuring device for determining thermal parameters of materials using the thermographic method - Google Patents
Measuring device for determining thermal parameters of materials using the thermographic methodInfo
- Publication number
- PL446175A1 PL446175A1 PL446175A PL44617523A PL446175A1 PL 446175 A1 PL446175 A1 PL 446175A1 PL 446175 A PL446175 A PL 446175A PL 44617523 A PL44617523 A PL 44617523A PL 446175 A1 PL446175 A1 PL 446175A1
- Authority
- PL
- Poland
- Prior art keywords
- materials
- measuring device
- thermal parameters
- determining thermal
- thermographic method
- Prior art date
Links
- 239000000463 material Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- 238000009413 insulation Methods 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
- G01J5/485—Temperature profile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Przyrząd pomiarowy do wyznaczania parametrów cieplnych materiałów metodą termograficzną, posiadające płytę mocującą dolną, płytę mocującą górną i płytę oporową, oraz układ pomiarowy złożony z zaizolowanych termicznie dwóch metalowych brył prostopadłościennych, posiada izolację termiczną obu brył pomiarowych, górnej i dolnej (7), składającą się z dwóch części przesuwnych, lewej (12a) i prawej (12b), posadowionych trwale na przynależnym do każdej z nich wsporniku nośnym (13), przymocowanym do ruchomego członu modułu wykonawczego, przy czym każda z części przesuwnych, lewa (12a) i prawa (12b) posiada w rzucie na płaszczyznę poziomą kształt litery „C” z wewnętrznym wybraniem w kształcie trójkąta prostokątnego równoramiennego.A measuring device for determining thermal parameters of materials by the thermographic method, having a lower mounting plate, an upper mounting plate and a resistance plate, and a measuring system consisting of two thermally insulated metal cuboid bodies, has thermal insulation of both measuring bodies, upper and lower (7), consisting of two sliding parts, left (12a) and right (12b), permanently mounted on a supporting bracket (13) belonging to each of them, attached to the movable member of the executive module, wherein each of the sliding parts, left (12a) and right (12b), has the shape of the letter "C" in the projection on a horizontal plane with an internal recess in the shape of an isosceles right-angled triangle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL446175A PL446175A1 (en) | 2023-09-19 | 2023-09-19 | Measuring device for determining thermal parameters of materials using the thermographic method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL446175A PL446175A1 (en) | 2023-09-19 | 2023-09-19 | Measuring device for determining thermal parameters of materials using the thermographic method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL446175A1 true PL446175A1 (en) | 2024-07-29 |
Family
ID=91971268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL446175A PL446175A1 (en) | 2023-09-19 | 2023-09-19 | Measuring device for determining thermal parameters of materials using the thermographic method |
Country Status (1)
| Country | Link |
|---|---|
| PL (1) | PL446175A1 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6142662A (en) * | 1998-06-16 | 2000-11-07 | New Jersey Institute Of Technology | Apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance |
| WO2018131482A1 (en) * | 2017-01-16 | 2018-07-19 | 三菱電機株式会社 | Thermal conductivity measurement device and thermal conductivity measurement method |
-
2023
- 2023-09-19 PL PL446175A patent/PL446175A1/en unknown
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6142662A (en) * | 1998-06-16 | 2000-11-07 | New Jersey Institute Of Technology | Apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance |
| WO2018131482A1 (en) * | 2017-01-16 | 2018-07-19 | 三菱電機株式会社 | Thermal conductivity measurement device and thermal conductivity measurement method |
Non-Patent Citations (1)
| Title |
|---|
| https://stal.elamed.pl/; Buliński Z i inni, Wyznaczanie przewodności ciał stałych na podstawie normy ASTM D 5470, Stal Metale & Nowe Technologie, 2019, str. 57-62 * |
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