PL449265A1 - Method and device for carrying out spectral measurements - Google Patents

Method and device for carrying out spectral measurements

Info

Publication number
PL449265A1
PL449265A1 PL449265A PL44926524A PL449265A1 PL 449265 A1 PL449265 A1 PL 449265A1 PL 449265 A PL449265 A PL 449265A PL 44926524 A PL44926524 A PL 44926524A PL 449265 A1 PL449265 A1 PL 449265A1
Authority
PL
Poland
Prior art keywords
image sensor
response
intensity
light source
reference plate
Prior art date
Application number
PL449265A
Other languages
Polish (pl)
Inventor
Jan Jaczewski
Tomasz Zabielski
Original Assignee
Rosz Małgorzata Avicon
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosz Małgorzata Avicon filed Critical Rosz Małgorzata Avicon
Priority to PL449265A priority Critical patent/PL449265A1/en
Publication of PL449265A1 publication Critical patent/PL449265A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Przedmiotem zgłoszenia jest sposób przeprowadzania pomiarów spektralnych, w którym oświetla lub prześwietla się płytkę referencyjną i badany obiekt oświetlaczem, składającym się z co najmniej jednego źródła światła i sensorem obrazu rejestruje się obraz uzyskany z płytki referencyjnej oraz badanego obiektu. Płytka referencyjna ma wysoką i stałą refleksyjność w analizowanym zakresie długości fal. Przeprowadza się kolejno oświetlanie płytki referencyjnej i obiektu za pomocą światła o widmie dobranym tak, aby rejestrowana odpowiedź sensora obrazu miała możliwie wysoką wartość w każdym z pasm pomiarowych. Przeprowadza się regulację intensywności świecenia źródła światła w oparciu o odpowiedź badanego obiektu i sposób obejmuje następujące etapy: wyłącza się wszystkie źródła światła, poza jednym źródłem światła o wybranej określonej długości fal; reguluje się intensywność świecenia źródła światła o wybranej określonej długości fal aż do uzyskania odpowiedzi sensora obrazu bliskiej wartości nasycenia; włącza się kolejne pod względem długości fali źródło światła i reguluje się jego intensywność aż do uzyskania odpowiedzi sensora obrazu bliskiej wartości nasycenia; sprawdza się odpowiedź sensora obrazu, czy nie osiągnięto wartości nasycenia sensora obrazu we wcześniej wybranych określonych zakresach długości fal; w przypadku osiągnięcia wartości nasycenia zmniejsza się intensywność poprzednio wybranych określonych źródeł światła, powtarza się powyższe etapy aż do wyregulowania intensywności wszystkich źródeł światła o analizowanych długościach fal, aby uzyskać quasi-ciągłą odpowiedź widmową. Zgłoszenie dotyczy też urządzenia realizującego ten sposób.The subject of the application is a method for conducting spectral measurements in which a reference plate and the tested object are illuminated or overexposed with an illuminator consisting of at least one light source, and an image sensor records the image obtained from the reference plate and the tested object. The reference plate has high and constant reflectivity in the analyzed wavelength range. The reference plate and the object are successively illuminated with light with a spectrum selected so that the recorded response of the image sensor has the highest possible value in each measurement band. The light source's intensity is adjusted based on the response of the tested object, and the method includes the following steps: all light sources are turned off, except one light source with a selected specific wavelength; the light source's intensity is adjusted with a selected specific wavelength until the image sensor's response is close to saturation; the next light source with a wavelength is turned on and its intensity is adjusted until the image sensor's response is close to saturation; the image sensor response is checked to see if the image sensor saturation value has been reached in the previously selected, defined wavelength ranges; if the saturation value is reached, the intensity of the previously selected, defined light sources is reduced, and the above steps are repeated until the intensity of all light sources at the analyzed wavelengths is adjusted to obtain a quasi-continuous spectral response. The application also concerns a device implementing this method.

PL449265A 2024-07-17 2024-07-17 Method and device for carrying out spectral measurements PL449265A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL449265A PL449265A1 (en) 2024-07-17 2024-07-17 Method and device for carrying out spectral measurements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL449265A PL449265A1 (en) 2024-07-17 2024-07-17 Method and device for carrying out spectral measurements

Publications (1)

Publication Number Publication Date
PL449265A1 true PL449265A1 (en) 2026-01-19

Family

ID=98430744

Family Applications (1)

Application Number Title Priority Date Filing Date
PL449265A PL449265A1 (en) 2024-07-17 2024-07-17 Method and device for carrying out spectral measurements

Country Status (1)

Country Link
PL (1) PL449265A1 (en)

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