PT3088873T - Sistema de inspeção de recipientes com controlo de luz individual - Google Patents

Sistema de inspeção de recipientes com controlo de luz individual

Info

Publication number
PT3088873T
PT3088873T PT161674593T PT16167459T PT3088873T PT 3088873 T PT3088873 T PT 3088873T PT 161674593 T PT161674593 T PT 161674593T PT 16167459 T PT16167459 T PT 16167459T PT 3088873 T PT3088873 T PT 3088873T
Authority
PT
Portugal
Prior art keywords
light control
inspection system
individual light
container inspection
container
Prior art date
Application number
PT161674593T
Other languages
English (en)
Original Assignee
Emhart Glass Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Emhart Glass Sa filed Critical Emhart Glass Sa
Publication of PT3088873T publication Critical patent/PT3088873T/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/24Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504Calibration devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08Testing mechanical properties
    • G01M11/081Testing mechanical properties by using a contact-less detection method, i.e. with a camera
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/93Detection standards; Calibrating baseline adjustment, drift correction
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/002Diagnosis, testing or measuring for television systems or their details for television cameras
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60Control of cameras or camera modules
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896Circuits specially adapted for system specific signal conditioning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06146Multisources for homogeneisation, as well sequential as simultaneous operation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biomedical Technology (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
PT161674593T 2015-04-29 2016-04-28 Sistema de inspeção de recipientes com controlo de luz individual PT3088873T (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562154508P 2015-04-29 2015-04-29
US201562272325P 2015-12-29 2015-12-29
US15/130,523 US11308601B2 (en) 2015-04-29 2016-04-15 Container inspection system with individual light control

Publications (1)

Publication Number Publication Date
PT3088873T true PT3088873T (pt) 2023-11-06

Family

ID=56092716

Family Applications (1)

Application Number Title Priority Date Filing Date
PT161674593T PT3088873T (pt) 2015-04-29 2016-04-28 Sistema de inspeção de recipientes com controlo de luz individual

Country Status (6)

Country Link
US (1) US11308601B2 (pt)
EP (2) EP4274247A3 (pt)
JP (1) JP2016212097A (pt)
ES (1) ES2959484T3 (pt)
PL (1) PL3088873T3 (pt)
PT (1) PT3088873T (pt)

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KR102449568B1 (ko) * 2018-01-09 2022-10-04 한화테크윈 주식회사 조명 제어 방법, 장치 및 컴퓨터 프로그램
EP3853593B1 (en) 2018-09-20 2025-12-03 Siemens Healthcare Diagnostics, Inc. Systems, methods and apparatus for autonomous diagnostic verification of optical components of vision-based inspection systems
DE102019117260A1 (de) * 2019-06-26 2020-12-31 Seidenader Maschinenbau Gmbh Vorrichtung zur optischen Inspektion von leeren und mit Flüssigkeit gefüllten Behältern
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US12578352B2 (en) 2019-10-31 2026-03-17 Siemens Healthcare Diagnostics Inc. Methods and apparatus providing calibration of foreground illumination for sample container characterization
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US12567134B2 (en) 2021-02-04 2026-03-03 Siemens Healthcare Diagnostics Inc. Apparatus and methods of detecting defects in machine vision systems
US12254383B2 (en) * 2021-03-30 2025-03-18 Accenture Global Solutions Limited Intelligent real-time defect prediction, detection, and AI driven automated correction solution
FR3127574B1 (fr) * 2021-09-30 2023-10-06 Tiama Procédé et dispositif d’inspection pour des récipients déplacés selon une trajectoire rectiligne
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CN116380418B (zh) * 2022-12-07 2025-07-29 北京杰福科技有限公司 自动测量玻璃副像偏离的装置

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Also Published As

Publication number Publication date
EP3088873B1 (en) 2023-09-13
EP4274247A2 (en) 2023-11-08
US11308601B2 (en) 2022-04-19
EP3088873A3 (en) 2016-11-09
ES2959484T3 (es) 2024-02-26
EP4274247A3 (en) 2024-01-24
US20160321796A1 (en) 2016-11-03
JP2016212097A (ja) 2016-12-15
PL3088873T3 (pl) 2024-01-29
EP3088873A2 (en) 2016-11-02

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