PT885397E - Sonda para dispositivos de accionamento de erros - Google Patents

Sonda para dispositivos de accionamento de erros

Info

Publication number
PT885397E
PT885397E PT97908176T PT97908176T PT885397E PT 885397 E PT885397 E PT 885397E PT 97908176 T PT97908176 T PT 97908176T PT 97908176 T PT97908176 T PT 97908176T PT 885397 E PT885397 E PT 885397E
Authority
PT
Portugal
Prior art keywords
probe
driving devices
fault
error driving
emitter
Prior art date
Application number
PT97908176T
Other languages
English (en)
Inventor
Piero Belforteo
Flavio Maggioni
Original Assignee
Telecom Italia Lab Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telecom Italia Lab Spa filed Critical Telecom Italia Lab Spa
Publication of PT885397E publication Critical patent/PT885397E/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Valve Device For Special Equipments (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Control Of Stepping Motors (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Eye Examination Apparatus (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
PT97908176T 1996-03-06 1997-03-05 Sonda para dispositivos de accionamento de erros PT885397E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT96TO000168A IT1285299B1 (it) 1996-03-06 1996-03-06 Sonda per dispositivi attuatori di guasto

Publications (1)

Publication Number Publication Date
PT885397E true PT885397E (pt) 2002-03-28

Family

ID=11414361

Family Applications (1)

Application Number Title Priority Date Filing Date
PT97908176T PT885397E (pt) 1996-03-06 1997-03-05 Sonda para dispositivos de accionamento de erros

Country Status (12)

Country Link
US (1) US6320390B1 (pt)
EP (1) EP0885397B1 (pt)
JP (1) JP3201611B2 (pt)
AT (1) ATE206525T1 (pt)
AU (1) AU708184B2 (pt)
CA (1) CA2248315A1 (pt)
DE (1) DE69707108T2 (pt)
ES (1) ES2166069T3 (pt)
IT (1) IT1285299B1 (pt)
NO (1) NO983884D0 (pt)
PT (1) PT885397E (pt)
WO (1) WO1997033180A1 (pt)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4275583B2 (ja) * 2004-06-24 2009-06-10 ユーディナデバイス株式会社 電子モジュール
US7609080B2 (en) * 2005-03-22 2009-10-27 Formfactor, Inc. Voltage fault detection and protection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2363360B1 (de) * 1973-12-20 1975-06-05 Koerting Radio Werke Gmbh, 8211 Grassau Transistorverstärker
US4309657A (en) * 1980-01-09 1982-01-05 Burroughs Corporation Apparatus for analyzing semiconductor memories
JPS57153464A (en) * 1981-03-18 1982-09-22 Toshiba Corp Injection type semiconductor integrated logic circuit
JPS62183215A (ja) * 1986-02-07 1987-08-11 Hitachi Ltd 半導体集積回路装置
EP0262367A1 (de) * 1986-09-30 1988-04-06 Siemens Aktiengesellschaft Mechanische Sonde zur Messung zeitabhängiger elektrischer Signale
US4841240A (en) * 1988-01-29 1989-06-20 American Telephone And Telegraph Company, At&T Bell Laboratories Method and apparatus for verifying the continuity between a circuit board and a test fixture

Also Published As

Publication number Publication date
EP0885397A1 (en) 1998-12-23
NO983884L (no) 1998-08-24
ATE206525T1 (de) 2001-10-15
ES2166069T3 (es) 2002-04-01
EP0885397B1 (en) 2001-10-04
ITTO960168A0 (pt) 1996-03-06
CA2248315A1 (en) 1997-09-12
AU2024097A (en) 1997-09-22
IT1285299B1 (it) 1998-06-03
JP3201611B2 (ja) 2001-08-27
JPH11505031A (ja) 1999-05-11
AU708184B2 (en) 1999-07-29
NO983884D0 (no) 1998-08-24
DE69707108D1 (de) 2001-11-08
DE69707108T2 (de) 2002-11-07
US6320390B1 (en) 2001-11-20
WO1997033180A1 (en) 1997-09-12
ITTO960168A1 (it) 1997-09-06

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