SE0102113L - Förfarande för att bringa på separata bärare monterade laserchips till en mätstation - Google Patents

Förfarande för att bringa på separata bärare monterade laserchips till en mätstation

Info

Publication number
SE0102113L
SE0102113L SE0102113A SE0102113A SE0102113L SE 0102113 L SE0102113 L SE 0102113L SE 0102113 A SE0102113 A SE 0102113A SE 0102113 A SE0102113 A SE 0102113A SE 0102113 L SE0102113 L SE 0102113L
Authority
SE
Sweden
Prior art keywords
fixture
chip
coordinates
camera
bring
Prior art date
Application number
SE0102113A
Other languages
English (en)
Other versions
SE0102113D0 (sv
SE517273C2 (sv
Inventor
Roland West
Mats Jensen
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE0102113A priority Critical patent/SE0102113L/sv
Publication of SE0102113D0 publication Critical patent/SE0102113D0/sv
Priority to TW090121610A priority patent/TW508710B/zh
Publication of SE517273C2 publication Critical patent/SE517273C2/sv
Publication of SE0102113L publication Critical patent/SE0102113L/sv
Priority to US10/480,030 priority patent/US6894481B2/en
Priority to JP2003504106A priority patent/JP4365206B2/ja
Priority to PCT/SE2002/001067 priority patent/WO2002101402A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
    • H01S5/0262—Photo-diodes, e.g. transceiver devices, bidirectional devices
    • H01S5/0264—Photo-diodes, e.g. transceiver devices, bidirectional devices for monitoring the laser-output
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Semiconductor Lasers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE0102113A 2001-06-12 2001-06-12 Förfarande för att bringa på separata bärare monterade laserchips till en mätstation SE0102113L (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0102113A SE0102113L (sv) 2001-06-12 2001-06-12 Förfarande för att bringa på separata bärare monterade laserchips till en mätstation
TW090121610A TW508710B (en) 2001-06-12 2001-08-31 A method of bringing a laser chip to a measurement position
US10/480,030 US6894481B2 (en) 2001-06-12 2002-06-04 Method and apparatus for bringing laser chips to a measurement position
JP2003504106A JP4365206B2 (ja) 2001-06-12 2002-06-04 レーザーチップを測定位置へと運搬する方法および装置
PCT/SE2002/001067 WO2002101402A1 (en) 2001-06-12 2002-06-04 Method and apparatus for bringing laser chips to a measurement position

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0102113A SE0102113L (sv) 2001-06-12 2001-06-12 Förfarande för att bringa på separata bärare monterade laserchips till en mätstation

Publications (3)

Publication Number Publication Date
SE0102113D0 SE0102113D0 (sv) 2001-06-12
SE517273C2 SE517273C2 (sv) 2002-05-21
SE0102113L true SE0102113L (sv) 2002-05-21

Family

ID=20284479

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0102113A SE0102113L (sv) 2001-06-12 2001-06-12 Förfarande för att bringa på separata bärare monterade laserchips till en mätstation

Country Status (5)

Country Link
US (1) US6894481B2 (sv)
JP (1) JP4365206B2 (sv)
SE (1) SE0102113L (sv)
TW (1) TW508710B (sv)
WO (1) WO2002101402A1 (sv)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2203853B (en) * 1987-04-21 1990-08-22 Stc Plc Light source and detector packages.
US5498973A (en) * 1994-12-22 1996-03-12 International Business Machines Corporation Apparatus for testing semiconductor laser devices
US6111424A (en) * 1997-09-04 2000-08-29 Lucent Technologies Inc. Testing method and apparatus for flat panel displays using infrared imaging
US6137305A (en) * 1998-10-26 2000-10-24 Lucent Technologies Inc. Method and apparatus for testing laser bars
US6208419B1 (en) * 1998-11-18 2001-03-27 Fuji Photo Film Co., Ltd. Method of and apparatus for bonding light-emitting element
JP4328409B2 (ja) * 1999-04-12 2009-09-09 富士フイルム株式会社 発光素子のボンディング装置
US6501260B1 (en) * 2000-12-15 2002-12-31 Corning Incorporated Bar tester

Also Published As

Publication number Publication date
SE0102113D0 (sv) 2001-06-12
US6894481B2 (en) 2005-05-17
US20040246009A1 (en) 2004-12-09
WO2002101402A1 (en) 2002-12-19
SE517273C2 (sv) 2002-05-21
TW508710B (en) 2002-11-01
JP2004529507A (ja) 2004-09-24
JP4365206B2 (ja) 2009-11-18

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Legal Events

Date Code Title Description
NUG Patent has lapsed