SE368626B - - Google Patents
Info
- Publication number
- SE368626B SE368626B SE13093/71A SE1309371A SE368626B SE 368626 B SE368626 B SE 368626B SE 13093/71 A SE13093/71 A SE 13093/71A SE 1309371 A SE1309371 A SE 1309371A SE 368626 B SE368626 B SE 368626B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19702051511 DE2051511B2 (de) | 1970-10-20 | 1970-10-20 | Roentgentopographiegeraet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE368626B true SE368626B (de) | 1974-07-08 |
Family
ID=5785657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE13093/71A SE368626B (de) | 1970-10-20 | 1971-10-15 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3751662A (de) |
| CH (1) | CH532785A (de) |
| DE (1) | DE2051511B2 (de) |
| FR (1) | FR2111520A5 (de) |
| GB (1) | GB1372885A (de) |
| SE (1) | SE368626B (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3992624A (en) * | 1975-04-29 | 1976-11-16 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method of X-ray topography at cryogenic temperature |
| DE3439471A1 (de) * | 1984-10-27 | 1986-04-30 | MTU Motoren- und Turbinen-Union München GmbH, 8000 München | Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende |
| DE4100680A1 (de) * | 1991-01-11 | 1992-07-23 | Siemens Ag | Verfahren zur zerstoerungsfreien bestimmung von verformungen eines halbleiterkristalles in einem gehaeuse |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2829268A (en) * | 1952-05-05 | 1958-04-01 | Industrial Nucleonics Corp | Standardization system |
| US3177360A (en) * | 1962-09-14 | 1965-04-06 | Norton Co | Diffractometer with a rotatable support to hold plural samples for automatic analysis of crystalline material |
| US3435219A (en) * | 1967-01-30 | 1969-03-25 | Atomic Energy Commission | Neutron spectrometer for high neutron flux |
-
1970
- 1970-10-20 DE DE19702051511 patent/DE2051511B2/de active Granted
-
1971
- 1971-10-14 CH CH1507971A patent/CH532785A/de not_active IP Right Cessation
- 1971-10-15 SE SE13093/71A patent/SE368626B/xx unknown
- 1971-10-19 FR FR7137428A patent/FR2111520A5/fr not_active Expired
- 1971-10-19 GB GB4855971A patent/GB1372885A/en not_active Expired
- 1971-10-20 US US00190722A patent/US3751662A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| GB1372885A (en) | 1974-11-06 |
| DE2051511A1 (de) | 1972-05-31 |
| DE2051511B2 (de) | 1973-05-03 |
| FR2111520A5 (de) | 1972-06-02 |
| US3751662A (en) | 1973-08-07 |
| CH532785A (de) | 1973-01-15 |
| DE2051511C3 (de) | 1973-11-29 |