SE401733B - Forfarande och apparat vid metning av plattjocklek - Google Patents

Forfarande och apparat vid metning av plattjocklek

Info

Publication number
SE401733B
SE401733B SE7613688A SE7613688A SE401733B SE 401733 B SE401733 B SE 401733B SE 7613688 A SE7613688 A SE 7613688A SE 7613688 A SE7613688 A SE 7613688A SE 401733 B SE401733 B SE 401733B
Authority
SE
Sweden
Prior art keywords
appliance
procedure
thick thickness
plating thick
plating
Prior art date
Application number
SE7613688A
Other languages
English (en)
Inventor
P S R Rundquist
S J Bjorkman
G S Jonsson
Original Assignee
Atomenergi Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atomenergi Ab filed Critical Atomenergi Ab
Priority to SE7613688A priority Critical patent/SE401733B/sv
Priority to US05/855,800 priority patent/US4309606A/en
Priority to DE19772754309 priority patent/DE2754309A1/de
Priority to JP14653377A priority patent/JPS5371851A/ja
Publication of SE401733B publication Critical patent/SE401733B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SE7613688A 1976-12-06 1976-12-06 Forfarande och apparat vid metning av plattjocklek SE401733B (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE7613688A SE401733B (sv) 1976-12-06 1976-12-06 Forfarande och apparat vid metning av plattjocklek
US05/855,800 US4309606A (en) 1976-12-06 1977-11-29 Measuring plate thickness
DE19772754309 DE2754309A1 (de) 1976-12-06 1977-12-06 Verfahren und vorrichtung zur messung der dicke von baendern oder platten
JP14653377A JPS5371851A (en) 1976-12-06 1977-12-06 Measuring method and apparatus for thickness of plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7613688A SE401733B (sv) 1976-12-06 1976-12-06 Forfarande och apparat vid metning av plattjocklek

Publications (1)

Publication Number Publication Date
SE401733B true SE401733B (sv) 1978-05-22

Family

ID=20329670

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7613688A SE401733B (sv) 1976-12-06 1976-12-06 Forfarande och apparat vid metning av plattjocklek

Country Status (4)

Country Link
US (1) US4309606A (sv)
JP (1) JPS5371851A (sv)
DE (1) DE2754309A1 (sv)
SE (1) SE401733B (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987007021A1 (en) * 1984-12-04 1987-11-19 Puumalaisen Tutkimuslaitos Oy Method for stabilisation of a square weight detector

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2826484C2 (de) 1978-06-16 1982-08-26 Laboratorium Prof. Dr. Rudolf Berthold, 7547 Wildbad Regelverfahren zur automatischen Driftstabilisierung bei einer Strahlungsmessung und Verwendungen bei diesem Verfahren
US4574387A (en) * 1981-09-18 1986-03-04 Data Measurement Corporation Apparatus and method for measuring thickness
DE3404149A1 (de) * 1984-02-07 1985-08-08 FAG Kugelfischer Georg Schäfer KGaA, 8720 Schweinfurt Verfahren und einrichtung zur messtechnischen ueberwachung eines szintillations-kernstrahlungsdetektors nebst nachfolge-elektronik
NL8702874A (nl) * 1987-12-01 1989-07-03 Philips Nv Inspectie apparaat met gedigitaliseerde elektronen detectie.
US5379237A (en) * 1990-05-31 1995-01-03 Integrated Diagnostic Measurement Corporation Automated system for controlling the quality of regularly-shaped products during their manufacture
RU2184934C2 (ru) * 2000-06-08 2002-07-10 Закрытое акционерное общество Московское научно-производственное объединение "СПЕКТР" Устройство для измерения толщины
RU2414724C2 (ru) * 2005-10-28 2011-03-20 Конинклейке Филипс Электроникс, Н.В. Способ и устройство для спектральной компьютерной томографии
ITUD20080072A1 (it) * 2008-04-04 2009-10-05 Danieli Automation Spa Misuratore di spessore per lamiere e relativo procedimento di misura
WO2016176480A1 (en) 2015-04-28 2016-11-03 Delta Subsea Llc Systems, apparatuses, and methods for monitoring undersea pipelines
GB201804743D0 (en) * 2018-03-23 2018-05-09 Johnson Matthey Plc Detection method and detector apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3046402A (en) * 1960-04-28 1962-07-24 Norman H Cherry Multiple thickness times density gamma gauge
US3270205A (en) * 1963-02-13 1966-08-30 Ca Atomic Energy Ltd Digital spectrum stabilizer for pulse analysing system
FR1515063A (fr) * 1966-11-25 1968-03-01 France Etat Méthode et banc de mesure de densité par rayonnement gamma
US3634688A (en) * 1970-01-19 1972-01-11 Baird Atomic Inc Multimode spectral analyzer
US3814937A (en) * 1972-04-24 1974-06-04 Kevex Corp Pulse pile-up rejector with live-time corrector circuit
US3757122A (en) * 1972-10-30 1973-09-04 D Bossen Basis weight gauging apparatus system and method
DE2352522A1 (de) * 1973-10-19 1975-04-30 Exatest Messtechnik Gmbh Verfahren und anordnung zur dickenmessung mittels gammastrahlenabsorption
US4047029A (en) * 1976-07-02 1977-09-06 Allport John J Self-compensating X-ray or γ-ray thickness gauge
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987007021A1 (en) * 1984-12-04 1987-11-19 Puumalaisen Tutkimuslaitos Oy Method for stabilisation of a square weight detector

Also Published As

Publication number Publication date
DE2754309A1 (de) 1978-06-08
JPS5371851A (en) 1978-06-26
US4309606A (en) 1982-01-05

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