SE433782B - Forfarande och anordning for testning av elektriska ledarelement - Google Patents

Forfarande och anordning for testning av elektriska ledarelement

Info

Publication number
SE433782B
SE433782B SE7811012A SE7811012A SE433782B SE 433782 B SE433782 B SE 433782B SE 7811012 A SE7811012 A SE 7811012A SE 7811012 A SE7811012 A SE 7811012A SE 433782 B SE433782 B SE 433782B
Authority
SE
Sweden
Prior art keywords
current
voltage
generator
average value
conductor element
Prior art date
Application number
SE7811012A
Other languages
English (en)
Swedish (sv)
Other versions
SE7811012L (sv
Inventor
A T English
G L Miller
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of SE7811012L publication Critical patent/SE7811012L/xx
Publication of SE433782B publication Critical patent/SE433782B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SE7811012A 1977-10-31 1978-10-23 Forfarande och anordning for testning av elektriska ledarelement SE433782B (sv)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements

Publications (2)

Publication Number Publication Date
SE7811012L SE7811012L (sv) 1979-05-01
SE433782B true SE433782B (sv) 1984-06-12

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7811012A SE433782B (sv) 1977-10-31 1978-10-23 Forfarande och anordning for testning av elektriska ledarelement

Country Status (12)

Country Link
JP (1) JPS5488777A (it)
CA (1) CA1120545A (it)
CH (1) CH635686A5 (it)
DE (1) DE2847074A1 (it)
DK (1) DK483278A (it)
FR (1) FR2407483A1 (it)
GB (1) GB2007850B (it)
HK (1) HK25584A (it)
IT (1) IT1099851B (it)
NL (1) NL7810608A (it)
SE (1) SE433782B (it)
SG (1) SG56382G (it)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4547724A (en) * 1983-02-07 1985-10-15 Tektronix, Inc. Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (ja) * 1985-05-02 1994-04-20 株式会社日立製作所 Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Also Published As

Publication number Publication date
SE7811012L (sv) 1979-05-01
CH635686A5 (de) 1983-04-15
CA1120545A (en) 1982-03-23
FR2407483B1 (it) 1983-09-16
FR2407483A1 (fr) 1979-05-25
SG56382G (en) 1983-09-02
DK483278A (da) 1979-05-01
GB2007850B (en) 1982-05-12
DE2847074A1 (de) 1979-05-03
IT7829239A0 (it) 1978-10-30
JPS5488777A (en) 1979-07-14
GB2007850A (en) 1979-05-23
HK25584A (en) 1984-03-30
NL7810608A (nl) 1979-05-02
IT1099851B (it) 1985-09-28

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