SE532247C8 - Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras - Google Patents

Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras

Info

Publication number
SE532247C8
SE532247C8 SE0702468A SE0702468A SE532247C8 SE 532247 C8 SE532247 C8 SE 532247C8 SE 0702468 A SE0702468 A SE 0702468A SE 0702468 A SE0702468 A SE 0702468A SE 532247 C8 SE532247 C8 SE 532247C8
Authority
SE
Sweden
Prior art keywords
inspected
connector
electrical connection
relay contact
relay
Prior art date
Application number
SE0702468A
Other languages
English (en)
Other versions
SE532247C2 (sv
SE0702468L (sv
Inventor
Hisashi Suzuki
Ryoichi Hirako
Original Assignee
Yokowo Seisakusho Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2007265372A external-priority patent/JP4906666B2/ja
Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk
Publication of SE0702468L publication Critical patent/SE0702468L/sv
Publication of SE532247C2 publication Critical patent/SE532247C2/sv
Publication of SE532247C8 publication Critical patent/SE532247C8/sv

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R29/00—Coupling parts for selective co-operation with a counterpart in different ways to establish different circuits, e.g. for voltage selection, for series-parallel selection, programmable connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R31/00—Coupling parts supported only by co-operation with counterpart
    • H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)
SE0702468A 2006-11-10 2007-11-09 Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras SE532247C8 (sv)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006305364A JP4845031B2 (ja) 2006-11-10 2006-11-10 中継コネクター
JP2007265372A JP4906666B2 (ja) 2006-11-10 2007-10-11 中継コネクター

Publications (3)

Publication Number Publication Date
SE0702468L SE0702468L (sv) 2008-05-11
SE532247C2 SE532247C2 (sv) 2009-11-24
SE532247C8 true SE532247C8 (sv) 2010-01-19

Family

ID=38786634

Family Applications (2)

Application Number Title Priority Date Filing Date
SE0702467A SE532151C2 (sv) 2006-11-10 2007-11-09 Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras
SE0702468A SE532247C8 (sv) 2006-11-10 2007-11-09 Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SE0702467A SE532151C2 (sv) 2006-11-10 2007-11-09 Reläkontakt för elektrisk anslutning av ett kontaktdon som skall inspekteras

Country Status (7)

Country Link
US (1) US7568957B2 (sv)
JP (1) JP4845031B2 (sv)
KR (1) KR101059177B1 (sv)
CN (1) CN101178427B (sv)
FI (1) FI121693B (sv)
SE (2) SE532151C2 (sv)
TW (1) TWI376852B (sv)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4783825B2 (ja) * 2008-11-01 2011-09-28 株式会社ヨコオ クリップ式中継コネクタ
JP5579547B2 (ja) 2010-09-07 2014-08-27 株式会社ヨコオ コネクタ接続用検査治具
JP6627655B2 (ja) * 2016-06-17 2020-01-08 オムロン株式会社 ソケット
CN106153988A (zh) * 2016-06-24 2016-11-23 段超毅 接触导通结构、接触导通装置和板对板测试器
KR102698227B1 (ko) * 2019-05-16 2024-08-27 삼성디스플레이 주식회사 커넥터
JP7136362B2 (ja) * 2019-10-04 2022-09-13 株式会社村田製作所 プローブ
KR102576071B1 (ko) * 2021-07-16 2023-09-08 주식회사 센서뷰 소형 커넥터 테스트용 연결지그

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4225819A (en) * 1978-10-12 1980-09-30 Bell Telephone Laboratories, Incorporated Circuit board contact contamination probe
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards
US5484295A (en) * 1994-04-01 1996-01-16 Teledyne Electronic Technologies Low profile compression electrical connector
US5642054A (en) * 1995-08-08 1997-06-24 Hughes Aircraft Company Active circuit multi-port membrane probe for full wafer testing
US5764069A (en) * 1995-10-30 1998-06-09 International Faster Corporation High density grid for testing circuit boards
JPH1183521A (ja) 1997-09-02 1999-03-26 Nissan Motor Co Ltd 車両用経路誘導装置
JP3214415B2 (ja) 1997-10-30 2001-10-02 日本電産リード株式会社 基板検査装置および基板検査方法
JPH11183521A (ja) 1997-12-22 1999-07-09 Yokowo Co Ltd クリップ式中継コネクタ
US7257465B2 (en) * 2002-10-15 2007-08-14 Rain Bird Corporation Open architecture modularity for irrigation controllers
JP4251855B2 (ja) * 2002-11-19 2009-04-08 株式会社ヨコオ 高周波・高速用デバイスの検査治具の製法
DE10260238B4 (de) 2002-12-20 2007-04-05 Atg Test Systems Gmbh & Co.Kg Adapter zum Testen einer oder mehrerer Leiteranordnungen und Verfahren
JP2004309441A (ja) * 2003-02-18 2004-11-04 Yamaha Corp プローブヘッド及びその組立方法並びにプローブカード
JP2004273192A (ja) 2003-03-06 2004-09-30 Yokowo Co Ltd コネクタ検査用治具
JP4011530B2 (ja) * 2003-08-22 2007-11-21 日本航空電子工業株式会社 コネクタ
WO2005106512A1 (ja) * 2004-04-30 2005-11-10 Advantest Corporation マニュアル試験用器具
JP2007294146A (ja) 2006-04-21 2007-11-08 Yamaichi Electronics Co Ltd 位置決め治具

Also Published As

Publication number Publication date
SE532151C2 (sv) 2009-11-03
KR101059177B1 (ko) 2011-08-25
KR20080042746A (ko) 2008-05-15
FI20070847L (sv) 2008-05-11
TW200836433A (en) 2008-09-01
JP2008123795A (ja) 2008-05-29
FI20070847A0 (sv) 2007-11-08
CN101178427B (zh) 2011-06-15
US20080113527A1 (en) 2008-05-15
SE532247C2 (sv) 2009-11-24
SE0702468L (sv) 2008-05-11
US7568957B2 (en) 2009-08-04
TWI376852B (en) 2012-11-11
CN101178427A (zh) 2008-05-14
FI121693B (sv) 2011-02-28
JP4845031B2 (ja) 2011-12-28
SE0702467L (sv) 2008-05-11

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