SE7806563L - Instrument for tjockleksmetning vid ett rorligt belagt substratmaterial - Google Patents

Instrument for tjockleksmetning vid ett rorligt belagt substratmaterial

Info

Publication number
SE7806563L
SE7806563L SE7806563A SE7806563A SE7806563L SE 7806563 L SE7806563 L SE 7806563L SE 7806563 A SE7806563 A SE 7806563A SE 7806563 A SE7806563 A SE 7806563A SE 7806563 L SE7806563 L SE 7806563L
Authority
SE
Sweden
Prior art keywords
saturity
rually
instrument
thickness
substrate material
Prior art date
Application number
SE7806563A
Other languages
English (en)
Swedish (sv)
Inventor
J Weinstock
D Lieber
W D Hay
Original Assignee
Unit Process Assemblies
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unit Process Assemblies filed Critical Unit Process Assemblies
Publication of SE7806563L publication Critical patent/SE7806563L/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
SE7806563A 1977-06-03 1978-06-05 Instrument for tjockleksmetning vid ett rorligt belagt substratmaterial SE7806563L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/803,250 US4115690A (en) 1977-06-03 1977-06-03 Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material

Publications (1)

Publication Number Publication Date
SE7806563L true SE7806563L (sv) 1978-12-03

Family

ID=25186018

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7806563A SE7806563L (sv) 1977-06-03 1978-06-05 Instrument for tjockleksmetning vid ett rorligt belagt substratmaterial

Country Status (8)

Country Link
US (1) US4115690A (fr)
JP (1) JPS542768A (fr)
BE (1) BE867784A (fr)
DE (1) DE2812995C3 (fr)
FR (1) FR2393267A1 (fr)
IT (1) IT1156804B (fr)
NL (1) NL7806028A (fr)
SE (1) SE7806563L (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4229652A (en) * 1977-06-03 1980-10-21 Unit Process Assemblies, Inc. Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material
US4190770A (en) * 1977-11-15 1980-02-26 Unit Process Assemblies, Inc. Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material
US4194114A (en) * 1978-01-03 1980-03-18 Ukrainsky Nauchno-Issledovatelsky Institut Tselljulozno-Bumazhoi Promyshlennosti (UKRNIIB) Device for non-contact gauging of thickness or weight per unit area of sheet and like materials
US4293767A (en) * 1979-08-24 1981-10-06 Helmut Fischer Apparatus for measuring the thickness of thin layers
US4383172A (en) * 1981-01-23 1983-05-10 Twin City International, Inc. Method and apparatus for measuring coating thicknesses on continuously moving material
JPS58100916U (ja) * 1981-12-28 1983-07-09 株式会社　インタツク 積雪防止装置
DE3931495C2 (de) * 1989-09-21 1997-06-26 Itt Ind Gmbh Deutsche Verfahren zur "fließenden" Feinklassifizierung von Kapazitätsdioden
JPH0645574U (ja) * 1992-12-03 1994-06-21 達也 大谷 すべり止めつきスプーン

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3412249A (en) * 1964-08-04 1968-11-19 Industrial Nucleonics Corp Backscatter thickness measuring gauge utilizing different energy levels of bremsstrahlung and two ionization chambers
GB1158329A (en) * 1965-07-22 1969-07-16 Industrial Nucleonics Corp Measuring Method and Apparatus
US3499152A (en) * 1966-03-18 1970-03-03 Industrial Nucleonics Corp Method and apparatus for improving backscatter gauge response
US3621259A (en) * 1969-01-17 1971-11-16 Measurex Corp Sheet-gauging apparatus

Also Published As

Publication number Publication date
DE2812995A1 (de) 1978-12-14
NL7806028A (nl) 1978-12-05
IT7849723A0 (it) 1978-06-05
FR2393267A1 (fr) 1978-12-29
JPS542768A (en) 1979-01-10
DE2812995C3 (de) 1981-12-17
FR2393267B1 (fr) 1980-11-07
US4115690A (en) 1978-09-19
BE867784A (fr) 1978-10-02
DE2812995B2 (de) 1981-03-26
IT1156804B (it) 1987-02-04

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