SE7906369L - Optisk mikrometer - Google Patents

Optisk mikrometer

Info

Publication number
SE7906369L
SE7906369L SE7906369A SE7906369A SE7906369L SE 7906369 L SE7906369 L SE 7906369L SE 7906369 A SE7906369 A SE 7906369A SE 7906369 A SE7906369 A SE 7906369A SE 7906369 L SE7906369 L SE 7906369L
Authority
SE
Sweden
Prior art keywords
optical micrometers
micrometers
optical
Prior art date
Application number
SE7906369A
Other languages
Unknown language ( )
English (en)
Swedish (sv)
Inventor
W Feist
K Junghans
R Roder
Original Assignee
Zeiss Jena Veb Carl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Jena Veb Carl filed Critical Zeiss Jena Veb Carl
Publication of SE7906369L publication Critical patent/SE7906369L/

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7906369A 1978-08-01 1979-07-25 Optisk mikrometer SE7906369L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD20705878A DD138100A1 (de) 1978-08-01 1978-08-01 Optisches mikrometer

Publications (1)

Publication Number Publication Date
SE7906369L true SE7906369L (sv) 1980-02-02

Family

ID=5513855

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7906369A SE7906369L (sv) 1978-08-01 1979-07-25 Optisk mikrometer

Country Status (3)

Country Link
DD (1) DD138100A1 (de)
DE (1) DE2925408A1 (de)
SE (1) SE7906369L (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD145957A1 (de) * 1979-10-01 1981-01-14 Wieland Feist Verfahren zur bestimmung der steha hsenfehler eines vermessungsgeraetes
DD146494A1 (de) * 1979-10-10 1981-02-11 Wieland Feist Verfahren zum ausmessen der lage eines index

Also Published As

Publication number Publication date
DD138100A1 (de) 1979-10-10
DE2925408A1 (de) 1980-02-21

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