SE8601800L - Sett och anordning for att overvaka ett feltolerant datorminne - Google Patents

Sett och anordning for att overvaka ett feltolerant datorminne

Info

Publication number
SE8601800L
SE8601800L SE8601800A SE8601800A SE8601800L SE 8601800 L SE8601800 L SE 8601800L SE 8601800 A SE8601800 A SE 8601800A SE 8601800 A SE8601800 A SE 8601800A SE 8601800 L SE8601800 L SE 8601800L
Authority
SE
Sweden
Prior art keywords
logic
signal generator
identification signal
error correction
elements
Prior art date
Application number
SE8601800A
Other languages
English (en)
Other versions
SE8601800D0 (sv
SE453228B (sv
Inventor
B Ossfeldt
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE8601800A priority Critical patent/SE453228B/sv
Publication of SE8601800D0 publication Critical patent/SE8601800D0/sv
Priority to EP19870850121 priority patent/EP0243332A1/en
Publication of SE8601800L publication Critical patent/SE8601800L/sv
Publication of SE453228B publication Critical patent/SE453228B/sv

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)
SE8601800A 1986-04-18 1986-04-18 Sett och anordning for att overvaka ett feltolerant datorminne SE453228B (sv)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE8601800A SE453228B (sv) 1986-04-18 1986-04-18 Sett och anordning for att overvaka ett feltolerant datorminne
EP19870850121 EP0243332A1 (en) 1986-04-18 1987-04-13 Method and apparatus for monitoring an error-tolerant computer store

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8601800A SE453228B (sv) 1986-04-18 1986-04-18 Sett och anordning for att overvaka ett feltolerant datorminne

Publications (3)

Publication Number Publication Date
SE8601800D0 SE8601800D0 (sv) 1986-04-18
SE8601800L true SE8601800L (sv) 1987-10-19
SE453228B SE453228B (sv) 1988-01-18

Family

ID=20364261

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8601800A SE453228B (sv) 1986-04-18 1986-04-18 Sett och anordning for att overvaka ett feltolerant datorminne

Country Status (2)

Country Link
EP (1) EP0243332A1 (sv)
SE (1) SE453228B (sv)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02166700A (ja) * 1988-12-15 1990-06-27 Samsung Electron Co Ltd エラー検査及び訂正装置を内蔵した不揮発性半導体メモリ装置
US9606851B2 (en) 2015-02-02 2017-03-28 International Business Machines Corporation Error monitoring of a memory device containing embedded error correction
US9940457B2 (en) 2015-02-13 2018-04-10 International Business Machines Corporation Detecting a cryogenic attack on a memory device with embedded error correction

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3405258A (en) * 1965-04-07 1968-10-08 Ibm Reliability test for computer check circuits
SE387764B (sv) * 1975-09-16 1976-09-13 Ericsson Telefon Ab L M Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet
US4223382A (en) * 1978-11-30 1980-09-16 Sperry Corporation Closed loop error correct
US4281398A (en) * 1980-02-12 1981-07-28 Mostek Corporation Block redundancy for memory array
US4363124A (en) * 1980-06-26 1982-12-07 International Business Machines Corp. Recirculating loop memory array tester
US4313199A (en) * 1980-06-26 1982-01-26 International Business Machines Corp. Recirculating loop memory array fault locator
US4531213A (en) * 1982-03-03 1985-07-23 Sperry Corporation Memory through checking system with comparison of data word parity before and after ECC processing

Also Published As

Publication number Publication date
SE8601800D0 (sv) 1986-04-18
EP0243332A1 (en) 1987-10-28
SE453228B (sv) 1988-01-18

Similar Documents

Publication Publication Date Title
KR900002086A (ko) 집적 회로의 다중 전원 접속부 검사 방법 및 그 장치
DE3587145D1 (de) Puffersystem mit erkennung von lese- oder schreibschaltungsfehlern.
BR9001125A (pt) Sistema de memoria de computador e unidade de memoria
FR2501891B1 (fr) Memoire semi-conductrice autocorrectrice d'erreurs
DE3070868D1 (en) Multi-processor computer system
DE69220818D1 (de) Verfahren und Einrichtung zur Fehlererkennung in Recherspeichern versehen mit Mehrfach-bit-Ausgängen
EP0268289A3 (en) Semiconductor memory device
DE69019822D1 (de) Verfahren und Vorrichtung zur Prüfung des Inhalts und der Adresse einer Speicheranordnung.
EP0252325A3 (en) Semiconductor device having a fuse circuit and a detecting circuit for detecting the states of the fuses in the fuse circuit
DE69421572D1 (de) Überprüfung von Redundanzelementen eines IC-Speichers ohne Programmierung redundanter Ersatzelemente
KR900008191B1 (ko) 대치 용장회로를 가진 반도체집적회로
DE3481687D1 (de) Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.
KR890005752A (ko) 반도체 비휘발성 메모리 장치
KR870002594A (ko) 반도체 기억장치
ATE72915T1 (de) Fehlererkennung.
SE8601800D0 (sv) Sett och anordning for att overvaka ett feltolerant datorminne
ATE51316T1 (de) Integrierter halbleiterspeicher.
ATE28707T1 (de) Schaltungsanordnung zur erkennung und speicherung von netzfehlern.
DE68908635D1 (de) Positionsmessvorrichtung.
GB1391976A (en) Information stores
DK404089A (da) Kredsloeb til kontrol og overvaagning af en elektronisk elektricitetstaellers funktion
DE68913902D1 (de) Integrierte Schaltung mit einer Signaldiskriminierungsschaltung und Verfahren zu deren Prüfung.
DE69622071D1 (de) Nachweiseinrichtung für die Übereinstimmung von Informationen in einem integrierten Schaltkreis
KR830001997B1 (ko) 논리 장치의 체크방식
SU1525745A1 (ru) Ассоциативный запоминающий элемент

Legal Events

Date Code Title Description
NAL Patent in force

Ref document number: 8601800-9

Format of ref document f/p: F

NUG Patent has lapsed