SG11201508564QA - Cleaning liquid composition - Google Patents
Cleaning liquid compositionInfo
- Publication number
- SG11201508564QA SG11201508564QA SG11201508564QA SG11201508564QA SG11201508564QA SG 11201508564Q A SG11201508564Q A SG 11201508564QA SG 11201508564Q A SG11201508564Q A SG 11201508564QA SG 11201508564Q A SG11201508564Q A SG 11201508564QA SG 11201508564Q A SG11201508564Q A SG 11201508564QA
- Authority
- SG
- Singapore
- Prior art keywords
- cleaning liquid
- liquid composition
- composition
- cleaning
- liquid
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/28—Heterocyclic compounds containing nitrogen in the ring
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3281—Heterocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/08—Liquid soap, e.g. for dispensers; capsuled
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/30—Amines; Substituted amines ; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/36—Organic compounds containing phosphorus
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/27—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
- H10P70/277—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers the processing being a planarisation of conductive layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
- Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013088637A JP6203525B2 (en) | 2013-04-19 | 2013-04-19 | Cleaning liquid composition |
| PCT/JP2014/060060 WO2014171355A1 (en) | 2013-04-19 | 2014-04-07 | Cleaning liquid composition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201508564QA true SG11201508564QA (en) | 2015-11-27 |
Family
ID=51731300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201508564QA SG11201508564QA (en) | 2013-04-19 | 2014-04-07 | Cleaning liquid composition |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US20160083675A1 (en) |
| EP (1) | EP2988321B1 (en) |
| JP (1) | JP6203525B2 (en) |
| KR (1) | KR102226023B1 (en) |
| CN (1) | CN105122429B (en) |
| SG (1) | SG11201508564QA (en) |
| TW (1) | TWI624541B (en) |
| WO (1) | WO2014171355A1 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160340620A1 (en) | 2014-01-29 | 2016-11-24 | Advanced Technology Materials, Inc. | Post chemical mechanical polishing formulations and method of use |
| US10351809B2 (en) | 2015-01-05 | 2019-07-16 | Entegris, Inc. | Post chemical mechanical polishing formulations and method of use |
| JP6991711B2 (en) * | 2016-12-27 | 2022-01-12 | 関東化学株式会社 | Cleaning liquid composition |
| CN110447090A (en) * | 2017-03-22 | 2019-11-12 | 三菱化学株式会社 | Cleaning liquid for substrate for semiconductor device, method for cleaning substrate for semiconductor device, method for manufacturing substrate for semiconductor device, and substrate for semiconductor device |
| WO2019044463A1 (en) * | 2017-08-31 | 2019-03-07 | 富士フイルム株式会社 | Processing liquid, kit, and method for cleaning substrate |
| KR20210024187A (en) * | 2018-07-20 | 2021-03-04 | 엔테그리스, 아이엔씨. | Cleaning composition with corrosion inhibitor |
| WO2020039574A1 (en) | 2018-08-24 | 2020-02-27 | キオクシア株式会社 | Semiconductor device and method for manufacturing same |
| JP7220040B2 (en) | 2018-09-20 | 2023-02-09 | 関東化学株式会社 | cleaning liquid composition |
| JP7414062B2 (en) * | 2019-03-27 | 2024-01-16 | Agc株式会社 | Method for manufacturing gallium oxide substrate |
| WO2021054009A1 (en) * | 2019-09-18 | 2021-03-25 | 富士フイルムエレクトロニクスマテリアルズ株式会社 | Cleaning method |
| WO2022163350A1 (en) * | 2021-01-29 | 2022-08-04 | 富士フイルム株式会社 | Composition, and method for cleaning substrate |
| JP7609683B2 (en) * | 2021-03-30 | 2025-01-07 | 株式会社フジミインコーポレーテッド | Semiconductor substrate manufacturing method and semiconductor substrate obtained by said manufacturing method |
| JP7811855B2 (en) * | 2022-02-02 | 2026-02-06 | 関東化学株式会社 | Etching solution composition and etching method |
Family Cites Families (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0641773A (en) | 1992-05-18 | 1994-02-15 | Toshiba Corp | Semiconductor wafer processing liquid |
| JP3219020B2 (en) | 1996-06-05 | 2001-10-15 | 和光純薬工業株式会社 | Cleaning agent |
| JP3165801B2 (en) | 1997-08-12 | 2001-05-14 | 関東化学株式会社 | Cleaning solution |
| JP3377938B2 (en) | 1997-10-21 | 2003-02-17 | 花王株式会社 | Cleaning composition and cleaning method |
| US7547669B2 (en) * | 1998-07-06 | 2009-06-16 | Ekc Technology, Inc. | Remover compositions for dual damascene system |
| JP4516176B2 (en) | 1999-04-20 | 2010-08-04 | 関東化学株式会社 | Substrate cleaning solution for electronic materials |
| US6395693B1 (en) | 1999-09-27 | 2002-05-28 | Cabot Microelectronics Corporation | Cleaning solution for semiconductor surfaces following chemical-mechanical polishing |
| JP4283952B2 (en) | 1999-10-12 | 2009-06-24 | 多摩化学工業株式会社 | Cleaning liquid composition for non-ferrous metal cleaning |
| AU2001241190A1 (en) * | 2000-03-21 | 2001-10-03 | Wako Pure Chemical Industries, Ltd. | Semiconductor wafer cleaning agent and cleaning method |
| KR20010107098A (en) | 2000-05-25 | 2001-12-07 | 김순택 | Electron gun for color picture tube |
| JP3402365B2 (en) | 2000-06-28 | 2003-05-06 | 日本電気株式会社 | Anticorrosive |
| US6599370B2 (en) * | 2000-10-16 | 2003-07-29 | Mallinckrodt Inc. | Stabilized alkaline compositions for cleaning microelectronic substrates |
| MY131912A (en) | 2001-07-09 | 2007-09-28 | Avantor Performance Mat Inc | Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility |
| JP4752270B2 (en) | 2002-11-08 | 2011-08-17 | 和光純薬工業株式会社 | Cleaning liquid and cleaning method using the same |
| JP4257163B2 (en) | 2002-11-12 | 2009-04-22 | セイコーエプソン株式会社 | Nozzle abnormality determination method and drawing apparatus in drawing apparatus, electro-optical device, method of manufacturing electro-optical device, and electronic apparatus |
| US7300601B2 (en) * | 2002-12-10 | 2007-11-27 | Advanced Technology Materials, Inc. | Passivative chemical mechanical polishing composition for copper film planarization |
| US7435712B2 (en) * | 2004-02-12 | 2008-10-14 | Air Liquide America, L.P. | Alkaline chemistry for post-CMP cleaning |
| US20050205835A1 (en) * | 2004-03-19 | 2005-09-22 | Tamboli Dnyanesh C | Alkaline post-chemical mechanical planarization cleaning compositions |
| US7923423B2 (en) * | 2005-01-27 | 2011-04-12 | Advanced Technology Materials, Inc. | Compositions for processing of semiconductor substrates |
| US7365045B2 (en) * | 2005-03-30 | 2008-04-29 | Advanced Tehnology Materials, Inc. | Aqueous cleaner with low metal etch rate comprising alkanolamine and tetraalkylammonium hydroxide |
| TWI282363B (en) | 2005-05-19 | 2007-06-11 | Epoch Material Co Ltd | Aqueous cleaning composition for semiconductor copper processing |
| SG162725A1 (en) * | 2005-05-26 | 2010-07-29 | Advanced Tech Materials | Copper passivating post-chemical mechanical polishing cleaning composition and method of use |
| US20070225186A1 (en) * | 2006-03-27 | 2007-09-27 | Matthew Fisher | Alkaline solutions for post CMP cleaning processes |
| CN100537142C (en) * | 2006-08-10 | 2009-09-09 | 中芯国际集成电路制造(上海)有限公司 | Cleaning device and method for chemical mechanical polishing equipment |
| US20100273330A1 (en) * | 2006-08-23 | 2010-10-28 | Citibank N.A. As Collateral Agent | Rinse formulation for use in the manufacture of an integrated circuit |
| US20080076688A1 (en) * | 2006-09-21 | 2008-03-27 | Barnes Jeffrey A | Copper passivating post-chemical mechanical polishing cleaning composition and method of use |
| US20080154786A1 (en) * | 2006-12-26 | 2008-06-26 | Weatherbill, Inc. | Single party platform for sale and settlement of OTC derivatives |
| JP2009194049A (en) | 2008-02-13 | 2009-08-27 | Sanyo Chem Ind Ltd | Detergent for copper wire semiconductor |
| JP2009239206A (en) | 2008-03-28 | 2009-10-15 | Sanyo Chem Ind Ltd | Cleaning agent for copper wiring semiconductor |
| JP5873718B2 (en) * | 2008-10-21 | 2016-03-01 | アドバンスド テクノロジー マテリアルズ,インコーポレイテッド | Copper cleaning and protection compound |
| WO2010084033A2 (en) | 2009-01-22 | 2010-07-29 | Basf Se | Composition for post chemical-mechanical polishing cleaning |
| US8765653B2 (en) | 2009-07-07 | 2014-07-01 | Air Products And Chemicals, Inc. | Formulations and method for post-CMP cleaning |
| JP2011074189A (en) | 2009-09-30 | 2011-04-14 | Sanyo Chem Ind Ltd | Detergent for copper wiring semiconductor |
| JP5646882B2 (en) * | 2009-09-30 | 2014-12-24 | 富士フイルム株式会社 | Cleaning composition, cleaning method, and manufacturing method of semiconductor device |
| JP5702075B2 (en) | 2010-03-26 | 2015-04-15 | アドバンスド テクノロジー マテリアルズ,インコーポレイテッド | Cleaning agent for copper wiring semiconductor |
| WO2011094568A2 (en) * | 2010-01-29 | 2011-08-04 | Advanced Technology Materials, Inc. | Cleaning agent for semiconductor provided with metal wiring |
| JP2012021151A (en) | 2010-06-16 | 2012-02-02 | Sanyo Chem Ind Ltd | Cleaning agent for copper wiring semiconductor |
| JP2012046685A (en) | 2010-08-30 | 2012-03-08 | Fujifilm Corp | Cleaning composition, cleaning method using the composition, and method of manufacturing semiconductor device |
| JP5242662B2 (en) | 2010-11-02 | 2013-07-24 | 定男 篠原 | Separation plate manufacturing method for separation plate type centrifuge |
| JP2012186470A (en) | 2011-02-18 | 2012-09-27 | Sanyo Chem Ind Ltd | Cleaner for copper wiring semiconductor |
| JP6066552B2 (en) * | 2011-12-06 | 2017-01-25 | 関東化學株式会社 | Cleaning composition for electronic devices |
| JP6123334B2 (en) * | 2012-02-17 | 2017-05-10 | 三菱化学株式会社 | Cleaning device for semiconductor device and method for cleaning substrate for semiconductor device |
| WO2013142250A1 (en) * | 2012-03-18 | 2013-09-26 | Advanced Technology Materials, Inc. | Post-cmp formulation having improved barrier layer compatibility and cleaning performance |
| EP3719105B1 (en) * | 2013-12-06 | 2023-09-27 | Fujifilm Electronic Materials USA, Inc. | Cleaning formulation for removing residues on surfaces |
| CN110177903A (en) * | 2017-01-17 | 2019-08-27 | 恩特格里斯公司 | Post etch residue removal for high-order node process backend processing |
-
2013
- 2013-04-19 JP JP2013088637A patent/JP6203525B2/en active Active
-
2014
- 2014-04-07 KR KR1020157032827A patent/KR102226023B1/en active Active
- 2014-04-07 SG SG11201508564QA patent/SG11201508564QA/en unknown
- 2014-04-07 US US14/784,983 patent/US20160083675A1/en not_active Abandoned
- 2014-04-07 WO PCT/JP2014/060060 patent/WO2014171355A1/en not_active Ceased
- 2014-04-07 EP EP14784903.8A patent/EP2988321B1/en active Active
- 2014-04-07 CN CN201480021935.6A patent/CN105122429B/en active Active
- 2014-04-18 TW TW103114290A patent/TWI624541B/en active
-
2020
- 2020-11-30 US US17/107,216 patent/US20210163856A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP2988321A4 (en) | 2016-11-02 |
| EP2988321B1 (en) | 2019-03-20 |
| US20210163856A1 (en) | 2021-06-03 |
| WO2014171355A1 (en) | 2014-10-23 |
| KR20150144780A (en) | 2015-12-28 |
| KR102226023B1 (en) | 2021-03-09 |
| US20160083675A1 (en) | 2016-03-24 |
| TW201506152A (en) | 2015-02-16 |
| JP2014212262A (en) | 2014-11-13 |
| EP2988321A1 (en) | 2016-02-24 |
| JP6203525B2 (en) | 2017-09-27 |
| CN105122429A (en) | 2015-12-02 |
| CN105122429B (en) | 2019-11-26 |
| TWI624541B (en) | 2018-05-21 |
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