SG44404A1 - Magnetoresistive read transducer having improved bias profile - Google Patents

Magnetoresistive read transducer having improved bias profile

Info

Publication number
SG44404A1
SG44404A1 SG1996000193A SG1996000193A SG44404A1 SG 44404 A1 SG44404 A1 SG 44404A1 SG 1996000193 A SG1996000193 A SG 1996000193A SG 1996000193 A SG1996000193 A SG 1996000193A SG 44404 A1 SG44404 A1 SG 44404A1
Authority
SG
Singapore
Prior art keywords
read transducer
magnetoresistive read
bias profile
improved bias
profile
Prior art date
Application number
SG1996000193A
Other languages
English (en)
Inventor
Mao-Min Chen
Kochan Ju
Mohamad T Krounbi
Ching Hwa Tsang
Po-Kang Wang
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SG44404A1 publication Critical patent/SG44404A1/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Magnetic Heads (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
SG1996000193A 1992-02-28 1993-02-18 Magnetoresistive read transducer having improved bias profile SG44404A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/843,702 US5285339A (en) 1992-02-28 1992-02-28 Magnetoresistive read transducer having improved bias profile

Publications (1)

Publication Number Publication Date
SG44404A1 true SG44404A1 (en) 1997-12-19

Family

ID=25290777

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996000193A SG44404A1 (en) 1992-02-28 1993-02-18 Magnetoresistive read transducer having improved bias profile

Country Status (4)

Country Link
US (1) US5285339A (fr)
EP (1) EP0558237A3 (fr)
JP (1) JPH0684145A (fr)
SG (1) SG44404A1 (fr)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG47479A1 (en) * 1992-08-25 1998-04-17 Seagate Technology A magnetoresistive sensor and method of making the same
US5669133A (en) * 1992-08-25 1997-09-23 Seagate Technology, Inc. Method of making a magnetoresistive sensor
JP2688173B2 (ja) * 1993-05-18 1997-12-08 インターナショナル・ビジネス・マシーンズ・コーポレイション 磁気抵抗読取りトランスジューサ
DE69420789T2 (de) * 1993-07-13 2000-04-27 International Business Machines Corp., Armonk Magnetoresistiver Lesewandler
CN1095153C (zh) * 1994-03-10 2002-11-27 国际商业机器公司 磁电阻传感元件及磁电阻传感器
US5712751A (en) * 1994-03-17 1998-01-27 Kabushiki Kaisha Toshiba Magnetic sensor and magnetic recording-reproducing head and magnetic recording-reproducing apparatus using same
WO1995026547A2 (fr) * 1994-03-25 1995-10-05 Philips Electronics N.V. Element magnetoresistif et tete magnetique comportant un tel element
US5841611A (en) * 1994-05-02 1998-11-24 Matsushita Electric Industrial Co., Ltd. Magnetoresistance effect device and magnetoresistance effect type head, memory device, and amplifying device using the same
US6256222B1 (en) 1994-05-02 2001-07-03 Matsushita Electric Industrial Co., Ltd. Magnetoresistance effect device, and magnetoresistaance effect type head, memory device, and amplifying device using the same
US5546253A (en) * 1994-05-06 1996-08-13 Quantum Corporation Digitial output magnetoresistive (DOMR) head and methods associated therewith
US5438470A (en) * 1994-05-13 1995-08-01 Read-Rite Corporation Magnetoresistive structure with contiguous junction hard bias design with low lead resistance
US5712565A (en) * 1994-06-22 1998-01-27 Seagate Technology, Inc. MR sensor having thick active region between two thinner inactive MR regions topped with respective permanent magnets
US5528440A (en) * 1994-07-26 1996-06-18 International Business Machines Corporation Spin valve magnetoresistive element with longitudinal exchange biasing of end regions abutting the free layer, and magnetic recording system using the element
US5434826A (en) * 1994-09-26 1995-07-18 Read-Rite Corporation Multilayer hard bias films for longitudinal biasing in magnetoresistive transducer
US5664316A (en) * 1995-01-17 1997-09-09 International Business Machines Corporation Method of manufacturing magnetoresistive read transducer having a contiguous longitudinal bias layer
JPH08221719A (ja) * 1995-02-16 1996-08-30 Tdk Corp スピンバルブ磁気抵抗ヘッド及びその製造方法
JPH08287422A (ja) * 1995-04-07 1996-11-01 Alps Electric Co Ltd 磁気抵抗効果型ヘッド
JP3990751B2 (ja) * 1995-07-25 2007-10-17 株式会社日立グローバルストレージテクノロジーズ 磁気抵抗効果型磁気ヘッド及び磁気記録再生装置
US5768067A (en) * 1995-09-19 1998-06-16 Alps Electric Co., Ltd. Magnetoresistive head using exchange anisotropic magnetic field with an antiferromagnetic layer
JPH09231522A (ja) * 1996-02-27 1997-09-05 Nec Corp 磁気抵抗効果ヘッド
US5739987A (en) * 1996-06-04 1998-04-14 Read-Rite Corporation Magnetoresistive read transducers with multiple longitudinal stabilization layers
US5748413A (en) * 1996-06-04 1998-05-05 Read-Rite Corporation Magnetoresistive reas transducer with exchange biasing of magnetoresistive sensor and soft adjacent layer
US6249406B1 (en) 1996-09-23 2001-06-19 International Business Machines Corporation Magnetoresistive sensor with a soft adjacent layer having high magnetization, high resistivity, low intrinsic anisotropy and near zero magnetostriction
US5946169A (en) * 1996-11-07 1999-08-31 Seagate Technology, Inc. Soft adjacent layer vertically biased magnetoresistive sensor having improved sensor stability
US5739990A (en) * 1996-11-13 1998-04-14 Read-Rite Corporation Spin-valve GMR sensor with inbound exchange stabilization
JP3455037B2 (ja) * 1996-11-22 2003-10-06 アルプス電気株式会社 スピンバルブ型薄膜素子、その製造方法、及びこのスピンバルブ型薄膜素子を用いた薄膜磁気ヘッド
US6356420B1 (en) 1998-05-07 2002-03-12 Seagate Technology Llc Storage system having read head utilizing GMR and AMr effects
US6230390B1 (en) 1998-10-30 2001-05-15 Headway Technologies, Inc. Canted longitudinal patterned exchange biased dual-stripe magnetoresistive (DSMR) sensor element and method for fabrication thereof
US6583971B1 (en) * 1999-03-09 2003-06-24 Sae Magnetics (Hk) Ltd. Elimination of electric-pop noise in MR/GMR device
JP2001014616A (ja) * 1999-06-30 2001-01-19 Tdk Corp 磁気変換素子、薄膜磁気ヘッドおよびそれらの製造方法
JP2003059014A (ja) 2001-08-23 2003-02-28 Hitachi Ltd 磁気抵抗効果型ヘッド及びその製造方法
US6545906B1 (en) * 2001-10-16 2003-04-08 Motorola, Inc. Method of writing to scalable magnetoresistance random access memory element
US7095646B2 (en) * 2002-07-17 2006-08-22 Freescale Semiconductor, Inc. Multi-state magnetoresistance random access cell with improved memory storage density
US6831312B2 (en) * 2002-08-30 2004-12-14 Freescale Semiconductor, Inc. Amorphous alloys for magnetic devices
US20040166368A1 (en) * 2003-02-24 2004-08-26 International Business Machines Corporation AP-tab spin valve with controlled magnetostriction of the biasing layer
US6956763B2 (en) * 2003-06-27 2005-10-18 Freescale Semiconductor, Inc. MRAM element and methods for writing the MRAM element
US6967366B2 (en) * 2003-08-25 2005-11-22 Freescale Semiconductor, Inc. Magnetoresistive random access memory with reduced switching field variation
US7344330B2 (en) * 2004-03-31 2008-03-18 Hitachi Global Storage Technologies Netherlands B.V. Topographically defined thin film CPP read head fabrication
US7129098B2 (en) * 2004-11-24 2006-10-31 Freescale Semiconductor, Inc. Reduced power magnetoresistive random access memory elements
US10746611B2 (en) * 2017-12-07 2020-08-18 Texas Instruments Incorporated Magnetostrictive strain gauge sensor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4242710A (en) * 1979-01-29 1980-12-30 International Business Machines Corporation Thin film head having negative magnetostriction
JPS5971112A (ja) * 1982-10-15 1984-04-21 Comput Basic Mach Technol Res Assoc 薄膜磁気ヘツド
JPS60251682A (ja) * 1984-05-29 1985-12-12 Hitachi Ltd 磁気抵抗効果型素子
JPS61192011A (ja) * 1985-02-20 1986-08-26 Hitachi Ltd 薄膜磁気ヘツド
US4713708A (en) * 1986-10-31 1987-12-15 International Business Machines Magnetoresistive read transducer
US4771349A (en) * 1986-10-31 1988-09-13 International Business Machine Corporation Magnetoresistive read transducer
US5005096A (en) * 1988-12-21 1991-04-02 International Business Machines Corporation Magnetoresistive read transducer having hard magnetic shunt bias
US5001586A (en) * 1989-08-01 1991-03-19 International Business Machines Corporation Very low noise magnetoresistive sensor for high density media applications
US5018037A (en) * 1989-10-10 1991-05-21 Krounbi Mohamad T Magnetoresistive read transducer having hard magnetic bias

Also Published As

Publication number Publication date
JPH0684145A (ja) 1994-03-25
EP0558237A3 (fr) 1993-10-13
EP0558237A2 (fr) 1993-09-01
US5285339A (en) 1994-02-08

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