SG55312A1 - Cvd of metals capable of receiving nickel or alloys thereof using iodide - Google Patents
Cvd of metals capable of receiving nickel or alloys thereof using iodideInfo
- Publication number
- SG55312A1 SG55312A1 SG1997001479A SG1997001479A SG55312A1 SG 55312 A1 SG55312 A1 SG 55312A1 SG 1997001479 A SG1997001479 A SG 1997001479A SG 1997001479 A SG1997001479 A SG 1997001479A SG 55312 A1 SG55312 A1 SG 55312A1
- Authority
- SG
- Singapore
- Prior art keywords
- iodide
- alloys
- cvd
- nickel
- metals capable
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/08—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal halides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing of the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12944—Ni-base component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12951—Fe-base component
- Y10T428/12958—Next to Fe-base component
- Y10T428/12965—Both containing 0.01-1.7% carbon [i.e., steel]
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Catalysts (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/668,295 US5869134A (en) | 1996-06-21 | 1996-06-21 | CVD of metals capable of receiving nickel or alloys thereof using iodide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG55312A1 true SG55312A1 (en) | 1998-12-21 |
Family
ID=24681778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG1997001479A SG55312A1 (en) | 1996-06-21 | 1997-05-10 | Cvd of metals capable of receiving nickel or alloys thereof using iodide |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US5869134A (de) |
| EP (1) | EP0814175B1 (de) |
| JP (1) | JP3320336B2 (de) |
| KR (1) | KR100287100B1 (de) |
| AT (1) | ATE209263T1 (de) |
| DE (1) | DE69708388T2 (de) |
| ES (1) | ES2166506T3 (de) |
| SG (1) | SG55312A1 (de) |
| TW (1) | TW438738B (de) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6569496B1 (en) * | 1998-03-30 | 2003-05-27 | International Business Machines Corporation | CVD of metals capable of receiving nickel or alloys thereof using inert contact |
| US6068912A (en) * | 1998-05-01 | 2000-05-30 | International Business Machines Corporation | Platible non-metallic filler material for metallurgical screening paste |
| US6254925B1 (en) * | 1998-07-28 | 2001-07-03 | International Business Machines Corporation | Source metal embedded in an inert material and process thereof |
| US6319554B1 (en) * | 1999-06-10 | 2001-11-20 | International Business Machine Corporation | Method and apparatus for surface metallization |
| TWI275319B (en) * | 2002-02-05 | 2007-03-01 | Semiconductor Energy Lab | Manufacturing method and method of operating a manufacturing apparatus |
| TWI286044B (en) * | 2002-02-22 | 2007-08-21 | Semiconductor Energy Lab | Light-emitting device and method of manufacturing the same, and method of operating manufacturing apparatus |
| US6875691B2 (en) * | 2002-06-21 | 2005-04-05 | Mattson Technology, Inc. | Temperature control sequence of electroless plating baths |
| US6797312B2 (en) * | 2003-01-21 | 2004-09-28 | Mattson Technology, Inc. | Electroless plating solution and process |
| US11309251B2 (en) | 2017-07-31 | 2022-04-19 | AdTech Ceramics Company | Selective metallization of integrated circuit packages |
| KR102355507B1 (ko) | 2018-11-14 | 2022-01-27 | (주)디엔에프 | 몰리브덴 함유 박막의 제조방법 및 이로부터 제조된 몰리브덴함유 박막 |
| WO2021232577A1 (zh) * | 2020-05-20 | 2021-11-25 | 中国科学院微电子研究所 | 一种碘化亚铜薄膜的制备方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3576500A (en) * | 1965-11-30 | 1971-04-27 | Gordon Gould | Low level laser with cyclic excitation and relaxation |
| JPS59155950A (ja) * | 1983-02-25 | 1984-09-05 | Shinko Electric Ind Co Ltd | 半導体装置用セラミックパッケージ |
| US4664942A (en) * | 1986-02-05 | 1987-05-12 | General Electric Company | Nickel diffusion bonded to metallized ceramic body and method |
| US4835010A (en) * | 1987-06-08 | 1989-05-30 | Exxon Research And Engineering Company | Aluminide dispersed ferrite diffusion coating on austenitic stainless steel substrates |
| JPH04329640A (ja) * | 1991-05-01 | 1992-11-18 | Mitsubishi Electric Corp | 配線層のドライエッチング方法 |
| US5471033A (en) * | 1994-04-15 | 1995-11-28 | International Business Machines Corporation | Process and apparatus for contamination-free processing of semiconductor parts |
| US5575856A (en) * | 1994-05-11 | 1996-11-19 | Sony Corporation | Thermal cycle resistant seal and method of sealing for use with semiconductor wafer processing apparatus |
-
1996
- 1996-06-21 US US08/668,295 patent/US5869134A/en not_active Expired - Fee Related
-
1997
- 1997-01-14 TW TW086100351A patent/TW438738B/zh not_active IP Right Cessation
- 1997-04-28 KR KR1019970015966A patent/KR100287100B1/ko not_active Expired - Fee Related
- 1997-05-10 SG SG1997001479A patent/SG55312A1/en unknown
- 1997-06-10 DE DE69708388T patent/DE69708388T2/de not_active Expired - Lifetime
- 1997-06-10 ES ES97304018T patent/ES2166506T3/es not_active Expired - Lifetime
- 1997-06-10 EP EP97304018A patent/EP0814175B1/de not_active Expired - Lifetime
- 1997-06-10 AT AT97304018T patent/ATE209263T1/de not_active IP Right Cessation
- 1997-06-18 JP JP16163997A patent/JP3320336B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| ATE209263T1 (de) | 2001-12-15 |
| KR980002290A (ko) | 1998-03-30 |
| JPH1068075A (ja) | 1998-03-10 |
| ES2166506T3 (es) | 2002-04-16 |
| DE69708388D1 (de) | 2002-01-03 |
| EP0814175A2 (de) | 1997-12-29 |
| DE69708388T2 (de) | 2002-08-08 |
| TW438738B (en) | 2001-06-07 |
| EP0814175A3 (de) | 1998-03-04 |
| US5869134A (en) | 1999-02-09 |
| EP0814175B1 (de) | 2001-11-21 |
| KR100287100B1 (ko) | 2001-04-16 |
| JP3320336B2 (ja) | 2002-09-03 |
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