SU815683A1 - Method of determining short-circuiting circuit parameters - Google Patents
Method of determining short-circuiting circuit parameters Download PDFInfo
- Publication number
- SU815683A1 SU815683A1 SU792746027A SU2746027A SU815683A1 SU 815683 A1 SU815683 A1 SU 815683A1 SU 792746027 A SU792746027 A SU 792746027A SU 2746027 A SU2746027 A SU 2746027A SU 815683 A1 SU815683 A1 SU 815683A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- circuit
- current
- short
- truncation
- short circuit
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 9
- 238000005259 measurement Methods 0.000 claims description 5
- 230000001939 inductive effect Effects 0.000 claims description 2
- 230000002123 temporal effect Effects 0.000 claims 1
- 241001233887 Ania Species 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
;54) СПОСОБ ОПРЕДЕЛЕНИЯ ПАРАМЕТРОВ ЦЕПИ КОРОТКОГО ЗАГ/1Ы1 :АНИЯ; 54) METHOD FOR DETERMINING THE PARAMETERS OF THE SHORT CABLE / 1S1 CHAIN: ANIA
1one
Изобретение относитс к электроизмерительной технике и может быть использовано при создании устройств дл определени параметров цепи короткого замыкани , например в электрических сет х напр жением 0,4 кВ.The invention relates to electrical measuring equipment and can be used to create devices for determining parameters of a short circuit, for example, in electric networks with a voltage of 0.4 kV.
Известен способ определени параметров цепи короткого замыкани 111.A known method for determining the parameters of a short circuit 111.
Недостатком известного способа вл етс низка точность, обусловленна вли нием переходных процессов.The disadvantage of this method is low accuracy due to the influence of transients.
Наиболее близким пр технической сущности к предлагаемом вл етс способ, включающий подачу испытательного синусоидального импульса напр жени с временным усечением переднего фронта и измерение максимального значени тока короткого замыкани 12.The closest pr technical entity to the present invention is a method that includes supplying a test sinusoidal voltage pulse with a time truncation of the leading edge and measuring the maximum value of the short circuit current 12.
Недостатком известного способа также вл етс невысока точность, обусловленна неполной компенсацией апериодической составл клцей измер емого тока.The disadvantage of this method is also low accuracy, due to incomplete compensation of the aperiodic composition of the measured current.
Цель изобретени - повьЛаение точности .The purpose of the invention is to improve accuracy.
Поставленна цель достигаетс тем, что в способе определени параметров цепи короткого зa ыкaни , включающем воздействие испытательным синусоидальным импульсом напр жени с временным The goal is achieved by the fact that in the method of determining the parameters of a short circuit circuit, including the impact of a test sinusoidal voltage pulse with a temporary
усечением переднего фронта и измерение максимального значени тока короткого замыкани , воздействуют дополнительным испытател.ьным синусоидальным импульсом напр жени с други временным усечением переднего фронта измер ют максимальное значение тока короткого замыкани одновременно с измерением максимального значени тока короткого зa икaни , вызванного основным испытательным синусоидальным импульсом напр жени с временным усечением переднего фронта, рассчитывают зависимости максимальных токов от величины активного и индуктивного сопротивлений цепи короткого Эс1мыкани , по которым определ ют параметры цепи короткого замыкани .By truncating the leading edge and measuring the maximum value of the short circuit current, an additional test sinusoidal voltage pulse is applied with another time cutting of the leading edge to measure the maximum value of the short circuit current simultaneously with the measurement of the maximum value of the short circuit current caused by the main test sinusoidal voltage pulse with time truncation of the leading edge, the dependencies of the maximum currents on the magnitude of the active and inductance are calculated the apparent resistance of the short ES1 circuit, which are used to determine the parameters of the short circuit.
На фиг. 1 представлена зависимост испытательного напр жени U(t) и переходного тока 1кз() ° времени t; на фиг. 2 - номограмма значений максимумов токов короткого замыкани дл различных значений индуктивного х и активного г сопротивлений , характерных дл электрических сетей напр жением 0,4 кВ.FIG. Figure 1 shows the dependence of the test voltage U (t) and transient current 1kz () ° time t; in fig. 2 is a nomogram of the values of the short-circuit current maxima for various values of inductive x and active resistance, characteristic for electrical networks with a voltage of 0.4 kV.
Claims (2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU792746027A SU815683A1 (en) | 1979-04-03 | 1979-04-03 | Method of determining short-circuiting circuit parameters |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU792746027A SU815683A1 (en) | 1979-04-03 | 1979-04-03 | Method of determining short-circuiting circuit parameters |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU815683A1 true SU815683A1 (en) | 1981-03-23 |
Family
ID=20819222
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU792746027A SU815683A1 (en) | 1979-04-03 | 1979-04-03 | Method of determining short-circuiting circuit parameters |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU815683A1 (en) |
-
1979
- 1979-04-03 SU SU792746027A patent/SU815683A1/en active
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