TH35528A - Methods and equipment for planar radiography and radiation detectors - Google Patents

Abstract

DC60 (22/01/42) Methods and instruments for radiography and, in particular, for planar radiography and instruments for the measurement of incident radiation. In the methods and instruments, X-rays (9) are emitted from an X-ray source (60), the X-rays are arranged into a planar beam and passed through the object to be imaged (62), and the X-rays passed through the aforementioned object (62) are measured in a detector (64). The detector (64), which measures the incident radiation, is housed in a parallel-plate gas avalanche chamber and consists of electrodes arranged between regions where a potential difference is applied to create an electric field, which causes the electron-ionic avalanche of primary and secondary ionization electrons to be released by the incident radiation. The detector (64) is oriented relative to Incident radiation (9) thus enters laterally between plates parallel to the first and second plates, between the region where the electric field is created. The electrical signal induced by the electron-ion avalanche described above is measured at least in one electrode, incorporating a number of detector electrodes arranged in close proximity, each in a direction truly parallel to the incident radiation. The signal from each detector electrode is processed in electronic circuitry to obtain values for each pixel corresponding to each detector electrode. Methods and instruments for radiography and, in particular, for planar radiography and instruments for measuring incident radiation. In these methods and instruments, X-rays (9) are emitted from an X-ray source.

Claims (1)

1. Methods for obtaining better virtual images in radiography. By planar beam, wherein - X-rays are emitted from an Xtag source: