TR201719203A2 - Bi̇r elektroni̇k ci̇hazin test edi̇lmesi̇ne yöneli̇k tekni̇k - Google Patents

Bi̇r elektroni̇k ci̇hazin test edi̇lmesi̇ne yöneli̇k tekni̇k Download PDF

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Publication number
TR201719203A2
TR201719203A2 TR2017/19203A TR201719203A TR201719203A2 TR 201719203 A2 TR201719203 A2 TR 201719203A2 TR 2017/19203 A TR2017/19203 A TR 2017/19203A TR 201719203 A TR201719203 A TR 201719203A TR 201719203 A2 TR201719203 A2 TR 201719203A2
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TR
Turkey
Prior art keywords
electronic device
simulator
testing
function
technique
Prior art date
Application number
TR2017/19203A
Other languages
English (en)
Inventor
Öcal Ömür
Şahi̇n Gebi̇zli̇ Ceren
Original Assignee
Vestel Elektronik Sanayi Ve Ticaret Anonim Sirketi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Vestel Elektronik Sanayi Ve Ticaret Anonim Sirketi filed Critical Vestel Elektronik Sanayi Ve Ticaret Anonim Sirketi
Publication of TR201719203A2 publication Critical patent/TR201719203A2/tr

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

Mevcut açıklama, özelikle bir televizyon olmak üzere bir elektronik cihazın (102) test edilmesine yönelik bir simülatör (100) ile ilgilidir. Simülatör (100) elektronik cihaza (102) bağlanabilmektedir ve en az bir işlemci ve en az bir bellek içermektedir, burada en az bir bellek, simülatörün (100) elektronik cihazın (102) en az bir fonksiyonunu simüle etmek, elektronik cihazdan (102) elektronik cihaz (102) tarafından en az bir fonksiyonun gerçekleştirilmesinin bir sonucunu almak ve elektronik cihaz (102) tarafından en az bir fonksiyonun gerçekleştirilmesinin bir sonucunu simülatör (100) tarafından en az bir fonksiyonun simüle edilmesinin bir sonucu ile karşılaştırmak üzere çalıştırılabileceği şekilde en az bir işlemci tarafından yürütülebilir talimatları içermektedir.
TR2017/19203A 2017-09-14 2017-11-30 Bi̇r elektroni̇k ci̇hazin test edi̇lmesi̇ne yöneli̇k tekni̇k TR201719203A2 (tr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP17191084.7A EP3457284A1 (en) 2017-09-14 2017-09-14 Technique for testing an electronic device

Publications (1)

Publication Number Publication Date
TR201719203A2 true TR201719203A2 (tr) 2019-03-21

Family

ID=59858981

Family Applications (1)

Application Number Title Priority Date Filing Date
TR2017/19203A TR201719203A2 (tr) 2017-09-14 2017-11-30 Bi̇r elektroni̇k ci̇hazin test edi̇lmesi̇ne yöneli̇k tekni̇k

Country Status (3)

Country Link
EP (1) EP3457284A1 (tr)
TR (1) TR201719203A2 (tr)
WO (1) WO2019052977A1 (tr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115002547B (zh) * 2022-08-01 2024-03-26 北京智象信息技术有限公司 一种用于模拟智能电视环境开发的模拟器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6185732B1 (en) * 1997-04-08 2001-02-06 Advanced Micro Devices, Inc. Software debug port for a microprocessor
US6684169B2 (en) * 2001-06-29 2004-01-27 Teradyne, Inc. Facilitating comparisons between simulated and actual behavior of electronic devices
US7606695B1 (en) * 2003-09-30 2009-10-20 Sun Microsystems, Inc. Self-checking simulations using dynamic data loading
KR102025694B1 (ko) * 2012-09-07 2019-09-27 삼성전자 주식회사 재구성 가능한 프로세서의 검증 방법

Also Published As

Publication number Publication date
EP3457284A1 (en) 2019-03-20
WO2019052977A1 (en) 2019-03-21

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