TW200410331A - System and method for the manufacture of surgical blades - Google Patents

System and method for the manufacture of surgical blades Download PDF

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Publication number
TW200410331A
TW200410331A TW92109342A TW92109342A TW200410331A TW 200410331 A TW200410331 A TW 200410331A TW 92109342 A TW92109342 A TW 92109342A TW 92109342 A TW92109342 A TW 92109342A TW 200410331 A TW200410331 A TW 200410331A
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TW
Taiwan
Prior art keywords
crystalline material
blade
cutting
wafer
cut
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TW92109342A
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Chinese (zh)
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TWI281712B (en
Inventor
Joseph F Keenan
Vadim M Daskal
James J Hughes
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Becton Dickinson Co
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Priority claimed from US10/383,573 external-priority patent/US7105103B2/en
Application filed by Becton Dickinson Co filed Critical Becton Dickinson Co
Publication of TW200410331A publication Critical patent/TW200410331A/en
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Publication of TWI281712B publication Critical patent/TWI281712B/en

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  • Laser Beam Processing (AREA)

Abstract

A method for manufacturing surgical blades from either a crystalline or poly-crystalline material, preferably in the form of a wafer, is disclosed. The method includes preparing the crystalline or poly-crystalline wafers by mounting them and machining trenches into the wafers. The methods for machining the trenches, which form the bevel blade surfaces, include a diamond blade saw, laser system, ultrasonic machine, and a hot forge press. The wafers are then placed in an etchant solution which isotropically etches the wafers in a uniform manner, such that layers of crystalline or poly-crystalline material are removed uniformly, producing single or double bevel blades. Nearly any angle can be machined into the wafer which remains after etching. The resulting radii of the blade edges is 5-500 nm, which is the same caliber as a diamond edged blade, but manufactured at a fraction of the cost.

Description

200410331 玖、發明說明 : 、…'.…-…····—— ....... " ;·: . . . '. ' . . " . ,: (發明說_翻:侧腿之麵纖、先纖術,容、鶴方式湖式簡單說明) 相關申請案之對照 2002年3月11日申請之美國臨時專利申請案第 60 / 3 62,999號及200 2年12月3日申請之第6〇/43〇,332 號等兩案已揭露相關主題。該兩案之整個內容皆已藉参考 方式倂入本案中。 (一)發明所屬之技術領域 本發明係有關於一種製造外科用器具的系統及方法。 更明確地,本發明係有關於一種以矽及其他結晶材料來製 造具外科品質之刀片的系統及方法。 現存之外科用刀片可由多種方法製造,且每--方法皆 具有其特定之優點及缺點。最常見之製造方法係機械式地 硏磨不鏽鋼。接著再搪磨(經由譬如超音波泥漿硏磨、機械 磨触(abrasion)及磨光(lapping)等各種不同方法)、或電 化學地拋光刀片,以達成一鋒利刀刃。該等方法之優點在 於可作大量製.作拋棄式刀片之經濟製程。該等製程之最大 缺點在於,刀刃之品質會變動。亦即欲達成良好之鋒利度 一致性仍爲一大挑戰。這主要係因爲製程本身之固有限制 。刀片刀刃之半徑仍可介於30奈米至1000奈米之間。 一較新的刀片製造方法係運用壓模印(c 〇 i n i n g )不鏽鋼 來取代硏磨者。接著再作電化學拋光刀片,以達成一鋒利 一 6 - 200410331 之刀刃。已發現到,本製程較硏磨方法更爲經仏。亦發現 到,亦可製作出具有較佳鋒利度一致性之刀片。本方法之 缺點在於,其鋒利度一致性仍較鑽石刀片製造程序所達成 者差。基於金屬刀片拋棄式之成本及改良的品質’目前在 軟組織外科中已普遍使用。 鑽石刀片之鋒利度在許多外科市場中仍屬金質標準’ 特別在眼睛外科中尤然。已知鑽石刀片能夠以最小的組織 阻力來乾淨俐落地切割軟組織。亦由於可在一次又一次之 切割後仍具有一致的鋒利度,因此一般皆要求使用鑽石刀 片。由於金屬刀片之極限鋒利度及鋒利度變異性遜色於鑽 石者,因此大多數之外科醫生係使用鑽石刀片。用於製作 鑽石刀片之製造程序係運用一磨光製程來達到一銳利地鋒 利度及一致的刀刃半徑。最終之刀片刀刃半徑係介於5奈 米至30奈米之間。本製程之缺點在於速度慢,且直接使這 種鑽石刀片之製造成本介於美金500至5000元。因此,這 種刀片係販賣至可重複使用之應用場合中。目前這種製程 係用於譬如紅寶石及藍寶石等較不硬之材料上,以藉較低 之成本達成相等之硬度。然而’儘管紅寶石及/或藍寶石外 科用品質之刀片較鑽石者便宜,但其仍具有缺點,即介於 美金50至5000元之較高製造成本、以及其刀刃僅可持續 使用大約兩百次。因此這種刀片係販賣至可重複使用及有 限度重複使用之應用場合。 已有一些關於使用矽來製造外科用刀片之提案。然而 ,在某一或其他型式中,這些製程將受限於其製造各種不 一 7 - 200410331 同結構之刀片、及以拋棄式成本來製造的能力。許多的矽 質刀片專利皆係以各向異性蝕刻矽爲基礎。各向異性蝕刻 製程中之蝕刻具有高度方向性,其中不同方向上之蝕刻速 率係互不相同。這種製程將可製造一鋒利的切割刀刃。然 而,基於該製程之本質,這將因可達成之刀片外型及內含 斜角所限制。譬如運用氫氧化鉀(Κ0Η )、乙二胺/鄰苯二酚 (EDP)、及氫氧化三甲基-2-羥乙基銨(TMAH)浴等之濕式表 體各向異性蝕刻製程,係沿著一特殊結晶面蝕刻,以達成 一鋒利刀刃。典型地爲矽<100>中之(1 1 1 )平面的該平面, 係自矽晶圓之表面平面傾斜54 . 7°。這將生成具有54 . 7°之 一內含斜角的一刀片,已發現該斜角對於大多數之外科應 用而言係過鈍而在臨床上無法接受。這種應用例在當該技 術應用於製作雙斜面刀片、該內含斜角爲109.4°時將更差 。該製程更進一步地係限制於其可製成之刀片輪廓。晶圓 中之蝕刻平面係配置成互相夾90°。因此,僅可製作出具有 矩形輪廓之刀片。 是以,亟需製造出一種可對付上述方法中之缺點的刀 片。本發明之系統及方法可藉不鏽鋼方法之拋棄式成本來 製作出具有鑽石刀片鋒利度之刀片。此外,本發明之系統 及方法將可大量地且藉嚴密製程控制來製作刀片。 (三)發明內_ 本發明可克服上述缺點且實現眾多優點,且本發明係 有關—種由譬如砂等一^結晶或多結晶材料來製造外科用 刀片的系統及方法,其中該系統及方法係藉由各種裝置而 一 8 - 200410331 在一結晶或多結晶中切削出溝渠以達成所需之斜角或刀片 架構。再將該業已切削之結晶或多結晶晶圓浸漬於一等向 性鈾刻溶液中,而該溶液係均勻地移除一層又一層之晶圓 材料分子,以形成具有均勻半徑、及可滿足軟組織外科應 用所需之充份品質的一切割刀刃。本發明之系統及方法係 提供一種用於製造這種高品質外科用刀片之極便宜的裝置 因此,本發明之一目的係提供一種製造外科用刀片的 方法’其步驟包括固定一矽或其他材質之結晶或多結晶晶 圓於一固定總成上、在該結晶或多結晶晶圓之〜第一側上 切削出一個或更多溝渠、蝕刻該結晶或多結晶晶圓第一側 以形成一個或更多外科用刀片、分離該等外科用刀片、及 組立該等外科用刀片。 本發明之又一目的係提供一種製造外科用刀片的方法 其步驟包括固定一結晶或多結晶晶圓於一固定總成上、 在該結晶或多結晶 渠、塗佈該結晶或 成卸除該結晶或多 第〜側再次固定於 圔之一第二側、倉虫 個或更多外科用刀 外科用刀片。 晶圓之一第一側上切 多結晶晶圓第一側一 結晶晶圓、以及將該 該固定總成上、切削 刻該結晶或多結晶晶 片、分離該等外科用 削出〜個或更多溝 塗覆、自該固定總 結晶或多結晶晶圓 該結晶或多結晶晶 圓第二側以形成一 刀片、及組立該等 法 本發明之又一目的係提供—種製造外科用刀片的方 其步驟包括固定〜結晶或多結晶晶圆 固定總成上 -9 一 200410331 、在該結晶或多結晶晶圓之一第一側上切削出一個或更多 溝渠、自該固定總成卸除該結晶或多結晶晶圓、以及將該 結晶或多結晶晶圓第一側再次固定於該固定總成上、切削 該結晶或多結晶晶圓之一第二側、鈾刻該結晶或多結晶晶 圓第二側以形成一個或更多外科用刀片、將該結晶或多結 晶材料之一層轉換而形成一硬化表面、分離該等外科用刀 片、及組立該等外科用刀片。 (四)實施方式 現在將參考圖式來說明較佳具體實施例之各種特徵, 其中相同之部件係以同樣之參考符號識別。以下對目前考 慮之本發明最佳實施模式所作的說明並無限制之意,而僅 用於描述本發明之一般性原理。 本發明之系統及方法係用於製造切開軟組織所需之外 科用刀片。儘管較佳具體實施例係顯示爲一外科用刀片, 但亦可依據將在以下作詳細討論之方法來製作多種切割裝 置。因此’熟知此項技藝之人士將可明白,儘管在整個討 論中皆參照「外科用刀片」,但亦可製作包括譬如醫療用 剃刀、抹刀、注射針、採樣套管、及其他醫療用尖銳物等 多種其他型式之切割裝置。 可用於製造該刀片之較佳基材係具有一較佳結晶方位 的結晶矽。然而,其他的矽方位,以及可等向性地蝕刻之 其他材料仍屬適當者。譬如,亦可使用方位爲<11〇>及<111> 之矽晶圓,以及摻雜至不同電阻率及含氧水準之矽晶圓。 亦可使用譬如氮化砂及神化錄等其他材料之晶圓。晶圓型 -10 - 200410331 式i係該基材> /+ ΤΤ·.. 又土 土態。除了結晶材料以外,亦可使用多 ”曰曰材料來製造外科用刀片。這種多結晶材料之範例包括 多結晶砂。請了解到,此中較「結晶」-詞係指結晶 與多結晶材料兩者。 因此,熟知此項技藝之人士將可明白,儘管整個討論 白^ ;、、、砂日日圓」’但在依據本發明之各具體實施例中 1使用具有各種不同方位之任何前述材料,以及可取得 之其他適當材料及方位。 第1圖係顯示依據本發明之一第一具體實施例,用於 由矽來製造一雙斜面外科用刀片的方法。第丨圖、第2圖 、及第3圖係大致說明依據本發明來製造矽質外科用刀片 的製fe。然而,第丨圖、第2圖、及第3圖中所示之方法 的步驟順序係可改變,以生成具有不同標準之矽質外科用 刀片、或符合不同的製造環境。因此,這意味著第丨圖、 第2圖、及第3圖所示之方法,可代表依據本發明之普通 具體貫施例,其中具有包括了相同步驟且可製成依據本發 明精神及範圍之一矽質外科用刀片的眾多不同變更。 第1圖之方法係依據本發明之一具體實施例,用於較 佳地以譬如矽等一結晶材料來製造一雙斜面外科用刀片, 且該方法係自步驟1 002開始。在步驟ι〇〇2中,該砍晶圓 係固定於固定總成204上。在第4圖中係顯示出,矽晶圓 2 0 4固疋於一晶圓框架/紫外線膠帶總成(固定總成)2 〇 $上 。固定總成2 0 4係在半導體產業中,用於輸運矽晶圓材料 之一通用方法。熟知此項技藝之人士將可理解到,在依據 200410331 本發明較佳具體實施例製造外科用刀片時,並非必須將矽( 結晶)晶圓2 0 2固定至一晶圓固定總成2 0 4。 第5圖係以側視圖(左側或右側;其呈對稱,但並非必 須如此)來顯不固定於相同固定總成2 0 4上之同一砂晶圓 202。在第5圖中,矽晶圓202係固定於膠帶308上,而該 膠帶再接著固定於固定總成204上。砂晶圓202具有一第 一側3 04及一第二側306。 請再次參考第1圖,決策步驟1 〇 〇 4係跟隨於步驟1 〇 〇 2 之後。決策步驟1 0 0 4係決定,是否有必要在步驟1 〇 〇 6中 將一選擇性之預切割製於矽晶圓2 0 2中。如第6圖所示, 可藉由一雷射水噴注402來實施該預切割。第6圖中係顯 示出,雷射水噴注402係將雷射光束404導引至矽晶圓202 上,而該砍晶圓係固定於固定總成2 0 4上。可由第6圖中 看出,藉由雷射光束4 0 4對矽晶圓2 0 2之衝擊,將可在矽 晶圓202中生成各種不同之預切割孔洞(或貫穿孔基準)4〇6 〇 藉由雷射光束4 0 4施加至矽晶圓2 0 2上,將得以熔散 矽晶圓202。雷射光束404熔散矽晶圓202之能力係與雷 射之波長λ有關。在使用一矽晶圓之較佳具體實施例中, 可產生最佳結果之該波長係1064奈米,其典型地可由一 |乙 鋁石榴石(YAG )雷射提供,但亦可使用其他型式之雷射。倘 若使用一不同的結晶或多結晶材料,則其他的波長及雷射 型式將更爲適當。 最終之貫穿孔基準406 (可藉這種方式切割出複數個孔 200410331 洞)可作爲切削溝渠之導引(以下將相關於步驟1008作詳細 說明),特別當使用一晶粒切割鋸條來切削溝渠時尤然。亦 可爲了相同目的而藉任何雷射光束(譬如一準分子雷射或雷 射水噴注(laser waterjet)402)來切割出貫穿孔基準406 。預切割之貫穿孔基準典型地係切割成一加號「+」或一圓 形外型。然而,貫穿孔基準外型之選擇係由特定製造工具 及環境所指示’因此無需以上述兩外型爲限。 除了利用一雷射光束來預切割貫穿孔基準以外,亦可 使用其他的機械切削方法。其包括、但並非限於譬如鑽孔 工具、機械硏磨工具、及一超音波切削工具1 〇〇。儘管使 用該等裝置對於本發明較佳具體實施例而言係屬新穎,然 而熟知此項技藝之人士應已熟知該等裝置及其一般性的運 用。 可在切削溝渠之前對矽晶圓202實施預切割,以使矽 晶圓2 0 2可在蝕刻製程期間保持其完整性而不致分割。一 雷射光束(譬如一雷射水噴注4 0 2或準分子雷射)可用於形 成晶粒切割刀片5 0 2所需之渦狀橋圓形貫穿孔溝槽(這將參 考第7A圖至第7C圖作詳細討論),以開始在矽晶圓中、其 周邊內切削溝渠。用於生成該等貫穿孔基準之機械切割裝 置及方法(如上所討論者)亦可用於生成該等貫穿孔溝槽。 請再次參考第1圖,次一個步驟係步驟1008,且可跟 隨於步驟1 0 0 6 (倘若貫穿孔基準4 0 6係切割入矽晶圓2 0 2 中)、或步驟1002及1004之後’其中該步驟1〇〇2爲矽晶 圓固定步驟(「步驟」1004並非一實體製造步驟;該等決 -13- 200410331 策步驟皆包括於其中已顯示出整個製造程序及其變型)。在 步驟1 008中係將溝渠切削入矽晶圓2〇2之第一側3〇4中。 可根據製造條件、及矽質外科用刀片成品所需之設計,而 使用各種切削溝渠之方法。 該等切削方法可運用一晶粒切割鋸條、雷射系統、及 一超音波切削工具或一熱鍛製程。亦可使用其他的切削方 法。以下將依序對每一種作討論。藉由任一種該等方法切 削出溝渠,皆可提供外科用刀片傾角(斜角)。當溝渠切削 在矽晶圓202上實施時,可依晶粒切割鋸條之外型、準分 子雷射所形成之圖案、或一超音波切削工具所形成之圖案 來移除矽材料,以形成該外科用刀片運作時所需之外型。 在晶粒切割鋸條之情況下,該矽質外科用刀片將僅具有筆 直的刀刃;而在後兩種方法中,該刀片大體上可爲任何所 需外型。在熱鍛製程之情況下,係加熱該矽晶圓以使其具 有延展性,再於兩模具之間壓印,其中每一該兩模具皆具 有待「模製」入該加熱、具延展性之矽晶圓中的需求溝渠 三維型態。爲了方便討論,「切削」溝渠包含可在一矽晶 圓中製造出溝渠的所有方法,其包括藉由一晶粒切割鋸條 、準分子雷射、超音波機、或一熱鍛製程所達成之以上特 別提及者、及尙未提及的等效方法。現在將詳細討論這些 切削方法。 第7A圖至第7D圖係顯示依據本發明之一具體實施例 ,用於在一矽晶圓中切削溝渠之晶粒切割鋸條的架構。在 第7A圖中,一第一晶粒切割鋸條5 0 2係表現出傾角Φ,且 -14- 200410331 該傾角大體上係該外科用刀片在整個製造程序完成 終傾角。第7B圖則係顯示具有兩傾斜切割表面,且 割表面皆表現出一切口傾角φ的一第二晶粒切割鋸伯 第7 C圖係顯示出第三晶粒切割鋸條5 0 6,其亦具有 角Φ ’但具有與第一晶粒切割鋸條502略微不同之 。第7D圖係顯示出具有如同第7B圖者一般地傾斜 斜切割表面的一第四晶粒切割鋸條5 0 8,且其中每 表面皆表現出一切口傾角Φ。 儘管第7A圖至第7D圖中所顯示之晶粒切割鋸 、504、5 06、及508皆具有相同的切口傾角Φ,然 此項技藝之人士將可明白,不同用途的矽質基材外 片可具有互相不同之切口傾角。此外,一單一 ΐ夕質 刀片可具有包括了不同傾角之不同切割刀刃,這將 中討論。第二晶粒切割鋸條504可提高製造一特殊 矽質基材外科用刀片時的生產力,或用於製作具有 個切割刀刃的矽質外科用刀片。以下將參考第20A 20G圖來詳細討論各種刀片之設計範例。在本發明 佳具體實施例中,該晶粒切割鋸條將爲一鑽石粒鋸f! 一特殊晶粒切割鋸條係用於在矽晶圓202之第-中切削溝道。該晶粒切割鋸條之組成成份係經過特 ,以提供最佳的最終表面處理且同時維持可接受的 命。該晶粒切割鋸條之刀刃係成型爲具有一輪廓, 將在矽晶圓202中成型最終溝道。該外型將與最終 面架構相關聯。譬如,外科用刀片中,單斜面刀片 後之最 每一切 ;504 ° 切口傾 一架構 之兩傾 一切割 條5 02 而熟知 科用刀 外科用 在以下 設計之 —* 一卜 —-一或二 圖至第 之一較 I ° •側 304 別選擇 磨耗壽 該輪廓 刀片斜 者典型 -15- 200410331 地包括介於15°至45°範圍內之斜面角度,而雙斜面刀片者 則包括介於1 5°至45°範圍內之斜面角度的一半。關於蝕刻 條件來選定一晶粒切割鋸條時,將可提供精密的斜角控制 〇 第8圖係顯示依據本發明之一具體實施例,一晶粒切 割鋸條貫穿固定於支持背墊上之一矽晶圓時的動作。第8 圖係顯示一晶粒切割鋸條機正在矽晶圓202第一側3 04中 切削溝渠時之動作。在本範例中,第7A圖至第7D圖中之 任一種晶粒切割鋸條(5 0 2、5 0 4、5 0 6、或5 0 8 )皆可用於生 成該矽質基材外科用刀片刀刃。應了解到,第7A圖至第7D 圖中之刀片架構並非唯一可用於生成晶粒切割鋸條的架構 。第9圖係顯示依據本發明之一具體實施例,用於在膠帶 式固定之一矽晶圓中切削一溝渠之一晶粒切割鋸條的剖面 圖。第9圖係顯示出相同於第8圖所示之晶粒切割鋸條已 實際穿透矽晶圓2 0 2時之密合的剖面圖。可由圖式中看出 ,晶粒切割鋸條502並未完全貫通矽晶圓202,而對於一 單斜面切割而言,僅穿透矽晶圓202厚度之大約50至90% 。這可應用於切削(或藉由熱鍛達成之模製)一單斜面溝渠 。對於藉任何一晶粒切割鋸條、或任何一種切削方法達成 之一雙斜面切割而言,可自矽晶圓202每一側上切削掉(或 模製)矽晶圓202厚度之大約25至49%。第10A圖與第10B 圖係分別顯示出’依據本發明之一具體實施例製成之具有 一單斜面切glj刀刃的一砍質外科用刀片、與具有一雙斜面 切割刀刃的一砂質外科用刀片。 -16- 200410331200410331 发明, description of the invention: ...'....-... ··· ——............ ";::.. '.'.. &Quot;. Facial fiber, fibrillation on the side legs, and the simple description of the lake and the crane method) Comparison of related applications U.S. Provisional Patent Application Nos. 60/3 62,999 filed on March 11, 2002 and December 2, 2002 3 Relevant themes have been revealed in two cases, such as Japanese Application No. 60 / 43〇, 332. The entire contents of the two cases have been incorporated into the case by reference. (I) Field of the Invention The present invention relates to a system and method for manufacturing surgical instruments. More specifically, the present invention relates to a system and method for making surgical-quality blades from silicon and other crystalline materials. Existing surgical blades can be manufactured by a variety of methods, each of which has its specific advantages and disadvantages. The most common manufacturing method is honing stainless steel mechanically. Then honing (via various methods such as ultrasonic mud honing, mechanical abrasion and lapping), or polishing the blade electro-chemically to achieve a sharp blade. The advantage of these methods is that they can be made in large quantities. They are economical processes for disposable blades. The biggest disadvantage of these processes is that the quality of the blade changes. In other words, achieving good sharpness consistency is still a big challenge. This is mainly due to the inherent limitations of the process itself. The radius of the blade can still be between 30nm and 1000nm. A newer blade manufacturing method uses stamped (coinn) stainless steel to replace the honer. Then the electrochemical polishing blade was made to achieve a sharp edge. It has been found that this process is more sophisticated than the honing method. It has also been found that blades with better sharpness consistency can also be made. The disadvantage of this method is that its sharpness consistency is still worse than that achieved by the diamond blade manufacturing process. Cost and improved quality based on metal blade disposables are now commonly used in soft tissue surgery. The sharpness of diamond blades is still the gold standard in many surgical markets ’, especially in eye surgery. Diamond blades are known to cut soft tissue cleanly and with minimal tissue resistance. It is also generally required to use diamond blades because they can still have a consistent sharpness after being cut again and again. Since the extreme sharpness and variability of sharpness of metal blades are inferior to those of diamonds, most surgeons use diamond blades. The manufacturing process used to make diamond blades uses a polishing process to achieve a sharp sharpness and a consistent blade radius. The final blade radius is between 5nm and 30nm. The disadvantage of this process is that it is slow and directly makes the manufacturing cost of this diamond blade between US $ 500 and 5000. Therefore, this blade is sold for reusable applications. This process is currently used on less rigid materials such as ruby and sapphire to achieve equal hardness at a lower cost. However, although ruby and / or sapphire surgical quality blades are cheaper than diamonds, they still have disadvantages, that is, the high manufacturing cost between US $ 50 to 5,000, and their blades can only be used about 200 times. Therefore, these blades are sold for reusable and limited reuse applications. There have been proposals for using silicon to make surgical blades. However, in some or other types, these processes will be limited by their ability to manufacture a variety of blades of the same structure and to manufacture at disposable cost. Many silicon blade patents are based on anisotropically etched silicon. The etching in the anisotropic etching process is highly directional, in which the etching rates in different directions are different from each other. This process will produce a sharp cutting edge. However, due to the nature of the process, this will be limited by the achievable blade shape and the included bevel. For example, wet surface anisotropic etching process using potassium hydroxide (K0Η), ethylenediamine / catechol (EDP), and trimethyl-2-hydroxyethylammonium hydroxide (TMAH) bath, etc. It is etched along a special crystal plane to achieve a sharp blade. This plane, which is typically the (1 1 1) plane of silicon < 100 >, is inclined 54.7 ° from the surface plane of the silicon wafer. This will result in a blade with an included bevel of 54.7 °, which has been found to be too blunt for most surgical applications to be clinically unacceptable. This application example is even worse when the technology is used to make a double beveled blade with an included bevel angle of 109.4 °. This process is further limited to the blade profiles it can make. The etched planes in the wafer are arranged at 90 ° to each other. Therefore, only blades with a rectangular outline can be made. Therefore, there is an urgent need to produce a blade which can cope with the disadvantages of the above method. The system and method of the present invention can make a blade with sharpness of a diamond blade by using the disposable cost of the stainless steel method. In addition, the system and method of the present invention will be able to make blades in large numbers and by tight process control. (3) Inside the invention _ The invention can overcome the above disadvantages and achieve many advantages, and the invention relates to a system and method for manufacturing surgical blades from a crystalline or polycrystalline material such as sand. The system and method It is through various devices that a groove is cut in a crystal or polycrystal to achieve the required bevel or blade structure. The crystalline or polycrystalline wafer that has been cut is immersed in an isotropic uranium engraving solution, and the solution uniformly removes layer after layer of wafer material molecules to form a uniform radius and satisfy soft tissue A cutting edge of sufficient quality for surgical applications. The system and method of the present invention provide an extremely inexpensive device for manufacturing such a high-quality surgical blade. Therefore, an object of the present invention is to provide a method of manufacturing a surgical blade. The steps include fixing a silicon or other material The crystalline or polycrystalline wafer is on a fixed assembly, one or more trenches are cut out on the first side of the crystalline or polycrystalline wafer, and the first side of the crystalline or polycrystalline wafer is etched to form a Or more surgical blades, separating the surgical blades, and assembling the surgical blades. Another object of the present invention is to provide a method for manufacturing a surgical blade, the steps of which include fixing a crystalline or polycrystalline wafer to a fixed assembly, coating the crystalline or polycrystalline channel in the crystalline or polycrystalline channel, and removing the The crystal or multiple sides are again fixed to one of the pupae, the second side, the worm, or more surgical blades. A polycrystalline wafer is cut on the first side of one of the wafers, and a crystalline wafer is cut on the first side of the wafer, and the fixed assembly is cut, the crystalline or polycrystalline wafer is cut, and the surgical cuts are separated by one or more Multi-groove coating, fixing a second crystallized or polycrystalline wafer from the second side of the crystallized or polycrystalline wafer to form a blade, and assembling the methods. Another object of the present invention is to provide a method for manufacturing a surgical blade. The steps include fixing ~ crystalline or polycrystalline wafer fixing assembly-9 200410331, cutting one or more trenches on the first side of one of the crystalline or polycrystalline wafers, and removing from the fixing assembly. The crystalline or polycrystalline wafer, and fixing the first side of the crystalline or polycrystalline wafer to the fixing assembly again, cutting one of the crystalline or polycrystalline wafers on the second side, and engraving the crystalline or polycrystalline wafer The second side of the wafer forms one or more surgical blades, converts one layer of the crystalline or polycrystalline material to form a hardened surface, separates the surgical blades, and assembles the surgical blades. (IV) Embodiments Various features of the preferred embodiment will now be described with reference to the drawings, in which the same components are identified by the same reference symbols. The following description of the presently considered best mode of implementation of the present invention is not intended to be limiting, and is only used to describe the general principles of the present invention. The system and method of the present invention are used to make surgical blades needed to cut soft tissue. Although the preferred embodiment is shown as a surgical blade, various cutting devices can be made according to methods that will be discussed in detail below. Therefore 'Persons familiar with the art will understand that although reference is made throughout the discussion to "surgical blades", it is also possible to make, for example, medical razors, spatulas, injection needles, sampling cannulas, and other medical sharp And other various types of cutting devices. A preferred substrate that can be used to make the blade is crystalline silicon with a preferred crystal orientation. However, other silicon orientations and other materials that can be etched isotropically are still appropriate. For example, silicon wafers with orientations < 11〇 > and < 111 >, and silicon wafers doped with different resistivities and oxygen-containing levels can also be used. Wafers made of other materials, such as nitrided sand and apocalypse, can also be used. Wafer type -10-200410331 The type i is the substrate > / + ΤΤ · .. and the soil state. In addition to crystalline materials, poly "materials can also be used to make surgical blades. Examples of such polycrystalline materials include polycrystalline sand. Please understand that the more" crystalline "here refers to crystalline and polycrystalline materials Both. Therefore, those skilled in the art will understand that, although the entire discussion is white ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, "' Other appropriate materials and orientations obtained. Fig. 1 shows a method for manufacturing a double-beveled surgical blade from silicon according to a first embodiment of the present invention. Figs. 丨, 2 and 3 are diagrams schematically illustrating the manufacturing of silicon surgical blades according to the present invention. However, the order of the steps of the method shown in Figures 1, 2, and 3 can be changed to produce silicon surgical blades with different standards, or to meet different manufacturing environments. Therefore, this means that the methods shown in Figs. 1, 2, and 3 can represent the general specific embodiments according to the present invention, which have the same steps and can be made according to the spirit and scope of the present invention. One of many different changes to a silicon surgical blade. The method of FIG. 1 is based on a specific embodiment of the present invention, and is used to better manufacture a double-beveled surgical blade from a crystalline material such as silicon, and the method starts from step 002. In step ι02, the chopped wafer is fixed on the fixed assembly 204. It is shown in Fig. 4 that the silicon wafer 204 is fixed on a wafer frame / ultraviolet tape assembly (fixing assembly) of 200 Å. Fixed assembly 204 is a common method used in the semiconductor industry to transport silicon wafer materials. Those skilled in the art will understand that when manufacturing a surgical blade according to the preferred embodiment of the 200410331, it is not necessary to fix the silicon (crystal) wafer 2 0 2 to a wafer fixing assembly 2 4 . Figure 5 is a side view (left or right; it is symmetrical, but not necessarily so) to show the same sand wafer 202 fixed on the same fixed assembly 204. In FIG. 5, the silicon wafer 202 is fixed on the adhesive tape 308, and the adhesive tape is then fixed on the fixing assembly 204. The sand wafer 202 has a first side 304 and a second side 306. Please refer to Figure 1 again. The decision step 1004 follows the step 1002. Decision step 1 0 0 4 determines whether it is necessary to make a selective pre-cut in silicon wafer 2 2 in step 1 06. As shown in FIG. 6, the pre-cutting can be performed by a laser water jet 402. It is shown in Fig. 6 that the laser water jet 402 guides the laser beam 404 onto the silicon wafer 202, and the cut wafer is fixed on the fixed assembly 204. As can be seen in Figure 6, by the impact of the laser beam 404 on the silicon wafer 202, a variety of different pre-cut holes (or through-hole references) can be generated in the silicon wafer 202. 〇 By applying the laser beam 404 to the silicon wafer 202, the silicon wafer 202 can be fused. The ability of the laser beam 404 to dissipate the silicon wafer 202 is related to the wavelength λ of the laser. In a preferred embodiment using a silicon wafer, the wavelength that yields the best results is 1064 nm, which is typically provided by a | Aluminum Garnet (YAG) laser, but other types can also be used Laser. If a different crystalline or polycrystalline material is used, other wavelengths and laser types will be more appropriate. The final through-hole reference 406 (a number of holes 200410331 can be cut in this way) can be used as a guide for cutting trenches (the following will be described in detail with respect to step 1008), especially when a trench is used to cut the trench This is especially true. It is also possible to cut through-hole reference 406 by any laser beam (such as an excimer laser or laser waterjet 402) for the same purpose. The pre-cut through-hole reference is typically cut into a plus sign "+" or a round shape. However, the selection of the reference shape of the through hole is indicated by the specific manufacturing tool and environment ', so it is not necessary to be limited to the above two shapes. In addition to using a laser beam to pre-cut the through-hole reference, other mechanical cutting methods can be used. It includes, but is not limited to, for example, drilling tools, mechanical honing tools, and an ultrasonic cutting tool 1000. Although the use of such devices is novel to the preferred embodiments of the present invention, those skilled in the art should already be familiar with such devices and their general use. The silicon wafer 202 may be pre-cut before the trench is cut so that the silicon wafer 202 can maintain its integrity during the etching process without being singulated. A laser beam (such as a laser water jet 402 or an excimer laser) can be used to form the vortex bridge circular through hole groove required for the grain cutting blade 5 02 (this will be referred to in Figure 7A to Figure 7C is discussed in detail) to begin cutting trenches in and around silicon wafers. The mechanical cutting devices and methods (as discussed above) used to generate these through-hole references can also be used to generate these through-hole trenches. Please refer to Figure 1 again, the next step is step 1008, and can follow step 1 0 6 (if the through hole reference 4 6 is cut into the silicon wafer 2 0 2), or after steps 1002 and 1004 ' The step 1002 is a silicon wafer fixing step (the "step" 1004 is not a physical manufacturing step; the decision steps 13-200410331 are included in the entire manufacturing process and its variants have been shown). In step 1 008, the trench is cut into the first side 300 of the silicon wafer 202. Various methods of cutting trenches can be used depending on the manufacturing conditions and the design required for the finished silicon surgical blade. These cutting methods may use a grain cutting saw blade, a laser system, and an ultrasonic cutting tool or a hot forging process. Other cutting methods can also be used. Each will be discussed in order below. Cutting the trench by any of these methods can provide a surgical blade inclination (bevel). When trench cutting is performed on the silicon wafer 202, the silicon material may be removed according to the shape of the die-cutting saw blade, a pattern formed by an excimer laser, or a pattern formed by an ultrasonic cutting tool to form the silicon material. The shape required for surgical blade operation. In the case of a die-cutting saw blade, the silicon surgical blade will only have a straight cutting edge; in the latter two methods, the blade can be of almost any desired shape. In the case of the hot forging process, the silicon wafer is heated to make it ductile, and then embossed between two molds, each of which has the heating and ductility to be “molded”. Three-dimensional form of demand trenches in silicon wafers. For the sake of discussion, "cutting" trenches includes all the methods by which trenches can be fabricated in a silicon wafer, including by a die-cut saw blade, excimer laser, ultrasonic machine, or a hot forging Special methods mentioned above, and equivalent methods not mentioned in 尙. These cutting methods will now be discussed in detail. 7A to 7D show the structure of a die-cutting saw blade for cutting trenches in a silicon wafer according to a specific embodiment of the present invention. In Fig. 7A, a first grain cutting saw blade 502 exhibits an inclination angle Φ, and the inclination angle is substantially the final inclination angle of the surgical blade during the entire manufacturing process. Figure 7B shows a second grain cutting saw with two inclined cutting surfaces, and the cutting surfaces show all inclination angles φ. Figure 7C shows a third grain cutting saw 5 0 6, which also It has an angle Φ ′ but slightly different from the first die-cutting saw blade 502. Fig. 7D shows a fourth die-cutting saw blade 508 having an oblique cutting surface inclined as in Fig. 7B, and each of the surfaces shows all the inclination angles Φ. Although the dicing saws, 504, 506, and 508 shown in Figs. 7A to 7D have the same inclination angle Φ, those skilled in the art will understand that the silicon substrates of different uses The sheets may have different inclination angles of the cuts. In addition, a single blade may have different cutting edges including different inclination angles, as will be discussed. The second die-cutting saw blade 504 can increase productivity when manufacturing a special silicon-based surgical blade, or can be used to make a silicon-based surgical blade having a cutting edge. The following will discuss the design examples of various blades in detail with reference to Figures 20A and 20G. In a preferred embodiment of the present invention, the die-cutting saw blade will be a diamond grain saw f! A special die-cutting saw blade is used to cut the channel in the first-middle of the silicon wafer 202. The components of the grain cutting saw blade are specially engineered to provide the best final surface finish while maintaining acceptable life. The blade of the die-cutting saw blade is formed to have a contour, and a final channel is formed in the silicon wafer 202. This shape will be associated with the final architecture. For example, among the surgical blades, everything behind a single beveled blade; 504 ° two inclination and one cutting strip of the 504 ° incision tilting structure, and the well-known surgical knife is used in the following designs— * 一 卜 —One or two The figure to the first is more than I °. • Side 304. Do not choose the wear life. The contour blades are typically -15-200410331. They include bevel angles ranging from 15 ° to 45 °, while those with double-beveled blades include between 1. Half the bevel angle in the range of 5 ° to 45 °. When selecting a die-cutting saw blade with regard to the etching conditions, precise bevel angle control can be provided. Figure 8 shows a die-cutting saw blade penetrating and fixed on a silicon wafer according to a specific embodiment of the present invention. Round time movement. Figure 8 shows the operation of a die cutting saw while cutting a trench in the first side 3 04 of the silicon wafer 202. In this example, any of the grain cutting saw blades (5 0 2, 5 0 4, 5 0 6 or 5 0 8) in Figs. 7A to 7D can be used to generate the silicon substrate surgical blade. Blade. It should be understood that the blade architectures in Figures 7A to 7D are not the only architectures that can be used to generate die-cutting saw blades. FIG. 9 is a cross-sectional view of a die-cutting saw blade for cutting a trench in a silicon wafer fixed with a tape according to a specific embodiment of the present invention. Fig. 9 is a close-up cross-sectional view showing that the die-cutting saw blade shown in Fig. 8 has actually penetrated the silicon wafer 202. It can be seen from the figure that the die-cutting saw blade 502 does not completely penetrate the silicon wafer 202, and for a single bevel cutting, it only penetrates about 50 to 90% of the thickness of the silicon wafer 202. This can be applied to cutting (or molding by hot forging) a single beveled trench. For a double bevel cut by any die-cutting saw blade or any one of the cutting methods, about 25 to 49 thicknesses of the silicon wafer 202 can be cut (or molded) from each side of the silicon wafer 202 %. Figures 10A and 10B show 'a chopped surgical blade with a single beveled glj blade made according to a specific embodiment of the present invention, and a sandy surgical blade with a double beveled cutting blade, respectively. With a blade. -16- 200410331

如上所述,亦可將溝槽切割入矽晶圓202中,特別當 一晶粒切割鋸條將用於切削溝渠時尤然。可藉由相似於貫 穿孔基準之一方式、亦即使用雷射水噴注或準分子雷射來 將溝槽切割入矽晶圓2 0 2中,但其具有一非常不同之目的 。可回憶到,貫穿孔基準係提供溝渠切削機使用,以將矽 晶圓2 0 2準確地定位於溝渠切削機上。由於第二切削(在矽 晶圓202相對側上)必須準確地定位,以確保適當地製造雙 斜面刀片,因此在製作雙斜面刀片時特別有用。然而,溝 槽係具有不同目的。溝槽將允許晶粒切割鋸條自邊緣開始 切割矽晶圓202 (如第8圖所示),而不致分裂或破壞矽.晶 圓202。如第8A圖中所示者係較佳具體實施例。請參考第 8圖,明顯地可發現到,倘若未使用溝槽且如圖所示者切 削溝渠,則由於業已切削之矽晶圓202在經切削出之溝渠 區域中明顯較薄,且即使小應力亦可使該矽晶圓破壞,因 此該矽晶圓將容易沿著經切削出之溝渠產生破壞。亦即, 第8圖中業已切削之政晶圓將缺乏結構剛性。比較該砂晶 圓與第8C圖之矽晶圓。第8C圖之業已切削的矽晶圓202 遠較爲堅固且可達成改良的生產率。依據第8C圖之矽晶圓 202可能在切削時破壞者將較第8圖中者少。如第8A圖及 第8B圖中所示,溝槽係較晶粒切割鋸條寬,且足夠長而允 許晶粒切割鋸條插入,以在適當深度處開始切削。因此, 晶粒切割鋸條並非企圖在向下運動的同時切削矽晶圓202 ,其中該向下運動將造成分裂及破壞;晶粒切割鋸條係如 同其原先所設計者’在沿水平方向運動時開始運動。第8C 一 17- 200410331 圖係顯不在砂晶圓2 0 2 —第一側中之一系列溝槽及經切削 出之溝渠。 第1 1圖係顯示依據本發明之一具體實施例,用於在一 矽晶圓中切削複數個溝渠之一雷射系統的方塊圖。該等溝 渠亦可如參考第1 2圖中所描述者,以超音波切削,以下將 對此作詳細討論。這兩種方法之優點在於,可藉由非線性 且複雜之切割刀刃輪廓來製造刀片,譬如半彎月刀片、匙 形刀片、及軟骨刀片等。第1 1圖係顯示一簡化的雷射機總 成9 0 0。雷射機總成9 0 0包括可放射出一雷射光束9 0 4的 一雷射902,及支撐於一基座908上的一多軸控制機構906 。當然,雷射機總成9 0 0亦包括一電腦、及可能地一網路 界面,其中該等者皆已爲了淸楚顯示而省略。 當藉雷射機總成900來切削溝渠時,矽晶圓202係固 定於亦能夠接受以多軸控制機構906來操縱之固定總成204 上。經由使用雷射切削總成900及各種光束遮罩技術,將 可切削出一陣列的刀片輪廓。光線遮罩係設於雷射902內 ,且經由仔細設計,將得以防止雷射將無需熔散之矽材料 熔散。對於雙斜面刀片,可藉由利用預切割導角2 0 6 A、2 0 6 Β 或基準4 0 6來對正的相同方法,來切削相對側。 雷射902係用於將溝渠圖案(使用一雷射時亦稱爲一「 熔散輪廓」)準確且精密地切削入矽晶圓202之第一側304 或第二側306中,以準備濕式等向性蝕刻步驟(這將參考第 1圖之步驟1 0 1 8作詳細討論)。多軸控制、及利用內部雷 射光束遮罩係用作爲前述矽晶圓2 0 2中熔散輪廓之光柵。 - 18 - 200410331 結果,可達成具有一所需輪廓之溝渠,其具有與該外科用 刀片產品所需者一致的淺彎角斜率。可經由這種製程達成 各種曲線輪廓之圖案。該切削步驟中可使用多種型式之雷 射。譬如,可使用一準分子雷射或雷射水噴注402。準分 子雷射902之波長可介於157奈米與245奈米之範圍內。 其他之範例包括一釔鋁石榴石雷射及具有一 3 5 5奈米波長 之雷射。當然,熟知此項技藝之人士將可理解到,可使用 具有介於150奈米至11,000奈米範圍內之某些特定波長的 雷射光束來切削溝渠圖案。 第1 2圖係顯示依據本發明之一具體實施例,用於在一 矽晶圓中切削溝渠之一超音波切削系統的方塊圖。超音波 切削係藉由使用一精密切削超音波工具1 04實施,而該工 具係經由硏磨泥漿102來切削矽晶圓202之第一側304或 第二側3 0 6。每一次僅切削一側。對於雙斜面刀片,可使 用貫穿孔基準406來對正,以藉由相同方法切削相對側。 超音波切削係用於將溝渠圖案準確且精密地切削入矽 晶圓202之表面中,以準備濕式等向性蝕刻步驟。超音波 切削係藉由超音波地振動一心軸/工具(工具)1 04而得實施 。工具104並未與矽晶圓202接觸,但極接近矽晶圓202 且藉由工具1 04所放射出之超音波作動來激發硏磨泥漿1 0 2 。由工具104放射出之超音波將驅迫硏磨泥漿1〇2腐蝕矽 晶圓202,以形成切削於工具104上之相對應圖案。 可經由銑、硏磨、或靜電放電加工(EDM )切削工具1 0 4 ,以生成溝渠圖案。業已切削之矽晶圓202上的最終圖案 一 19- 200410331 將相對應於已切削至工具1 04上者。使用一準分子雷射之 一超音波切削方法的優點在於,可在矽晶圓202之一完整 側上,同時具有藉超音波切削出之多種刀片溝渠圖案。是 以,本製程係快速且較不昂貴。亦,如同準分子雷射切削 製程,亦可藉由本製程達成各種曲線輪廓之圖案。 第1 3圖係依據本發明之一具體實施例,用於在一矽晶 圓中形成複數個溝渠之一熱鍛系統的圖式,該等溝渠架構 亦可熱鍛至該晶圓表面上。這種製程係將該晶圓加熱至一 具延展性之狀態。接著可在兩模具之間壓印該晶圓表面, 其中該模具包含了相對於最終溝渠者之負向圖案。 矽晶圓202係在一加熱室中預熱,或可藉由加熱基座 構件1 054作動而完全加熱,其中矽晶圓202係置放於該加 熱基座構件上。矽晶圓202在高溫下經過一段足夠時間後 將具有延展性。接著,以足夠之壓力將加熱過之模具1 〇 5 2 的負向圖像印於矽晶圓2 0 2之第一側3 0 4上。模具1 〇 5 2之 設計可使其達成具有各種斜角、深度、長度、及輪廓的多 種溝渠,以生成幾乎任何可想像到的刀片設計。第1 3圖中 所示之圖式業經大幅度地簡化及誇大,以明確地表現出熱 鍛製程之相關特徵。 討論了眾多種用於切削溝渠之方法後,請再將注意焦 點轉回第1圖。在將溝渠切削入矽晶圓202第一側304中 的步驟1 008之後,必須於決策步驟200 1中決定是否塗佈 矽晶圓2 0 2。第1 4圖係顯示依據本發明之一具體實施例, 具有已切削完成之一單一溝渠及施加至切削側之一塗覆的 一20 - 200410331 一砂晶圓。倘若欲施加一塗覆’則可在步驟2 0 0 2中,依據 熟知此項技藝之人士所已知之眾多技術中的其中之一,將 塗覆1 1 0 2施加至矽晶圓2 0 2之第一側。塗覆1 1 〇 2有助於 蝕刻控制,及提供最終刀片刀刃額外的強度。矽晶圓2 0 2 係設於一沈積室中,使矽晶圓2026之整個第一側3 04 -包 括平坦區及溝渠區-皆可塗佈一氮化矽(四氮化三矽,Si 3Ν4) 薄層。最終之塗覆1102之厚度可介於l〇奈米至2微米之 範圍內。塗覆1 102可由任何較矽(結晶)晶圓202硬之材料 構成。明確地,塗覆1 1 0 2亦可由氮化鈦(T i Ν )、氮化鈦鋁 (A 1 T i N )、二氧化矽(S i 02)、碳化矽(s i C )、碳化鈦(T i C )、 氮化硼(BN)、或鑽石狀結晶(DLC)構成。以下將參考第18A 圖及第1 8B圖來更詳細地再次討論雙斜面外科用刀片的塗 覆。 繼已在選擇性步驟2 0 0 2中施加塗覆1 1 0 2之後,次一 步驟係卸除與再次固定的步驟2 0 0 3 (倘若未施加任何塗覆 ,則步驟2003亦可跟隨於步驟1〇〇8之後)。在步驟2003 中係利用相同的標準式固定機,自膠帶3 〇 8卸除矽晶圓2 〇 2 。該機器係藉由將紫外(UV)線輻射至對紫外線敏感之膠帶 3 0 8上’以減少其厚度。亦可使用低黏性或熱釋放膠帶來 取代對紫外線敏感之膠帶3〇8。經過以充份的紫外線曝光 後’可輕易地自膠帶式固定拔起矽晶圓2 〇 2。可接著再第 二側306面朝上的情況下再次固定矽晶圓2〇2,以準備對 第二側3 0 6切削溝渠。 接著在砂晶圓202上實施步驟2004。在步驟2004中 - 21- 200410331 係如同步驟1 006 —般地,將溝渠切削入矽晶圓202之第二 側3 0 6中,以生成雙斜面矽質基材外科用刀片。第1 5圖係 顯示依據本發明之一具體實施例,用於在藉膠帶式固定之 矽晶圓202中切削出一第二溝渠的一晶粒切割鋸條502剖 面圖。當然,亦可使用準分子雷射902、超音波機工具1〇〇 或熱鍛製程來在矽晶圓202中切削第二溝渠。第1 5圖中係 顯示晶粒切割鋸條5 02將一第二溝渠切削至矽晶圓202之 第二側3 06上。其顯示出已在步驟2002中選擇性地施加的 塗覆1 102。第10A圖與第10B圖係分別顯示最終之單與雙 斜面切口。第10圖中,已在矽晶圓202上製作一單切口, 而在單一刀片總成中造成切口傾角φ。第丨〇圖中,已將一 第二溝渠切削入矽晶圓202中(藉由上述之任何一種溝渠切 削製程),且該第二溝渠具有相同於該第一溝渠者之傾角。 其結果係一雙斜面矽質基材外科用刀片,其中每一切割刀 刃皆表現出一切口傾角,而產生一雙斜面傾角Φ。第1 6圖 係顯示依據本發明之一具體實施例,已在兩側上切削出溝 渠之一矽晶圓的剖面影像。 必須在切削溝渠步驟2004後之決策步驟2005中決定 ,是否在步驟1 0 1 8中對雙切削溝渠矽晶圓202實施蝕刻, 或在步驟1 0 1 6中對雙切削溝渠矽晶圓2 0 2實施晶粒切割。 可藉由一晶粒切割鋸條、雷射光束(譬如,準分子雷射、或 雷射水噴注402 )來實施晶粒切割步驟1016。晶粒切割可提 供最終之條狀物,以在訂作的夾具而非晶圓舟(以下將作詳 細討論)中蝕刻(步驟1 〇 1 8中)。 - 22- 200410331 第17A圖及第17B圖係顯示依據本發明之一具體實施 例,在一矽晶圓上實施一等向性鈾刻製程,其中該政晶圓 之兩側上皆具有已切削成之溝渠。在蝕刻步驟1 〇 1 8中,業 已切削之矽晶圓2 02係自膠帶308卸除。接著再將砂晶圓 202置放於一晶圓舟中且浸漬於一等向性酸性浴14〇〇中。 控制蝕刻劑1 4 0 2之溫度、濃度、及擾動,以使該鈾刻製程 之均勻度最佳化。可使用之較佳等向性蝕刻劑1 40 2係由氫 氟酸、硝酸、及醋酸(HNA)組成。可使用其他的化合及濃度 來達成相同目的。譬如,可使用水來替換。亦可使用噴塗 式触刻、等向性二氟化氙氣體蝕刻、及電解蝕刻取代浸漬 蝕刻,而仍得達到相同結果。可作爲氣體蝕刻中之一化合 物的其他範例係六氟化硫、或其他相似之氟化氣體。 該蝕刻製程將均勻地蝕刻矽晶圓202之兩側及其各別 之複數溝渠,直到相對之溝渠輪廓互相交叉爲止。可由蝕 刻劑1 402直接移除矽晶圓202且當移除時即沖洗一次。由 該製程獲致之期待切割刀刃半徑將介於5奈米至500奈米 之範圍內。 等向性化學鈾刻係一種藉一均勻方式來移除矽的製程 。在依據本發明之一具體實施例的製造程序中,藉上述切 削製作出之晶圓表面輪廓將均勻地終結於與該晶圓相對側 上之輪廓交叉處(倘若需要單斜面刀片,則將與未切削之相 對矽晶圓表面交叉)。使用等向性蝕刻將可達成所需之刀片 鋒利度而同時保持刀片傾角。由於所需之刀刃幾何形狀過 於精細而無法承受切削造成之機械與熱應力’因此無法僅 -23- 200410331 由切削來達成晶圓輪廓父叉。等向性酸性浴1 4 Q 〇中之等向 性飩刻劑(蝕刻劑)1 402的每一酸性組成成份皆具有一特殊 效用。首先’硝酸係使曝露之矽氧化,及其次,氫氟酸將 移除該氧化砂。醋酸在本製程期間係作爲一稀釋液,精密 地控制組成成份、溫度、及擾動係達成重複性結果所必須 者。 在第17圖中,不具有塗覆11〇2之矽晶圓202已置放 於等向性鈾刻浴1 4‘〇 0中。請注意到,包括第一外科用刀片 1404、第二外科用刀片1406、及第三外科用刀片1408的 每一外科用刀片係互相連接。當蝕刻劑丨4 2在矽上作用時 ’將在一段時間內移除一層又一層分子,而減少砂(亦即外 科用刀片)之寬度,直到(第一外科用刀片1 4 〇 4 )之兩傾角 1410與1412在該兩者與次一外科用刀片(第二外科用刀片 1 406 )接合之位置點處互相交叉爲止。其結果爲形成出眾多 個外科用刀片(1 4 0 4、1 4 0 6、及1 4 0 8 )。請注意到,由於石夕 材料已由蝕刻劑1 402溶解,因此除了殘留的少量矽材料以 外,已可在整個等向性蝕刻製程中保持複數個相同傾角。 第18Α圖及第18Β圖係依據本發明之另一具體實施例 ,在一矽晶圓上實施之一等向性蝕刻製程,其中該矽晶圓 之兩側上皆具有已切削成之溝渠,且某一側上具有一塗覆 層。在第18圖及第18Β圖中,膠帶308及塗覆1102已餘留 於矽晶圓202上,使得該蝕刻製程僅作用於矽晶圓202 $ 第二側306上。該晶圓在蝕刻製程期間,並非必須固定於 膠帶上;其僅爲一製造之選擇。再一次,等向性蝕刻材料 一 24 - 200410331 1042僅於曝露之矽晶圓202上作用,而(一層又一層地)移 除矽材料,但仍保持著相同於步驟2004中所切削出者之傾 角(由於其爲第二側3 06 )。結果,在第18B圖中,分別由 於膠帶3 0 8及選擇性的塗覆1 102、與由於等向性鈾刻劑1402 可沿著切削出之溝渠表面移除複數個均勻的矽分子層,因 此矽質基材外科用刀片1 504、1 5 0 6、及1 5 0 8將分別在第 一側3 04上與第二側306上具有相同於步驟1 008及2004 中所切削出者之傾角。矽晶圓202之第一側304完全未蝕 刻,因此可提供最終完成之矽質基材外科用刀片額外的強 度。 使用選擇性之步驟2002、即施加塗覆1102至矽晶圓202 第一側3 0 4之另一優點在於,切割刀刃(第一切削溝渠側) 係包括塗覆1 1 02 (其較佳地係由一氮化矽層構成),其中該 塗覆具有較基底矽材料強硬之材料特性。因此,施加塗覆 1102之製程將造成較強硬且較耐用的一切割刀刃。塗覆 1102亦提供該刀片表面一磨耗阻礙物,其對於在電動機械 之往復式刀片裝置中、接觸鋼材的刀片尤其重要。表I係 顯示不具有塗覆1102之一砂質基材外科用刀片(砍)、及具 有塗覆1 1 02者(氧化矽)的典型強度指示規格。As described above, trenches can also be cut into silicon wafer 202, especially when a die-cutting saw blade is to be used to cut trenches. The trench can be cut into a silicon wafer 202 by a method similar to the perforation benchmark, that is, using laser water jet or excimer laser, but it has a very different purpose. It can be recalled that the through-hole reference system is provided with a trench cutter to accurately position the silicon wafer 202 on the trench cutter. Since the second cut (on the opposite side of the silicon wafer 202) must be accurately positioned to ensure that the double-beveled blade is properly manufactured, it is particularly useful when making double-beveled blades. However, trench systems serve different purposes. The grooves will allow the die-cutting saw blade to cut the silicon wafer 202 (as shown in Figure 8) from the edge without splitting or damaging the silicon wafer 202. The one shown in Figure 8A is a preferred embodiment. Please refer to FIG. 8. It is obvious that if the trench is not used and the trench is cut as shown in the figure, the silicon wafer 202 that has been cut is significantly thinner in the cut trench area, and even if it is small. Stress can also damage the silicon wafer, so the silicon wafer will easily be damaged along the cut trench. That is, the already-cut wafers in Figure 8 will lack structural rigidity. Compare this sand crystal circle with the silicon wafer of Figure 8C. The already cut silicon wafer 202 of Figure 8C is far more robust and can achieve improved productivity. The silicon wafer 202 according to FIG. 8C may be less damaged during cutting than that in FIG. 8. As shown in Figures 8A and 8B, the grooves are wider than the grain-cutting saw blade and are long enough to allow the grain-cutting saw blade to be inserted to begin cutting at a suitable depth. Therefore, the die-cutting saw blade does not attempt to cut the silicon wafer 202 at the same time as the downward movement, which will cause splitting and destruction; the die-cutting saw blade starts as it was originally designed by the 'moving in the horizontal direction' motion. Figure 8C-1 17- 200410331 shows a series of grooves and cut trenches in the sand wafer 2 0 2-the first side. FIG. 11 is a block diagram showing a laser system for cutting one of a plurality of trenches in a silicon wafer according to a specific embodiment of the present invention. These trenches can also be cut with ultrasound, as described with reference to Figure 12, which will be discussed in detail below. The advantage of these two methods is that blades can be manufactured with non-linear and complicated cutting edge contours, such as half-meniscus blades, spoon-shaped blades, and cartilage blades. Figure 11 shows a simplified laser machine assembly 900. The laser machine assembly 900 includes a laser 902 that emits a laser beam 904, and a multi-axis control mechanism 906 supported on a base 908. Of course, the laser assembly 900 also includes a computer and possibly a network interface, which have been omitted for the sake of clarity. When the laser assembly 900 is used to cut the trench, the silicon wafer 202 is fixed on the fixed assembly 204 that can also be operated by the multi-axis control mechanism 906. Using laser cutting assembly 900 and various beam masking techniques, an array of blade profiles can be cut. The light shield is located in the laser 902 and is carefully designed to prevent the laser from melting without melting the silicon material. For double-beveled inserts, the opposite side can be cut by the same method using a pre-cut lead angle of 2 06 A, 2 06 B, or a reference 4 06. Laser 902 is used to accurately and precisely cut the trench pattern (also called a "fusion profile" when using a laser) into the first side 304 or the second side 306 of the silicon wafer 202 to prepare for wet Isotropic etching step (this will be discussed in detail with reference to step 1 108 of FIG. 1). Multi-axis control and the use of an internal laser beam mask are used as gratings for the fusion profile in the aforementioned silicon wafer 202. -18-200410331 As a result, a trench with a desired profile can be achieved, which has a shallow bend slope consistent with that required for the surgical blade product. A variety of curved contour patterns can be achieved through this process. Various types of lasers can be used in this cutting step. For example, an excimer laser or laser water jet 402 can be used. The wavelength of the quasi-component laser 902 can be in the range of 157 nm and 245 nm. Other examples include an yttrium aluminum garnet laser and a laser with a wavelength of 3,55 nm. Of course, those skilled in the art will understand that the trench pattern may be cut using a laser beam having a certain wavelength in the range of 150 nm to 11,000 nm. Fig. 12 is a block diagram showing an ultrasonic cutting system for cutting trenches in a silicon wafer according to a specific embodiment of the present invention. Ultrasonic cutting is performed by using a precision cutting ultrasonic tool 104, and the tool cuts the first side 304 or the second side 306 of the silicon wafer 202 via the honing slurry 102. Cut only one side at a time. For double beveled inserts, the through-hole reference 406 can be used to align to cut the opposite side in the same way. Ultrasonic cutting is used to accurately and precisely cut the trench pattern into the surface of the silicon wafer 202 to prepare a wet isotropic etching step. Ultrasonic cutting is performed by ultrasonically vibrating a mandrel / tool (tool) 104. The tool 104 is not in contact with the silicon wafer 202, but is very close to the silicon wafer 202 and the honing mud 10 2 is excited by the ultrasonic action emitted by the tool 104. The ultrasonic wave emitted from the tool 104 will drive the honing slurry 102 to etch the silicon wafer 202 to form a corresponding pattern cut on the tool 104. Milling, honing, or electrostatic discharge machining (EDM) cutting tools 104 can be used to generate trench patterns. The final pattern on the cut silicon wafer 202 19-200410331 will correspond to the cut on the tool 104. The advantage of an ultrasonic cutting method using an excimer laser is that it can have a variety of blade trench patterns cut by ultrasonic waves on one complete side of the silicon wafer 202. Yes, this process is fast and less expensive. Also, like the excimer laser cutting process, various curved contour patterns can also be achieved by this process. Figure 13 is a schematic diagram of a hot forging system for forming a plurality of trenches in a silicon crystal circle according to a specific embodiment of the present invention. The trench structures can also be hot forged onto the surface of the wafer. This process heats the wafer to a ductile state. The wafer surface can then be embossed between two molds, where the mold contains a negative pattern relative to the final trench. The silicon wafer 202 is preheated in a heating chamber, or can be completely heated by the action of heating the base member 1 054, wherein the silicon wafer 202 is placed on the heating base member. Silicon wafer 202 will be ductile after a sufficient period of time at high temperatures. Then, a negative image of the heated mold 105 2 is printed on the first side 3 04 of the silicon wafer 202 with sufficient pressure. The design of the mold 105 allows it to achieve a variety of trenches with various bevels, depths, lengths, and contours to produce almost any conceivable blade design. The pattern shown in Figure 13 has been greatly simplified and exaggerated to clearly show the relevant characteristics of the hot forging process. After discussing the various methods for cutting trenches, turn your attention back to Figure 1. After step 1 008 of cutting the trench into the first side 304 of the silicon wafer 202, a decision must be made in a decision step 2001 whether to coat the silicon wafer 202. Figure 14 shows a 20-200410331 sand wafer with a single trench that has been cut and a coating applied to the cutting side according to a specific embodiment of the present invention. If a coating is to be applied, the coating 1 1 0 2 may be applied to the silicon wafer 2 0 2 according to one of many techniques known to those skilled in the art in step 2 0 2. The first side. Coating 1 1 2 helps etch control and provides extra strength to the final blade edge. The silicon wafer 2 0 2 is set in a deposition chamber, so that the entire first side 3 04 of the silicon wafer 2026-including the flat area and the trench area-can be coated with a silicon nitride (tri-silicon nitride, Si 3Ν4) thin layer. The thickness of the final coating 1102 may be in the range of 10 nanometers to 2 microns. Coating 1 102 may be composed of any material that is harder than silicon (crystalline) wafer 202. Specifically, the coating 1 1 0 2 can also be made of titanium nitride (Ti n), titanium aluminum nitride (A 1 Ti n), silicon dioxide (Si 02), silicon carbide (si C), titanium carbide (T i C), boron nitride (BN), or diamond-like crystal (DLC). The application of the double-beveled surgical blade will be discussed again in more detail with reference to FIGS. 18A and 18B. After the coating 1 1 0 2 has been applied in the selective step 2 0 2, the next step is the removal and re-fixing step 2 0 3 (If no coating is applied, step 2003 can also be followed by After step 1008). In step 2003, the silicon wafer 2 02 was removed from the tape 3 08 by using the same standard fixing machine. The machine reduces the thickness by radiating ultraviolet (UV) rays onto the ultraviolet-sensitive adhesive tape 308 '. Low-viscosity or heat-release tapes can also be used in place of UV-sensitive tapes 308. After exposure with sufficient UV light, the silicon wafer 202 can be easily pulled out from the tape-type fixing. Then, the silicon wafer 202 can be fixed again with the second side 306 facing upward to prepare to cut the trench on the second side 306. Step 2004 is then performed on the sand wafer 202. In step 2004-21- 200410331, as in step 1 006, the trench is cut into the second side 3 06 of the silicon wafer 202 to generate a double-beveled silicon substrate surgical blade. FIG. 15 is a cross-sectional view of a die-cutting saw blade 502 for cutting a second trench in a silicon wafer 202 fixed by an adhesive tape according to a specific embodiment of the present invention. Of course, an excimer laser 902, an ultrasonic tool 100, or a hot forging process can also be used to cut the second trench in the silicon wafer 202. Figure 15 shows the die-cutting saw blade 502 cutting a second trench onto the second side 306 of the silicon wafer 202. It shows a coating 1 102 that has been selectively applied in step 2002. Figures 10A and 10B show the final single and double bevel cuts, respectively. In FIG. 10, a single notch has been made on the silicon wafer 202, and the inclination angle φ of the notch is caused in the single blade assembly. In the figure, a second trench has been cut into the silicon wafer 202 (by any of the trench cutting processes described above), and the second trench has the same inclination angle as that of the first trench. The result is a pair of beveled silicon substrate surgical blades, where each cutting blade exhibits all inclination angles, resulting in a pair of bevel angles Φ. FIG. 16 is a cross-sectional image of a silicon wafer in which a trench has been cut on both sides according to a specific embodiment of the present invention. It must be decided in the decision step 2005 after the cutting trench step 2004 whether to etch the dual-cut trench silicon wafer 202 in step 10 18 or the dual-cut trench silicon wafer 20 in step 10 16 2 Carry out die cutting. The die-cutting step 1016 may be performed by a die-cutting saw blade, a laser beam (eg, an excimer laser, or a laser water jet 402). Die cutting provides the final strip for etching in custom fixtures rather than wafer boats (discussed in more detail below) (in step 1018). -22- 200410331 Figures 17A and 17B show an isotropic uranium engraving process on a silicon wafer according to a specific embodiment of the present invention, in which both sides of the political wafer are cut. Into a ditch. In the etching step 108, the silicon wafer 202 that has been cut is removed from the adhesive tape 308. The sand wafer 202 is then placed in a wafer boat and immersed in an isotropic acid bath 1400. The temperature, concentration, and disturbance of the etchant 1420 are controlled to optimize the uniformity of the uranium etching process. A preferred isotropic etchant 1 40 2 which can be used is composed of hydrofluoric acid, nitric acid, and acetic acid (HNA). Other compounds and concentrations can be used to achieve the same purpose. For example, it can be replaced with water. Spray etching, isotropic xenon difluoride gas etching, and electrolytic etching can also be used instead of immersion etching, and the same results can still be achieved. Other examples that can be used as a compound in gas etching are sulfur hexafluoride, or other similar fluorinated gases. This etching process will uniformly etch both sides of the silicon wafer 202 and its respective plural trenches until the opposing trench profiles cross each other. The silicon wafer 202 can be directly removed by the etchant 1 402 and rinsed once when removed. The expected cutting edge radius obtained by this process will be in the range of 5 nm to 500 nm. Isotropic chemical uranium engraving is a process for removing silicon by a uniform method. In the manufacturing process according to a specific embodiment of the present invention, the surface profile of the wafer produced by the above cutting will end uniformly at the intersection with the profile on the opposite side of the wafer (if a single bevel blade is required, the Uncut opposite silicon wafer surface crosses). The use of isotropic etching will achieve the required blade sharpness while maintaining blade inclination. Because the geometry of the required blade is too fine to withstand the mechanical and thermal stresses caused by cutting, it is not possible to achieve wafer profile parent forks by cutting only -23- 200410331. Each acid component of the isotropic etching agent (etching agent) 1 402 in the isotropic acid bath 1 4 Q 〇 has a special effect. First, nitric acid oxidizes the exposed silicon, and secondly, hydrofluoric acid will remove the oxidized sand. Acetic acid is used as a diluent during this process. Precise control of composition, temperature, and perturbation are necessary to achieve repeatable results. In Fig. 17, a silicon wafer 202 without a coating of 1102 has been placed in an isotropic uranium engraving bath 14'00. Note that each of the surgical blades including the first surgical blade 1404, the second surgical blade 1406, and the third surgical blade 1408 is interconnected. When the etchant 4 2 acts on the silicon, 'layers and layers of molecules will be removed within a period of time, and the width of the sand (ie, the surgical blade) will be reduced until (the first surgical blade 1 4 04). The two inclination angles 1410 and 1412 intersect each other at a point where the two are in contact with the next surgical blade (second surgical blade 1 406). As a result, a large number of surgical blades (1440, 1406, and 1408) were formed. Please note that because the Shi Xi material has been dissolved by the etchant 1 402, it can maintain a plurality of the same inclination angles throughout the isotropic etching process, with the exception of a small amount of silicon material remaining. 18A and 18B are an isotropic etching process performed on a silicon wafer according to another embodiment of the present invention, wherein the silicon wafer has cut trenches on both sides, And there is a coating layer on one side. In FIGS. 18 and 18B, the tape 308 and the coating 1102 have been left on the silicon wafer 202, so that the etching process is only applied to the silicon wafer 202 $ the second side 306. The wafer does not have to be fixed to the tape during the etching process; it is only a manufacturing option. Once again, the isotropic etching material 24-200410331 1042 acts only on the exposed silicon wafer 202, and the silicon material is removed (layer after layer), but it remains the same as that cut in step 2004. Inclination (as it is the second side 3 06). As a result, in Figure 18B, due to the tape 3 0 8 and the selective coating 1 102, and the isotropic uranium etching agent 1402, a plurality of uniform silicon molecular layers can be removed along the surface of the cut trench. Therefore, the silicon-based surgical blades 1 504, 15 06, and 15 0 8 will have the same values on the first side 3 04 and the second side 306 as those cut in steps 1 008 and 2004, respectively. inclination. The first side 304 of the silicon wafer 202 is completely unetched, thus providing additional strength for the final silicon substrate surgical blade. Another advantage of using selective step 2002, namely applying coating 1102 to silicon wafer 202 first side 3 4 is that the cutting edge (first cutting trench side) includes coating 1 1 02 (which is preferably It is composed of a silicon nitride layer), wherein the coating has stronger material characteristics than the base silicon material. Therefore, the process of applying the coating 1102 will result in a stronger and more durable cutting edge. Coating 1102 also provides a wear obstruction on the surface of the blade, which is particularly important for blades that come in contact with steel in a reciprocating blade device for electric machinery. Table I shows typical strength indication specifications for surgical blades (chops) that are not coated with one of the sandy substrates and coated with 1 102 (silica).

表I 特性 矽 氮化矽 楊氏模數(十億帕斯卡(GPa)) 160 323 降伏強度(十億帕斯卡(G P a )) 7 14 200410331 楊氏模數(Young’s Modu 1 us )(亦稱爲彈性模數)係一材 料固有剛性(s t 1 f f n e s s )之度量。模數愈高,即材料愈強硬 。降伏強度係一材料在負荷下,由彈性轉變爲塑性變形的 點。換言之,在該點處,材料將不再撓曲,而將永久地扭 曲或斷裂。蝕刻完成後(不論具有或不具有塗覆11〇2),業 已蝕刻之砂晶圓202將徹底沖洗及淸潔,以移除所有殘餘 的鈾刻劑1 40 2化學藥品。 桌19 Η係顯不依據本發明之一具體實施例來製造在一 側上具有一塗覆之一雙斜面矽質外科用刀片的一最終切割 刀刃。切割刀刃1602具有5至500奈米之一半徑,其係與 一鑽石外科用刀片相似,但可藉遠較低之成本製造。當已 實施完成步驟1 0 1 8的蝕刻製程後,可依據步驟1 〇 2 〇固定 矽質基材外科用刀片,這係與步驟1〇〇2及步驟2003相同 〇 在固定步驟1020之後,可在步驟1022中分離該等石夕 質基材外科用刀片(矽質刀片),這意味著使用一晶粒切割 鋸條、雷射光束(譬如,雷射水噴注4 0 2或一準分子雷射) 、或其他適當裝置來分割每一矽質刀片,以使該等矽質刀 片互相分割。熟知此項技藝之人士將可理解到,亦可使用 具有介於150奈米至11,〇〇〇奈米範圍內之某些特定波長的 雷射。一種波長在此範圍內之雷射範例係一準分子雷射。 雷射水噴注(釔鋁石榴石雷射)之獨特性在於,可在晶圓中 形成渦狀之曲線、中斷的圖案。這可提供製造者彈性地製 作幾乎一無限制數量的非切割刀刃刀片輪廓。雷射水噴注 - 2 6 - 200410331 係使用一水流作爲一波導,以允許雷射如同一帶鋸一般地 切割。這係上述中僅可切割出連續、筆直線圖案之目前技 藝水準中的晶粒切割.機所無法達成者。 ‘在步驟1024中,可依據客戶之特殊需求,而拾起該分 離外科用矽質刀片、及將其置放於刀片手柄總成上。然而 ,在實際「拾起及置放」之前,可在晶圓固定機中藉紫外 線來照射業已蝕刻之矽晶圓202 (固定於膠帶及框架上、或 一膠帶/晶圓框架上),以減小膠帶3 0 8之厚度。再將仍位 於「減小厚度」之膠帶及框架、或膠帶/晶圓框架上的矽晶 圓2 0 2裝載於可藉商業方式取得之一晶粒.-連附組立系統中 。回顧以上之討論,可依據各種製造環境來交換某些特定 步驟之順序。其一範例爲分離、及紫外線照射步驟。倘若 必要時,可交換該等步驟。 該晶粒-連附組立系統可自「減小厚度」之膠帶及框架 、或膠帶/晶圓框架移除各別之業已蝕刻的矽質外科用刀片 ,且在需求之公差內,將該等矽質外科用刀片連附至其各 別之托架。可使用一環氧樹脂及黏著劑來固定該兩組件。 可使用包括熱堆疊、超音波堆疊、超音波焊接、雷射焊接 、或共晶接合等其他組立方法,將該矽質外科用刀片連附 至其各別之基板。最後,在步驟丨〇 2 6中,可將完全組立完 成之具有手柄的㈣外科用刀片封裝,以確保安全性且= 傷害性,並且加以輸送,而得用於該矽質外科用刀片所設 計之用途中。 可用於將該外科际71 上 料用刀片固定至其托架的其他組立方法 -27- 200410331 包括使用其他溝槽。如上所述,可藉由雷射水噴注或準分 子雷射來生成溝槽,且該等溝槽係在切削溝渠時,提供該 晶粒切割鋸條可嚙合矽晶圓202之一開口。使用額外之溝 槽將可在該刀片中提供一收容件,以供一托架中之一個或 更多柱件使用。第24圖係顯示這種配置。在第24圖中, 製作完成之外科用刀片2402已具有生成於其托架界面區域 2406中的兩溝槽2404A、2404B。該界面具有刀片托架2410 之柱件2408A、2408B。可在製造程序中之任一時間點,將 該等溝槽切割入砍晶圓2 0 2中,但較佳地係在分離該外科 用刀片之前實施。可在連繋之前,將一黏著劑施加至適當 區間,以確保一牢固的固持。接著,可如圖式所示者,膠 合一外罩2 4 1 2,以提供成品一完美外觀。實施柱件-溝槽 總成之目的在於,提供刀片2 4 0 2抵抗可能在一切割程序期 間遭遇到之任何拉力的額外抵抗力。 在說明了一雙斜面矽質基材外科用刀片之製造程序後 ,請將注意力轉移至第2圖,其中顯示出依據本發明之一 弟一具體貫施例’由砂來製造一單斜面外科用刀片之一方 法的流程圖。第1圖之步驟1〇〇2、1〇〇4、1〇〇6、及1008 係與第2圖中顯示之方法者相同,因此不再贅述,然而, 製作一單斜面外科用刀片之方法與製造一雙斜面外科用刀 片之方法,係再次一步驟、即步驟1 〇丨〇中互不相同,因此 將對此作詳細討論。 在步驟1 0 0 8之後,決策步驟i 0丨〇將決定業已切削完 成之砂晶圓2 0 2是否自矽晶圓固定總成2 〇 4卸除。倘若卸 -28- 200410331 除了單溝渠矽晶圓202 (在步驟1012中),則一更進一步之 選擇性者,係在步驟1 〇 1 6中對該單溝渠晶圓作晶粒切割。 在選擇性之卸除步驟1 〇 1 2中,可利用相同之標準式固定機 ,將矽晶圓2 02自膠帶3 08卸除。 倘若在步驟1012中卸除了矽晶圓202,則可選擇性地 在步驟1016中對矽晶圓202作晶粒切割(亦即,將矽晶圓 2 0 2切割成細長條物)。可藉由一晶粒切割刀片、準分子雷 射902、或雷射水噴注402來實施晶粒切割步驟1016。晶 粒切割係提供將在訂作的夾具而非晶圓舟中(以下將詳細討 論)蝕刻(在步驟1 0 1 8中)的最終細長條物。在製造一單斜 面矽質基材外科用刀片之方法中,不論晶粒切割步驟1 0 1 6 、卸除步驟1012、抑或切削溝渠步驟1〇〇8之後的次一步 驟,皆爲步驟1 0 1 8。步驟1 0 1 8係蝕刻步驟,上述中業已 對其作詳細討論。此後,接續者爲步驟1 020、1 022、1024 、及 1 026,且由於上述中已參考一雙斜面矽質基材外科用 刀片之製造來對所有該等者作詳細說明,因此無需贅述。 第3圖係顯示依據本發明之一第三具體實施例,由矽 來製造一單斜面外科用刀片之一變型方法的流程圖。第3 圖中所示之方法在步驟1 002、1 004、1 006、及1 008中係 與第2圖所示者完全相同。然而,在第3圖中之步驟1〇〇8 之後,將具有塗佈步驟2002。由於上述中已參考第1圖來 說明塗佈步驟2002,因此無需贅述。該塗佈步驟之結果與 前述者相同:矽晶圓202之切削側上具有一層1 102。 塗佈步驟2002之後,將在步驟2003中卸除及再次固 -29- 200410331 定矽晶圓202。本步驟亦與先前參考第丄圖(步驟2003 )討 論者完全相同。其結果爲,矽晶圓2 0 2之塗佈側將朝下方 面向固疋總成204。此後’將發生步驟1〇18、1〇2〇、1〇22 、1 〇 2 4、及1 〇 2 6,且以上已對所有該等者作詳細說明。其 總結果爲一單斜面外科用刀片,且其第一側3 〇 4 (切削側) 具有一塗覆層1102,以改善該外科用刀片之強度及耐久性 。桌23A圖及第23B圖係詳細地顯示及描述該具有塗覆之 單斜面外科用刀片。 第23A圖及第23B圖係顯示依據本發明之更一具體實 施例,在一矽晶圓上之一等向性蝕刻製程,其中該矽晶圓 之一側上具有一業已切削成之溝渠,且在一相對側上具有 一塗覆層。如上所述,矽晶圓2 0 2具有施加於第一側3 0 4 上之塗覆1102,該塗覆接著又固定至膠帶308上而因此與 該膠帶緊密接觸,如第23A圖所示。接著,將矽晶圓202 置於包含有蝕刻劑1 4 0 2之浴1 4 0 0中,如上所述中已詳細 討論者。蝕刻劑1 402開始蝕刻矽晶圓202之第二側3 06 ( 「頂側」),以移除一層又一層之矽分子。一段時間後,矽 晶圓202之厚度將因蝕刻劑1 402而減小,直到第二側306 接觸第一側304及塗覆1102爲止。其結果爲一具有氮化矽 塗覆之單斜面砂質基材外科用刀片。具有一氮化砂(或經塗 覆之)刀片刀刃者可擁有之所有前述優點,皆可相同地適用 於參考第18A圖、第18B圖、及第19圖來顯示及討論的本 型刀片上。 第20A圖至第20G圖係顯示可依據本發明之方法製造 - 30 - 200410331 的矽質基材外科用刀片之各種範例。可利用本製程來製造 各種不同之刀片設計。可製作出具有單斜面、對稱與不對 稱之雙斜面 '及曲線切割刀刃的刀片。對於單斜面者而言 ’僅在該晶圓之一側上實施切削。可製作出譬如單刀刃鑿 刀(第20A圖)、三刀刃鑿刀(第2〇B圖)、兩刀刃呈鋒利之 長縫切刀(s 1 i t )(第20C圖)、四刀刃呈鋒利之長縫切刀(第 2 0D圖)、一刀刃呈鋒利之針刺(s t ab )(第20E圖)、一刀刃 呈鋒利之角膜刀(第20F圖)、及曲線型鋒利刀刃之半彎月 刀(第20G圖)。可藉由本製程來改變輪廓傾角、寬度、長 度、厚度、及斜角。本製程可結合傳統之光微影技術來製 作更多變異及特徵。 第21A圖與第21B圖係分別顯示,在5,000X倍放大率 下之依據本發明一具體實施例製造的一矽質外科用刀片、 與一不鏽鋼外科用刀片的側視圖。請注意第2 1 A圖與第2 1 B 圖之差別。第21A圖較平滑且較均勻。第22A圖與第22B 圖係分別顯示,在1 0,000X倍放大率下之依據本發明一具 體實施例製造的一矽質外科用刀片、與一不鏽鋼外科用之 刀片刀刃的上視圖。再次提出,第22A圖與第22B圖之差 別在於,前者、亦即依據本發明一具體實施例之方法達成 的結果’遠較第22B圖之不鏽鋼刀片平滑且均勻。 第25A圖及第25B圖係顯示由一結晶材料製成的一刀 片刀刃、以及由一結晶材料製成且該結晶材料包括依據本 發明一具體實施例之一層轉換製程的一刀片刀刃之輪廓透 視。在本發明之另一具體實施例中,可能在蝕刻該矽晶圓 -31- 200410331 之後,將基板材料之表面藉化學方式轉換成一新材料2504 。迨種步驟亦稱爲一「熱氧化、μ化轉換」、或「砍表面 之碳化矽轉換」步驟。可允許其他元素與該基板/刀片材料 交互作用而生成其他化合物。將該刀片表面轉換成該基板 材料之一化合物的利益在於,可選擇該新材料/表面,而得 生成一較硬之切割刀刃。但不同於一塗覆,該刀片之切割 刀刃仍可保持後蝕刻步驟之幾何形狀及鋒利度。請注意第 25Α圖及第25Β圖,該矽質刀片之深度將因該轉換製程而 不致變化;「D 1」(僅具有矽之刀片深度)等於「D2」(具有 一轉換層2504之矽質刀片的厚度)。 請參考第1圖,在步驟1 〇 1 8之後,將決定是否轉換表 面(決策步驟1 〇 1 9 )。倘若欲加入一轉換層(自決策步驟1 〇 1 9 出發之「是」路徑),則將在步驟1 〇2 1中加入一轉換層。 接著,本方法將前進至步驟1 020。倘若不加入轉換層(自 決策步驟101 9出發之「否」路徑)’則本方法將前進至步 驟1 0 2 0。該轉換製程需要擴散或高溫爐。該基板係在真空 或一惰性環境下加熱至超過5 00°C之一溫度。選定之氣體將 以一受控制之濃度裝塡入高溫爐中’且因高溫而擴散至矽 中。當該等氣體擴散至矽中之後’該等氣體將與矽交互作 用,以形成一新化合物。由於該新化合物係由擴散、以及 與該基板之化學反應而生成’並非藉施加一塗覆達成’因 此可保持該矽質刀片之原始幾何形狀(鋒利度)°該轉換製 程之一額外利益在於’該轉換層之光學折射率係與該基板 者不同,使得該刀片可顯現出色彩。該顏色係根據該轉換 -32- 200410331 材料之組成成份及其厚度兩者而定。 表面處業已轉換之一單結晶基板材料亦表現出較一未 轉換之刀片者優良的破裂及磨耗抵抗力。藉由將表面改變 成一較軟材料,可降低該基板沿著結晶面形成裂痕起始點 及劈裂破壞之趨勢。 可交換實施之一製造步驟的更一範例係毛面處理步驟 。該刀片之矽表面通常具有高度地反射性,特別在以外科 用刀片之較佳具體實施例製造時尤然。這當外科醫師在具 有一照明源之一顯微鏡下使用該刀片時,將困擾該外科醫 師。因此,該刀片表面可具有一毛面處理,使入射光線(譬 如,來自外科手續期間所使用之一高強度燈)漫射,以使其 顯得晦暗而不再發亮。可藉由一適當之雷射來輻射該刀片 表面,依據特定之圖案及密度來熔散該刀片表面中之區域 ,以達成毛面處理。由於放射出之雷射光線一般爲圓形, 因此該等熔散區域係呈一圓形,但並非必須如此。該等圓 形熔散區域之直徑尺寸係藉於2 5至5 0微米之範圍內,且 再次提出,可根據製造者及其所使用之雷射型式而定。 圓形熔散區域之「密度」係指,由該等圓形熔散區域 所覆蓋之表面積所佔的總百分比。一大約5%之「熔散區域 密度」將使正常下平滑、呈反射鏡狀外觀之刀片明顯地變 晦暗。然而,一同設置所有該等熔散區域,將不致影響該 刀片平衡之反射鏡狀效應。因此,該等圓形熔散區域係施 加該刀片之整個表面積,但需以一隨機方式實施。實際上 ,可產生一圖形檔案,其係隨機地設置凹陷部,但可達成 -33 - 200410331 一所需之特定熔散區域密度及圖案隨機性的效果。可由人 工、或藉由一電腦程式自動生成該圖形檔案。可實現之一 額外特徵在於,能夠將序號、製造者商標、或著外科醫師 或醫院之名字刻於該刀片本身上。 典型地,可使用一高架龍門雷射機、或電流計頭 (galvo-head)雷射機,在該刀片上生成毛面處理。其中, 前者速度較慢,但極爲準確,而後者速度較快,但未如高 架龍門者一般地準確。由於總體準確度並非極端重要,而 製造速度將直接影響成本,因此電流計頭雷射機仍屬較佳 工具。其能夠每秒運動數千公厘,而.對於一典型之外科用 刀片,提供一大約五秒鐘之總熔散區域蝕刻時間。 以上已參考某些特定之說明用具體實施例來描述本發 明。然而,熟知此項技藝之人士將可輕易地明白,可能以 不同於上述說明用具體實施例者之特殊型式來具體實施本 發明。這可在不脫離本發明之精神及範圍內達成。說明用 具體實施例僅作爲闡述用,而不應認定爲有限制之意。本 發明之範圍將由隨附申請專利範圍及其等義者、而非前述 說明所定義。 (五)圖式簡單說明 第1圖係顯示依據本發明之一第一具體實施例,用於 由矽來製造一雙斜面外科用刀片的方法之流程圖; 第2圖係顯示依據本發明之一第二具體實施例,用於 由矽來製造一單斜面外科用刀片的方法之流程圖; 第3圖係顯示依據本發明之一第三具體實施例,用於 一 34 - 200410331 由石夕來製造一^卓斜面外科用刀片的變型方法之流程圖; 第4圖係以上視圖來顯不固定於一固定總成上的一矽 晶圓; 第5圖係以側視圖來顯不固定於具有膠帶之一固定總 成上的一矽晶圓; 第6圖係顯示依據本發明之一具體實施例,使用一雷 射水噴注來預切割一矽晶圓’以輔助在該矽晶圓中切削出 溝渠; 第7A圖至第7D圖係顯示依據本發明之一具體實施例 ,用於在一矽晶圓中切削溝渠之晶粒切割鋸條的架構; 第8圖係顯示依據本發明之一具體實施例,一晶粒切 割鋸條貫穿固定於支持背墊上之一 5夕晶圓時的動作; 第8 A圖至第8 C圖係顯示依據本發明之一具體實施例 ,當藉由一晶粒切割鋸條在一矽晶圓中切削溝渠時的溝槽 使用方式; 第9圖係顯示依據本發明之一具體實施例,用於在膠 帶式固定之一矽晶圓中切削一溝渠之一晶粒切割鋸條的剖 面圖; 第1 0 A圖與第1 0 B圖係分別顯示出,依據本發明之一 具體實施例製成之具有一單斜面切割刀刃的一矽質外科用 刀片、與具有一雙斜面切割刀刃的一矽質外科用刀片; 第1 1圖係顯不依據本發明之一具體實施例,用於在一 矽晶圓中切削複數個溝渠之一雷射系統的方塊圖; 第1 2圖係顯示依據本發明之一具體實施例,用於在一 -35 - 200410331 矽晶圓中切削溝渠之一超音波切削系統的方塊圖; 第1 3圖係依據本發明之一具體實施例,用於在一矽晶 圓中形成複數個溝渠之一熱鍛系統的圖式; 第1 4圖係顯示依據本發明之一具體實施例,具有已切 削完成之一單一溝渠及施加至切削側之一塗覆的一矽晶圓 第1 5圖係顯示依據本發明之一具體實施例,用於在藉 膠帶式固定之一矽晶圓中切削出一第二溝渠的一晶粒切割 秦居條剖面圖, 第1 6圖係顯示依據本發明之一具體實施例,已在兩側 上切削出溝渠之一矽晶圓的剖面影像; 第17A圖及第17B圖係顯示依據本發明之一具體實施 例,在一矽晶圓上實施一等向性蝕刻製程,其中該矽晶圓 之兩側上皆具有已切削成之溝渠; 第18A圖及第18B圖係依據本發明之一具體實施例, 在一矽晶圓上實施之一等向性触刻製程,其中該矽晶圓之 兩側上皆具有已切削成之溝渠,且某一側上具有一塗覆層 第1 9圖係顯示依據本發明之一具體實施例來製造在一 側上具有一塗覆之一雙斜面矽質外科用刀片的一最終切割 刀刃; 第20A圖至第20G圖係顯示可依據本發明之方法製造 的矽質基材外科用刀片之各種範例; 第21 A圖與第21B圖係分別顯示,在5,000X倍放大率 -36 - 200410331 下之依據本發明一具體實施例製造的一矽質外科用刀片 與一不鏽鋼外科用刀片的側視圖; 率 第22A圖與第mb圖係分別顯示,在10,〇〇〇χ倍方戈 下之依據本發明一具體實施例製造的一矽質外科用 與一不鏽鋼外科用之刀片刀刃的上視圖;Table I Characteristics Silicon Nitride Silicon Young's Modulus (Giga Pascals (GPa)) 160 323 Falling Strength (Giga Pascals (GP a)) 7 14 200410331 Young's Modu 1 us (also known as elasticity) Modulus) is a measure of the inherent stiffness (st 1 ffness) of a material. The higher the modulus, the stronger the material. The drop strength is the point at which a material changes from elastic to plastic deformation under load. In other words, at this point, the material will no longer flex and will permanently twist or break. After the etching is completed (with or without coating 1102), the etched sand wafer 202 will be thoroughly rinsed and cleaned to remove all remaining uranium etchants 1 40 2 chemicals. Table 19 shows that a final cutting edge having a coated double beveled silicon surgical blade on one side is manufactured in accordance with an embodiment of the present invention. The cutting blade 1602 has a radius of 5 to 500 nanometers, which is similar to a diamond surgical blade, but can be manufactured at a much lower cost. After the etching process of step 10 18 has been completed, the silicon substrate surgical blade can be fixed according to step 1020, which is the same as step 1002 and step 2003. After the step 1020, the In step 1022, the stone-based substrate surgical blade (silicon blade) is separated, which means the use of a grain cutting saw blade, a laser beam (for example, laser water jet 402 or an excimer laser) ), Or other suitable means to divide each silicon blade so that the silicon blades are separated from each other. Those skilled in the art will understand that lasers with certain specific wavelengths in the range of 150 nm to 11,000 nm can also be used. An example of a laser with a wavelength in this range is an excimer laser. Laser water jets (yttrium aluminum garnet lasers) are unique in that they can form vortex-shaped, discontinuous patterns in the wafer. This provides the manufacturer with the flexibility to make an almost unlimited number of non-cutting edge blade profiles. Laser Water Jetting-2 6-200410331 uses a stream of water as a waveguide to allow the laser to cut like a band saw. This is the one in the current state of the art technology that can only cut continuous, straight line patterns. ‘In step 1024, according to the special needs of the customer, the silicon surgical blade for pick-up can be picked up and placed on the blade handle assembly. However, before actual "pick up and placement", the silicon wafer 202 (fixed on the tape and the frame, or a tape / wafer frame) can be irradiated with ultraviolet rays in a wafer fixing machine to Reduce the thickness of the tape 308. The silicon wafers on the tape and frame, or the tape / wafer frame, which are still in the "reduced thickness", are then loaded into a die that can be obtained by commercial means.-An attached assembly system. Recalling the discussion above, the order of some specific steps can be exchanged according to various manufacturing environments. One example is the separation and ultraviolet irradiation steps. These steps can be exchanged if necessary. The die-attach assembly system can remove individual etched silicon surgical blades from "reduced thickness" tapes and frames, or tape / wafer frames, and within the required tolerances, Silicon surgical blades are attached to their respective brackets. An epoxy resin and an adhesive can be used to fix the two components. The silicon surgical blade can be attached to its respective substrate using other assembly methods including thermal stacking, ultrasonic stacking, ultrasonic welding, laser welding, or eutectic bonding. Finally, in step 丨 26, the fully assembled osmium surgical blade with a handle can be packaged to ensure safety and = invasiveness, and it can be transported to be used for the design of the silicon surgical blade In the use. Other assembly methods that can be used to secure this surgical 71 feeding blade to its bracket -27- 200410331 include the use of other grooves. As described above, trenches can be generated by laser water jet or excimer laser, and the trenches are provided when the trench is cut, and the die-cutting saw blade can engage one of the openings of the silicon wafer 202. The use of additional grooves will provide a receptacle in the blade for use with one or more posts in a bracket. Figure 24 shows this configuration. In FIG. 24, the manufactured blade 2402 for surgery has two grooves 2404A and 2404B formed in the bracket interface area 2406. This interface has posts 2408A, 2408B for the blade holder 2410. The grooves can be cut into the dicing wafer 202 at any point in the manufacturing process, but it is preferably performed before the surgical blade is separated. An adhesive can be applied to the appropriate area before contacting to ensure a firm hold. Then, as shown in the figure, a cover 2 4 1 2 can be glued to provide a perfect appearance of the finished product. The purpose of implementing the post-groove assembly is to provide the blade 2 4 2 with additional resistance to any tension that may be encountered during a cutting process. After explaining the manufacturing process of a pair of beveled silicon substrate surgical blades, please turn your attention to FIG. 2, which shows a specific embodiment of the present invention, 'Make a single bevel from sand. Flow chart of one method of surgical blades. Steps 1002, 1004, 1006, and 1008 in FIG. 1 are the same as those shown in FIG. 2 and will not be described again. However, a method for making a single bevel surgical blade This method is different from the method of manufacturing a pair of beveled surgical blades, that is, step 100, so this will be discussed in detail. After step 108, the decision step i0 丨 〇 will determine whether the sand wafer 202 which has already been cut is removed from the silicon wafer fixing assembly 204. If the -28-200410331 is unloaded except for the single trench silicon wafer 202 (in step 1012), a further option is to die-cut the single trench wafer in step 1016. In the selective removal step 102, the silicon wafer 2 02 can be removed from the tape 3 08 by using the same standard fixing machine. If the silicon wafer 202 is removed in step 1012, the silicon wafer 202 may be selectively die-cut in step 1016 (i.e., the silicon wafer 202 is cut into elongated objects). The die cutting step 1016 may be performed by a die cutting blade, an excimer laser 902, or a laser water jet 402. The grain cutting system provides the final elongated strip that will be etched (in step 10 18) in a custom fixture rather than a wafer boat (discussed in detail below). In the method for manufacturing a single beveled silicon substrate surgical blade, whether it is the grain cutting step 10 16, the removing step 1012, or the next step after the trench cutting step 10 08, it is all the step 10 1 8. Step 10 18 is an etching step, which has been discussed in detail above. After that, the steps are followed by steps 1 020, 1 022, 1024, and 1 026, and since all of them have been described in detail above with reference to the manufacture of a pair of beveled silicon substrate surgical blades, no further explanation is necessary. Fig. 3 is a flow chart showing a modification of a single beveled surgical blade made of silicon according to a third embodiment of the present invention. The method shown in Figure 3 in steps 1 002, 1 004, 1 006, and 1 008 is exactly the same as that shown in Figure 2. However, after step 1008 in Fig. 3, there will be a coating step 2002. Since the coating step 2002 has been described above with reference to FIG. 1, it is unnecessary to repeat it. The result of this coating step is the same as the foregoing: the silicon wafer 202 has a layer 1 102 on the cutting side. After the coating step 2002, the silicon wafer 202 will be removed and fixed in step 2003. This step is also exactly the same as the one discussed previously with reference to the second figure (step 2003). As a result, the coating side of the silicon wafer 202 will face the solid assembly 204 downward. Thereafter, steps 1018, 1020, 1022, 1024, and 1026 will occur, and all of them have been described in detail above. The overall result is a single bevel surgical blade, and the first side 304 (cutting side) has a coating layer 1102 to improve the strength and durability of the surgical blade. Tables 23A and 23B show and describe the coated single bevel surgical blade in detail. 23A and 23B show an isotropic etching process on a silicon wafer according to a more specific embodiment of the present invention, in which one side of the silicon wafer has a cut trench, A coating layer is provided on an opposite side. As described above, the silicon wafer 202 has a coating 1102 applied to the first side 304, which is then fixed to the adhesive tape 308 and is thus in close contact with the adhesive tape, as shown in Fig. 23A. Next, the silicon wafer 202 is placed in a bath 1440 containing an etchant 1420, as discussed in detail above. The etchant 1 402 starts to etch the second side 3 06 (“top side”) of the silicon wafer 202 to remove layers of silicon molecules. After some time, the thickness of the silicon wafer 202 will be reduced by the etchant 1 402 until the second side 306 contacts the first side 304 and is coated 1102. The result is a single bevel sandy substrate surgical blade with a silicon nitride coating. All the aforementioned advantages that a person with a nitrided sand (or coated) blade has can be applied to the same type of blades as shown and discussed with reference to Figures 18A, 18B, and 19 . Figures 20A to 20G show various examples of silicon-based surgical blades that can be manufactured by the method of the present invention. This process can be used to make a variety of different blade designs. Blades with single bevel, symmetrical and asymmetric double bevels, and curved cutting edges can be made. For a single bevel, ’cutting is performed on only one side of the wafer. Can produce single-edged chisels (Fig. 20A), three-edged chisels (Fig. 20B), two long-edged long-slit cutters (s 1 it) (Fig. 20C), and four-edged blades Long slit knife (Fig. 20D), a sharp acupuncture blade (st ab) (Fig. 20E), a sharp corneal knife (Fig. 20F), and a curved half-curved blade Moon Sword (picture 20G). This process can be used to change the profile inclination, width, length, thickness, and bevel. This process can be combined with traditional light lithography techniques to make more variations and features. 21A and 21B are respectively side views of a silicon surgical blade and a stainless steel surgical blade manufactured according to a specific embodiment of the present invention at a magnification of 5,000X. Please note the difference between Figure 2 A and Figure 2 B. Figure 21A is smoother and more uniform. 22A and 22B are top views of a silicon surgical blade and a stainless steel surgical blade, respectively, manufactured at a 10,000X magnification according to a specific embodiment of the present invention. It is again proposed that the difference between FIG. 22A and FIG. 22B is that the former, that is, the result achieved by the method according to a specific embodiment of the present invention, is much smoother and more uniform than the stainless steel blade of FIG. 22B. 25A and 25B are perspective views showing the outline of a blade edge made of a crystalline material and a blade edge made of a crystalline material including a layer conversion process according to a specific embodiment of the present invention; . In another embodiment of the present invention, it is possible to chemically convert the surface of the substrate material into a new material 2504 after etching the silicon wafer -31-200410331. This step is also referred to as a "thermal oxidation, µ conversion", or "silicon carbide conversion by cutting surface" step. Other elements may be allowed to interact with the substrate / blade material to generate other compounds. The benefit of converting the blade surface into a compound of the substrate material is that the new material / surface can be selected to produce a harder cutting edge. However, unlike a coating, the cutting edge of the blade can still maintain the geometry and sharpness of the post-etching step. Please note in Figures 25A and 25B, the depth of the silicon blade will not change due to the conversion process; "D 1" (only blade depth with silicon) is equal to "D2" (silicon with a conversion layer 2504) Blade thickness). Please refer to Figure 1. After step 1018, you will decide whether to convert the surface (decision step 1019). If a transition layer is to be added (the “yes” path from decision step 1010), a transition layer will be added in step 1021. The method then proceeds to step 1020. If no conversion layer is added ("No" path starting from decision step 1019) ', the method will proceed to step 1 0 2 0. This conversion process requires a diffusion or high temperature furnace. The substrate is heated to a temperature in excess of 500 ° C under a vacuum or an inert environment. The selected gas will be loaded into a high temperature furnace 'at a controlled concentration' and diffused into the silicon due to the high temperature. After the gases have diffused into the silicon, the gases will interact with the silicon to form a new compound. Because the new compound is generated by diffusion and chemical reaction with the substrate 'is not achieved by applying a coating', the original geometry (sharpness) of the silicon blade can be maintained. An additional benefit of the conversion process is 'The optical refractive index of the conversion layer is different from that of the substrate, so that the blade can develop color. The color is based on both the composition of the conversion and the thickness of the material. One of the single crystal substrate materials that has been converted at the surface also exhibits better resistance to cracking and abrasion than an unconverted blade. By changing the surface to a softer material, it is possible to reduce the tendency of the substrate to form crack initiation points and cleavage failure along the crystal plane. A further example of a manufacturing step that can be implemented interchangeably is a matte processing step. The silicon surface of the blade is generally highly reflective, especially when manufactured in a preferred embodiment of a surgical blade. This can bother the surgeon when the surgeon uses the blade under a microscope with an illumination source. Therefore, the blade surface may have a matte finish to diffuse incident light (for example, from a high-intensity lamp used during surgical procedures) so that it appears dull and no longer shiny. The surface of the blade can be irradiated by an appropriate laser, and the area in the surface of the blade can be fused according to a specific pattern and density to achieve a rough surface treatment. Since the emitted laser light is generally circular, the fused regions are circular, but this is not necessary. The diameter of these circular fused regions is in the range of 25 to 50 micrometers, and it is again proposed that it can be determined according to the manufacturer and the type of laser used. The “density” of circular fused regions refers to the total percentage of the surface area covered by those circular fused regions. A "fuse area density" of about 5% will significantly dim blades that are normally smooth and mirror-like in appearance. However, setting all these fused areas together will not affect the mirror-like effect of the blade balance. Therefore, the circular fused regions are applied over the entire surface area of the blade, but need to be implemented in a random manner. In fact, a graphic file can be generated, which is provided with recesses randomly, but it can achieve the desired effects of specific density of the fusion area and randomness of the pattern. The graphic file can be generated manually, or by a computer program. One of the additional features is that the serial number, the manufacturer's trademark, or the name of the surgeon or hospital can be engraved on the blade itself. Typically, an overhead gantry laser or galvo-head laser can be used to produce a matte finish on the blade. Among them, the former is slower but extremely accurate, while the latter is faster, but not as accurate as the overhead gantry. Because overall accuracy is not extremely important, and manufacturing speed will directly affect cost, galvanometer head lasers are still a better tool. It is capable of moving thousands of millimeters per second, and for a typical surgical blade, provides a total etch time of the fusion zone of about five seconds. The present invention has been described above with reference to certain specific embodiments using specific embodiments. However, those skilled in the art will readily understand that the present invention may be embodied in a special form other than the one described above using specific embodiments. This can be achieved without departing from the spirit and scope of the invention. The specific embodiments are only used for illustration, and should not be regarded as restrictive. The scope of the invention will be defined by the scope of the accompanying patent applications and their equivalents, not by the foregoing description. (V) Brief Description of Drawings Figure 1 is a flowchart showing a method for manufacturing a double bevel surgical blade from silicon according to a first embodiment of the present invention; Figure 2 is a flowchart showing a method according to the present invention. A second specific embodiment is a flowchart of a method for manufacturing a single bevel surgical blade from silicon; FIG. 3 shows a third specific embodiment according to the present invention for a 34-200410331 by Shi Xi A flowchart of a method for manufacturing a modified bevel surgical blade; FIG. 4 is a view above to show a silicon wafer fixed on a fixed assembly; and FIG. 5 is a side view to show whether it is fixed on a silicon wafer. A silicon wafer with a tape on a fixed assembly; FIG. 6 shows a laser water jet to pre-cut a silicon wafer according to a specific embodiment of the present invention to assist in the silicon wafer Cut out trenches; Figures 7A to 7D show the structure of a die-cutting saw blade for cutting trenches in a silicon wafer according to a specific embodiment of the present invention; Figure 8 shows one of the present invention Specific embodiment, a die cutting saw blade Figure 5A to 8C show the actions when a 5th wafer is fixed on the supporting back pad. According to a specific embodiment of the present invention, when a saw blade is cut in a silicon wafer by a die Method for using trenches when cutting trenches; FIG. 9 is a cross-sectional view of a die-cutting saw blade for cutting a trench in a silicon wafer with tape-type fixing according to a specific embodiment of the present invention; FIG. 1 Figures 0 A and 10 B respectively show a silicon surgical blade having a single bevel cutting blade and a silicon material having a double bevel cutting blade made according to a specific embodiment of the present invention. Surgical blades; FIG. 11 is a block diagram showing a laser system for cutting one of a plurality of trenches in a silicon wafer according to a specific embodiment of the present invention; FIG. 12 is a diagram showing a laser according to the present invention A specific embodiment is a block diagram of an ultrasonic cutting system for cutting one of trenches in a silicon wafer of -35-200410331; FIG. 13 is a diagram for a silicon wafer according to a specific embodiment of the present invention. Hot forging system forming one of a plurality of trenches in a circle Figure 14 shows a silicon wafer with a single trench that has been cut and a coating applied to the cutting side according to a specific embodiment of the present invention. Figure 15 shows a silicon wafer according to the present invention. A specific embodiment is a cross-sectional view of a grain-cutting Qinju bar for cutting a second trench in a silicon wafer fixed by tape. FIG. 16 shows a specific embodiment according to the present invention. A cross-sectional image of a silicon wafer having a trench cut on both sides; FIGS. 17A and 17B show an isotropic etching process performed on a silicon wafer according to a specific embodiment of the present invention, wherein The silicon wafer has cut trenches on both sides; FIGS. 18A and 18B are an isotropic touch-etching process performed on a silicon wafer according to a specific embodiment of the present invention. The silicon wafer has cut trenches on both sides, and a coating layer on one side. Figure 19 shows a coating manufactured on one side according to a specific embodiment of the present invention. One final cutter with double beveled silicon surgical blades Figures 20A to 20G show various examples of silicon-based surgical blades that can be manufactured according to the method of the present invention; Figures 21A and 21B show separately, at 5,000X magnification -36- 200410331 A side view of a silicon surgical blade and a stainless steel surgical blade manufactured according to a specific embodiment of the present invention; Figures 22A and mb are respectively shown at 10, 000 square times. The following is a top view of a silicon surgical blade and a stainless steel surgical blade made according to a specific embodiment of the present invention;

弟23Α圖及弟23Β圖係顯示依據本發明之更一亘辦 施例,在一矽晶圓上之一等向性蝕刻製程,其中該矽晶 之一側上具有一業已切削成之溝渠,且在一相對側上真 一塗覆層; 第24 ΒΙ係顯示-手柄與依據本發明—具體實施例製造 之一外科用刀片的一柱件-溝槽總成;及 第25Α圖及帛25Β_係顯示由—結晶材料製成的—刀 材料包括依據本 片刀刃、以及由一結晶材料製成且該結晶 發明 視。 一具體實施例之一層轉換製程的 刀片刀刃之輪廓透 元件符號說明 100 102 104 202 204 304 306 308 超音波機工具 硏磨泥漿 工具 矽晶_ 固定總成 第一側 第二側 膠帶 一 37〜 200410331 402 雷射水噴注 404 ^ 904 雷射光束 406 貫穿孔基準 502 第一晶粒切割刀片 504 第二晶粒切割刀片 506 第三晶粒切割刀片 508 第四晶粒切割刀片 900 雷射機總成 902 雷射 906 多軸控制機構 908 基座 1002 、 1020 固定晶圓 1004 預切割 1006 預切割 1008 ^ 2004 切削溝渠 1010 卸除 1012 卸除 1014 、 1018 鈾刻 1016 晶粒切割 1018 蝕亥U 1019 加入轉換層 1021 轉換層製程 1022 分離 1024 拾起及置放 -38 - 200410331 1026 1052 1054 1102 1400 1402 1404 1406 1408 1410 、 1412 1504 、 1506 、 1508 1602 200 1 2002 2003 2005 2402 2404a ^ 2404b 2406 2408a ^ 2408b 2410 2412 2504 D1 封裝 (加熱過之)模具 加熱基座構件 塗覆 等向性酸性浴 (等向性)蝕刻劑 第一外科用刀片 第二外科用刀片 第三外科用刀片 傾角 矽質基材外科用刀片 切割刀口 塗佈 塗佈 卸除及再次固定 切削或晶粒切割 製作完成之外科用刀片 溝槽 托架界面區域 柱件 刀片托架 外罩 轉換層 僅具有矽之刀片深度 -39 - 200410331 D2 具有一轉換層之矽質刀片的厚度 Φ 傾角Figure 23A and Figure 23B show a further embodiment according to the present invention, an isotropic etching process on a silicon wafer, in which one side of the silicon crystal has a trench that has been cut. And a true coating layer on an opposite side; the 24th ΒΙ series display-handle and a post-groove assembly of a surgical blade manufactured in accordance with the present invention-specific embodiment; and FIG. 25A and FIG. 25B_ It is shown that the knife material made of-crystalline material includes the blade according to the present sheet, and the crystalline invention is made of a crystalline material. A specific embodiment of the one-layer conversion process of the blade edge of the blade through the component symbol description 100 102 104 202 204 304 306 308 Ultrasonic machine tool honing mud tool silicon crystal _ Fixing assembly first side second side tape-37 ~ 200410331 402 Laser water injection 404 ^ 904 Laser beam 406 Through hole reference 502 First die cutting blade 504 Second die cutting blade 506 Third die cutting blade 508 Fourth die cutting blade 900 Laser machine assembly 902 Laser 906 Multi-axis control mechanism 908 Base 1002, 1020 Fixed wafer 1004 Pre-cut 1006 Pre-cut 1008 ^ 2004 Cutting trench 1010 Unload 1012 Unload 1014, 1018 Uranium engraving 1016 Grain cutting 1018 Etching U 1019 Add conversion layer 1021 Conversion layer process 1022 Separate 1024 Pick up and place -38-200410331 1026 1052 1054 1102 1400 1402 1404 1406 1408 1408 1410, 1412 1504, 1506, 1508 1602 200 1 2002 2003 2005 2402 2404a ^ 2404b 2406 2408a ^ 2408b 2410 2412 2504 D1 Encapsulated (heated) mold heating base member coating isotropic acid bath (isotropic) etching Agent first surgical blade second surgical blade third surgical blade inclination angle silicon substrate surgical blade cutting blade coating coating removal and re-fixation cutting or die-cutting finished blade groove bracket for surgery Interface area pillar blade bracket cover conversion layer only has silicon blade depth-39-200410331 D2 thickness of silicon blade with a conversion layer Φ inclination

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Claims (1)

200410331 拾、申晴專利範_ ' ......; ;;. ; ; . " ' ·. .-:: .. ' '-"'Λ. 1.-種由-結晶材料製造一切割裝置的方法,其包括: 在該結晶材料晶^ _々_笛 . 付曰日_之一弟一側上切削出至少一刀片輪 廓; 蝕刻該結晶材料晶圓’以形成至少—外科用刀片;及 分離該等業已蝕刻之結晶材料外科用刀片。 2 ·如申g靑專利fe圍第丨項之方法,其中該切削步驟包括: 藉由一晶粒切割鋸條,以在該結晶材料晶圓中切削出 至少一刀片輪廓。 3 ·如申硝專利範圍第1項之方法’其中該切削步驟包括: 藉由一雷射光束,以在該結晶材料晶圓中切削出至少 一刀片輪廓。 4.如申請專利範圍第3項之方法’其中該雷射光束係由準 分子雷射或雷射水噴注產生。 5 ·如申S靑專利$E圍弟1項之方法’其中該切削步驟包括: 藉由一超音波機,以在該結晶材料晶圓中切削出至少 一刀片輪廓。 6 ·如申請專利範圍第1項之方法’其中該切削步驟包括: 藉由一熱鍛製程,以在該結晶材料晶圓中切削出至少 一刀片輪廓。 7 ·如申請專利範園第1項之方法,其中該蝕刻步驟包括: 將具有至少一刀片輪廓之該結晶材料晶圓置放於一晶 圓舟上; 將該晶圓舟、及該具有至少一刀片輪廓之該結晶材料 200410331 晶圓浸漬於一等向性酸性浴中;及 藉由一均句方式触刻該結晶材料,使得可在任何曝露 表面上皆藉一均勻方式移除該結晶材料,因此得以蝕刻 出呈該至少一刀片輪廓外型的·~鋒利外科用刀片刀刃。 8 .如申I靑專利範圍桌7項之方法,其中該等向性酸性浴包 括: 氫氟酸、硝酸、及醋酸之混合物。 9 ·如申請專利範圍第7項之方法,其中該等向性酸性浴包 括·· 氫氟酸、硝酸、及水之混合物。 1 0 .如申請專利範圍第1項之方法,其中該餓刻步驟包括: 將具有至少一刀片輪廓之該結晶材料晶圓置放於一晶 圓舟上; 將一噴塗式餘刻劑噴塗至該晶圓舟、及該具有至少一 刀片輪廓之該結晶材料晶處;及 藉由一均勻方式且利用該噴塗式蝕刻劑來蝕刻該結晶 材料,使得可在任何曝露表面上皆藉一均勻方式移除該 結晶材料,因此得以鈾刻出呈該至少一刀片輪廓外型的 鋒利外科用刀片刀刃。 1 1 .如申請專利範圍第1項之方法,其中該蝕刻步驟包括: 將具有至少一刀片輪廓之該結晶材料晶圓置放於一晶 圓舟上; 將該晶圓舟、及該具有至少一刀片輪廓之該結晶材料 晶圓浸漬於一等向性二氦化氣、六氟化硫、或相似之氟 - 4 2 - 200410331 化氣體環境中;及 藉由一均勻方式且利用該等向性二氟化氙、六氟化硫 、或相似之化氣體來餓刻該結晶材料,使得可在任何· 曝露表面上皆藉一均勻方式移除該結晶材料,因此得& 蝕刻出呈該至少一刀片輪廓外型的一鋒利外科用刀片刀 刃。 1 2 .如申請專利範圍第1項之方法,其中該蝕刻步驟包括: 將具有至少一刀片輪廓之該結晶材料晶圓置放於_晶 圓舟上; 將該晶圓舟、及該具有至少一刀片輪廓之該結晶材料 晶圓浸漬於一電解浴中;及 藉由一均勻方式且利用該電解浴來蝕刻該結晶材料, 使得可在任何曝露表面上皆藉一均勻方式移除該結晶材 料,因此得以蝕刻出呈該至少一刀片輪廓外型的一鋒利 外科用刀片刀刃。 1 3 ·如申請專利範圍第1項之方法,其中該分離步驟包括: 藉由一晶粒切割刀片對該業已切削之結晶材料晶圓作 晶粒切割。 1 4 ·如申請專利範圍第1項之方法,其中該分離步驟包括: 藉由一雷射光束對該業已切削之結晶材料晶圓作晶半立 切割。 5 ·如申請專利範圍第1項之方法,其中該雷射光束係由〜 準分子雷射或一雷射水噴注產生。 1 6 ·如申請專利範圍第1項之方法,其中又包括: 一 4 3 - 200410331 在切削出呈單斜面外科用刀片型式之該至少一刀片輪 廓之後、且在該鈾刻步驟之前,對該業已切削之結晶材 料晶圓的輪廓作晶粒切割。 1 7 .如申請專利範圍第1 6項之方法,其中該晶粒切割步驟包 括: 藉由一晶粒切割刀片對該業已切削之結晶材料晶圓作 晶粒切割。 1 8 ·如申請專利範圍第1 6項之方法,其中該晶粒切割步驟包 括: 藉由一雷射光束對該業已切削之結晶材料晶圓作晶粒 切割。 1 9 .如申請專利範圍第1 8項之方法,其中該雷射光束係由一 準分子雷射或一雷射水噴注產生。 20 ·如申請專利範圍第丨項之方法,其中又包括: 在該蝕刻步驟之前’於該結晶材料晶圓中之該結晶材 料晶圓一第二側上切削出至少一第二刀片輪廓。 21 ·如申請專利範圍第20項之方法,其中又包括: 塗佈該業已切削之結晶材料晶圓的第一側。 2 2 ·如申請專利範圍第2 1項之方法,其中該塗佈步驟包括: 將選自由氮化矽、氮化鈦、氮化鈦鋁、二氧化矽、碳 化矽、碳化鈦、氮化硼、或鑽石狀結晶所組成之群的一 材料層來塗佈該業已切削之結晶材料晶圓的第一側。 2 3 ·如申請專利範圍第2 〇項之方法,其中又包括: 在該第二側中切削出該至少一第二刀片輪廓之後、且 一 4 4 一 200410331 在該蝕刻步驟之前,對該業已切削之結晶材料晶圓作晶 粒切割,而成爲複數個互相分割的已切削雙斜面刀片輪 廓。 2 4 .如申請專利範圍第2 3項之方法,其中該晶粒切割步驟包 括: 藉由一晶粒切割刀片對該業已切削之結晶材料晶圓作 晶粒切割。 25 ·如申請專利範圍第23項之方法,其中該晶粒切割步驟包 括: 藉由一雷射光束ΐί該業已切削之結晶材料晶圓作晶粒 切割。 2 6 ·如申請專利範圍第2 5項之方法,其中該雷射光束係由一 準分子雷射或一雷射水噴注產生。 27 ·如申請專利範圍第!項之方法,其中又包括: 在該切削結晶材料晶圓之步驟之後,塗佈該結晶材料 晶圓之第一側;及 在該蝕刻步驟之前’將該結晶材料晶圓固定於其第一 側上。 •如申請專利範圍第27項之方法,其中該塗佈步驟包括: 將選自由氮化矽、氮化鈦、氮化鈦鋁、二氧化矽、碳 化砂、碳化鈦、氮化硼、或鑽石狀結晶所組成之群的— 材料層來塗佈該業已形成之結晶材料晶圓的第一側。 肩申請專利範圍胃i項之方法’其中該結晶材料包括石夕 2 8 - 45 - 29 200410331 30 一種由一結晶林 曰曰付枓製造〜切割裝置的方法,其包括: 將一結晶材料晶圓固定於-固定總成上; 預切割該固$ ^ α θ r 、 疋之紀日日材料晶圓,以切割出複數個貫穿 孔基準,來輔助該切削步驟; 在該結晶材料晶圓之一第一側上切削出至少一刀片輪 廓; W 蝕刻該結晶材料晶圓,以形成至少-外科用刀片; 分離該等業已蝕刻之結晶材料外科用刀片;及 藉由紫外線來輻射該業已分離之蝕刻結晶材料外科用 刀片,以自該固定總成分割出,而準備加以封裝後再販 售。 、 31.如申請專利範圍第30項之方法’其中該預切割步驟包括 藉由一雷射光束,在該業已固定之結晶材料晶圓中預 切割出該等貫穿孔基準。 3 2 ·如申g靑專利範圍第31項之方法,其中該雷射光束係由一 準分子雷射或一雷射水噴注產生。 33 ·如申請專利範圍第30項之方法,其中該預切割步驟包括 藉由一機械切削裝置’在該業已固定之結晶材料晶圓 中預切割出該等貫穿孔基準。 3 4 ·如申請專利範圍第3 3項之方法,其中該機械切削裝置包 括一*鑽孔工具、超首波切削工具、或一機械硏磨裝置。 35 ·如申請專利範圍第30項之方法,其中該結晶材料包括砂 一 46- 200410331 36 · -種由—結晶材料製造—切割裝置的方法,其包括: 將一結晶材料晶圓固定於—固定總成上; 預切割該固定之結晶材料晶 1曰日直I 以切割出複數個溝槽 ,來輔助該切削步驟; 廓 在該結晶材半斗晶圓之一第—側±七刀削出至少—刀片輪 蝕刻該結晶材料晶圓,以形成至少一外科用刀片; 分離該等業已蝕刻之結晶材料外科用刀片;及 藉由紫外線來輻射該業已分離之蝕刻結晶材料外科用 刀片’以自該固定總成分割出,而準備加以封裝後再販 售。, 3 7 .如申請專利範圍第3 6項之方法,其中又包括: 藉由一雷射光束’在該業已固定之結晶材料晶圓中, 遠離該結晶材料邊緣之一距離處,預切割出該等溝槽; 及 藉由一晶粒切割鋸條切削出該至少一刀片輪廓,其中 該晶粒切割鋸條係在該等預切割溝槽處與該結晶晶圓嚙 合。 38 ·如申請專利範圍第37項之方法,其中該雷射光束係由一 準分子雷射或一雷射水噴注產生。 3 9 ·如申請專利範圍第3 6項之方法,其中又包括: 藉由一機械切削裝置,在該業已固定之結晶材料晶圓 中’速離該結晶材料邊緣之一距離處,預切割出該等溝 - 47- 200410331 槽;及 藉由一晶粒切割鋸條· 該晶粒切割鋸條係在該 合。 40 .如申請專利範圍第39項 括一鑽孔工具、超音波, 4 1 .如申請專利範圍第3 6項 ϋ削出該至少一刀片輪廓,其中 亭預切割溝槽處與該結晶晶圓嚙 之方法,其中該機械切削裝置包 |削工具、或一機械硏磨裝置。 之方法,其中該結晶材料包括矽200410331 Shifan, Shenqing Patent Fan _ '......; ;;;;. &Quot;' ·. .- :: .. ''-" 'Λ. 1.-made by -crystalline material A cutting device method, comprising: cutting out at least one blade profile on one side of the crystalline material crystal ^ _々_ flute; one side of the brother; etch the crystalline material wafer 'to form at least-surgical Blades; and surgical blades for separating these etched crystalline materials. 2. The method according to item 1 of the patent application, wherein the cutting step includes: cutting a saw blade with a die to cut out at least one blade profile in the crystalline material wafer. 3. The method according to claim 1 of the patent application scope, wherein the cutting step includes: cutting a contour of at least one blade in the crystalline material wafer by a laser beam. 4. The method according to item 3 of the patent application scope, wherein the laser beam is generated by an excimer laser or a laser water jet. 5. The method according to item S of the patent $ E of Shou Shou, wherein the cutting step includes: using an ultrasonic machine to cut out at least one blade profile in the crystalline material wafer. 6. The method according to item 1 of the scope of patent application, wherein the cutting step comprises: cutting a contour of at least one blade in the crystalline material wafer by a hot forging process. 7. The method of claim 1, wherein the etching step includes: placing the crystalline material wafer having at least one blade profile on a wafer boat; placing the wafer boat, and the wafer having at least one A blade profile of the crystalline material 200410331 is immersed in an isotropic acid bath; and the crystalline material is etched by a uniform sentence method, so that the crystalline material can be removed in a uniform manner on any exposed surface Therefore, it is possible to etch out a sharp surgical blade with the contour of the at least one blade. 8. The method of claim 7 in the scope of the patent application, wherein the tropic acid bath includes: a mixture of hydrofluoric acid, nitric acid, and acetic acid. 9. The method according to item 7 of the scope of patent application, wherein the isotropic acid bath includes a mixture of hydrofluoric acid, nitric acid, and water. 10. The method according to item 1 of the scope of patent application, wherein the step of engraving comprises: placing the crystalline material wafer having at least one blade profile on a wafer boat; spraying a spray-type post-etch agent onto The wafer boat and the crystalline material crystal having at least one blade profile; and the crystalline material is etched by a uniform method and using the spray-type etchant, so that a uniform method can be borrowed on any exposed surface The crystalline material is removed, so that uranium can be used to cut sharp surgical blade edges with the contour of the at least one blade. 1 1. The method of claim 1, wherein the etching step includes: placing the crystalline material wafer having at least one blade profile on a wafer boat; placing the wafer boat, and the wafer having at least one The crystalline material wafer with a blade profile is immersed in an isotropic dihelium gas, sulfur hexafluoride, or similar fluorine-4 2-200410331 gas environment; and by using a uniform method and using the isotropic Xenon difluoride, sulfur hexafluoride, or similar chemical gas to engrav the crystalline material, so that the crystalline material can be removed in a uniform manner on any exposed surface, so the & A sharp surgical blade with an outline of at least one blade. 1 2. The method according to item 1 of the patent application scope, wherein the etching step includes: placing the crystalline material wafer having at least one blade profile on a wafer boat; placing the wafer boat and the wafer having at least one A crystalline material wafer with a blade profile is immersed in an electrolytic bath; and the crystalline material is etched in a uniform manner using the electrolytic bath, so that the crystalline material can be removed in a uniform manner on any exposed surface Therefore, a sharp surgical blade edge having the contour of the at least one blade can be etched. 1 3 · The method according to item 1 of the patent application scope, wherein the separating step includes: dicing the crystalline material wafer that has been cut with a dicing blade. 14 · The method according to item 1 of the patent application scope, wherein the separating step includes: performing a semi-vertical dicing on the already cut crystalline material wafer by a laser beam. 5. The method according to item 1 of the patent application range, wherein the laser beam is generated by an excimer laser or a laser water jet. 1 6 · The method according to item 1 of the patent application scope, further comprising: a 4 3-200410331 after cutting the contour of the at least one blade in the form of a single bevel surgical blade and before the uranium cutting step, The crystalline material wafer has been cut for grain cutting. 17. The method according to item 16 of the patent application scope, wherein the die cutting step comprises: using a die cutting blade to perform a die cutting on the wafer of crystalline material that has been cut. 18 · The method according to item 16 of the patent application scope, wherein the die cutting step includes: dicing the already cut crystalline material wafer by a laser beam. 19. The method of claim 18, wherein the laser beam is generated by an excimer laser or a laser water jet. 20. The method according to item 丨 of the patent application scope, further comprising: cutting out at least a second blade profile on a second side of the crystalline material wafer in the crystalline material wafer before the etching step. 21 · The method according to item 20 of the patent application scope, further comprising: coating the first side of the crystalline material wafer that has been cut. 2 2 · The method according to item 21 of the patent application scope, wherein the coating step comprises: selecting from the group consisting of silicon nitride, titanium nitride, titanium aluminum nitride, silicon dioxide, silicon carbide, titanium carbide, and boron nitride Or a layer of material consisting of a group of diamond-like crystals to coat the first side of the crystalline material wafer that has been cut. 2 3 · The method of claim 20 in the scope of patent application, further comprising: after cutting out the at least one second blade profile in the second side, and a 4 4 -200410331 before the etching step, The cut crystalline material wafer is cut into grains, and becomes a plurality of cut double beveled blade contours that are separated from each other. 24. The method according to item 23 of the patent application scope, wherein the die cutting step comprises: using a die cutting blade to perform a die cutting on the already-cut crystalline material wafer. 25. The method according to item 23 of the patent application, wherein the die cutting step includes: cutting the crystalline material wafer that has been cut by a laser beam. 26. The method of claim 25, wherein the laser beam is generated by an excimer laser or a laser water jet. 27 · If the scope of patent application is the first! The method of claim 1, further comprising: coating the first side of the crystalline material wafer after the step of cutting the crystalline material wafer; and 'fixing the crystalline material wafer to the first side thereof before the etching step. on. • The method of claim 27, wherein the coating step includes: selecting from silicon nitride, titanium nitride, titanium aluminum nitride, silicon dioxide, sand carbide, titanium carbide, boron nitride, or diamond A group of crystalline crystals—a layer of material to coat the first side of the crystalline material wafer that has been formed. The method of applying for the scope of item I of the patent for shoulders, wherein the crystalline material includes Shi Xi 2 8-45-29 200410331 30. A method for manufacturing a cutting device from a crystal forest, including: cutting a crystal material wafer Fixing on the fixing assembly; pre-cutting the solid material wafers ^ α θ r, 疋 纪 纪 日 day material wafers, to cut a plurality of through-hole references to assist the cutting step; in one of the crystalline material wafers Cut out at least one blade profile on the first side; W etch the crystalline material wafer to form at least a -surgical blade; separate the etched crystalline material surgical blades; and irradiate the separated etch by ultraviolet light The crystalline material surgical blade is divided from the fixed assembly, and is prepared to be packaged before being sold. 31. The method according to item 30 of the patent application scope, wherein the pre-cutting step includes pre-cutting the through-hole references in a fixed crystalline material wafer by a laser beam. 3 2 · The method according to item 31 of the patent application, wherein the laser beam is generated by an excimer laser or a laser water jet. 33. The method of claim 30, wherein the pre-cutting step includes pre-cutting the through-hole references by a mechanical cutting device 'in the fixed crystalline material wafer. 34. The method according to item 33 of the scope of patent application, wherein the mechanical cutting device includes a * drilling tool, a super-head cutting tool, or a mechanical honing device. 35. The method of claim 30, wherein the crystalline material includes sand 46-200410331 36. A method of manufacturing from a crystalline material and a cutting device, including: fixing a crystalline material wafer to a fixed On the assembly; pre-cut the fixed crystalline material crystal 1-day straight I to cut a plurality of grooves to assist the cutting step; outline on the first side of the crystalline material half bucket wafer ± seven blades At least-the blade wheel etches the crystalline material wafer to form at least one surgical blade; separates the etched crystalline material surgical blades; and irradiates the separated etched crystalline material surgical blades with ultraviolet rays to The fixed assembly is split and ready to be packaged before being sold. 37. The method according to item 36 of the patent application scope, which further comprises: pre-cutting a laser beam 'in a fixed crystalline material wafer at a distance away from the edge of the crystalline material. The grooves; and cutting the at least one blade profile by a die-cutting saw blade, wherein the die-cutting saw blade engages the crystalline wafer at the pre-cut grooves. 38. The method of claim 37, wherein the laser beam is generated by an excimer laser or a laser water jet. 3 9 · The method according to item 36 of the patent application scope, which further includes: pre-cutting out a distance from the edge of the crystalline material in the fixed crystalline material wafer by a mechanical cutting device The groove-47- 200410331 slot; and by a die cutting saw blade · the die cutting saw blade is attached to the joint. 40. If item 39 of the scope of patent application includes a drilling tool and ultrasonic, 41. If item 36 of the scope of patent application, at least one blade profile is cut out, wherein the pre-cut grooves of the kiosk and the crystalline wafer The method of biting, wherein the mechanical cutting device includes a cutting tool, or a mechanical honing device. Method, wherein the crystalline material includes silicon
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TWI886554B (en) * 2023-08-29 2025-06-11 國立中央大學 Wire cutting method and system for cutting wafer

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CN111497047A (en) * 2019-01-30 2020-08-07 株式会社迪思科 Origin position registration method for cutting device
CN111497047B (en) * 2019-01-30 2024-03-15 株式会社迪思科 How to register the origin position of cutting equipment

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