TW200417825A - Method for fabricating light exposing apparatus, light unit, light exposing apparatus, light exposing method, and adjusting method - Google Patents

Method for fabricating light exposing apparatus, light unit, light exposing apparatus, light exposing method, and adjusting method Download PDF

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Publication number
TW200417825A
TW200417825A TW092132869A TW92132869A TW200417825A TW 200417825 A TW200417825 A TW 200417825A TW 092132869 A TW092132869 A TW 092132869A TW 92132869 A TW92132869 A TW 92132869A TW 200417825 A TW200417825 A TW 200417825A
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Taiwan
Prior art keywords
light
light source
solid
exposure device
adjusting
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TW092132869A
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Chinese (zh)
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TWI278723B (en
Inventor
Shuji Takenaka
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Nikon Corp
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70116Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0009Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
    • G02B19/0014Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only at least one surface having optical power
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • G02B19/0061Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a LED
    • G02B19/0066Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a LED in the form of an LED array
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70141Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

The light exposing apparatus, which uses the light source of mercury-vapor lamp adapted in the user's current equipment, can also use the solid light source. A method is used to fabricate a light exposing apparatus, which uses an illuminating optical system with a condensing optical system to illuminate a mask, and transfers a pattern formed on the mask to an optical sensing plate. The method includes a solid light source disposing step (S11) for disposing multiple solid light sources at the front focusing position of the condensing optical system or at the conjugate position with it. Also and in steps S12-S16, with respect to the light source, different from the solid light sources, the properly-set first state of the property for the illuminating optical system is properly set to the second state by disposing the solid light sources.

Description

200417825 五、發明說明(1) 〜 【發明所屬之技術領域】 本發明是有關於’對於半導體曝光裝置或液晶基板曝 光裝置’從光源部之光照射於所要之面,而形成精密圖案 之曝光裝置之製造方法;被使用於曝光裝置之光源單元;具 有光源單元之曝光裝置;使用該曝光裝置之曝光方法與曝 光裝置的調整方法。 【先前技術】 傳統上’於半導體曝光裝置或液晶基板曝光裝置,從 光源部之光照射於所要之面,而形成精密圖案於基板上之 投影曝光裝置之光源,其波長約為360ηιη之紫外光主要是 使用水銀燈等。此水銀燈之壽命,由於大概是5〇〇〜小 時,曝光裝置必要定期更換水銀燈,造成使用者很大的負 擔。又,必要高電力以確保高照度,其伴隨發熱也必要有 對策等,會有高運作成本之問題與隨著長時間而劣化之原 因而破裂的危險性。 、 對於發光二極體,比起水銀燈其發光效率高,由於有 省電、小發熱量之特點,可以實現大幅降低運作成本。又 由於壽命為約3 0 0 0小時,更換的負擔小,沒有隨著長時間 而劣化之原因而破裂的危險性。更於最近,UV-LED被開 發,其在波長365 nm下有100 mw程度之高光輸出率。 發光二極體等的固態光源使用於投影曝光裝置之情 形,雖然有如上述之優點,有使用傳統水銀燈等之光源之 投影曝光裝置,對於所有使用者之觀點,引入新的曝光裝200417825 V. Description of the invention (1) ~ [Technical field to which the invention belongs] The present invention relates to an exposure device for forming a precise pattern by irradiating light from a light source unit on a desired surface from a semiconductor exposure device or a liquid crystal substrate exposure device. Manufacturing method; light source unit used in exposure device; exposure device having light source unit; exposure method using the exposure device and adjustment method of the exposure device. [Prior art] Traditionally, in a semiconductor exposure device or a liquid crystal substrate exposure device, light from a light source unit is irradiated on a desired surface, and a light source of a projection exposure device that forms a precise pattern on a substrate has an ultraviolet light having a wavelength of about 360 nm. The main use is mercury lamps. Since the life of this mercury lamp is about 500 ~ hours, it is necessary for the exposure device to periodically replace the mercury lamp, which causes a great burden on the user. In addition, high power is required to ensure high illumination, and it is necessary to take measures to cope with heat generation. There are problems of high operating costs and the risk of rupture due to deterioration over time. For light-emitting diodes, its luminous efficiency is higher than that of mercury lamps. Due to the characteristics of power saving and small heat generation, it can significantly reduce operating costs. In addition, since the life is about 3,000 hours, the burden of replacement is small, and there is no danger of rupture due to deterioration over time. More recently, UV-LEDs have been developed with high light output rates of about 100 mw at a wavelength of 365 nm. In the case where solid-state light sources such as light-emitting diodes are used in projection exposure devices, although there are advantages as described above, there are projection exposure devices that use light sources such as traditional mercury lamps. For all users, a new exposure device is introduced.

200417825 五、發明說明(3) 於申請第卜3項之個別曝光裝置之製造方法包括,與 該些固體光源不同的光源,例如藉由水銀燈所構成的光 源,取換成固體光源之情形下,藉由調整步驟,對應於與 該些固體光源不同的光源被設定成適當的第1狀態之該照 明光學系統的特性,藉由該些固體光源的配置,而設定成 適當的第2狀態之特性。 又,於申請第4項之曝光裝置之製造方法,該調整步 驟包括利用調整在該罩幕或該感光性基板之照明不均勻之 照明不均勻調整步驟,與調整在該罩幕或該感光性基板之 遠心的遠心調整步驟之至少其一以進行調整。 於申請第4項之曝光裝置之製造方法,可以製造以調 整在罩幕或該感光性基板的照明不均勻,與在該罩幕 感光性基板之遠心之曝光裝置。 5 ^ 又 由該調 之至少 體光源 佈調整 於 整從該 出之配 又 驟包括 性調整 ,心1f諝弟b項之曝光裝置之製造方法,其特徵 整步驟包括調整從該些固體光源射出之多個光束 其一的發散角的發散角調整步驟,與調整從該些 射出之多個光束内之至少其一的配光分佈之配^ 步驟之至少其一的步驟,以進行調整。 申請第5項之曝光裝置之製造方法,可以製造以, 些固體光源射出之多個發散角,從該此固體’ 光分佈之曝光裝置。 一先,原 • ’於申請第6項之曝光裝置之製造方法,該調整 :利用調整該照明光學系統之照明特性的一照=; 步驟’與調整從該些固體光源之射出光之一射出200417825 V. Description of the invention (3) The manufacturing method of the individual exposure device in item 3 of the application includes the case where the light source different from these solid light sources, such as a light source composed of a mercury lamp, is replaced with a solid light source. According to the adjustment steps, the characteristics of the illumination optical system corresponding to the light sources different from the solid light sources are set to the appropriate first state, and the properties of the second light state are set to the appropriate second state by the arrangement of the solid light sources. . Further, in the method for manufacturing an exposure device according to the fourth item, the adjusting step includes a step of adjusting an uneven illumination by adjusting an uneven illumination on the mask or the photosensitive substrate, and adjusting the sensitivity on the mask or the sensitivity. At least one of the telecentric adjustment steps of the telecentricity of the substrate is performed for adjustment. In the manufacturing method of the exposure device of item 4, the exposure device can be manufactured to adjust the uneven illumination on the mask or the photosensitive substrate and the telecentricity of the photosensitive substrate on the mask. 5 ^ The adjustment of at least the body light source cloth is adjusted to the entire distribution, and the manufacturing method of the exposure device of item 1f 谞 b is characterized in that the whole step includes adjusting the emission from the solid light sources. The step of adjusting the divergence angle of the divergence angle of one of the plurality of light beams is adjusted with at least one of the matching steps of adjusting the light distribution distribution of at least one of the plurality of light beams emitted from the plurality of light beams. By applying the manufacturing method of the exposure device of item 5, it is possible to manufacture an exposure device with a plurality of divergence angles emitted from these solid light sources and light distribution from the solid. First of all, the original method of manufacturing the exposure device in the sixth item of the application, the adjustment: using a photo of adjusting the illumination characteristics of the illumination optical system =; step 'and adjusting the emission from one of the light emitted from the solid light sources

12725pif.ptd 第8頁12725pif.ptd Page 8

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五、發明說明(4) 調整步驟。 又,於甲請第7項之 明特性調整步驟,利用〜光裝置之製造方法,其中該照 罩幕或該感光性基板之^照明不均勻調整步驟以調整在該 調整在該罩幕或該感光G明不均勻,與一遠心調整步驟以 整;以及該射出光調整牛基板之遠心之至少其一以進行調 出之多個光束内之至少^复 利用調整從該些固體光源射 % 驟,與調整從該些固體2〜的發散角的一發散角調整步 的阶氺八你夕 Γ 先减射出之多個光束内之至少其一 的配无刀仰之一配朵公yfefc 1 九刀佈啁整步驟之至少其一的步驟,以 進灯調整。V. Description of the invention (4) Adjustment steps. In addition, Yu Jia asks for the characteristic adjustment step of item 7 to use a manufacturing method of a light device, in which the illumination unevenness adjustment step of the photomask or the photosensitive substrate is adjusted to adjust the adjustment in the mask or the The photosensitivity G is uneven, and is adjusted with a telecentric adjustment step; and the emitted light adjusts at least one of the telecentricity of the bovine substrate to perform at least ^ reuse adjustment within a plurality of light beams. Step with a divergence angle adjustment step that adjusts the divergence angles from the solids 2 to 你 你 你 先 First reduce at least one of the emitted multiple beams with a knife without one with a yfefc 1 9 At least one of the steps of cutting the cloth to adjust the light.

,、於申請第6或7項之曝光裝置之製造方法,從該些固體 光源射出之多個光發散角,與從該些固體光源射出之配光 分佈之調整,可以製造曝光裝置。In the manufacturing method of the exposure device of item 6 or 7, the exposure device can be manufactured by adjusting the divergence angles of the light emitted from the solid light sources and the distribution of light distribution from the solid light sources.

又’申請第8項的曝光裝置之製造方法,其對於使用 含一 t光光學系統之一照明光學系統以照明一罩幕’將該 罩幕之圖案轉印到一感光性基板,該曝光裝置之製造方法 包括:一固體光源配置步驟,將多個固體光源配置於該聚 光光學系統之一前侧焦點位置或是與其光學共轆之一位 置;以及一調整步驟,對應於與該些固體光源不同之光源 被設定成適當的第丨狀態之該曝光裝置的曝光條件,藉由 該些固體光源的配詈,&而設定成適當的第2狀態之曝光條 件。 又,申請第Θ項的曝光裝置之製造方法,其使用一照The method of manufacturing an exposure device according to the eighth aspect of the present invention is directed to using a lighting optical system including a t-light optical system to illuminate a mask. The pattern of the mask is transferred to a photosensitive substrate. The manufacturing method includes: a solid-state light source disposing step, arranging a plurality of solid-state light sources at a front focal position of the condensing optical system or a position in common with its optics; and an adjusting step corresponding to the solid-state light sources. Light sources with different light sources are set to the appropriate exposure conditions of the exposure device in the first state, and appropriate solid state light sources are used to set the appropriate exposure conditions in the second state. In addition, the method for manufacturing an exposure device according to item Θ is applied using a photo

12725pif.ptd 第9頁 200417825 五、發明說明(5) 明光學系統 板,該曝光 驟,將多個 以及一調整 定成適當的 固體光源的 又,申 步驟包括施 控制裝置之 又,申 步驟包括調 整步驟,與 步驟之至少 於申請 體光源之光 固體光源之 件之差做為 又,申 體光源包括 又,申 設於一照明 陣列狀的一 光出射端, 光源陣列不 第8〜11項的 源,例如由 情形下,利 補償值,施 請第1 2項的 發光二極體 請第1 3項的 裝置,該光 固體光源陣 為陣列狀的 同的光源, 照明一罩幕將該罩幕之圖案轉印到一感光性基 裝置之製造方法,包含:一固體光源配置步 固體光源配置於該照明光學系統所定的位置; 步驟,對應於與該些固體光源不同之光源被設 第1狀態之該曝光裝置的曝光條件,藉由該些 配置,而設定成適當的第2狀態之曝光條件。 請第10項之曝光裝置之製造方法,其中該調整 加補償值給控制包含於曝光條件中的曝光量的 步驟。 請第11項的曝光裝置之製造方法,其中該調整 整該照明光學系統的照明特性之一照明特性調 調整從該些固體光源之射出光之一射出光調整 其一0 曝光裝置之製造方法,別於多個固 水銀燈所構成的光源,將其取換成 用調整步驟,將光源取換之曝光條 加給控制裝置,而控制曝光量。 曝光裝置之製造方法,其中該些固 陣列。 光源單元,該光源單元可拆卸與裝 源單元包括:多個固體光源配列成 列;以及配置於該固體光源陣列之 一光學元件,其中相對於與該固體 被設定成適當的第1狀態之該照明12725pif.ptd Page 9 200417825 V. Description of the invention (5) The optical system board, which exposes multiple and one adjustments to an appropriate solid light source, the application step includes the application of a control device, and the application step includes The adjustment step is different from the step of applying the solid light source of the body light source, and the body light source includes the light source, which is located at a light emitting end of an illumination array. The light source array is not the 8th to the 11th. For example, according to the situation, the compensation value is applied to the light-emitting diode of item 12 and the device of item 13 is applied. The light-solid light source array is an array of the same light source. A manufacturing method for transferring a pattern of a mask to a photosensitive base device includes: a solid light source arrangement step; the solid light source is arranged at a predetermined position of the illumination optical system; and a step corresponding to a light source different from the solid light sources is provided. The exposure conditions of the exposure device in the first state are set to the appropriate exposure conditions in the second state by these arrangements. The method of manufacturing an exposure device according to item 10, wherein the adjustment adds a compensation value to the step of controlling the exposure amount included in the exposure conditions. The method of manufacturing an exposure device according to item 11, wherein the adjustment adjusts one of the lighting characteristics of the illumination optical system, and the lighting characteristic adjusts and adjusts one of the emitted light from the solid light sources. Different from a light source composed of multiple solid mercury lamps, the light source is replaced by an adjustment step, and the exposure bar is replaced by an exposure bar to the control device to control the exposure amount. A manufacturing method of an exposure device, wherein the solid arrays. A light source unit, which is detachable and attachable to the source unit, includes: a plurality of solid light sources arranged in a row; and an optical element arranged in the solid light source array, wherein the light source unit is set to an appropriate first state with the solid. illumination

12725pif.ptd 第10頁 200417825 五、發明說明(6) 裝置的特性,藉由該些固體光源的配置,而設定成適當的 第2狀態之特性,對應該照明裝置提供含有發散角與配光 分佈之射出光。 又’申請第1 4項的光源單元,其中該固體光源陣列與 該光學元件,可以配置於將從光源燈的光聚集的一橢圓鏡 與在該照明裝置内的一光學積分器之間的光路中。 於申請第1 3與1 4項的光源單元,相對於照明裝置的固 體光源陣列的不同光源,例如,相對於由水銀燈所構成的 光源’被設定成適當的第1狀態之該照明裝置的特性,藉 由該些固體光源的配置,而設定成適當的第2狀態之特 性,可以提供含有發散角與配光分佈之射出光。 又’申睛第15項之光源單元,包括該調整固體光源陣 列的射出光特性之調整裝置。於申請第丨5項之光源單元利 用調整裝置以調整固體光源陣列的射出光特性。 ,、又,申請第16項之光源單元,更包括多個光纖,該些 光纖之每一入射端與該些固體光源連接。 於申請第1 6項之光源單元,可以使固體光源的配置的 自由度大,且谷易任思形成多個光纖的射出端的配列形 狀0 、又’申請第1 7項之光源單元,包括:多個固體光源配 _ 列成陣列狀的-固體光源陣列,以及調整該固體光源陣 之射出光特性之調整裝置。 該調整裝置可以調 、從該固體光源陣 又,申請第1 8項之光源單元,其中 整從該固體光源陣列射出之光的發散角12725pif.ptd Page 10 200417825 V. Description of the invention (6) The characteristics of the device are set to the appropriate second state characteristics by the configuration of these solid light sources, and the lighting device is provided with a divergence angle and light distribution. Out of the light. The application of the light source unit of item 14, wherein the solid-state light source array and the optical element can be arranged in the optical path between an elliptical mirror that collects light from the light source lamp and an optical integrator in the lighting device. in. In the light source unit of the application Nos. 13 and 14, different characteristics of the light source with respect to the solid-state light source array of the lighting device, for example, the characteristics of the lighting device set to an appropriate first state with respect to the light source composed of a mercury lamp By setting the properties of these solid-state light sources and setting the characteristics to an appropriate second state, it is possible to provide emitted light including a divergence angle and a light distribution. The light source unit of the 15th item includes the adjustment device for adjusting the emitted light characteristics of the solid-state light source array. The light source unit in the fifth item of the application uses an adjustment device to adjust the light emission characteristics of the solid-state light source array. The light source unit of the 16th application further includes a plurality of optical fibers, and each incident end of the optical fibers is connected to the solid light sources. In the application of the light source unit of item 16, the freedom of configuration of the solid-state light source is large, and Gu Yirensi forms the arrangement shape of the exit ends of multiple optical fibers 0, and the application of the light source unit of item 17 includes: A plurality of solid-state light sources are arranged in an array-a solid-state light source array, and an adjusting device for adjusting the emitted light characteristics of the solid-state light source array. The adjusting device can adjust the light source unit from the solid-state light source array and apply for item 18, wherein the divergence angle of the light emitted from the solid-state light source array is adjusted.

200417825 五、發明說明(7) 心 列射出之光的配光分佈、在被照射面的照明不均度及遠 之其中至少其一。 於第17或18項之光源單元,藉由調整裝置可以調整從 固體光源陣列射出的光的發散角、光的配光分佈、在被照 射面的照度不均與遠心。 又,申請第1 9項之光源單元,更包括多個光纖,該些 光纖之每一入射端與該些固體光源連接。 於申請第1 9項之光源單元,可以使固體光源的配置的 自由度大’且容易任意形成多個光纖的射出端的配列形 狀。 又’申請第20項之曝光方法,適用於如申請第1〜12項 任其一之曝光裝置之製造方法所製造出的曝光裝置,包括 利用從該些固體光源之光,以照明該罩幕之一照明步驟; 以及將該罩幕之圖案轉印到該感光性基板之一轉印步驟。 又’申請第2 1項之曝光方法,其中該轉印步驟包括使 用將該罩幕之圖案像投影到該感光性基板的投影光學系 統’將該罩幕之圖案轉印到該感光性基板之步驟。 於申請第20與21項之曝光方法,因為使用相對與多個 固體光源相別的光源而被設定成適當的第1狀態之該照明 裝置的特性,藉由該些固體光源的配置,而設定成適當的 第2狀態之特性之曝光裝置,罩幕之圖案可以良好轉印到 該感光性基板。 又’申請第22項的曝光裝置,包括:如申請第13〜19項 任其一之光源單元;以及為了將罩幕之圖案曝光到感光性200417825 V. Description of the invention (7) At least one of the light distribution of the light emitted from the heart row, the unevenness of illumination on the illuminated surface and the distance. In the light source unit of item 17 or 18, the adjustment device can adjust the divergence angle of light emitted from the solid-state light source array, the light distribution of the light, the uneven illumination on the illuminated surface, and the telecentricity. In addition, the light source unit of item 19 of the application further includes a plurality of optical fibers, and each incident end of the optical fibers is connected to the solid light sources. In the light source unit of the 19th application, it is possible to increase the degree of freedom in the arrangement of the solid-state light source, and it is easy to arbitrarily form the arrangement shape of the exit ends of a plurality of optical fibers. It also applies for the exposure method of item 20, which is applicable to the exposure device manufactured by applying the manufacturing method of any one of the exposure devices of items 1 to 12, including using the light from the solid light sources to illuminate the mask. One of a lighting step; and one of a transfer step of transferring the pattern of the mask to the photosensitive substrate. It also applies for the exposure method of item 21, wherein the transferring step includes using a projection optical system that projects the pattern image of the mask onto the photosensitive substrate. step. In the application of the exposure methods of items 20 and 21, the characteristics of the lighting device set to an appropriate first state because a light source different from a plurality of solid light sources is used are set by the configuration of the solid light sources. The exposure device having an appropriate second-state characteristic allows the pattern of the mask to be well transferred to the photosensitive substrate. Another application for the exposure device of item 22 includes: applying a light source unit of any one of items 13 to 19; and exposing the pattern of the mask to photosensitivity

12725pif.ptd 第12頁 200417825 五、發明說明(8) "' ---- 基板,利用從該光源單元的光照明兮 又,申請第23項之曝光裝置,^ 之一照明裝置。 投影到感光性基板之投影光學系統。匕括將該罩幕之圖案 於申清第22與23項之曝光楚置,、12725pif.ptd Page 12 200417825 V. Description of the invention (8) " '---- The substrate is illuminated by the light from the light source unit, and the exposure device of item 23 is applied, which is one of the lighting devices. Projection optical system that projects onto a photosensitive substrate. The dagger was placed in the exposure of items 22 and 23 of Shen Qing,

V 裝置,與固體光源不同之光源,似i光源單兀相對於照明 燈所構成的光源,被設定成適當的,因為相對於由水銀 的特性,藉由該些固體光源的配置,1狀態之該照明裝置 狀態之特性,可以提供含有發散g而设定成適當的第2 因此罩幕之圖案可以良好轉印到=配光分佈之射出光, 又,申請第24項的曝光方法二 第22或23項之曝光裝置,該曝光吏用於如申靖專利範圍 用從該光源單元之光以照明該I法包括一照明步驟,利 該罩幕之圖案轉印到該感光性基^以及一轉印步驟’將 於申睛第2 4項的曝光方法, 置,與固體光源不同之光界,例ί源早元相對於照明裝 銀燈所構成的光源,被設定成^ ’因為使用相對於由水 置的特性,藉由該些固的第1狀態之該照明裝 2狀態之特性,可以提供含有發^置,而設定成適當的第 之曝光裝置,因此罩幕之0有幸ΥΛ與配光分佈之射出光 板。 幕之圖案可以良好轉印到該感光性基 ιί夕項的曝光裝置的調整方法,用於為了將 系統之照明光學“,===由包含有 之曝光裝置的調整方法裝置的光以照明該罩幕 * 包括一固體光源配置步驟,將取The V device is a light source different from the solid light source. The i-light source unit is set to be appropriate for the light source composed of the lighting lamp. Because of the characteristics of mercury, the configuration of these solid light sources is 1 state. The characteristics of the state of the lighting device can be provided to include a divergent g which is set to an appropriate second. Therefore, the pattern of the mask can be well transferred to the light emitted by the light distribution. In addition, the application of the 24th exposure method 2nd 22nd Or an exposure device according to item 23, which is used for illuminating the light from the light source unit as described in the Shen Jing patent. The method I includes an illumination step, and the pattern of the mask is transferred to the photosensitive substrate. The transfer step 'will be based on the exposure method of item No. 24 in Shenyan, which is different from the solid light source. For example, the source light source is set to ^' because the light source is composed of a silver light. Due to the characteristics of the water setting, and the characteristics of the lighting device 2 state of the solid first state, it is possible to provide an exposure device that is set to include the device and is set to an appropriate first. Therefore, the 0 of the mask is fortunate. Emitted light from light distribution . The method of adjusting the curtain pattern can be well transferred to the photosensitive device. It is used to adjust the illumination of the system. The mask * includes a solid-state light source configuration step.

200417825 五、發明說明(9) 代該光源裝置的多個固體光源配置於該聚光光學系統之前 側焦點位置或與其的光學共輛位置,以及一調整步驟,利 用該些固體光源之配置,以調整該照明光學系統之照明特 性0 於申請第25項的曝光裝置的調整方法,雖然將取代光 源裝置的多個固體光源配置於該聚光光學系統之一前側焦 點位置或是與其光學共軛之位置,利用調整步驟,做為曝 光裝置的照明光學系統的照明特性,可以良好維持。 又,申請第26項的曝光裝置的調整方法,為了將_罩200417825 V. Description of the invention (9) A plurality of solid-state light sources replacing the light source device are arranged at the front focal position of the condensing optical system or the optical co-location position therewith, and an adjustment step is made by using the configuration of the solid-state light sources to Adjusting the illumination characteristics of the illumination optical system 0 The adjustment method of the exposure device of the 25th application, although a plurality of solid-state light sources replacing the light source device are arranged at a front focal position of one of the condensing optical systems or are optically conjugated to it The position, using the adjustment step, can be well maintained as the illumination characteristics of the illumination optical system of the exposure device. In addition, the adjustment method of the exposure device of the 26th item is applied to

幕之圖案轉印到一感光性基板,藉由照明光學系統,利用 從光源裝置的光以照明該罩幕之曝光裝置的調整方法,包 括:一固體光源配置步驟,將取代該光源裝置的多個固體υ 光源配置於該照明光學系統之所定位置;以及一調整步 驟,利用該些固體光源之配置,以調整該照明光I/ 照明特性。 兀予糸、、死之 :申請第26項的曝光裝置的調整方法,雖然將取代該 光源裝置的多個固體光源配置於該照明光學系統之所定位 置,做為曝光裝置的照明光學系統的照明特性或是曝光條 件可以良好維持。 ' 又,申請第27項的曝光方 圍第25或26項之曝光裝置的調 之曝光方法,包括一照明步驟 從該些固體光源之光以照明該 該罩幕之圖案轉印到該感光性 法,用於利用如申請專利範 整方法而被調整的曝光裝置 ’藉由照明光學系統,利用 罩幕;以及一轉印步驟,將 基板。The pattern of the curtain is transferred to a photosensitive substrate, and the illumination optical system uses the light from the light source device to illuminate the exposure device of the mask. The method for adjusting the exposure device includes a solid light source arrangement step that will replace the light source device. A solid υ light source is arranged at a predetermined position of the illumination optical system; and an adjusting step, using the configuration of the solid light sources, to adjust the illumination light I / lighting characteristics. Wu Yuquan, Zhizhi: Application for the adjustment method of the exposure device of item 26, although a plurality of solid light sources replacing the light source device are arranged at a predetermined position of the illumination optical system as the illumination of the illumination optical system of the exposure device Characteristics or exposure conditions can be well maintained. 'Also, an exposure method for adjusting the exposure device of the exposure device of item 27 or item 25 or item 26 includes an illumination step of transferring the light from the solid light sources to illuminate the pattern of the mask to the photosensitivity Method for adjusting the exposure device using a patent-regulating method such as' using a mask by an illumination optical system; and a transfer step to transfer the substrate.

200417825 五、發明說明(ίο) 於申請第2 7項的曝光方法,照明光學系統的照明特 性’因為適當調整取代光裝置配置的多個固體光源,罩幕 之圖案可以良好轉印到一感光性基板。 為讓本發明之上述和其他目的、特徵、和優點能更明 顯易懂,下文特舉一較佳實施例,並配合所附圖式,作詳 細說明如下: 【實施方式】 以下請參閱圖示,對本發明實施例進行說明。第i圖 繪示依據本發明之第一實施例的投影曝光裝置示意圖。 如第1圖所示的投影曝光裝置具有代表由高壓水銀燈 所成之光源的光源1。此光源1由發光二極體(固體光源)配 列成陣列狀之發光二極體陣列所構成,設置於一具有由旋 轉橢圓面所成之反射面之橢圓鏡2的第2焦點位置。於橢圓 鏡2的第2焦點位置,是在與後述的聚光光學系統7之前侧 焦點位置(光源侧焦點位置)之光學共軛位置。更,也可以 配置光源1的位置,為聚光光學系統7之前側焦點位置(光 源侧焦點位置)之光學共扼位置的近旁。又,由光源1所 構成的發光二極體,1個約有]〇mW以上的輸出率,其幹 波長較佳在450nm以下。 〃 w 從配置於橢圓鏡2的第2焦點位置的光源}之光束,| 用對準透鏡3轉換成大約平行光後,從光學穑八 利 ^ 予償刀器的蠅眼 蠅眼透鏡4由有正折射率之多個透鏡構件其光轴平〃200417825 V. Description of the invention (ίο) For the exposure method of item 27, the lighting characteristics of the illumination optical system 'because of the proper adjustment of multiple solid light sources instead of the light device configuration, the pattern of the mask can be well transferred to a photosensitivity Substrate. In order to make the above and other objects, features, and advantages of the present invention more comprehensible, a preferred embodiment is described below in detail with the accompanying drawings as follows: [Embodiment] Please refer to the drawings below The embodiments of the present invention will be described. FIG. I is a schematic diagram of a projection exposure apparatus according to a first embodiment of the present invention. The projection exposure apparatus shown in Fig. 1 has a light source 1 representing a light source made of a high-pressure mercury lamp. This light source 1 is composed of a light-emitting diode (solid-state light source) array of light-emitting diodes arranged in an array, and is arranged at a second focal position of an elliptical mirror 2 having a reflecting surface formed by a rotating elliptical surface. The second focal position at the elliptical mirror 2 is an optical conjugate position at a front focal position (light source side focal position) with a focusing optical system 7 described later. Furthermore, the position of the light source 1 may be arranged near the optical conjugate position of the front focal position (light source side focal position) of the focusing optical system 7. In addition, one light-emitting diode composed of the light source 1 has an output rate of about 0 mW or more, and its dry wavelength is preferably 450 nm or less. 〃 w The light beam from the light source} disposed at the second focal position of the elliptical mirror 2 is converted into approximately parallel light by the alignment lens 3, and then is converted from the optical fly ^ The optical axis of a plurality of lens members having a positive refractive index is flat

12725pif.ptd 第15頁 200417825 五、發明說明(11) 於基準光轴AX,而在縱橫方向緊密配列成。構成蠅眼透鏡 4之每個透鏡構件,具有與在罩幕上應形成的照射形狀(換 言之於平板上應形成曝光區域的形狀)相似的矩形狀斷 面。又’構成繩眼透鏡4之每個透鏡構件之入射端面,形 成向入射端之凸面球面狀,與向射出端之凸面球面狀。 因此,入射於蠅眼透鏡4之光束,其波面藉由個透鏡12725pif.ptd Page 15 200417825 V. Description of the invention (11) It is closely aligned with the reference optical axis AX in the vertical and horizontal directions. Each lens member constituting the fly-eye lens 4 has a rectangular cross-section similar to the irradiation shape (in other words, the shape of an exposure area on a flat plate) that should be formed on the mask. Also, the incident end surface of each lens member constituting the eyelet lens 4 has a convex spherical shape toward the incident end and a convex spherical shape toward the exit end. Therefore, the wavefront of the light beam incident on the fly-eye lens 4 passes through a lens

V 構件而被分割’於各透鏡構件之後側焦點面分別形成一光 源像。即是’蠅眼透鏡4之後侧焦點面由多個光源像所成 的實質面光源,即是被形成的二次光源。從被形成於蠅眼 透,4之後侧焦點面之二次光源之光束,從配置在近旁的 (7光圈5入射。σ光圈5配置於與後述投影光學系統pL的入 射,面大約光學共軛位置,有用以限定二次光源之照明所 要範圍之可變開口部。σ光圈5 ,藉由開口部的開口徑的 變化,決定照明條件的值(於投影光學系統的瞳面之開 口徑相對於在其瞳面上的二次光源像的口徑比),以設定 成所要之值。 藉由σ光圈5從二次光源之光束,由反射鏡6且經由多 個透鏡7a〜7c所構成的聚光光學系統7的聚光作用後,與被 :=:的所定圖案’重疊地均勻照明。透過罩幕μ的 ρ上开产投影光學系統PL ’在感光性基板之平板 !,於更平二用Λ?發光二㈣(固體光源)所構成的光源 用光岸Τ Ί )得到5〇 以上的照度。又,利 "、在千板p (被照射面),可以抑制在相對於照度不 12725pif.ptd 第16頁 200417825 五、發明說明(12) 均度之平均值(基準值)之正負丨〇%以内。於此,相對平 照度基準值之照度不均度1(%),其在平板p的照度掃描$ 向(X軸方向)之平均值的最大值Imax (W/公分平方)、曰在 板P的照度掃描方向(X軸方向)之平均值的最小值Imiη ^ 公分平方),其用以下之數學式表示: min)}x 100(%) {( Imax -Imin)/(Imax 又,於此投影曝光裝置,光源1,在額定輸出率以下 的輸出率進行射出照明光。因此,可以延長固體光源的妄 命。接著,與投影光學系統PL的光軸直交的平面内;'由= 動控制平板P的二次光源,進行全部曝光或掃描曝光,於 平板P的各曝光區域,罩幕Μ的圖案逐次被曝光。 、 更,平板Ρ,被載置於平板台PS上,於平板台ps上, 配置有照度感測器8。又,蠅眼透鏡4與反射鏡6之間的光 路中,配置有分光器9,由分光器9反射之光,入射於積分 感測器10。、積分感測器1〇之檢測信號,向控制部n輸出。 又’照度感測器8之檢測信號,向控制部11輸出。 於此,積分感測器1 0之檢測信號與在平板ρ上的曝光 照度之關係,預先高精度計算,而被記憶於控制部丨丨内的 記憶體。控制部1 1,是由可以由積分感測器丨〇之檢測信 號,,間接地對平板P的監視曝光照度(平均值)與其積分值 (積异曝光量的平均值)之構件所構成。此控制部丨丨於曝光 中,從光源1之光,藉由積分感測器丨〇算出對平板ρ的曝光The V-member is divided 'to form a light source image on each of the focal planes behind the lens members. That is, it is a substantially planar light source formed by a plurality of light source images on the rear focal plane of the 'fly-eye lens 4, which is a secondary light source formed. The light beam from the secondary light source formed on the side of the fly's eye, 4 rear side focal plane, is incident from (7 aperture 5 incident. Σ aperture 5 is placed incident on the projection optical system pL described later, the surface is approximately optically conjugated The position is used to limit the variable openings required for the illumination of the secondary light source. The σ aperture 5 determines the value of the lighting conditions by changing the opening diameter of the openings (the opening diameter on the pupil surface of the projection optical system is relative to The aperture ratio of the secondary light source image on its pupil plane) is set to a desired value. The light beam from the secondary light source through the σ diaphragm 5 is condensed by the reflection mirror 6 and through a plurality of lenses 7a to 7c. After the light-condensing effect of the optical-optical system 7, the uniform illumination is overlapped with the predetermined pattern '=:'. The projection optical system PL is produced on the ρ of the mask μ on the flat plate of the photosensitive substrate! A light source for light sources composed of Λ? Light emitting diodes (solid light sources) is used to obtain an illuminance of 50 or more. In addition, the "&"; in the plate p (irradiated surface) can be suppressed relative to the illuminance is not 12725pif.ptd page 16 200417825 V. Description of the invention (12) The average value of the average (reference value) of the positive and negative 丨 〇 Within%. Here, the illuminance unevenness 1 (%) relative to the reference value of the flat illuminance, the maximum value of the average value of the illuminance scan on the plate p $ direction (X-axis direction) Imax (W / cm2), said on the plate P The minimum value of the average value of the illuminance scanning direction (X-axis direction) Imiη ^ cm2) is expressed by the following mathematical formula: min)} x 100 (%) {(Imax -Imin) / (Imax The projection exposure device, light source 1, emits illumination light at an output rate lower than the rated output rate. Therefore, the fate of a solid-state light source can be prolonged. Then, in a plane orthogonal to the optical axis of the projection optical system PL; 'Controlled by motion' The secondary light source of the plate P is subjected to full exposure or scanning exposure, and the pattern of the mask M is sequentially exposed in each exposed area of the plate P. Furthermore, the plate P is placed on the plate table PS and is placed on the plate table ps On the top, an illuminance sensor 8 is arranged. In the optical path between the fly-eye lens 4 and the reflecting mirror 6, a spectroscope 9 is arranged, and the light reflected by the spectroscope 9 enters the integration sensor 10. The detection signal from the sensor 10 is output to the control unit n. The 'illumination sensor 8' The detection signal is output to the control unit 11. Here, the relationship between the detection signal of the integration sensor 10 and the exposure illuminance on the flat plate ρ is calculated with high accuracy in advance and stored in the memory in the control unit 丨. The control unit 11 is constituted by a component that can indirectly monitor the exposure illuminance (average value) of the plate P and its integral value (average value of the different exposure amounts) from the detection signal of the integration sensor 〇. This control unit 丨 丨 calculates the exposure to the flat plate ρ from the light of the light source 1 through the integration sensor 丨 0 during the exposure.

200417825 五、發明說明(13) 照度的積分值。控制部1 1,逐次算出照度的積分值,其對 應結果得到在平板P的適當曝光量,而控制光源1之輸出 率。更,照度感測器8之檢測結果與積分感測器1 〇之檢測 結果,於顯示部顯示。 次之,進行對第1圖之投影曝光裝置之造方法之說 明。第2圖繪示依據本發明之第一實施例的投影曝光裝置 之製造方法流程圖。 首先’將有由高壓水銀燈所成之光源的投影曝光裝置 之水銀燈取除(S10)。次之,由發光二極體(固體光源)配 列成陣列狀之發光二極體陣列所構成之源1,設置於橢圓 鏡2的第2焦點位置(S11)。於此,橢圓鏡2的第2焦點是在 與聚光光學系統7之前侧焦點位置之光學共軛位置。更, 配置光源1的位置,也可以是在聚光光學系統7之前側焦點 位置之光學共軛位置的近旁。 接著’配置由代表由高壓水銀燈所成之光源的發光二 極體陣列所構成的光源1,補償其曝光條件差的值,未示 於圖,藉由輸入部而輸入到控制部丨丨(s丨2 )。此即,對應 於由高壓水銀燈所成之光源,被設定於適當的第1狀態的 曝光裝置的曝光條件,例如,曝光時間、曝光量等,對應 光源1而適當設定成第2狀態的曝光條件。 接著’進行由光源1射出之光的發散角之調整(S13)。 於此由光源1射出之光的發散角之調整,可以利用由光源i 射出之光而入射於對準透鏡3之調整而進行。例如,對準 透鏡3由多個透鏡所構成,而一部分的透鏡利用在光軸Αχ200417825 V. Description of the invention (13) Integrated value of illumination. The control unit 11 successively calculates the integrated value of the illuminance, and obtains an appropriate exposure amount on the tablet P according to the result, and controls the output rate of the light source 1. Furthermore, the detection result of the illuminance sensor 8 and the detection result of the integral sensor 10 are displayed on the display section. Next, the manufacturing method of the projection exposure apparatus of FIG. 1 is explained. Fig. 2 shows a flowchart of a method for manufacturing a projection exposure apparatus according to a first embodiment of the present invention. First, the mercury lamp of the projection exposure device having a light source made of a high-pressure mercury lamp is removed (S10). Next, the source 1 composed of the light-emitting diodes (solid-state light sources) arranged in an array is arranged at the second focal position of the elliptical mirror 2 (S11). Here, the second focal point of the elliptical mirror 2 is an optical conjugate position at the focal position on the front side of the focusing optical system 7. Furthermore, the position where the light source 1 is arranged may be near the optical conjugate position of the focal position on the side in front of the condenser optical system 7. Next, the light source 1 composed of a light-emitting diode array representing a light source made of a high-pressure mercury lamp is arranged, and the value for compensating for the poor exposure conditions is not shown in the figure, and is input to the control section through the input section丨 2). That is, the exposure conditions of the exposure device set to an appropriate first state corresponding to the light source formed by the high-pressure mercury lamp, for example, exposure time, exposure amount, etc., are appropriately set to the second state of exposure conditions corresponding to the light source 1. . Next, the adjustment of the divergence angle of the light emitted from the light source 1 is performed (S13). Here, the adjustment of the divergence angle of the light emitted from the light source 1 can be performed by adjusting the light emitted from the light source i and incident on the alignment lens 3. For example, the alignment lens 3 is composed of a plurality of lenses, and a part of the lenses is used on the optical axis Ax

12725pif.ptd 第18頁 20041782512725pif.ptd Page 18 200417825

方向移動等,可以進行調整由光源丨射出光的發散角之調 整。又,即使構成光源1的多個發光二極體之中的一邛分 發光二極體傾斜,也可以進行由光源丨射出之光的發散角 之調整。 更’當作構成光源1的多個發光二極體,即使預先選 擇其最適當的發散角,也可以進行由光源丨射出之光的發 散角之調整。又,也可以光源丨的光出射面端配置透鏡^ 列’且藉由透鏡陣列調整光的發散角。Directional movement, etc., can be adjusted by adjusting the divergence angle of light emitted from the light source. Further, even if one minute of the light-emitting diodes constituting the light source 1 is inclined, the divergence angle of the light emitted from the light source 丨 can be adjusted. Furthermore, as a plurality of light-emitting diodes constituting the light source 1, even if the most appropriate divergence angle is selected in advance, the divergence angle of the light emitted from the light source 丨 can be adjusted. In addition, a lens ^ row 'may be arranged at the end of the light exit surface of the light source 丨, and the divergence angle of the light may be adjusted by the lens array.

接著’進行由光源1射出之光的配光分佈之調整 (S14)。此由光源!射出之光的配光分佈之調整,配iE置蠅眼 陣列於光源1的光出射面端,可以藉由蠅眼陣列之像差而 調整。又,也可以在構成光源1的多個發光二極體之個別 光出射面端,藉由配置角度性濾波器而調整。更,即使構 成光源1的多個發光二極體之中的一部分發光二極體傾 斜’也可以進行由光源1射出之光的配光特性之調整。Next, the light distribution of the light emitted from the light source 1 is adjusted (S14). This by the light source! The light distribution of the emitted light can be adjusted by placing a fly-eye array at the end of the light-emitting surface of the light source 1 with the iE, which can be adjusted by the aberration of the fly-eye array. Moreover, it is also possible to adjust by arranging an angular filter at the ends of the individual light emitting surfaces of the plurality of light emitting diodes constituting the light source 1. Furthermore, even if a part of the light-emitting diodes among the plurality of light-emitting diodes constituting the light source 1 is tilted ', the light distribution characteristics of the light emitted from the light source 1 can be adjusted.

接著’進行罩幕或平板p上的照明不均勻調整(S15)。 照明不均度調整是根據配置於平板p上的照度感測器8所檢 測出的結果而進行。此照明不均勻之調整,包括傾斜不均 勻之調整與對稱中心不均勻之調整。於傾斜不均勻之調 整,構成聚光光學系統7之一部分透鏡,例如可以藉由將 透鏡7b相對光軸αχ偏移’或是使傾斜而進行。又,可以藉 由將對準透鏡3相對光軸Αχ偏移,或是使傾斜而進行。 又’於對稱中心不均勻之調整,構成聚光光學系統7之一 部分透鏡’例如可以將透鏡7b相對光軸^方向偏移而進Next, the illumination unevenness adjustment on the mask or the plate p is performed (S15). The illumination unevenness is adjusted based on the result detected by the illuminance sensor 8 arranged on the flat plate p. The adjustment of the uneven illumination includes the adjustment of the unevenness of the tilt and the unevenness of the center of symmetry. The adjustment of the unevenness of the tilt to form a part of the lens of the condensing optical system 7 can be performed, for example, by shifting the lens 7b from the optical axis αx 'or tilting it. This can be performed by shifting the alignment lens 3 from the optical axis Ax or tilting it. In addition, “the unevenness is adjusted at the center of symmetry to form a part of the lens of the condensing optical system 7”, for example, the lens 7b can be shifted from the direction of the optical axis ^

12725pif.ptd 第19頁 200417825 五、發明說明(15) 行。12725pif.ptd Page 19 200417825 V. Description of Invention (15).

接著,進行罩幕Μ或平板p上的遠心(telecentHeity) 的調整(S16)。更’於遠心的調整,設置於平板p下部的位 置感測器(未示於圖),根據進行成像位置檢測結果,使在 投影光學糸統之光轴方向移動而進行。於此,罩幕μ戍平 板Ρ上的遠心的調整,包括傾斜遠心的調整及倍率遠心的 調整。傾斜遠心的調整蠅眼單元,即是蠅眼陣列4及^光 圈5為一體,可以藉由相對於光軸^之移動,或是僅是占 光圈5相對於光軸ΑΧ之移動而進行。又,可以藉由控^構 成光源1之多個發光二極體的光量分佈而進行。 又,倍率遠心的調整,蠅眼單元,即是蠅眼陣列4及 5光圈5為一體,藉由使在光軸以移動,或是僅是占光圈5 相對於光軸ΑΧ之移動而進行。藉由進行以上之調整, 具有光源1的投影曝光裝置的製造。 ' 於此實施例關於投影曝光裝置的製造方法,既存的投 影曝光裝置的光源,因為使用金屬氣體或稀有氣體等的又 燈,可以將之取代為具長壽命、且有低運作成本等優點之 發光二極體或是雷射二極體等,即所謂之固體光源。Next, the telecentricity on the mask M or the tablet p is adjusted (S16). Furthermore, for the adjustment of the telecentricity, a position sensor (not shown in the figure) provided at the lower part of the plate p is moved in the direction of the optical axis of the projection optical system based on the detection result of the imaging position. Here, the adjustment of the telecentricity on the mask μ 戍 plate P includes the adjustment of the tilt telecentricity and the adjustment of the telecentricity of the magnification. Adjusting the fly-eye unit obliquely and telecentrically, that is, the fly-eye array 4 and the diaphragm 5 as a whole, can be performed by moving relative to the optical axis ^, or only occupying the movement of the diaphragm 5 relative to the optical axis AX. In addition, it can be performed by controlling the light amount distribution of the plurality of light emitting diodes constituting the light source 1. In addition, for the adjustment of the telecentricity, the fly-eye unit, that is, the fly-eye array 4 and the 5 aperture 5 as a whole, is performed by moving on the optical axis, or only occupying the movement of the aperture 5 relative to the optical axis AX. By performing the above adjustments, the projection exposure device having the light source 1 is manufactured. '' In this embodiment, regarding the manufacturing method of the projection exposure device, the existing light source of the projection exposure device can be replaced with a lamp with a long life and low operating cost because it uses a metal gas or a rare gas and a lamp. Light-emitting diodes or laser diodes are so-called solid-state light sources.

此,可以提供在低運作成本下有長壽命且沒有破裂 的光源之投影曝光裝置。 & 接著,參閱第3圖,第3圖繪示依據本發明之第二杏 例的投影曝光裝置示意圖。於第二實施例的說明, 貫施例之投影曝光裝置相同之構件,就使用與第—每 相同之符號以說明。 只^例Therefore, it is possible to provide a projection exposure apparatus having a long life and no cracking light source at a low operating cost. & Next, refer to FIG. 3, which is a schematic diagram of a projection exposure apparatus according to a second example of the present invention. In the description of the second embodiment, the same components of the projection exposure apparatus throughout the embodiment are described using the same symbols as in the first. Only ^ example

200417825 五、發明說明(16) 由第3圖為第二實施例,投影曝光裝置之結構示意 圖。如第3圖所示的投影曝光裝置,具有由高壓水銀燈所 成的光源以光源1代表。此光源1藉由以發光二極體(固體 光源)以陣列狀排列而構成發光二極體陣列,且置放於聚 光光學系統7的前側焦點位置所決定的位置。又,配置光 源1的位置,也可以在聚光光學系統7的前侧焦點位置之近 旁。 從被配置於聚光光學系統7的前侧焦點位置的光源1所 射出的光束,藉由反射鏡6被利用多個透鏡7a〜7c所構成的 聚光光學系統7的聚光作用後,與被形成有所定的圖案之 罩幕Μ重疊,而均勻照明。穿透過罩幕Μ之圖案的光束,藉 由投影光學系統PL,有感光性基板之平板Ρ上形成罩幕Μ之 圖案的影像。如此,於與投影光學系統PL之光軸直交的平 面内,平板Ρ由二維的驅動控制,以進行全部曝光或是掃 描曝光,平板Ρ的各曝光區域,以罩幕Μ之圖案逐次曝光。 又,平板Ρ被載置於一平板台PS上,於平板台PS上, 配置有照度感測器8。又,光源1與反射鏡6之間的光路 中,配置有分光器9。利用分光器9被反射的光,使入射於 積分感測器1 0。由積分感測器10之檢測信號,向控制部11 輸出。根據被儲存的曝光條件,對應光源1,進行輸出控 制信號。又,將照度感測器8之檢出結果及積分感測器1 〇 之檢出結果顯示於顯示部1 2上。 接著,說明對此地2實施例之投影曝光裝置之製造方 法。第4圖為如第1實施例的投影曝光裝置之製造方法流程200417825 V. Description of the invention (16) The third embodiment is a schematic diagram of the structure of a projection exposure device according to the second embodiment. The projection exposure apparatus shown in FIG. 3 is represented by a light source 1 having a light source made of a high-pressure mercury lamp. This light source 1 is configured by arranging light-emitting diodes (solid light sources) in an array to form a light-emitting diode array, and is placed at a position determined by the front focal position of the condenser optical system 7. The position where the light source 1 is arranged may be near the focal position on the front side of the condensing optical system 7. The light beam emitted from the light source 1 arranged at the front focal position of the condenser optical system 7 is condensed by the reflector 6 by the condenser optical system 7 composed of a plurality of lenses 7a to 7c, and The mask M formed with a predetermined pattern is overlapped and uniformly illuminated. The light beam passing through the pattern of the mask M is used to form an image of the pattern of the mask M on a flat plate P having a photosensitive substrate by the projection optical system PL. In this way, in a plane orthogonal to the optical axis of the projection optical system PL, the flat plate P is controlled by two-dimensional driving to perform full exposure or scanning exposure. Each exposure area of the flat plate P is sequentially exposed in a pattern of the mask M. In addition, the tablet P is placed on a tablet table PS, and an illuminance sensor 8 is arranged on the tablet table PS. In the optical path between the light source 1 and the mirror 6, a beam splitter 9 is arranged. The light reflected by the spectroscope 9 is made incident on the integrating sensor 10. The detection signal from the integration sensor 10 is output to the control unit 11. In accordance with the stored exposure conditions, an output control signal is output in response to the light source 1. The detection result of the illuminance sensor 8 and the detection result of the integral sensor 10 are displayed on the display unit 12. Next, a method for manufacturing the projection exposure apparatus according to the second embodiment will be described. FIG. 4 is a flow chart of the manufacturing method of the projection exposure device according to the first embodiment.

ΙΗI

12725pif.ptd 第21頁 200417825 五、發明說明(17) 圖。 首先’從有由高壓水銀燈所成的光源之投影曝光裝 置’將咼壓水銀燈之光源、對準透鏡、繩眼陣列及光圈取 除(S2 0 ),接著,由將發光二極體配列成陣列的發光二極 體陣列所構成的光源,配置於聚光光學系統7之前側焦點 位置(S2 1 )。又,配置光源!的位置,也可以在系 統7之前侧焦點位置之近旁。12725pif.ptd Page 21 200417825 V. Description of the invention (17) Figure. First, "from a projection exposure device having a light source made of a high-pressure mercury lamp", the light source, the alignment lens, the eye-eye array, and the aperture of the high-pressure mercury lamp are removed (S20), and then the light-emitting diodes are arranged into an array. The light source constituted by a light emitting diode array is arranged at a focal position in front of the condensing optical system 7 (S2 1). Also, configure the light source! The position can also be near the side focus position in front of the system 7.

接著,進打對光源丨所射出的光之發散角的調整 (S23)。此光源1所射出的光之發散角的調整,可以進行相 從光源1所射出的光入射於聚光光學系統7之調整。即是, 構成聚光光學系統7之多個透鏡7a〜7c ==方:r動,進行從光源广:射出二 即使::光 發散角調整。 源1所射出的光之 :丄做為構成光則的多個發光二 擇最適當的發散角’也可以進行 二= 列,且,由透鏡陣列調整光的發散角;"心配置透鏡Next, the adjustment of the divergence angle of the light emitted from the light source 丨 is performed (S23). The adjustment of the divergence angle of the light emitted from the light source 1 can be performed such that the light emitted from the light source 1 is incident on the condenser optical system 7. That is, the plurality of lenses 7a to 7c constituting the condensing optical system 7 are adjusted to move from the light source to the light source and emit the light, and the light divergence angle is adjusted. Of the light emitted from source 1: 丄 as a plurality of light emission constituting the light, the most appropriate divergence angle can be selected. Two = columns can be performed, and the lens divergence angle is adjusted by the lens array;

接著’進行對光源1所射出的光 (S24)。對於從古、店! 之配光为佈的調整 對於攸先源1所射出的光之配光分 定 源1的光出射面端配置透鏡九刀㈣調整,4 像差而調整。X,為構通二二^利用使透鏡陣列有 個#出射面诚—為構成先源1的夕個發光二極體之每 個先出射…精由配置有角度性之過據器而調整1Next, the light emitted from the light source 1 is performed (S24). For Conggu, shop! The light distribution of the light is adjusted by cloth. The light distribution of the light emitted by the source 1 is determined by arranging a lens with nine blades and adjusting the 4 aberrations. X, in order to construct the second two ^ using the lens array to have a # 出面 诚 —for each of the first light-emitting diodes that constitute the first source 1 to emit first ... the fine adjustment is made by the angled device

200417825 五、發明說明(18) 構成光源1的多個發光二極體之一部分的發光二極體即使 傾斜’也可以進行對光源1所射出的光之配光特性的調 整。 0 接著’進行罩幕Μ或平板P的照明不均度的調整 (S25 )。更,照明不均度的調整,根據配置於平板^上的照 明感測器8之檢出結果而進行。此照明不均度的調整,包 含傾斜不均度的調整與中心對稱不均度的調整。傾斜不均 度的調整,可以藉由在光源丨的光出射面端的近旁配置濃 度傾斜之過濾器而進行。又,構成聚光光學系統7之一部 分透鏡,例如可以相對於光轴^方向將透鏡7b :傾::進行。又,可以變化構成光源i的多個發光二或極疋 光八°匕的:光二極體的方向而進行。$,可以藉由將 光源1全部傾斜而進行。 面端二、二::ΐ ί不均度的調整,可以光源1的光出射 面知t近旁配置濃度分佈(中心對稱)之過遽器而進行。 又,構成聚光光學系統7之一部分透鏡,例如可以將相 移動而進行。[可以將為了補正中心200417825 V. Description of the invention (18) Even if the light emitting diodes which are part of the plurality of light emitting diodes constituting the light source 1 are tilted, the light distribution characteristics of the light emitted from the light source 1 can be adjusted. 0 Next, the illumination unevenness of the mask M or the flat panel P is adjusted (S25). Further, the adjustment of the illumination unevenness is performed based on the detection result of the illumination sensor 8 arranged on the tablet ^. This adjustment of illumination unevenness includes adjustment of tilt unevenness and adjustment of center symmetric unevenness. The adjustment of the tilt unevenness can be performed by arranging a filter having a tilted concentration near the end of the light exit surface of the light source. In addition, as a part of the lens constituting the light condensing optical system 7, the lens 7b can be tilted with respect to the optical axis ^ direction :, for example. In addition, it is possible to change the direction of the light-emitting diodes by changing a plurality of light-emitting diodes or poles constituting the light source i. $ Can be performed by tilting all the light sources 1. The second and second ends of the surface: ί The adjustment of the unevenness can be performed by the light emission of the light source 1 and the presence of a concentration distribution (center symmetry) filter near the surface. In addition, a part of the lens constituting the condensing optical system 7 can be performed by shifting a phase, for example. [Can be corrected

:旁 '罩幕Μ與光學共軺位置或其近旁等的光:中在而罩進幕M 接著,進行罩幕Μ或平板p的遠心的調 於远心的調整,設置於D τ ) 光軸方向移動而進行心二果墓二在投影光學系統之 、 罩幕μ或平板ρ上的遠心的調 12725pif.ptd 第23頁 200417825 五、發明說明(19) 整,包括傾斜遠心的調整及倍率遠心的調整。 調整,可以使光源1在光軸AX方向移動而進行。又车^ 聚光光學系統7之-部分透鏡’例如可以相對於光轴Αχ方 向將透鏡7b移^而進行。更,可以將為了補正遠心的遠心 補正板或遠心^正透鏡,插入於在罩細 學共輛位置或其近旁等的光路中而進行。 又,於傾斜遠心的調整,可以使光源^ 方向移動而進行。又,構成光源丨的發光二 以變化其光強度分佈而進行。更,可以 遠心補正板或遠心補正透鏡,插 w? 运〜的 與光學共輛位置或其近旁等的光路 I/卓幂Μ π敕 少目你士 1寸幻尤路中而進打。藉由如上之 調整,可元成具備有光源1之投影曝光裝置之 關於第2貫施例的投影曝光裝、^ ^ ^ 投影曝光裝置的光源,因為使用金屬氣製二,既存的 ;光可;具長壽命、且有低運作== 此,可以提供在低運作”之固體光源。因 置的聚光光學系統L可的投影曝光裝 置。 了以扶供更緊密的投影曝光裝 更,於上述第1實施例與第2實施例,照明光學 照明特性的調整,雖然進行 充的 值,從光源1射出的光發散角之Λ先置之控制而施加補償 ⑺阳旧Tt*知月文角之調整,從先肩1射屮 光分佈的調整,罩幕河4平妬ρ μ ^ _攸尤源1耵出先的配 皁赉M :¾十板Ρ上的照明不均度的調整,及 12725pif.ptd 第24頁 200417825 五、發明說明(20) 罩幕Μ或平板上P上的遠心調整,但是也可以利用其中之至 少其一而進行照明光學系統的照明特性的調整。 接著’參照第5圖,進行本發明第3實施例之投影曝光 裝置之說明。關於第3實施例之說明,與第1實施例之投影 曝光裝置相同之構件,以與第1實施例使用之相同符號而 進行說明。 第5圖繪示依據本發明之第三實施例的投影曝光裝置 示意圖。如第5圖之投影曝光裝置,具備有代表由高壓水 銀燈所構成的光源單元2 〇。此即光源單元2 〇位置取決於由 有迴轉橢圓面所成的反射面之橢圓鏡2的第2焦點位置。此 橢圓鏡2的第2焦點位置,為與後述聚光光學系統7之前側 焦點位置共輛的位置。又,光源單元2 〇之配置位置,也可 以是聚光光學系統7之前侧焦點位置共輛的位置的近旁。 關於其他點,則與第1實施例之投影曝光裝置相同。 次之,參照第6圖,進行本發明第4實施例之投影曝光 裝置之說明。關於第4實施例之說明,與第1實施例之投影 曝光裝置相同之構件,以與第1實施例使用之相同符號而 進行說明。 第6圖繪示依據本發明之第四實施例的投影曝光裝置 示意圖。如第6圖之投影曝光裝置,具備有代表由高壓水 銀燈所構成的光源單元2〇。此即光源單元2〇之位置取決於 聚光光學系統7之前側焦點位置。又,光源單元2〇之配置 位置’也可以是聚光光學系統7之前側焦點位置的近旁。 關於其他點,則與第2實施例之投影曝光裝置相同。: The light on the side of the mask M and the optical oscillating position or its vicinity: The middle is masked into the curtain M. Then, the telecentric adjustment of the mask M or the flat plate p is performed, and the light is set at D τ). Move in the axial direction to perform the telecentric adjustment of the heart 2 fruit tomb 2 on the projection optical system, the mask μ or the flat plate 12725pif.ptd Page 23 200417825 V. Description of the invention (19) Adjustment, including tilt telecentric adjustment and magnification Telecentric adjustment. The adjustment can be performed by moving the light source 1 in the optical axis AX direction. The partial lens of the condenser optical system 7 can be performed by, for example, shifting the lens 7b with respect to the optical axis Ax. Furthermore, a telecentric correction plate or a telecentric lens for correcting the telecentricity may be inserted into an optical path such as a car-sharing position or the vicinity thereof. In addition, the adjustment of the tilt telecentricity can be performed by moving the light source ^ direction. The light emission of the light source is performed by changing its light intensity distribution. Moreover, you can use a telecentric correction plate or a telecentric correction lens. This is the optical path I / Zhuo Mi M π 敕 shared with or near the optical vehicle. Shake your eyes into the 1-inch magic road. With the above adjustment, the projection exposure device of the second embodiment and the projection exposure device provided with the light source 1 can be converted into the light source of the projection exposure device ^ ^ ^ because the metal gas is used to make two, the existing; light can be With a long life and low operation == This can provide a solid-state light source at low operation. The condensing optical system L can be used as a projection exposure device. In order to support a more compact projection exposure device, In the first and second embodiments described above, although the lighting optical characteristics are adjusted, although the value is adjusted, the Λ of the divergence angle of the light emitted from the light source 1 is controlled in advance to apply compensation. The adjustment is based on the adjustment of the light distribution from the first shoulder to the first, and the cover of the river 4 is equal to ρ μ ^ _ Youyouyuan 1 is the first distribution soap M: ¾ The adjustment of the illumination unevenness on the ten plates P, and 12725pif.ptd Page 24 200417825 V. Description of the invention (20) The telecentric adjustment on the mask M or P on the flat plate, but at least one of them can also be used to adjust the lighting characteristics of the illumination optical system. Fig. 5 shows the projection of the third embodiment of the present invention Description of the light device. Regarding the description of the third embodiment, the same components as those of the projection exposure device of the first embodiment will be described with the same symbols as those used in the first embodiment. FIG. 5 shows a third embodiment according to the present invention. Schematic diagram of the projection exposure device of the third embodiment. The projection exposure device shown in FIG. 5 is provided with a light source unit 20, which is composed of a high-pressure mercury lamp. This means that the position of the light source unit 20 is determined by a reflection formed by a rotating elliptical surface. The second focal position of the elliptical mirror 2 on the surface. The second focal position of the elliptical mirror 2 is the same position as the focal position on the front side of the condensing optical system 7 described later. The position of the light source unit 20 may be arranged. It is near the position of the common vehicle in front of the focusing optical system 7. The other points are the same as the projection exposure apparatus of the first embodiment. Second, referring to FIG. 6, the projection of the fourth embodiment of the present invention is performed. Explanation of the exposure device. Regarding the description of the fourth embodiment, the same components as those of the projection exposure device of the first embodiment will be described with the same symbols as those used in the first embodiment. A schematic diagram of a projection exposure apparatus according to a fourth embodiment of the present invention is shown. The projection exposure apparatus shown in FIG. 6 is provided with a light source unit 20 represented by a high-pressure mercury lamp. This means that the position of the light source unit 20 depends on the The focus position on the front side of the light optical system 7. The arrangement position 'of the light source unit 20 may be near the focus position on the front side of the condensing optical system 7. The other points are the same as those of the projection exposure apparatus of the second embodiment.

12725pif.ptd 第25頁 200417825 五、發明說明 具備於第3實施例與第4實施例的投影曝光裝置之光源 單元20,如第7A圖所示,在基板2〇a上配列陣列狀的發光' 二極體2 Ob之發光二極體陣列(固體光源陣列)及具有正倍 率之微透鏡20c,配列成陣列狀之微透鏡陣列所構成,而 微透鏡陣列配置於發光二極體陣列之光出射面的近旁。關 於此光源單元2 0,利用具有有正倍率之微透鏡陣列之藉由 控制發光二極體陣列之開口數,從發光二極體2〇b射出的 光的發散角可以調整像束方向。 又 光源早元20,也可以如第7B圖所示之結構。第7B 圖所示之光源單元2 0 ’在基板2 〇 a上配列陣列狀的發光二 極體20b之發光二極體陣列(固體光源陣列)及具有負倍率 之微透鏡2Od,配列成陣列狀之微透鏡陣列所構成,而微 透鏡陣列配置於發光二極體陣列之光出射面的近旁。關於 此光源單元2 0,利用具有有負倍率之微透鏡陣列之藉由控 制發光二極體陣列之開口數,從發光二極體2 〇 b射出的光 的發散角可以調發散方向。 又,光源單元20,也可以如第8圖所示之結構。第8圖 所不之光源單元20,在基板2〇a上配列陣列狀的發光二極 體2 0 b之發光二極體陣列(固體光源陣列)、不均補正板(濃 度分佈(對稱中心)過濾器及濃度傾斜過濾器)2〇e、及遠心 補正板20f所構成,而不均補正板2〇e及遠心補正板2〇f配 置1發光二極體陣列之光出射面的近旁。又,不均補正板 及遠心補正板,也可以分別由不均補正透鏡及遠心補正透 鏡取代。於第8圖所示之光源單元2〇,設置有在光路内通12725pif.ptd Page 25 200417825 V. Description of the invention The light source unit 20 provided in the projection exposure apparatus of the third embodiment and the fourth embodiment, as shown in FIG. 7A, arrays of light emission are arranged on the substrate 20a ' A light emitting diode array (solid light source array) of a diode 2 Ob and a microlens 20c having a positive magnification are arranged in an array of microlens arrays, and the microlens array is arranged in the light emitting of the light emitting diode array Near by. Regarding the light source unit 20, the direction of the image beam can be adjusted by controlling the number of openings of the light emitting diode array by using a microlens array having a positive magnification, and the divergence angle of light emitted from the light emitting diode 20b. The light source early element 20 can also have a structure as shown in FIG. 7B. The light source unit 20 ′ shown in FIG. 7B is arranged on the substrate 20a, and the light emitting diode array (solid light source array) and the microlens 2Od having negative magnification are arranged in an array on the substrate 20a. The micro-lens array is arranged near the light-emitting surface of the light-emitting diode array. Regarding this light source unit 20, by controlling the number of openings of the light emitting diode array by using a microlens array having a negative magnification, the divergence angle of the light emitted from the light emitting diode 2Ob can be adjusted. The light source unit 20 may have a structure as shown in FIG. 8. The light source unit 20 shown in FIG. 8 includes a light emitting diode array (solid light source array) and an unevenness correction plate (concentration distribution center) on the substrate 20a. The filter and the concentration tilt filter) 20e and the telecentricity correction plate 20f are configured, and the unevenness correction plate 20e and the telecentricity correction plate 20f are arranged near the light emitting surface of the light emitting diode array. The unevenness correction plate and the telecentricity correction plate may be replaced by the unevenness correction lens and the telecentricity correction lens, respectively. The light source unit 20 shown in FIG. 8 is provided with a light passage in the light path.

12725pif.ptd 第26頁 20041782512725pif.ptd Page 26 200417825

五、發明說明(22) 過不均補正板2〇e及遠心補正板2〇f之機構,利用在光路内 通過不均補正板2 〇 e及遠心補正板2 〇 f,可以調整傾斜不均 勻、中心對稱不均勻、傾斜遠心、及倍率遠心。 又’照明光學系統的傾斜不均度調整,如第9 A圖所 示,可以藉由光源單元20之傾斜而進行。又,照明光學系 統的倍率遠心的調整,如第9β圖所示,可以藉由光源單^ 2 0在光軸方向移動而進行。又,照明光學系統的相斜不均 度調整,如第9C圖所示,可以藉由光源單元20在光軸垂直 方向移動而進行。這光源單元2〇之傾斜調整、往光軸方向 或光軸垂直方向之移動,可以利用光源單元位置調整機構 (未不於圖)而進行。更,照明光學系統的傾斜遠心之調 麵 整’可以藉由控制構成固體光源陣列的多個發光二極體的 光量而進彳亍。 於上述各實施例之曝光裝置,藉由照明裝置以照明罩 幕(照明步驟),與使用投影光學系統,將被形成於罩幕轉 印用之圖案曝光於感光性基板(曝光步驟),可以製造微元 件(半導體元件)、影像元件、液晶顯示元件、薄膜電磁頭 等。以下,使用實施例的曝光裝置,利用於做為感光性基 板之晶圓(平板)等形成所定的回路圖案,得到做為微元件 的半導體元件之半導體元件製造方法,參照第丨〇圖之流程磡 圖而說明。 首先,於第10圖之步驟S301,於一批次的晶圓上,蒸 度一金屬膜。接著,於步驟S302,在其一批次晶圓上的金 屬膜上塗佈光阻。之後,於步驟S3 03,使用本實施例之曝V. Description of the invention (22) The mechanism that passes the unevenness correction plate 20e and the telecentricity correction plate 20f, and uses the unevenness correction plate 20e and the telecentricity correction plate 20f to pass through the optical path to adjust the uneven tilt. , Center symmetry is uneven, inclined telecentric, and magnification telecentric. The adjustment of the tilt unevenness of the illumination optical system can be performed by the tilt of the light source unit 20 as shown in Fig. 9A. In addition, as shown in FIG. 9β, the magnification telecentricity of the illumination optical system can be adjusted by moving the light source unit ^ 20 in the direction of the optical axis. In addition, as shown in Fig. 9C, the phase inclination unevenness of the illumination optical system can be adjusted by moving the light source unit 20 in the optical axis vertical direction. The tilt adjustment of the light source unit 20 and the movement to the optical axis direction or the vertical direction of the optical axis can be performed by using a light source unit position adjustment mechanism (not shown in the figure). Furthermore, the tilting and telecentric adjustment of the illumination optical system can be performed by controlling the light amounts of the plurality of light emitting diodes constituting the solid-state light source array. In the exposure apparatus of each of the above embodiments, the illumination device is used to illuminate the mask (illumination step), and the projection optical system is used to expose the pattern formed on the mask to the photosensitive substrate (exposure step). Manufacture of micro-elements (semiconductor elements), imaging elements, liquid crystal display elements, thin-film electromagnetic heads, etc. In the following, using the exposure device of the embodiment, a semiconductor element manufacturing method for forming a predetermined circuit pattern using a wafer (flat plate) or the like as a photosensitive substrate to obtain a semiconductor element as a micro element is described with reference to the flow chart in FIG. Click on the figure and explain. First, in step S301 in FIG. 10, a metal film is evaporated on a batch of wafers. Next, in step S302, a photoresist is coated on the metal film on one batch of wafers. After that, in step S303, the exposure of this embodiment is used.

12725pif.ptd 第27頁 200417825 五、發明說明(23) 光裝置’在罩幕上的圖案像,藉由投影光學系統,其一批 次晶圓上各拍攝區域順次曝光轉印。即是,藉由照明光學 裝置以照明罩幕(照明步驟),且將罩幕的圖案轉印到晶圓 上(曝光步驟)。 之後’於步驟S304,其一批次晶圓上的光阻進行顯影 後,於步驟S305,在一批次晶圓上,藉由以光阻圖案為罩 幕進行姓刻’對應於罩幕之圖案之回路圖案,被形成於各 晶圓上的各拍攝區域。之後,藉由進行更上層佈局的回路 圖案的形成等,半導體等的元件被製造。於上述之半導體 元件製造方法,有極細微的回路圖案之半導體元件,可以 得到良好的生產率。 又’於第1、3、5、6圖所示的曝光裝置,藉由於平板 (玻璃板)上形成所定的圖案(回路圖案或電極圖案等),可 以得到做為微元件的液晶顯示元件。以下,參閱第丨丨圖, 說明做為微元件的液晶顯示元件之製造方法。 於第11圖’於圖案形成步驟S4〇1,使用實施例的曝光 裝置’將罩幕的圖案轉印感光於感光性基板(被塗佈光阻 的玻璃基板等),以進行所謂之光微影製程。藉由此光微 影步驟,在感光性基板上,包含多個電極等所定的圖案被 形成。其後,被曝光的基板,利用進行顯影製程、蝕刻步 ,、移除光阻等製程,於基板上被形成的所定圖案,而接 著到彩色濾光片的形成步驟S4〇2。 接著於毛色渡光片的形成步驟s 4 0 2,對應紅(R)、 綠(G)、藍(B)之3個點為一組,矩陣狀的多個配列,或是12725pif.ptd Page 27 200417825 V. Description of the invention (23) The pattern image of the light device 'on the mask is sequentially exposed and transferred by the projection optical system for each shooting area on the batch of wafers. That is, the mask is illuminated by the illumination optical device (illumination step), and the pattern of the mask is transferred to the wafer (exposure step). After that, in step S304, the photoresist on one batch of wafers is developed, and in step S305, on a batch of wafers, the last name is engraved with the photoresist pattern as a mask. The circuit pattern of the pattern is formed in each imaging region on each wafer. Thereafter, elements such as a semiconductor are manufactured by forming a circuit pattern of a higher-level layout and the like. In the semiconductor device manufacturing method described above, a semiconductor device having an extremely fine circuit pattern can obtain good productivity. Furthermore, in the exposure apparatus shown in Figs. 1, 3, 5, and 6, a predetermined pattern (circuit pattern, electrode pattern, etc.) is formed on a flat plate (glass plate), and a liquid crystal display element can be obtained as a micro element. Hereinafter, a method for manufacturing a liquid crystal display device as a micro device will be described with reference to FIG. In FIG. 11 'in the pattern forming step S40.1, the pattern of the mask is transferred to a photosensitive substrate (a glass substrate coated with a photoresist, etc.) by using the exposure device of the embodiment to perform so-called light micro Film production process. In this photolithography step, a predetermined pattern including a plurality of electrodes and the like is formed on the photosensitive substrate. Thereafter, the exposed substrate is subjected to a predetermined pattern formed on the substrate by processes such as a development process, an etching step, and removal of a photoresist, followed by a step S402 of forming a color filter. Next, at the step s 4 0 2 of forming the hair color light sheet, corresponding to the three points of red (R), green (G), and blue (B) as a group, a plurality of matrix-like arrays, or

200417825 五、發明說明(24)200417825 V. Description of Invention (24)

紅、綠、藍的3個條狀濾光組,配列於多個水平掃描方 向,以形成彩色濾光片。接著,於彩色遽光片的形成 S402之後,進订胞組合步驟S4〇3。於胞組合步驟s4〇3 用由圖案形成步驟S401所得到有所定圖案的基板,與 色濾光片的形成步驟S402所得到的彩色濾光片等之液曰^ 板(液晶胞),將之組合。於胞組合步驟S4〇3,例如,: 案形成步驟S401所得到有所定圖案的基板,與由 Z 片的形成步驟S402所得到的彩色濾光片之間注入 製造液晶面板(液晶胞)。 sa 肉 又,於上述各實施例,做為多個固體光源, 發光點之固體光源晶片,其晶片配列成多個陣列狀而成 ©體光源晶片陣列,更也可以使用於將多個發光點做進一 個基板之型態等。又,固體光源元件可以有機或無機。 又,於上述之各實施例,做為光源,也可以使 個固體光源與對應各固體光源所設置的多個光 ς 體(光纖)所組合之光纖光源。於此情形,第丨與第2實施^ 之先源1更可變更為光纖光源。第3肖第4實施例 :2。内的固體光源陣列(2〇a、2〇b),可以變更為 早 源。 第1 2圖繪示固體光源71與對應固體光源71所設置 纖72,由多個束合成之光纖光源69。於第12圖繪示^ 光源69,從固體光源71射出之光,入射於光纖?2 纖 端,而從光纖72之出射端出射。即是,光纖72之每一入射 端,與固體光源71光學耦接。又,於第U圖繪示,固體:Three red, green, and blue stripe filter groups are arranged in a plurality of horizontal scanning directions to form a color filter. Next, after the formation of the color phosphor film S402, the cell combination step S403 is performed. In the cell combination step s403, a liquid crystal plate (liquid crystal cell) such as a substrate having a predetermined pattern obtained in the pattern forming step S401 and a color filter obtained in the color filter forming step S402 is used. combination. In the cell combination step S403, for example, a substrate having a predetermined pattern obtained in the step S401 and the color filter obtained in the step S402 of the Z-sheet formation are injected to manufacture a liquid crystal panel (liquid crystal cell). Sa meat, in the above embodiments, as a solid light source wafer with multiple solid light sources and light emitting points, the wafers are arranged in a plurality of arrays to form a bulk light source wafer array, and it can also be used to integrate multiple light emitting points. Do the type of a substrate. The solid-state light source element may be organic or inorganic. In addition, in the above-mentioned embodiments, as the light source, a solid-state light source and a plurality of light sources (optical fibers) provided corresponding to each solid-state light source may be combined as an optical fiber light source. In this case, the first source 1 of the second and second embodiments may be changed to a fiber light source. 3rd Xiao 4th embodiment: 2. The solid-state light source array (20a, 20b) can be changed to an early source. Fig. 12 shows a solid-state light source 71 and a fiber 72 arranged corresponding to the solid-state light source 71, and an optical fiber light source 69 composed of a plurality of beams. In Figure 12, a light source 69 is shown. The light emitted from the solid-state light source 71 is incident on the fiber end 2 and exits from the exit end of the optical fiber 72. That is, each incident end of the optical fiber 72 is optically coupled to the solid-state light source 71. Also, as shown in Figure U, the solid:

12725pif.ptd 第29頁 200417825 五、發明說明(25) 源71、對應各固體光源71所設置的透鏡(聚光光學系統)73 以及光纖72,由多個束合成光纖光源70。於第13圖之光纖 光源70,從固體光源71射出之光,入射於透鏡7 3,藉由透 鏡7 3之聚光後入射於光纖7 2之入射端,且由光纖7 2之出射 端射出。此即,光纖7 2之每一入射端,與固體光源71光學 耦合。 如第12圖所示光纖光源69與第13圖所示光纖光源70, 利用使用有適當的開口數的光纖72,通常為橢圓形狀的固 體光源71的光束外型75(參照第14A圖),可以由圓形的外 型76(參照第14B與14C圖)所形成。 又,藉由多個光纖的射出端所合成任意形狀,光源射 出端的形狀(射出端配置形狀),可以形成最適當的形狀。 例如,第1 5A圖繪示從光纖光源之射出端的形狀可以為矩 形,也可以形成如第1 5B圖繪示之形狀。又,如第1 6圖所 示’光纖光源69、70之光纖之出射端,為束狀形狀與蠅眼 積分器8 0之一的構件8 1之形狀相似,要形成多個光纖之出 射端部分的形狀極為容易。 接著,第17圖繪示,對應於第13圖之光纖光源7〇之一 的固體光源71,設置透鏡(聚光光學系統)73與光纖72。於 第13圖之光纖光源70,在固體光源71之發散角内具有最大 _ 出射角度之光的開口數(最大出射角度(半角)的正弦 (sin),以下稱為開口數)為NA1,固體光源71之發光部的 大小(直徑)的最大值0 ,光纖72可能進出的角度範圍(半 角)的正弦(sin),也就是光纖72的開口數為NA2,光纖7212725pif.ptd Page 29 200417825 V. Description of the invention (25) The source 71, a lens (condensing optical system) 73 and an optical fiber 72 provided for each solid-state light source 71, are combined into a fiber light source 70 by a plurality of beams. In the optical fiber light source 70 in FIG. 13, the light emitted from the solid light source 71 is incident on the lens 7 3, and the light collected by the lens 7 3 is incident on the incident end of the optical fiber 7 2, and is emitted from the exit end of the optical fiber 72. . That is, each incident end of the optical fiber 72 is optically coupled to the solid-state light source 71. As shown in FIG. 12 and FIG. 13, the optical fiber light source 69 and the optical fiber light source 70 shown in FIG. 13 use an optical fiber 72 with an appropriate number of openings, and a beam shape 75 of a generally elliptical solid light source 71 (see FIG. 14A). It may be formed by a circular shape 76 (refer to FIGS. 14B and 14C). In addition, by arbitrarily forming a combination of the exit ends of a plurality of optical fibers, the shape of the exit end of the light source (the exit end arrangement shape) can be formed into the most appropriate shape. For example, Fig. 15A shows that the shape of the exit end from the optical fiber light source may be rectangular, or it may be formed as shown in Fig. 15B. In addition, as shown in FIG. 16, the output ends of the optical fibers of the optical fiber light sources 69 and 70 have a beam shape similar to the shape of the component 81 of one of the fly-eye integrators 80, and it is necessary to form multiple optical output ends. The shape of the part is extremely easy. Next, Fig. 17 shows that a solid light source 71 corresponding to one of the optical fiber light sources 70 of Fig. 13 is provided with a lens (condensing optical system) 73 and an optical fiber 72. In the optical fiber light source 70 in FIG. 13, the number of openings of the light having the largest _ exit angle (the sine of the maximum exit angle (half angle), hereinafter referred to as the number of openings) within the divergence angle of the solid light source 71 is NA1, and the solid The maximum value of the size (diameter) of the light emitting part of the light source 71 is 0, and the sine sinusoid (sin) of the angular range (half angle) that the optical fiber 72 can enter and exit, that is, the number of openings of the optical fiber 72 is NA2, and the optical fiber 72

12725pif.ptd 第30頁 200417825 五、發明說明(26) 的入射端的核心直徑D,其滿足於na2 ^ 0 /D X NA1之條 件。藉由滿足此條件,從固體光源7丨射出之光沒有無用之 光’而可以進入光纖72,以維持從固體光源71射出之光的 光量,使可以從光纖72出射端射出。 ^ 又’使用做為光纖之石英光纖之情形,固體光源71的 最大開口數N A1 ’發光部的大小(直徑)的最大值0,石英 光纖72的入射端的核心直徑D,其滿足於〇. 3 - 0/D X , N A1之條件。藉由滿足此條件,從固體光源射出之光沒有 無用之光’而可以進入石英光纖72,以維持從固體光源射 出之光的光量,使可以從光纖72出射端射出。 又’第18圖為光纖光源69、7〇之出射端之蠅眼積分器_ 80之結構圖。第19圖為蠅眼積分器8〇之一的構件81,其入 射端面的形狀。第20圖為光纖光源69、7〇之出射端83之形 狀示意圖。於此,蠅眼積分器8〇之構件81之入射端面之一 邊長為a,另一邊長為b。由多個光纖72合成束的出射端83 的形狀’其一邊長為A,另一邊長為b,光纖72與蠅眼積分 器8 0之間的位置,對準透鏡8 2之焦點距離為f丨,蠅眼積分 器80之焦點距離為f'2,則Αχ f2/fl 及Bx f2/fl 之關 係成立。 又,在光纖光源為m組的光纖光源69、70所構成情形 # 下(m為自然數),從m組的光纖72射出的光之光輸出總量為 W,光纖72的出射端的核心直徑為d,其希望滿足[mx {d (f2/fl)p τγ/(4χ ax b)]x w-30 (mW)之條件。藉由滿足 此條件,相對蠅眼積分器8〇之一的構件81之光源像的填充12725pif.ptd Page 30 200417825 V. Description of the invention The core diameter D of the incident end of (26) satisfies the condition of na2 ^ 0 / D X NA1. By satisfying this condition, the light emitted from the solid-state light source 7 丨 can enter the optical fiber 72 without unnecessary light 'to maintain the light amount of the light emitted from the solid-state light source 71 so that it can be emitted from the exit end of the optical fiber 72. ^ In the case of using a quartz fiber as an optical fiber, the maximum number of openings N A1 of the solid-state light source 71 'is the maximum value of the size (diameter) of the light-emitting portion 0, and the core diameter D of the incident end of the quartz fiber 72 is satisfied. 3-0 / DX, N A1 conditions. By satisfying this condition, the light emitted from the solid-state light source can enter the quartz optical fiber 72 without useless light 'to maintain the amount of light emitted from the solid-state light source so that it can be emitted from the exit end of the optical fiber 72. Fig. 18 is a structural diagram of a fly-eye integrator_80 at the emitting ends of the optical fiber light sources 69 and 70. Fig. 19 shows the shape of the entrance end face of one of the members 81 of the fly eye integrator 80. Fig. 20 is a schematic diagram showing the shapes of the exit ends 83 of the optical fiber light sources 69 and 70. Here, one side of the incident end face of the component 81 of the fly eye integrator 80 is a, and the other side is b. The shape of the exit end 83 of the bundle composed of a plurality of optical fibers 72 is "one side is A and the other side is b", the position between the optical fiber 72 and the fly-eye integrator 80, and the focal distance of the alignment lens 82 is f丨 If the focal distance of the fly-eye integrator 80 is f'2, then the relationship between Αχ f2 / fl and Bx f2 / fl is established. In the case where the optical fiber light source is an optical fiber light source 69, 70 of m group (m is a natural number), the total light output of the light emitted from the optical fiber 72 of the m group is W, and the core diameter of the exit end of the optical fiber 72 Is d, which hopes to satisfy the condition of [mx {d (f2 / fl) p τγ / (4χ ax b)] x w-30 (mW). By satisfying this condition, the light source image of the component 81 corresponding to one of the fly eye integrator 80 is filled.

12725pif.ptd 第31頁 200417825 五、發明說明(27) ,可以為最適當狀態,可以做為曝光裝置而得到實用的照 it ^ 8 η ^ μ ^ «1 、出射端,其束的形狀與蠅眼 積为器80的構件81之形狀希望為相似。 光二:tTi二所示的光纖光源69與第13圖所示的光纖 ,最小值為Pmin,於;==的光量的最大值為 ^ A5 a d : 於具先纖72的出射端之光量之平均 f 動;二利用則 )/( Pmax+Pmin)算 S :w /蠅眼積分器80的入射端所要求的光量的波動 :條件。先源71的數量n ’而希望滿足n^(AP/AW)2 _ 光衿此條件,從光纖光源69、70的出射端射出之 不均勻’利用固體光源71的數量η比(△" 由平均化的效果可以提供有穩定光輸出的 氺二’如第1 2圖所示的光纖光源69與第1 3圖所示的光纖 开/”固體光糊波長、光量等的輸出特性Ϊ; Μ光^ ^止猎由輸出特性相異的的多個固體光源71做為光 出特使用,以將光纖光源69、7〇的出射端之輸 .,句勻平均化。光纖光源69、70的出射端被平均化 源71的“利用蠅眼積分器8〇被平均化。第21圖為各固體光 ^出特:出特性不均句被平均化的圖示化。具有各別相旦 的固體光源71平均化,其圖示化綱。如此:、 桢田】棒 >寺性相異多個固體光源71組合成光纖光源69、70的 月仃下,藉由平均化效果可以得到有穩定輸出的照明12725pif.ptd Page 31 200417825 V. Description of the invention (27), it can be in the most appropriate state, and can be used as an exposure device to get a practical photo it ^ 8 η ^ μ ^ «1, the exit end, the shape of the beam and the fly It is desirable that the shape of the component 81 of the ophthalmic device 80 be similar. Light two: the optical fiber light source 69 shown in tTi two and the optical fiber shown in FIG. 13, the minimum value is Pmin, and the maximum light amount of == is ^ A5 ad: the average amount of light at the exit end of the fiber 72 f move; second use then) / (Pmax + Pmin) to calculate S: w / fluctuation of light quantity required at the entrance end of fly eye integrator 80: condition. The number n of the first source 71 is n 'and it is desired to satisfy n ^ (AP / AW) 2 _ light. This condition, the non-uniformity of the light emitted from the exit ends of the optical fiber light sources 69, 70' uses the number η ratio of the solid light source 71 (△ " The averaged effect can provide a stable light output of the second optical fiber light source 69 as shown in FIG. 12 and the optical fiber shown in FIG. 13 / "solid light paste wavelength, light output and other output characteristics Ϊ; Μ 光 ^^ Only a plurality of solid light sources 71 with different output characteristics are used as the light output to uniformly output the light emitting ends of the optical fiber light sources 69 and 70. The optical fiber light sources 69 and 70 are evenly averaged. The exit end of the light is averaged by the "average fly integrator 80" of the averaging source 71. Fig. 21 is a graph showing each solid light ^ special feature unevenness is averaged. The solid-state light source 71 is averaged, and its outline is illustrated. So :, Putian] Rod > A combination of multiple solid-state light sources 71 with different characteristics to form optical fiber light sources 69, 70 can be obtained by the averaging effect. Lighting with stable output

12725pif.ptd 第32頁 20041782512725pif.ptd Page 32 200417825

又,曝光裝置為掃描型曝光裝置的情形,具有同步遮 板為較佳。第2 2繪示依據本發明掃描型曝光裝置之結構示 意圖。此曝光裝置,相對光學投影系統,罩幕台及基板台 移動之同時,將罩幕的圖案轉印到平板p上的掃描型曝光 裝置有同步遮板(可動遮板機構)9〇。而其他之點,與第1 實施例的曝光裝置有相同結構。In the case where the exposure device is a scanning type exposure device, it is preferable to have a synchronous shutter. The 22nd drawing shows the structure of a scanning exposure apparatus according to the present invention. This exposure device has a synchronous shutter (movable shutter mechanism) 90, which is a scanning exposure device that transfers the pattern of the mask to the plate p while moving the mask stage and the substrate stage relative to the optical projection system. Otherwise, it has the same structure as the exposure apparatus of the first embodiment.

如第22圖所示,罩幕Μ的近旁,配置有固定的遮板BL〇 與可動遮板機構90。如第23圖所示,此可動遮板機構由4 個可動遮板BL1、BL2、BL3、BL4所成。藉由可動遮板 BL1、BL2的邊緣決定掃描曝光方向的開口 Ap的寬度。又, 藉由可動遮板BL3、BL4的邊緣決定掃描曝光方向的開口Ap 的長度。又’用4個可動遮板BL1〜BL4的各邊緣來限定開口 AP的形狀’可以包含於投影透鏡pl的圓形影像場丨F内而 定。As shown in FIG. 22, a fixed shutter BL0 and a movable shutter mechanism 90 are arranged near the mask M. As shown in FIG. 23, this movable shutter mechanism is made up of four movable shutters BL1, BL2, BL3, and BL4. The width of the opening Ap in the scanning exposure direction is determined by the edges of the movable shutters BL1 and BL2. The length of the opening Ap in the scanning exposure direction is determined by the edges of the movable shutters BL3 and BL4. Also, "the shape of the opening AP is defined by the edges of the four movable shutters BL1 to BL4" may be included in the circular image field F of the projection lens pl.

通過固定遮板BL0的開口與可動遮板機構9〇的開口 Ap 的照明光照射罩幕Μ。最終’利用各可動遮板BL1〜儿斗所形 成的開口 AP與固定遮板的開口重叠的唯一區域,進行罩幕 Μ的照明。於通常得曝光狀態,固定遮板的開口的像在罩 幕Μ的圖案面成像’於進行罩幕Μ的特定掃描曝光區域的週 邊即是遮光部分的近旁區域的曝光的情形下,利用4個可 動遮板BU〜BL4,可以防止遮光部分的外側的照明光入 射。即是,於罩幕台的掃描之際,監視從照明光學系統射 出的光束與罩幕Μ的相對位置之關係。根據此監視資訊,Illumination light passing through the opening Ap of the fixed shutter BL0 and the opening Ap of the movable shutter mechanism 90 irradiates the mask M. Finally, the opening M formed by each of the movable shutters BL1 to the bucket is overlapped with the opening of the fixed shutter to illuminate the curtain M. In the normally exposed state, the image of the opening of the fixed shutter is imaged on the pattern surface of the mask M. In the case where the periphery of a specific scanning exposure area of the mask M is exposed in the vicinity of the light-shielding portion, four images are used. The movable shutters BU to BL4 prevent the illumination light from entering the outside of the light shielding portion. That is, when scanning the mask stage, the relationship between the relative position of the light beam emitted from the illumination optical system and the mask M is monitored. Based on this monitoring information,

12725pif.ptd 第33頁 200417825 五、發明說明(29) 於罩幕Μ上的特殊掃描曝光區域的曝光開始時或是終了 時,於遮光部分的近旁區域判斷開始曝光之情形下,移動 可動遮板BL1,BL2的邊緣位置,以控制掃描曝光方向的開 口 ΑΡ的寬度。如此,可以防止不要的圖案等被轉印到平 板。又,於此曝光裝置,關於與罩幕Μ共軛的位置或是近 旁,也可以在其他位置設置可動遮板機構。 又’曝光裝置也可以設置有防止帶電裝置。第24繪示 具有防止帶電裝置之曝光裝置結構示意圖。於其他點,則 與第1實施例之曝光裝置相同。關於此曝光裝置,分別設 置收容光源的框體92,與收容照明光學系統及投影光學系 統的框體93,框體92與框體93電性連接,更可接地。即 疋’框體9 2與框體9 3保持同電位。又,分別設置有供給光 源電力的電源部9 4與供給曝光裝置本體電力的電源部9 5, 其個別一端接地。因此,可以防止曝光裝置的光源與曝光 裝置的本體的帶靜電,而防止由靜電造成的固體光源的損 壞。 又,於上述的各實施例之替換罩幕,也可以使用可變 圖案產生裝置以產生應該投影之圖案。如此之可變圖案產 生裝置一般可分為自發光型影像顯示元件與非發光型影像 顯示元件。自發光型影像顯示元件例如是陰極射線管 (CRT)、無機發光顯示器、有機發光顯示器(有機發光二極 體,OLED)、LED 顯示器、LD (laser diode, LD)顯示器、 %射出顯示器(field emission display,FED)、電漿面 板顯示器(plasma diplay panel,PDP)等。又,非發光型12725pif.ptd Page 33 200417825 V. Description of the invention (29) When the exposure of the special scanning exposure area on the mask M starts or ends, move the movable shutter when it is judged that the exposure starts in the area near the light-shielding part. The edge positions of BL1 and BL2 are to control the width of the opening AP in the scanning exposure direction. In this way, it is possible to prevent unnecessary patterns and the like from being transferred to the flat plate. Also, in this exposure device, a movable shutter mechanism may be provided at a position other than the position conjugated to the mask M or in the vicinity thereof. The exposure device may be provided with an antistatic device. FIG. 24 is a schematic structural diagram of an exposure device having a charging prevention device. Otherwise, it is the same as the exposure apparatus of the first embodiment. With respect to this exposure device, a frame body 92 accommodating a light source is separately provided, and a frame body 93 accommodating an illumination optical system and a projection optical system. The frame body 92 is electrically connected to the frame body 93 and can be grounded. That is, the frame body 9 'and the frame body 93 are held at the same potential. Further, a power source section 94 for supplying light source power and a power source section 95 for supplying power to the exposure apparatus main body are respectively provided, and one ends thereof are grounded. Therefore, it is possible to prevent the light source of the exposure device and the body of the exposure device from being electrostatically charged, and to prevent the solid light source from being damaged by static electricity. In addition, in the alternative masks of the above embodiments, a variable pattern generating device may be used to generate a pattern to be projected. Such a variable pattern generating device can be generally classified into a self-emission type image display device and a non-emission type image display device. Self-luminous image display elements are, for example, cathode ray tubes (CRT), inorganic light emitting displays, organic light emitting displays (OLEDs), LED displays, LD (laser diode, LD) displays, and% emission displays (field emission display (FED), plasma diplay panel (PDP), etc. Non-light emitting type

200417825 五、發明說明(30) 影像顯示元件例如是空間光調變器(spatial light modulator以下簡稱為SLM)、以空間調變光振幅相位或偏 光的狀態之元件、穿透型空間光調變器、與反射型空間光 調變器。對於穿透型空間光調變器如可變形微反射鏡元件 (Deformable Micro-mirror device DMD,或是數位微反 射鏡元件Digital Micro-mirror device)、反射鏡陣列、 反射型液晶顯示元件、電泳顯示器(Electr〇Ph〇retic200417825 V. Description of the invention (30) The image display element is, for example, a spatial light modulator (hereinafter referred to as SLM), an element that spatially modulates the light amplitude phase or the state of polarized light, and a transmissive spatial light modulator , And reflective spatial light modulator. For transmissive spatial light modulators such as deformable micro-mirror device DMD, or digital micro-mirror device, mirror array, reflective liquid crystal display element, electrophoretic display (Electr〇Ph〇retic

Display)、電子紙張(或電子油墨)、光柵閥(Grating 1 ight valve)等。 關於本發明曝光裝置的製造方法,與多個固體光源不 同的光源,例如藉由水銀燈所構成的光源,取換成固體光 源之情形下,藉由調整步驟,對應於與該些固體光源不同 的光源被設定成適當的第丨狀態之該照明光學系統的特 性’藉由該些固體光源的配置,而設定成適當的第2狀態 之特性。其方法可以製造包括具有多個固體光源適當特性 的照明光學系統之曝光裝置。 又’關於本發明的光源單元,對於照明裝置與固體光 源陣列不同之光源,例如藉由水銀燈所構成的光源,被設 定成適當的第1狀態之照明裝置的特性,藉由該些固體光 源的配置,而設定成適當的第2狀態之特性,可以提供具⑩ 有發散角或配光分佈的射出光。 一又,關於本發明曝光方法,對於與多個固體光源不同 的光源’被设定成適當的第丨狀態之照明光學系統的特 生因為使用藉由邊些固體光源的配置,而設定成適當的Display), electronic paper (or electronic ink), grating valve (Grating 1 ight valve), etc. Regarding the manufacturing method of the exposure device of the present invention, when a light source different from a plurality of solid light sources, for example, a light source composed of a mercury lamp is replaced with a solid light source, the adjustment steps correspond to those different from the solid light sources. The characteristics of the illumination optical system in which the light source is set to an appropriate first state are set to the characteristics in an appropriate second state by the arrangement of the solid light sources. The method can manufacture an exposure device including an illumination optical system having appropriate characteristics of a plurality of solid-state light sources. Furthermore, regarding the light source unit of the present invention, for a light source having a lighting device different from the solid light source array, for example, a light source constituted by a mercury lamp is set to an appropriate characteristic of the lighting device in the first state. It is arranged and set to the appropriate second state characteristics, which can provide the emitted light with a divergence angle or a light distribution. Regarding the exposure method of the present invention, the special feature of the illumination optical system in which a light source different from a plurality of solid-state light sources is set to an appropriate first state is set because it uses an arrangement of some solid-state light sources. of

12725pif.ptd12725pif.ptd

第35頁 200417825 五、發明說明(31) 第2狀態之特性的曝光裝置,罩幕的圖案可以良好被轉印 到感光性基板上。 又’關於本發明曝光裝置’光源單元對於照明裝置, 與多個固體光源陣列不同的光源,例如對於藉由水銀燈所 構成的光源,被設定成適當的第1狀態之照明裝置的特 性,藉由該些固體光源的配置,而設定成適當的第2狀態 之特性的曝光裝置,罩幕的圖案玎以良好被轉印到感光性 基板上。 又,關於本發明曝光裝置的調整方法,對於取代光源 裝置的多個固體光源配置於照明光學系統的所定位置之情 形,藉由調整步驟可以調整照明光學系統的照明特性。Page 35 200417825 V. Description of the invention (31) The exposure device with the second characteristic, the pattern of the mask can be well transferred to the photosensitive substrate. In the "exposure device of the present invention", the light source unit is different from a plurality of solid-state light source arrays in the lighting device. For example, for a light source composed of a mercury lamp, the characteristics of the lighting device set to an appropriate first state are determined by The arrangement of these solid-state light sources is set to an exposure device with appropriate characteristics in the second state, and the pattern of the mask is transferred to the photosensitive substrate in a good manner. Regarding the adjustment method of the exposure device of the present invention, in the case where a plurality of solid-state light sources instead of the light source device are arranged at predetermined positions of the illumination optical system, the illumination characteristics of the illumination optical system can be adjusted by the adjustment step.

12725pif.ptd 第36頁 200417825 圖式簡單說明 第1圖繪示依據本發明之第一實施例的投影曝光裝置 示意圖。 第2圖繪示依據本發明之第一實施例的投影曝光裝置 之製造方法流程圖。 第3圖繪示依據本發明之第二實施例的投影曝光裝置 示意圖。 第4圖繪示依據本發明之第二實施例的投影曝光裝置 之製造方法流程圖。 _ 第5圖繪示依據本發明之第三實施例的投影曝光裝置 示意圖。 第6圖繪不依據本發明之第四實施例的投影曝光裝置 示意圖。 第7 A〜7B圖繪示依據本發明光源單元之說明圖。 第8圖繪示依據本發明光源單元之說明圖。 第9 A〜9C圖繪示依據本發明光源單元之說明圖。 第1 0圖繪示依據本發明微元件製造方法之流程圖。 第11圖繪示依據本發明微元件製造方法之流程圖。 第1 2圖繪示依據本發明光纖光源的結構示意圖。 第1 3圖繪示依據本發明另一光纖光源的結構示意圖。 第14A〜14C圖繪示依據本發明,從光源射出之光束外 緣形狀之示意圖。 第1 5A〜1 5B圖繪示依據本發明從光纖光源之射出端的 形狀之示意圖。 第1 6緣示依據本發明從光纖光源之射出端的形狀與蠅12725pif.ptd Page 36 200417825 Brief Description of Drawings Figure 1 is a schematic diagram of a projection exposure apparatus according to a first embodiment of the present invention. Fig. 2 shows a flowchart of a method for manufacturing a projection exposure apparatus according to a first embodiment of the present invention. FIG. 3 is a schematic diagram of a projection exposure apparatus according to a second embodiment of the present invention. FIG. 4 is a flowchart of a manufacturing method of a projection exposure apparatus according to a second embodiment of the present invention. _ Figure 5 is a schematic diagram of a projection exposure apparatus according to a third embodiment of the present invention. FIG. 6 is a schematic diagram of a projection exposure apparatus according to a fourth embodiment of the present invention. 7A to 7B are explanatory diagrams of a light source unit according to the present invention. FIG. 8 is an explanatory diagram of a light source unit according to the present invention. 9A to 9C are explanatory diagrams of a light source unit according to the present invention. FIG. 10 shows a flowchart of a micro-device manufacturing method according to the present invention. FIG. 11 is a flowchart of a micro-device manufacturing method according to the present invention. FIG. 12 is a schematic structural diagram of an optical fiber light source according to the present invention. FIG. 13 is a schematic structural diagram of another optical fiber light source according to the present invention. Figures 14A to 14C are schematic diagrams illustrating the shape of the outer edge of a light beam emitted from a light source according to the present invention. Figures 15A to 15B are schematic diagrams showing the shape of the exit end from the optical fiber light source according to the present invention. The 16th edge shows the shape and fly of the exit end from the optical fiber light source according to the present invention.

12725pif.ptd 第37頁 20041782512725pif.ptd p. 37 200417825

眼積分器的構件的形狀相似之示意圖。 第1 7繪示依據本發明對於光纖光源,從固體光源射出 的有,之光,為了引入光纖之條件說明示意圖。 八哭f =示依據本發明’⑼光纖光源之射出端到蠅眼積 分器之結構示意圖。 s 第财示依據本發明繩眼積分器之一的構件形狀 圖。 第20繪示依據本發明從光纖光源之射出端的形狀示意 圖0 第2 1繪示依據本發明各固體光源的輪 均化之狀態其圖示化之示意圖。 出特性之統計爭The schematic diagram of the shape of the components of the eye integrator is similar. The seventeenth is a schematic diagram for explaining the conditions for introducing optical fibers to the optical fiber light source from the solid light source according to the present invention. Eight tears f = shows a schematic structural diagram of the exit end of the '⑼ fiber optic light source to the fly eye integrator according to the present invention. s section shows the shape of a component of one of the rope eye integrators according to the present invention. Fig. 20 is a schematic diagram showing the shape of the exit end of the optical fiber light source according to the present invention. Fig. 21 is a schematic diagram showing the state of the wheel homogenization of each solid light source according to the present invention. Statistical contention

置之結構示意圖。 置,設計有4個可Schematic diagram of the structure. Set, the design has 4 available

苐2 2繪示依據本發明掃描型曝光裝 第2 3繪示依據本發明掃描型曝光裳 動遮板之結構示意圖。 防止帶電裴置之曝光裝置 第24繪示依據本發明具備有 結構示意圖。 【圖式標記說明】 1 : 光源Fig. 22 shows a scanning type exposure device according to the present invention. Fig. 23 shows a schematic structure view of a scanning type exposure shutter according to the present invention. An exposure device for preventing charging from being placed is shown in Figure 24 according to the present invention. [Schematic mark description] 1: Light source

橢圓鏡 對準透鏡 光圈 聚光光學系統 透鏡 照度感測器Elliptical mirror Alignment lens Aperture Condensing optical system Lens Illumination sensor

200417825 圖式簡單說明 10 : 積分感測器 11 : 控制部 12 : 顯示部 20 : 光源單元 2 0a: 基板 20b: 發光二極體 20c 、 20d: 微透鏡 2 0 e : 不均補正板 20f : 遠心補正板 69 > 70 : 光纖光源 71 : 固體光源 72: 光纖 73: 透鏡 80 : 蠅眼積分器 82 : 對準透鏡 92 > 93: 框體 94、95 ·· 電源部 M: 罩幕、 P: 平板 PL: 投影光學系200417825 Brief description of the drawing 10: Integral sensor 11: Control section 12: Display section 20: Light source unit 2 0a: Substrate 20b: Light emitting diode 20c, 20d: Micro lens 2 0e: Unevenness correction plate 20f: Telecentric Correction plate 69 > 70: Optical fiber light source 71: Solid-state light source 72: Optical fiber 73: Lens 80: Fly-eye integrator 82: Alignment lens 92 > 93: Frame 94, 95 · Power supply section M: Cover, P : Flat PL: Projection Optics

12725pif.ptd 第39頁12725pif.ptd Page 39

Claims (1)

200417825 六、申請專利範圍' --- 光與1系一種曝光裝置之製造方法’其對於使用含一聚光 案^ f統之一照明光學系統以照明一罩幕,將該罩幕之圖 八 P司—感光性基板,該曝光裝置之製造方法包括: ^固體光源配置步驟,將多個固體光源配置於該聚光 光干系統之一前侧焦點位置或是與其光學共軛之一位置; 以及 ^ 、一調整步驟,對應於與該些固體光源不同之光源被設 疋成適當的第1狀態之該照明光學系統的特性,藉由該些 固體光源的配置,而設定成適當的第2狀態之特性。200417825 VI. Scope of patent application --- Light and 1 is a manufacturing method of an exposure device 'For the use of an illumination optical system with a light-concentrating system ^ f system to illuminate a mask, Figure 8 of the mask Division P—a photosensitive substrate. The manufacturing method of the exposure device includes: ^ a solid light source disposing step, arranging a plurality of solid light sources at a front focal position of the condensing light drying system or a position of an optical conjugate with the solid light source; And ^, an adjustment step, corresponding to the characteristics of the illumination optical system in which a light source different from the solid light sources is set to an appropriate first state, and is set to an appropriate second by the configuration of the solid light sources State characteristics. 2·如申請專利範圍第1項之曝光裝置之製造方法,其 中咸照明光學系統包含在該些固體光源與該聚光光學系統 之間的光路中的一光學積分器。 3 · 一種曝光裝置之製造方法,其使用一照明光學系 統照明一罩幕,將該罩幕之一圖案轉印到一感光性基板, 該曝光裝置之製造方法,包含: 一固體光源配置步驟,將多個固體光源配置於該照明 光學系統所定的位置;以及2. The manufacturing method of the exposure device according to item 1 of the patent application, wherein the salty illumination optical system includes an optical integrator in an optical path between the solid light sources and the condensing optical system. 3. A manufacturing method of an exposure device, which uses an illumination optical system to illuminate a mask, and transfers a pattern of the mask to a photosensitive substrate. The manufacturing method of the exposure device includes: a solid light source arrangement step, Arranging a plurality of solid-state light sources at positions determined by the illumination optical system; and 一調整步驟,對應於與該些固體光源不同之光源被設 定成適當的第1狀態之該照明光學系統的特性,藉由該些 固體光源的配置,而設定成適當的第2狀態之特性。 4.如申請專利範圍第卜3項之其一的曝光裝置之製造 方法,其中該調整步驟包括:利用一照明不均勻調整步驟 以調整在該罩幕或該感光性基板之照明不均勻,與一遠心 調整步驟以調整在該罩幕或該感光性基板之遠心之至少其An adjustment step corresponds to the characteristics of the illumination optical system corresponding to a light source different from the solid light sources being set to an appropriate first state, and the properties of the second light state are set to be appropriate by the arrangement of the solid light sources. 4. The method for manufacturing an exposure device according to item 3 of the scope of the patent application, wherein the adjusting step includes: using an uneven illumination adjustment step to adjust the uneven illumination on the mask or the photosensitive substrate, and A telecentric adjustment step to adjust at least one of the telecentricity of the mask or the photosensitive substrate 12725pif.ptd 第40頁 200417825 六、申請專利fe圍 一以進行調整。 5. 如申請專利範圍第卜3項之其一的曝光裝置之製造 方法,其中該調整步驟包括:利用調整從該些固體光源射 出之多個光束内之至少其一的發散角的一發散角調整步 驟,與調整從該些固體光源射出之多個光束内之至少其一 的配光分佈之一配光分佈調整步驟之至少其一的步驟,以 進行調整。 6. 如申請專利範圍第卜3項之其一的曝光裝置之製造 方法,其中該調整步驟包括:利用調整該照明光學系統之 照明特性的一照明特性調整步驟,與調整從該些固體光源 之射出光之一射出光調整步驟。 7. 如申請專利範圍第6項之曝光裝置之製造方法,其 中: 該照明特性調整步驟,利用一照明不均勻調整步驟以 調整在該罩幕或該感光性基板之照明不均勻,與一遠心調 整步驟以調整在該罩幕或該感光性基板之遠心之至少其一 以進行調整;以及 該射出光調整步驟,利用調整從該些固體光源射出之 多個光束内之至少其一的發散角的一發散角調整步驟,與 調整從該些固體光源射出之多個光束内之至少其一的配光 分佈之一配光分佈調整步驟之至少其一的步驟,以進行調 整。 8. —種曝光裝置之製造方法,其對於使用含一聚光 光學系統之一照明光學系統以照明一罩幕,將該罩幕之圖12725pif.ptd Page 40 200417825 Six, apply for patents to adjust. 5. The manufacturing method of the exposure device according to item 3 of the scope of patent application, wherein the adjusting step includes: using a divergence angle of adjusting a divergence angle of at least one of the plurality of light beams emitted from the solid light sources. The adjusting step is a step of adjusting at least one of a light distribution distribution adjusting step of at least one of the light distribution distributions of the plurality of light beams emitted from the solid light sources. 6. The manufacturing method of the exposure device according to item 3 of the scope of patent application, wherein the adjustment step includes: using an illumination characteristic adjustment step for adjusting the illumination characteristics of the illumination optical system, and adjusting the distance from the solid light sources. One of the emitted light is an emitted light adjustment step. 7. The manufacturing method of the exposure device according to item 6 of the patent application scope, wherein: the illumination characteristic adjustment step utilizes an illumination unevenness adjustment step to adjust the unevenness of illumination on the mask or the photosensitive substrate, and a telecentricity An adjusting step for adjusting at least one of the telecentricity of the mask or the photosensitive substrate; and an outgoing light adjusting step for adjusting a divergence angle of at least one of a plurality of light beams emitted from the solid light sources A step of adjusting a divergence angle, and a step of adjusting at least one of a light distribution distribution adjustment step of at least one of a plurality of light beams emitted from the solid light sources. 8. A method of manufacturing an exposure device, which uses an illumination optical system including a light-concentrating optical system to illuminate a mask, and maps the mask 12725pif.ptd 第41頁 200417825 六、申請專利範圍 案轉印到一感光性基板,該曝光裝置之製造方法包括· 一固體光源配置步驟,將多個固體光源配置於該聚光 光學系統之一前側焦點位置或是與其光學共輛之一 以及 ’ 一調整步驟,對應於與該些固體光源不同之光源被設 定成適當的第1狀態之該曝光裝置的曝光條件,藉由該些 固體光源的配置,而設定成適當的第2狀態之曝^條^ 了 9· 一種曝光裝置之製造方法,其使用一照明光學系 統照明一罩幕將該罩幕之圖案轉印到一感光性基板,該曝 光裝置之製造方法,包含: 一固體光源配置步驟,將多個固體光源配置於該照明 光學系統所定的位置;以及 一調整步驟,對應於與該些固體光源不同之光源被設 疋成適當的第1狀態之該曝光裝置的曝光條件,藉由該些 固體光源的配置,而設定成適當的第2狀態之曝光條件。 10·如申请專利範圍第8或9項之曝光裝置之製造方 法,其中該調整步驟包括施加補償值給控制包含於該曝光 條件中的曝光量之控制裝置的步驟。 11·如申請專利範圍第8或9項之曝光襞置之製造方 法,其中該調整步驟包括調整該照明光學系統的照明特性 之一照明特性調整步驟,與調整從該些固體光源之射出光 之一射出光調整步驟之至少其一。 ,12·如申請專利範圍第1〜3,8〜9項任其一之曝光裝置 之製造方法,其中該些固體光源包括發光二極體陣列。 200417825 六、申請專利範圍 明裝括該光*單元可拆卸與裝…照 多:固體光源配列成陣列狀的一固體光以及 學元^㈣n體光源陣列之光出射端,為陣列狀的一光 相Λ於與該固體光源陣列不同的光源,被設定成 該照明裝置的特性,藉由該些固體光源 罟摆桩入女^疋成適當的第2狀態之特性,對應該照明裝 置k供含有發散角與配光分佈之射出光。 ,、14·如申請專利範圍第13項之光源單元,其中該固體 光源陣列與該光學元件,可以配置於將從光源燈的光聚 的一橢圓鏡與在該照明裝置内的一光學積分器之間的光路 中。 15·如申請專利範圍第1 3或1 4項之光源單元,包括該 調整固體光源陣列的射出光特性之調整裝置。 16·如申請專利範圍第13或14項之光源單元,更包括 多個光纖,該些光纖之每一入射端與該些固體光源連接。 17. 一種光源單元,包括: 多個固體光源配列成陣列狀的一固體光源陣列;以及 調整該固體光源陣列之射出光特性之調整裝置。 18·如申請專利範圍第1 7項之光源單元,其中該調整 裝置可以調整從該固體光源陣列射出之光的發散角、從^ 固體光源陣列射出之光的配光分佈、以及在被照射面的照 明不均度及遠心之其中至少其一。12725pif.ptd Page 41 200417825 6. The scope of the patent application is transferred to a photosensitive substrate. The manufacturing method of the exposure device includes a solid light source arrangement step. A plurality of solid light sources are arranged on the front side of one of the condensing optical systems. The focal position or one of the optical vehicles and the adjustment step correspond to the exposure conditions of the exposure device in which the light source different from the solid light sources is set to an appropriate first state, and the configuration of the solid light sources An exposure device set to an appropriate second state is provided. A method of manufacturing an exposure device that uses an illumination optical system to illuminate a mask and transfers the pattern of the mask to a photosensitive substrate. The manufacturing method of the device includes: a solid-state light source arrangement step of arranging a plurality of solid-state light sources at predetermined positions of the illumination optical system; and an adjustment step in which light sources different from the solid-state light sources are set to an appropriate first light source. The exposure conditions of the exposure device in the 1 state are set to an appropriate exposure bar in the second state by the arrangement of the solid light sources. . 10. The method of manufacturing an exposure device as claimed in claim 8 or 9, wherein the adjusting step includes a step of applying a compensation value to a control device that controls an exposure amount included in the exposure condition. 11. The manufacturing method of the exposure device according to item 8 or 9 of the scope of the patent application, wherein the adjusting step includes adjusting one of the lighting characteristics of the lighting optical system, and adjusting the light output from the solid light sources. At least one of the emitted light adjustment steps. 12. The method for manufacturing an exposure device according to any one of claims 1 to 3, 8 to 9, in which the solid-state light sources include light-emitting diode arrays. 200417825 VI. The scope of the patent application includes that the light * unit can be disassembled and installed ... Multi-photograph: a solid light arrayed by a solid light source and the light emitting end of the academic element ^ ㈣n body light source array is an array of light The light source is different from the solid light source array, and is set to the characteristics of the lighting device. By using the solid light sources, the characteristics of the light source are set to an appropriate second state, corresponding to the lighting device k. Emitted light with divergence angle and light distribution. 14. The light source unit according to item 13 of the patent application range, wherein the solid light source array and the optical element can be arranged in an elliptical mirror that collects light from the light source lamp and an optical integrator in the lighting device. In the light path. 15. The light source unit according to item 13 or 14 of the scope of patent application, including the adjusting device for adjusting the light emission characteristics of the solid-state light source array. 16. The light source unit according to item 13 or 14 of the scope of patent application, further comprising a plurality of optical fibers, and each incident end of the optical fibers is connected to the solid light sources. 17. A light source unit, comprising: a solid light source array in which a plurality of solid light sources are arranged in an array; and an adjusting device for adjusting a light emitting characteristic of the solid light source array. 18. The light source unit according to item 17 of the scope of patent application, wherein the adjusting device can adjust the divergence angle of the light emitted from the solid-state light source array, the light distribution of the light emitted from the solid-state light source array, and the area to be illuminated. At least one of uneven illumination and telecentricity. 12725pif.ptd 第43頁 200417825 六、申請專利範圍 19. 如申請專利範圍第或18項之光源單元,更包括 多個光纖,該些光纖之每一入射端與該些固體光源連接。 20. 一種曝光方法,適用於如申請專利範圍第卜3, 8〜9項任其一之曝光裝置之製造方法所製造出的曝光裝 置,包括: 利用從該些固體光源之光,以照明該罩幕之一照明步 驟;以及 將該罩幕之圖案轉印到該感光性基板之一轉印步驟。 21. 如申請專利範圍第2 0項之曝光方法,其中該轉印 步驟包括使用將該罩幕之圖案像投影到該感光性基板的投 影光學系統,將該罩幕之圖案轉印到該感光性基板之步 驟。 22· 一種曝光裝置,包括: 如申明專利範圍第13〜14,17〜18項任其一之光源單 元;以及 μ 利用從該光 為了將罩幕之圖案曝光到感光性基板 單元的光照明該罩幕之一照明裝置。12725pif.ptd Page 43 200417825 6. Scope of patent application 19. For example, the light source unit of the patent application scope item or 18 includes a plurality of optical fibers, and each incident end of the optical fibers is connected to the solid light sources. 20. An exposure method suitable for an exposure device manufactured by the method of manufacturing an exposure device according to any one of claims 3, 8 to 9 of the scope of patent application, comprising: using light from the solid light sources to illuminate the A step of lighting the mask; and a step of transferring the pattern of the mask to the photosensitive substrate. 21. The exposure method as claimed in claim 20, wherein the transferring step includes using a projection optical system that projects a pattern image of the mask onto the photosensitive substrate, and transfers the pattern of the mask to the photosensitive Step of a flexible substrate. 22. An exposure device comprising: a light source unit such as any one of claims 13 to 14, 17 to 18 of the declared patent scope; and μ illuminating the light from the light in order to expose the pattern of the mask to the photosensitive substrate unit One of the lighting devices of the curtain. 罢葸2九請專利範圍第22項之曝光裝置,更包括將 罩幕之圖f投影到感光性基板之投影光學系統。 腺# 2梦4·署一 ί Ϊ光方法,使用於如申請專利範圍第22項 曝光裝置,该曝光方法包括: 以及’、月V驟,利用從該光源單元之光以照明該罩幕 轉P步驟,將該罩幕之圖案轉印到該感丨性基板。No. 29. The exposure device according to item 22 of the patent scope further includes a projection optical system that projects the image f of the mask onto a photosensitive substrate.腺 # 2 梦 4 · 司 一 ί The light exposure method is used in the exposure device such as the 22nd patent application scope, and the exposure method includes: and ', month V, using the light from the light source unit to illuminate the mask In step P, the pattern of the mask is transferred to the sensitive substrate. 200417825 六、申請專利範圍 25. 一種曝光裝置的調整方法,用於為了將一罩幕之 圖案轉印到一感光性基板,藉由包含有聚光光學系統之照 明光學系統,利用從光源裝置的光以照明該罩幕之曝光裝 置的調整方法,包括: 一固體光源配置步驟,將取代該光源裝置的多個固體 光源配置於該聚光光學系統之前侧焦點位置或與其的光學 共軛位置;以及 一調整步驟,利用該些固體光源之配置,以調整該照 明光學系統之照明特性。200417825 VI. Application for Patent Scope 25. A method for adjusting an exposure device is used to transfer a pattern of a curtain to a photosensitive substrate. By using an illumination optical system including a condenser optical system, The method for adjusting an exposure device for illuminating the mask includes: a solid light source disposing step of disposing a plurality of solid light sources replacing the light source device at a focal position in front of the focusing optical system or an optical conjugate position thereof; And an adjusting step, using the configuration of the solid light sources to adjust the illumination characteristics of the illumination optical system. 26· —種曝光裝置的調整方法,為了將一罩幕之圖案 轉印到一感光性基板,藉由照明光學系統,利用從光源裝 置的光以照明該罩幕之曝光裝置的調整方法,包括: 固體光源配置步驟,將取代該光源裝置的多個固體 光源配置於該照明光學系統之所定位置;以及 一调整步驟,利用該些固體光源之配置,以調整該昭 明光學系統之照明特性。 “、、 乙1 · 一種曝光方法 26項之曝光裝置的調整 法,包括: ’用於利用如申請專利範圍第2 5或 方法而被調整的曝光裝置之曝光方 嗍光學系 » … -,、八 % 源之光以照明該罩幕;以及 28轉2 Π:將該罩幕之圖案轉印到該感光性基板。 . · +光裝置的調整方法,用於包含有 系統之照明光學系統;::法 先先學 …、明罩幕,將該罩幕之圖案轉印到26 · —An adjusting method of an exposure device, in order to transfer a pattern of a mask to a photosensitive substrate, by an illumination optical system, using the light from a light source device to illuminate the exposure device of the mask, the method includes: : A solid-state light source configuration step, in which a plurality of solid-state light sources replacing the light source device are arranged at predetermined positions of the illumination optical system; and an adjustment step, using the configuration of the solid-state light sources, to adjust the lighting characteristics of the Zhaoming optical system. ",, B1 · A method of adjusting the exposure device of 26 exposure methods, including: 'Exposure system for the exposure device using the exposure device adjusted as described in Patent Application No. 25 or Method 嗍 Optical System» ...-,, 8% of the source of light to illuminate the mask; and 28 turns 2 Π: transfer the pattern of the mask to the photosensitive substrate.. + Adjustment method of the light device for the illumination optical system including the system; :: The law first learns ..., the curtain is exposed, and the pattern of the curtain is transferred to 第45頁Page 45 200417825 六、申請專利範圍 一感光性基板之曝光裝置的調整方法,包括: 一固體光源配置步驟,將多個固體光源配置於該聚光 光學系統之前側焦點位置或與其的光學共軛位置;以及 一調整步驟,對應於與該些固體光源不同之光源被設 定成適當的第1狀態之該曝光裝置的曝光條件,藉由該些 固體光源的配置,而設定成適當的第2狀態之曝光條件。 2 9· 一種曝光裝置的調整方法,用於照明光學系統以 照明罩幕’將該罩幕之圖案轉印到一感光性基板之曝光裝 置的調整方法,包括: 一固體光源配置步驟’將多個固體光源配置於該照明 _ 光學系統所定的位置;以及 一調整步驟,對應於與該些固體光源不同之光源被設 定成適當的第1狀態之該曝光裝置的曝光條件,藉由該些 固體光源的配置,而設定成適當的第2狀態之曝光條件。 30·如申請專利範圍第28或29項之曝光裝置的調整方 法’其中該調整步驟包含施加補償值給控制該曝光量之控 制裝置之步驟。 31.如申請專利範圍第28或29項之曝光裝置的調整方 法’其中該調整步驟包含調整該照明光學系統的照明特性 之一照明特性調整步驟,與調整從該些固體光源之射出光 之一射出光調整步驟之至少其一。 32· —種曝光裝置,包括: 依照如申請專利範圍第丨〜3,8〜9項任其一之曝光裝置 之製造方法所製造之曝光裝置。 一200417825 VI. Patent application scope A method for adjusting an exposure device of a photosensitive substrate, comprising: a solid light source disposing step of disposing a plurality of solid light sources at a focal position or an optical conjugate position of a front side of the condensing optical system; and An adjusting step, corresponding to the exposure conditions of the exposure device in which a light source different from the solid light sources is set to an appropriate first state, and the arrangement of the solid light sources is set to an appropriate second state of exposure conditions . 2 9 · An adjustment method of an exposure device for an illumination optical system to illuminate a mask 'an adjustment method of an exposure device that transfers the pattern of the mask to a photosensitive substrate, comprising: a solid-state light source configuration step' Solid-state light sources are arranged at positions determined by the illumination_optical system; and an adjustment step corresponding to the exposure conditions of the exposure device in which a light source different from the solid-state light sources is set to an appropriate first state, by the solid-state The arrangement of the light sources is set to an appropriate exposure condition in the second state. 30. The adjusting method of the exposure device according to the 28th or 29th of the scope of patent application ', wherein the adjusting step includes a step of applying a compensation value to a control device that controls the exposure amount. 31. The method for adjusting an exposure device according to item 28 or 29 of the scope of patent application, wherein the adjusting step includes one of adjusting an illumination characteristic of the illumination optical system, and one of adjusting light emitted from the solid light sources. At least one of the emitted light adjustment steps. 32 · —An exposure device comprising: an exposure device manufactured in accordance with a method for manufacturing an exposure device according to any one of the scope of application for patents Nos. 3 to 8 to 9. One 12725pif.ptd 第46頁 200417825 六、申請專利範圍 33. —種曝光裝置,包括: 依照如申請專利範圍第2 5,2 6,2 8,2 9項任其一之曝 光裝置的調整方法所製造之曝光裝置。 _ Φ12725pif.ptd Page 46 200417825 VI. Patent Application Range 33. An exposure device, including: Manufactured in accordance with the adjustment method of any one of the exposure devices in the patent application scope No. 25, 26, 28, 29 Exposure device. _ Φ 12725pif.ptd 第47頁12725pif.ptd Page 47
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