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Application filed by Wintek CorpfiledCriticalWintek Corp
Priority to TW93134803ApriorityCriticalpatent/TWI249037B/en
Application grantedgrantedCritical
Publication of TWI249037BpublicationCriticalpatent/TWI249037B/en
Publication of TW200615541ApublicationCriticalpatent/TW200615541A/en
The present invention is related to a contact-type thin film probe (2), which is provided with a plastic substrate having a face formed thereon plural signal lines. One terminal of each signal line is disposed with a contact conduction layer for contacting the circuit of the liquid crystal display. In addition, a compound-electroplating is used to perform transmutation onto each contact conduction layer to improve the wear-resisting characteristic and increase its application lifetime.
TW93134803A2004-11-122004-11-12Contact-type thin film probe
TWI249037B
(en)