TW200615565A - Radiation detecting apparatus, scintillator panel, their manufacturing method and radiation detecting system - Google Patents

Radiation detecting apparatus, scintillator panel, their manufacturing method and radiation detecting system

Info

Publication number
TW200615565A
TW200615565A TW094127203A TW94127203A TW200615565A TW 200615565 A TW200615565 A TW 200615565A TW 094127203 A TW094127203 A TW 094127203A TW 94127203 A TW94127203 A TW 94127203A TW 200615565 A TW200615565 A TW 200615565A
Authority
TW
Taiwan
Prior art keywords
layer
scintillator
radiation detecting
protection layer
protection
Prior art date
Application number
TW094127203A
Other languages
English (en)
Other versions
TWI290231B (en
Inventor
Yoshihiro Ogawa
Satoshi Okada
Tomoyuki Tamura
Shinichi Takeda
Kazumi Nagano
Masato Inoue
Katsuro Takenaka
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of TW200615565A publication Critical patent/TW200615565A/zh
Application granted granted Critical
Publication of TWI290231B publication Critical patent/TWI290231B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/20189—Damping or insulation against damage, e.g. caused by heat or pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/301—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/014—Manufacture or treatment of image sensors covered by group H10F39/12 of CMOS image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/026—Wafer-level processing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/40—Optical elements or arrangements
    • H10F77/496—Luminescent members, e.g. fluorescent sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
TW094127203A 2004-08-10 2005-08-10 Radiation detecting apparatus, scintillator panel, their manufacturing method and radiation detecting system TWI290231B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004233417 2004-08-10

Publications (2)

Publication Number Publication Date
TW200615565A true TW200615565A (en) 2006-05-16
TWI290231B TWI290231B (en) 2007-11-21

Family

ID=35839277

Family Applications (2)

Application Number Title Priority Date Filing Date
TW095146120A TWI334934B (en) 2004-08-10 2005-08-10 Radiation detecting apparatus and scintillator panel
TW094127203A TWI290231B (en) 2004-08-10 2005-08-10 Radiation detecting apparatus, scintillator panel, their manufacturing method and radiation detecting system

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW095146120A TWI334934B (en) 2004-08-10 2005-08-10 Radiation detecting apparatus and scintillator panel

Country Status (5)

Country Link
US (1) US7514686B2 (zh)
EP (1) EP1779140B1 (zh)
CN (1) CN101002110B (zh)
TW (2) TWI334934B (zh)
WO (1) WO2006016505A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI872356B (zh) * 2022-01-19 2025-02-11 友達光電股份有限公司 光感測器

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JP7564655B2 (ja) 2020-07-14 2024-10-09 キヤノン株式会社 放射線撮像パネル、放射線撮像装置、放射線撮像システム、および、シンチレータプレート
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TWI872356B (zh) * 2022-01-19 2025-02-11 友達光電股份有限公司 光感測器

Also Published As

Publication number Publication date
EP1779140B1 (en) 2018-06-20
CN101002110A (zh) 2007-07-18
US7514686B2 (en) 2009-04-07
WO2006016505A1 (en) 2006-02-16
TWI334934B (en) 2010-12-21
CN101002110B (zh) 2010-12-08
EP1779140A4 (en) 2016-08-31
TWI290231B (en) 2007-11-21
US20070257198A1 (en) 2007-11-08
TW200722781A (en) 2007-06-16
EP1779140A1 (en) 2007-05-02

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