TW200615744A - Method and device for detecting flat panel display device by visual model - Google Patents

Method and device for detecting flat panel display device by visual model

Info

Publication number
TW200615744A
TW200615744A TW093133394A TW93133394A TW200615744A TW 200615744 A TW200615744 A TW 200615744A TW 093133394 A TW093133394 A TW 093133394A TW 93133394 A TW93133394 A TW 93133394A TW 200615744 A TW200615744 A TW 200615744A
Authority
TW
Taiwan
Prior art keywords
image
detection
test
flat panel
panel display
Prior art date
Application number
TW093133394A
Other languages
Chinese (zh)
Other versions
TWI267737B (en
Inventor
Zhao-Hua Wen
Chia-Hao Kuo
zi-jian Zhang
Original Assignee
Taiwan Tft Lcd Ass
Chunghwa Picture Tubes Ltd
Au Optronics Corp
Quanta Display Inc
Hannstar Display Corp
Chi Mei Optoelectronics Corp
Ind Tech Res Inst
Toppoly Optoelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Tft Lcd Ass, Chunghwa Picture Tubes Ltd, Au Optronics Corp, Quanta Display Inc, Hannstar Display Corp, Chi Mei Optoelectronics Corp, Ind Tech Res Inst, Toppoly Optoelectronics Corp filed Critical Taiwan Tft Lcd Ass
Priority to TW093133394A priority Critical patent/TWI267737B/en
Priority to JP2005318377A priority patent/JP2006139777A/en
Priority to KR1020050104351A priority patent/KR100842616B1/en
Publication of TW200615744A publication Critical patent/TW200615744A/en
Application granted granted Critical
Publication of TWI267737B publication Critical patent/TWI267737B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • G06T7/41—Analysis of texture based on statistical description of texture
    • G06T7/44—Analysis of texture based on statistical description of texture using image operators, e.g. filters, edge density metrics or local histograms
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/02—Identification, exchange or storage of information
    • B01L2300/025—Displaying results or values with integrated means
    • B01L2300/027—Digital display, e.g. LCD, LED
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Probability & Statistics with Applications (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Image Processing (AREA)
  • Liquid Crystal (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention is to provide a method and device for detecting flat panel display device by visual model capable of characterizing MURA defects in flat panel display. A differential recognition generation system realized by hardware or software is applied to get the image frame of a test panel from an image capturing system; then a background value is obtained by a background simulation system, and detection reference information is obtained by a detection information generation system. The method includes a process for capturing the image of the test panel; a process for adjusting the captured image and generating a test image and the reference image; a process for generating the test image and the reference image by the stream of recognition generation having the processes of a front end processing, image information estimation and image information matching; a process for generating a detection chart and a detection numerical value by finally collecting respective kinds of pieces of test information; and a panel quality determining process for determining image quality in the flat panel display device by the use of the detection chart and the detection value.
TW093133394A 2004-11-02 2004-11-02 Method and device for detecting flat panel display device by visual model TWI267737B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW093133394A TWI267737B (en) 2004-11-02 2004-11-02 Method and device for detecting flat panel display device by visual model
JP2005318377A JP2006139777A (en) 2004-11-02 2005-11-01 Method and apparatus for detecting a flat panel display device by visual model
KR1020050104351A KR100842616B1 (en) 2004-11-02 2005-11-02 Method and Apparatus For Detecting Flat Panel Display By Vision Model

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW093133394A TWI267737B (en) 2004-11-02 2004-11-02 Method and device for detecting flat panel display device by visual model

Publications (2)

Publication Number Publication Date
TW200615744A true TW200615744A (en) 2006-05-16
TWI267737B TWI267737B (en) 2006-12-01

Family

ID=36620529

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093133394A TWI267737B (en) 2004-11-02 2004-11-02 Method and device for detecting flat panel display device by visual model

Country Status (3)

Country Link
JP (1) JP2006139777A (en)
KR (1) KR100842616B1 (en)
TW (1) TWI267737B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104216546A (en) * 2013-06-03 2014-12-17 业鑫科技顾问股份有限公司 Touch control display device
TWI486839B (en) * 2013-06-03 2015-06-01 Ye Xin Technology Consulting Co Ltd Touch display device
CN110751919A (en) * 2018-07-23 2020-02-04 财团法人工业技术研究院 Transparent display system and operation method thereof

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4799329B2 (en) * 2006-09-07 2011-10-26 株式会社東芝 Unevenness inspection method, display panel manufacturing method, and unevenness inspection apparatus
JP5813611B2 (en) 2012-09-28 2015-11-17 富士フイルム株式会社 Image evaluation apparatus, image evaluation method, and program
JP5813610B2 (en) 2012-09-28 2015-11-17 富士フイルム株式会社 Image evaluation apparatus, image evaluation method, and program
CN113703203B (en) * 2021-07-30 2023-08-22 惠州市德赛西威汽车电子股份有限公司 Automatic testing method for display uniformity of LCD screen
CN114022464B (en) * 2021-11-10 2024-06-14 广东工业大学 An adaptive detection method for internal voids in solder joints of chip resistors
CN114199892B (en) * 2021-12-10 2022-11-18 江苏雷默智能科技有限公司 Plate measuring method and system based on machine vision

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3920382B2 (en) * 1996-01-23 2007-05-30 株式会社日立製作所 Method and apparatus for detecting defects or foreign matter

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104216546A (en) * 2013-06-03 2014-12-17 业鑫科技顾问股份有限公司 Touch control display device
TWI486839B (en) * 2013-06-03 2015-06-01 Ye Xin Technology Consulting Co Ltd Touch display device
CN104216546B (en) * 2013-06-03 2017-03-15 鸿富锦精密工业（深圳）有限公司 Touch control display device
CN110751919A (en) * 2018-07-23 2020-02-04 财团法人工业技术研究院 Transparent display system and operation method thereof

Also Published As

Publication number Publication date
KR20060052414A (en) 2006-05-19
KR100842616B1 (en) 2008-06-30
TWI267737B (en) 2006-12-01
JP2006139777A (en) 2006-06-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees