TW200634324A - Test system - Google Patents

Test system

Info

Publication number
TW200634324A
TW200634324A TW094145829A TW94145829A TW200634324A TW 200634324 A TW200634324 A TW 200634324A TW 094145829 A TW094145829 A TW 094145829A TW 94145829 A TW94145829 A TW 94145829A TW 200634324 A TW200634324 A TW 200634324A
Authority
TW
Taiwan
Prior art keywords
test system
current
output
tested object
tested
Prior art date
Application number
TW094145829A
Other languages
Chinese (zh)
Other versions
TWI279570B (en
Inventor
Shingo Morita
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200634324A publication Critical patent/TW200634324A/en
Application granted granted Critical
Publication of TWI279570B publication Critical patent/TWI279570B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3275—Details of drivers for data electrodes
    • G09G3/3283—Details of drivers for data electrodes in which the data driver supplies a variable data current for setting the current through, or the voltage across, the light-emitting elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

The object of this invention is to realize a test system capable of conducting measurement at high precision. This invention improves a test system by which a tested object conducting current output is tested. The device according to this invention is characterized by including: a current measuring section that measures an output of the tested object; a current generating section, provided between the current measuring section and the tested object, that supplies an inverting current based on an expect value of output of the tested object.
TW094145829A 2005-03-25 2005-12-22 Test system TWI279570B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005089273A JP2006267041A (en) 2005-03-25 2005-03-25 Test system

Publications (2)

Publication Number Publication Date
TW200634324A true TW200634324A (en) 2006-10-01
TWI279570B TWI279570B (en) 2007-04-21

Family

ID=37203167

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094145829A TWI279570B (en) 2005-03-25 2005-12-22 Test system

Country Status (3)

Country Link
JP (1) JP2006267041A (en)
KR (1) KR100764861B1 (en)
TW (1) TWI279570B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI699539B (en) * 2018-12-28 2020-07-21 新唐科技股份有限公司 Io-pin abnormal detecting system and method thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001027885A (en) * 1999-07-14 2001-01-30 Sony Corp Cutoff adjustment device
JP2004004788A (en) * 2002-04-24 2004-01-08 Seiko Epson Corp Control circuit of electronic element, electronic circuit, electro-optical device, method of driving electro-optical device, electronic apparatus, and control method of electronic element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI699539B (en) * 2018-12-28 2020-07-21 新唐科技股份有限公司 Io-pin abnormal detecting system and method thereof

Also Published As

Publication number Publication date
KR20060103092A (en) 2006-09-28
JP2006267041A (en) 2006-10-05
KR100764861B1 (en) 2007-10-09
TWI279570B (en) 2007-04-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees