TW200638314A - Direct detect sensor for flat panel displays - Google Patents

Direct detect sensor for flat panel displays

Info

Publication number
TW200638314A
TW200638314A TW095114247A TW95114247A TW200638314A TW 200638314 A TW200638314 A TW 200638314A TW 095114247 A TW095114247 A TW 095114247A TW 95114247 A TW95114247 A TW 95114247A TW 200638314 A TW200638314 A TW 200638314A
Authority
TW
Taiwan
Prior art keywords
flat panel
voltage
panel displays
electrode
sensing electrode
Prior art date
Application number
TW095114247A
Other languages
English (en)
Inventor
David W Gardner
Andrew M Hawryluk
Original Assignee
Photon Dynamics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc filed Critical Photon Dynamics Inc
Publication of TW200638314A publication Critical patent/TW200638314A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
TW095114247A 2005-04-22 2006-04-21 Direct detect sensor for flat panel displays TW200638314A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US67396705P 2005-04-22 2005-04-22
US68762105P 2005-06-02 2005-06-02
US68960105P 2005-06-09 2005-06-09
US69784405P 2005-07-08 2005-07-08

Publications (1)

Publication Number Publication Date
TW200638314A true TW200638314A (en) 2006-11-01

Family

ID=37215293

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095114247A TW200638314A (en) 2005-04-22 2006-04-21 Direct detect sensor for flat panel displays

Country Status (6)

Country Link
US (5) US7466161B2 (zh)
JP (1) JP2008537152A (zh)
KR (1) KR101295933B1 (zh)
CN (1) CN101228450B (zh)
TW (1) TW200638314A (zh)
WO (1) WO2006116060A2 (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI411871B (zh) * 2010-06-03 2013-10-11 Semiconductor Components Ind 迴圈增益調整電路
TWI703656B (zh) * 2016-12-16 2020-09-01 美商特索羅科學有限公司 發光二極體（ｌｅｄ）測試裝置及製作方法
US10962586B2 (en) 2017-01-23 2021-03-30 Apple Inc. Light emitting diode (LED) test apparatus and method of manufacture
US10989755B2 (en) 2017-06-20 2021-04-27 Apple Inc. Light emitting diode (LED) test apparatus and method of manufacture

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7466161B2 (en) * 2005-04-22 2008-12-16 Photon Dynamics, Inc. Direct detect sensor for flat panel displays
US7786742B2 (en) 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
JP5380286B2 (ja) * 2006-07-17 2014-01-08 スキャニメトリクス，インコーポレイテッド 検査回路を有する薄膜トランジスタアレイ
TW200818973A (en) * 2006-10-11 2008-04-16 Au Optronics Corp Temperature regulative display system and controlling method of amoled panel
US8692777B2 (en) * 2008-02-08 2014-04-08 Apple Inc. Method for rapidly testing capacitance sensing array fault conditions using a floating conductor
US8536892B2 (en) * 2008-02-29 2013-09-17 Palo Alto Research Center Incorporated System for testing transistor arrays in production
US8164588B2 (en) * 2008-05-23 2012-04-24 Teledyne Scientific & Imaging, Llc System and method for MEMS array actuation including a charge integration circuit to modulate the charge on a variable gap capacitor during an actuation cycle
US8552429B2 (en) * 2008-10-23 2013-10-08 The Regents Of The University Of California Proximity charge sensing for semiconductor detectors
CN101750765B (zh) * 2008-12-18 2011-12-28 北京京东方光电科技有限公司 液晶显示器公共电极线断线不良的检测方法
JP4816738B2 (ja) * 2009-02-05 2011-11-16 ソニー株式会社 情報入出力装置
DE102009022965A1 (de) * 2009-05-28 2010-12-02 Siemens Aktiengesellschaft Messung eines Substrats mit elektrisch leitenden Strukturen
US9035673B2 (en) 2010-01-25 2015-05-19 Palo Alto Research Center Incorporated Method of in-process intralayer yield detection, interlayer shunt detection and correction
CN102243382B (zh) * 2010-05-13 2014-12-31 上海天马微电子有限公司 液晶显示装置及其制作方法、检测及改善装置
DE102010023128A1 (de) * 2010-06-09 2011-12-15 Siemens Aktiengesellschaft Kapazitiver Sensor
TWI426286B (zh) 2010-08-02 2014-02-11 財團法人工業技術研究院 基板電性的量測設備
CN102411099A (zh) * 2010-09-25 2012-04-11 财团法人工业技术研究院 基板电性的测量设备
US20130088245A1 (en) * 2011-10-10 2013-04-11 Kla-Tencor Corporation Capacitive Inspection Of EUV Photomasks
US9045332B2 (en) * 2011-11-29 2015-06-02 Qualcomm Mems Technologies, Inc. Thin back glass interconnect
KR102223552B1 (ko) * 2013-12-04 2021-03-04 엘지디스플레이 주식회사 유기 발광 표시 장치 및 그의 구동 방법
CN105589231B (zh) * 2016-03-09 2019-04-30 京东方科技集团股份有限公司 非接触式探针信号加载装置
TWI778072B (zh) * 2017-06-22 2022-09-21 以色列商奧寶科技有限公司 用於在超高解析度面板中偵測缺陷之方法
CN107749273B (zh) 2017-11-07 2019-10-15 京东方科技集团股份有限公司 电信号检测模组、驱动方法、像素电路和显示装置
TWI634339B (zh) * 2017-11-21 2018-09-01 興城科技股份有限公司 檢測薄膜電晶體基板之方法及裝置
CN108758540A (zh) * 2018-05-28 2018-11-06 武汉华星光电技术有限公司 面光源及面光源的检测方法
CN110095704B (zh) * 2019-04-17 2022-02-22 深圳市华星光电半导体显示技术有限公司 检测阵列基板中电路缺陷的装置及方法
KR102690401B1 (ko) 2020-02-26 2024-08-02 삼성전자주식회사 디스플레이 구동 회로 및 그것을 포함하는 표시 장치
CN113447858B (zh) * 2020-11-11 2022-11-11 重庆康佳光电技术研究院有限公司 电路背板检测装置及检测方法
US11835710B2 (en) * 2020-12-15 2023-12-05 Infineon Technologies Ag Method of mode coupling detection and damping and usage for electrostatic MEMS mirrors
EP4037308B1 (fr) * 2021-01-29 2024-07-31 Stmicroelectronics (Grenoble 2) Sas Capteurs d'images
CN112986787B (zh) * 2021-05-20 2021-07-30 江西省兆驰光电有限公司 一种发光二极管测试装置
KR102794956B1 (ko) 2021-09-17 2025-04-16 삼성디스플레이 주식회사 표시 장치의 검사 방법 및 장치
US12613349B2 (en) 2023-01-17 2026-04-28 GE Precision Healthcare LLC Flat panel X-ray detector for computed tomography
US12566208B2 (en) 2023-09-22 2026-03-03 Orbotech Ltd. Pulsed laser micro LED inspection

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5036317A (en) * 1988-08-22 1991-07-30 Tektronix, Inc. Flat panel apparatus for addressing optical data storage locations
US5179345A (en) 1989-12-13 1993-01-12 International Business Machines Corporation Method and apparatus for analog testing
US5057775A (en) * 1990-05-04 1991-10-15 Genrad, Inc. Method of testing control matrices for flat-panel displays
US5258705A (en) * 1990-12-21 1993-11-02 Sharp Kabushiki Kaisha Active matrix substrate inspecting device
JPH05126890A (ja) 1991-10-30 1993-05-21 Sharp Corp 基板部品検査装置
JPH0627494A (ja) * 1992-02-14 1994-02-04 Inter Tec:Kk 薄膜トランジスタアクティブマトリクス基板の 検査方法及び装置
TW387080B (en) 1994-06-21 2000-04-11 Hitachi Ltd A display device integrated with an input device
US5694053A (en) * 1995-06-07 1997-12-02 Xerox Corporation Display matrix tester
JP2002022789A (ja) * 2000-07-05 2002-01-23 Oht Inc 検査装置及び検査方法
US6600325B2 (en) 2001-02-06 2003-07-29 Sun Microsystems, Inc. Method and apparatus for probing an integrated circuit through capacitive coupling
US7081908B2 (en) 2001-02-22 2006-07-25 Mitsubishi Heavy Industries, Ltd. Apparatus and method for testing electrode structure for thin display device using FET function
JP4450143B2 (ja) * 2001-05-24 2010-04-14 オー・エイチ・ティー株式会社 回路パターン検査装置並びに回路パターン検査方法及び記録媒体
US7466161B2 (en) 2005-04-22 2008-12-16 Photon Dynamics, Inc. Direct detect sensor for flat panel displays

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI411871B (zh) * 2010-06-03 2013-10-11 Semiconductor Components Ind 迴圈增益調整電路
TWI703656B (zh) * 2016-12-16 2020-09-01 美商特索羅科學有限公司 發光二極體（ｌｅｄ）測試裝置及製作方法
US11037841B2 (en) 2016-12-16 2021-06-15 Apple Inc. Light emitting diode (LED) test apparatus and method of manufacture
US10962586B2 (en) 2017-01-23 2021-03-30 Apple Inc. Light emitting diode (LED) test apparatus and method of manufacture
US10989755B2 (en) 2017-06-20 2021-04-27 Apple Inc. Light emitting diode (LED) test apparatus and method of manufacture

Also Published As

Publication number Publication date
WO2006116060A2 (en) 2006-11-02
US20060237627A1 (en) 2006-10-26
US20080315908A1 (en) 2008-12-25
US7960993B2 (en) 2011-06-14
US7466161B2 (en) 2008-12-16
US20090295425A1 (en) 2009-12-03
US20100045334A1 (en) 2010-02-25
KR101295933B1 (ko) 2013-08-14
US20080157802A1 (en) 2008-07-03
CN101228450A (zh) 2008-07-23
JP2008537152A (ja) 2008-09-11
CN101228450B (zh) 2011-06-08
KR20080003838A (ko) 2008-01-08
WO2006116060A3 (en) 2007-12-13

Similar Documents

Publication Publication Date Title
TW200638314A (en) Direct detect sensor for flat panel displays
US20220382409A1 (en) Mitigation of parasitic capacitance in self capacitance touch sensing
GB0614261D0 (en) Electric Potential Sensor
US7554073B2 (en) High linearity CMOS ambient light sensor
US20150301674A1 (en) Active matrix organic light emitting diode pixel unit circuit, display panel and electronic product
US9542049B2 (en) Touch sensing circuit and method, touch screen and display device
CN105044955B (zh) 光电传感器及其驱动方法、阵列基板和显示装置
TW200614852A (en) Active organic electroluminescence display panel module and driving module thereof
WO2009005239A3 (en) Voltage amplifier and driving device of display device using the voltage amplifier
TW200614146A (en) Pixel circuit, active matrix apparatus and display apparatus
CN103354078A (zh) 有源矩阵有机发光二极管像素单元电路以及显示面板
CN101644587A (zh) 传感器元件、感光矩阵、触控面板及触控感测方法
ATE447257T1 (de) Dynamisch vorgespannter verstärker
TWI341077B (zh)
JP5269482B2 (ja) センサ基板及び検査装置
CN109313158B (zh) 半导体装置和细胞电位测量设备
CN107643854B (zh) 一种阵列基板、显示面板及显示装置
CN103354082A (zh) 一种触摸驱动电路、液晶面板及其驱动方法
CN203288218U (zh) 一种amoled像素电路及显示装置
TW200707899A (en) Differential amplifier
JP2010175572A (ja) 光検出回路及び自動調光回路
EP1845515A3 (en) Liquid crystal display device and common electrode voltage generating circuit
CN103164099B (zh) 一种触摸屏触摸点定位检测电路、触摸屏及显示装置
JP2011053864A (ja) センシング装置および電子機器
KR101324218B1 (ko) 산소 및 과산화수소 기반의 전기화학 당뇨센서를 위한 정전압분극장치