TW200714902A - Inspection device - Google Patents

Inspection device

Info

Publication number
TW200714902A
TW200714902A TW094134487A TW94134487A TW200714902A TW 200714902 A TW200714902 A TW 200714902A TW 094134487 A TW094134487 A TW 094134487A TW 94134487 A TW94134487 A TW 94134487A TW 200714902 A TW200714902 A TW 200714902A
Authority
TW
Taiwan
Prior art keywords
inspection device
probe frames
substrate
flexible member
probe
Prior art date
Application number
TW094134487A
Other languages
English (en)
Other versions
TWI272389B (en
Inventor
Chih-Ping Chen
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW94134487A priority Critical patent/TWI272389B/zh
Application granted granted Critical
Publication of TWI272389B publication Critical patent/TWI272389B/zh
Publication of TW200714902A publication Critical patent/TW200714902A/zh

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW94134487A 2005-10-03 2005-10-03 Inspection device TWI272389B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94134487A TWI272389B (en) 2005-10-03 2005-10-03 Inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94134487A TWI272389B (en) 2005-10-03 2005-10-03 Inspection device

Publications (2)

Publication Number Publication Date
TWI272389B TWI272389B (en) 2007-02-01
TW200714902A true TW200714902A (en) 2007-04-16

Family

ID=38441246

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94134487A TWI272389B (en) 2005-10-03 2005-10-03 Inspection device

Country Status (1)

Country Link
TW (1) TWI272389B (zh)

Also Published As

Publication number Publication date
TWI272389B (en) 2007-02-01

Similar Documents

Publication Publication Date Title
TW200745568A (en) Probe structures with electronic components
ATE510239T1 (de) Sekundär-displayintegration in flexiblen anzeigeanordnungen
ATE541193T1 (de) Klinisches ohrthermometer
TW200719865A (en) Simple and easy measuring device of physiological signal having Universal Serial Bus
CA119246S (en) Support arm for an object
GB2422907B (en) Device for measuring the body temperature of an organism
TW200617491A (en) Electro-optical device and electronic apparatus
DE60333052D1 (de) Kupplungshilfe Vorrichtung für elektrische Verbindungskontakte
MY145117A (en) Disposable diaper
TW200617869A (en) Display device
ATE529783T1 (de) Entwicklungsvorrichtung, bilderzeugungsvorrichtung und verwendung der entwicklungsvorrichtung
EP2261941A4 (en) VACUUM INTERRUPTER SWITCH AND GAS INSULATED SWITCH ASSEMBLY THEREWITH
TWI339730B (en) Prober for electronic device testing on large area substrates
DK2019452T3 (da) Konnektor og elektronisk apparat omfattende samme
DE602006020960D1 (de) Elektrische Verbindung eines Endoskops
DE602005004317D1 (de) Befestigungseinrichtung für elektrische Steckverbinder und Verwendung derselben
IL180800A0 (en) Apparatus components and methods of using apparatus components to detect the presence of an analyte
WO2006066112A3 (en) Using parametric measurement units as a source of power for a device under test
FI20031677L (fi) Elektrodirakenne sähköisten vasteiden mittaamiseksi ihmiskehosta
TW200714902A (en) Inspection device
WO2008014392A3 (en) Circuit module
HU228288B1 (en) Electricity meter with measuring device and with apparatus inspecting for proper operation of the measuring device
GB0223632D0 (en) Semiconductor testing instrument
WO2009023577A3 (en) Electrophotography device
TW200609558A (en) Promotional aid

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees