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Application filed by Au Optronics CorpfiledCriticalAu Optronics Corp
Priority to TW94134487ApriorityCriticalpatent/TWI272389B/en
Application grantedgrantedCritical
Publication of TWI272389BpublicationCriticalpatent/TWI272389B/en
Publication of TW200714902ApublicationCriticalpatent/TW200714902A/en
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Tests Of Electronic Circuits
(AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections
(AREA)
Abstract
An inspection device for a substrate is disclosed. The device includes a pair of probe frames and a flexible member. The probe frames are electrically connected to the substrate. The flexible member electrically connects the probe frames.