TW200716997A - Electrical testing device - Google Patents

Electrical testing device

Info

Publication number
TW200716997A
TW200716997A TW094136828A TW94136828A TW200716997A TW 200716997 A TW200716997 A TW 200716997A TW 094136828 A TW094136828 A TW 094136828A TW 94136828 A TW94136828 A TW 94136828A TW 200716997 A TW200716997 A TW 200716997A
Authority
TW
Taiwan
Prior art keywords
contacts
socket
board
testing
testing device
Prior art date
Application number
TW094136828A
Other languages
Chinese (zh)
Other versions
TWI271529B (en
Inventor
Chun-Liang Kuo
Chien-Jung Lin
Te-Chang Pan
Original Assignee
Advanced Semiconductor Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW94136828A priority Critical patent/TWI271529B/en
Application granted granted Critical
Publication of TWI271529B publication Critical patent/TWI271529B/en
Publication of TW200716997A publication Critical patent/TW200716997A/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

An electrical testing device is provided. The electrical device includes a socket, a circuit board, a pogo pin socket and a testing board. The socket is disposed on the circuit board for supporting a chip package unit, and the pogo pin socket is disposed between the circuit board and the testing board. Wherein, the pogo pin socket has pogo pins therein in contact with first contacts of the circuit and second contacts of the testing board, respectively. When the pogo pins are pressed, the first contacts are electrically connected to the second contacts, respectively, for operating electrical open/short test.
TW94136828A 2005-10-21 2005-10-21 Electrical testing device TWI271529B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94136828A TWI271529B (en) 2005-10-21 2005-10-21 Electrical testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94136828A TWI271529B (en) 2005-10-21 2005-10-21 Electrical testing device

Publications (2)

Publication Number Publication Date
TWI271529B TWI271529B (en) 2007-01-21
TW200716997A true TW200716997A (en) 2007-05-01

Family

ID=38435223

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94136828A TWI271529B (en) 2005-10-21 2005-10-21 Electrical testing device

Country Status (1)

Country Link
TW (1) TWI271529B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453424B (en) * 2010-03-30 2014-09-21 Ngk Spark Plug Co Jig of electric detection and method for manufacturing a wiring substrate
TWI818548B (en) * 2022-05-23 2023-10-11 久元電子股份有限公司 Test kits and test equipment

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102088305B1 (en) * 2018-11-22 2020-03-13 주식회사 아이에스시 Test socket for use in testing tested device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453424B (en) * 2010-03-30 2014-09-21 Ngk Spark Plug Co Jig of electric detection and method for manufacturing a wiring substrate
TWI818548B (en) * 2022-05-23 2023-10-11 久元電子股份有限公司 Test kits and test equipment

Also Published As

Publication number Publication date
TWI271529B (en) 2007-01-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees