TW200724272A - Method for bonding between electrical devices using ultrasonic vibration - Google Patents
Method for bonding between electrical devices using ultrasonic vibrationInfo
- Publication number
- TW200724272A TW200724272A TW095143148A TW95143148A TW200724272A TW 200724272 A TW200724272 A TW 200724272A TW 095143148 A TW095143148 A TW 095143148A TW 95143148 A TW95143148 A TW 95143148A TW 200724272 A TW200724272 A TW 200724272A
- Authority
- TW
- Taiwan
- Prior art keywords
- bonding
- electrical devices
- ultrasonic vibration
- electrical device
- adhesives
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01225—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/074—Connecting or disconnecting of anisotropic conductive adhesives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/253—Materials not comprising solid metals or solid metalloids, e.g. polymers or ceramics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/325—Die-attach connectors having a filler embedded in a matrix
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5525—Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Wire Bonding (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
The present invention is to provide a method for bonding between electrical devices, including the steps of: aligning electrodes on a bonded area of an upper electrical device and a lower electrical device to be bonded; and curing of adhesives by applying ultrasonic energy to the adhesives between the upper electrical device and the lower electrical device.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050113105A KR100746330B1 (en) | 2005-11-24 | 2005-11-24 | Connection method between electronic parts using ultrasonic wave |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200724272A true TW200724272A (en) | 2007-07-01 |
| TWI306423B TWI306423B (en) | 2009-02-21 |
Family
ID=38067402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095143148A TWI306423B (en) | 2005-11-24 | 2006-11-22 | Method for bonding between electrical devices using ultrasonic vibration |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JP2009517861A (en) |
| KR (1) | KR100746330B1 (en) |
| CN (1) | CN101322233B (en) |
| DE (1) | DE112006003181T5 (en) |
| TW (1) | TWI306423B (en) |
| WO (1) | WO2007061216A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI492342B (en) * | 2011-10-12 | 2015-07-11 | 聯詠科技股份有限公司 | Integrated circuit chip package and application glass flip chip substrate structure |
| US9236360B2 (en) | 2011-10-12 | 2016-01-12 | Novatek Microelectronics Corp. | IC chip package and chip-on-glass structure using the same |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4364928B2 (en) * | 2007-04-13 | 2009-11-18 | 積水化学工業株式会社 | Conductive fine particles, anisotropic conductive material, and conductive connection structure |
| KR100844430B1 (en) * | 2007-08-24 | 2008-07-08 | (주)에이앤아이 | Connection method between electronic parts |
| DE102008050000A1 (en) * | 2008-09-30 | 2010-04-01 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for the simultaneous mechanical and electrical connection of two parts |
| KR20100053016A (en) * | 2008-11-12 | 2010-05-20 | 한국과학기술원 | (method for bonding between electrical devices by adjusting the heating temperature of adhesive and apparatus for bonding between electrical devices by adjusting the heating temperature of adhesive |
| KR101046590B1 (en) | 2009-02-16 | 2011-07-05 | 한국과학기술원 | Electronic component joining method using vibration energy and vibration energy application device |
| KR101051045B1 (en) * | 2009-06-02 | 2011-07-21 | 중앙대학교 산학협력단 | Terminal connection method using conductive adhesive |
| KR101025620B1 (en) * | 2009-07-13 | 2011-03-30 | 한국과학기술원 | Anisotropic Conductive Adhesive for Ultrasonic Bonding and Connecting Method Between Electronic Components Using the Same |
| US8129220B2 (en) | 2009-08-24 | 2012-03-06 | Hong Kong Polytechnic University | Method and system for bonding electrical devices using an electrically conductive adhesive |
| KR101582943B1 (en) * | 2009-10-15 | 2016-01-08 | 삼성디스플레이 주식회사 | Manufacturing method of flat panel display |
| DE102010039339A1 (en) | 2010-08-16 | 2012-08-09 | Steffen Möglich | Adhesive system, useful for a workpiece, comprises microcapsules in which a coupling agent or a component of a coupling agent is encapsulated |
| CN102157406A (en) * | 2011-01-20 | 2011-08-17 | 中南大学 | Method for bonding chip with resin substrate through ultrasonic vibration |
| KR101908501B1 (en) | 2011-12-07 | 2018-10-17 | 엘지디스플레이 주식회사 | Integrated Touch Screen With Organic Emitting Display Device and Method for Manufacturing the Same |
| DE102013009234B4 (en) | 2012-06-01 | 2019-10-02 | Technische Universität Dresden | Process for the preparation of electrically conductive compounds between joining partners as well as a use of a polymer or polymer mixture |
| KR101348127B1 (en) | 2012-06-18 | 2014-01-07 | 손재설 | Maunfacturing method for circuit pattern on heat sink |
| JP2014053597A (en) * | 2012-08-09 | 2014-03-20 | Hitachi Chemical Co Ltd | Chip type electronic component and connection structure |
| US9603580B2 (en) | 2013-05-24 | 2017-03-28 | Fujifilm Sonosite, Inc. | High frequency ultrasound probe |
| GB2520511A (en) | 2013-11-21 | 2015-05-27 | Surf Technology As | Ultrasound transducer |
| EP2884242B1 (en) * | 2013-12-12 | 2021-12-08 | ams International AG | Sensor Package And Manufacturing Method |
| CN104051281B (en) * | 2014-06-13 | 2016-08-31 | 武汉理工大学 | Filling device and method under ultrasonic activation auxiliary flip-chip plastic packaging molding |
| CN104157617B (en) | 2014-07-29 | 2017-11-17 | 华为技术有限公司 | Chip integrated module, chip packaging structure and chip integration method |
| CA3036115A1 (en) * | 2016-10-07 | 2018-04-12 | Multimaterial-Welding Ag | Method of activating adhesives |
| KR101740006B1 (en) * | 2016-11-23 | 2017-06-09 | 지스마트 주식회사 | Flexible circuit board for transparent display board improved durability and the assembling method thereof |
| KR101932337B1 (en) | 2017-04-12 | 2018-12-26 | 한국과학기술원 | Anisotropic conductive film including polymer layer for suppressing movement of conductive particles and manufacturing method thereof using vertical ultrasonic wave |
| WO2018207547A1 (en) * | 2017-05-12 | 2018-11-15 | コニカミノルタ株式会社 | Light-emitting device |
| GB2584106B (en) | 2019-05-21 | 2024-03-27 | Pragmatic Printing Ltd | Flexible electronic structure |
| KR102704007B1 (en) * | 2019-09-30 | 2024-09-10 | 삼성디스플레이 주식회사 | Ultrasonic bonding apparatus and ultrasonic bonding method using the same |
| JP7406955B2 (en) * | 2019-10-29 | 2023-12-28 | セイコーインスツル株式会社 | 2-layer single-sided flexible board and method for manufacturing a 2-layer single-sided flexible board |
| KR102860672B1 (en) | 2020-07-30 | 2025-09-17 | 삼성디스플레이 주식회사 | Electronic device |
| GB2601325B (en) | 2020-11-25 | 2023-12-13 | Pragmatic Semiconductor Ltd | Support structures for flexible electronic circuits |
| TWI787685B (en) * | 2020-12-11 | 2022-12-21 | 力成科技股份有限公司 | Three-dimensional integrated circuit assembly and manufacturing method thereof |
| CN112867288B (en) * | 2021-01-05 | 2021-08-17 | 江苏特丽亮镀膜科技有限公司 | ACF conductive adhesive film structure, hot pressing method thereof and hot pressing assembly |
| KR102520768B1 (en) * | 2021-04-21 | 2023-04-12 | 주식회사 경신전선 | Method for ultrasonic bonding for circuit device using anisotropic conductive film |
| WO2026014567A1 (en) * | 2024-07-10 | 2026-01-15 | 엘지전자 주식회사 | Circuit device and display device comprising same |
| CN120018400A (en) * | 2025-02-14 | 2025-05-16 | 江苏洲旭电路科技有限公司 | A manufacturing process for ultra-thin printed circuit boards for MiniLED |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07137042A (en) * | 1993-11-17 | 1995-05-30 | San Giken Kk | Curing method of curing resin |
| JPH10199935A (en) * | 1997-01-06 | 1998-07-31 | Matsushita Electric Ind Co Ltd | Work mounting method |
| TW396471B (en) * | 1997-06-04 | 2000-07-01 | Ibm | Electrodeposition of low temperature, high conductivity, powder materials for electrically conductive paste formulations |
| JP4097379B2 (en) * | 1999-01-29 | 2008-06-11 | 松下電器産業株式会社 | Electronic component mounting method and apparatus |
| JP3339450B2 (en) * | 1999-03-02 | 2002-10-28 | 株式会社村田製作所 | Method for manufacturing surface acoustic wave device |
| JP3351402B2 (en) * | 1999-04-28 | 2002-11-25 | 株式会社村田製作所 | Electronic element, surface acoustic wave element, mounting method thereof, electronic component or surface acoustic wave device manufacturing method, and surface acoustic wave device |
| KR100367407B1 (en) * | 2000-03-31 | 2003-01-14 | 학교법인 한양학원 | low contact resistance chip bonding method |
| JP4526195B2 (en) * | 2001-01-26 | 2010-08-18 | トッパン・フォームズ株式会社 | Baggage tag and its manufacturing method |
| JP2002222405A (en) * | 2001-01-26 | 2002-08-09 | Toppan Forms Co Ltd | Luggage tag and its manufacturing method |
| JP2002288612A (en) * | 2001-03-27 | 2002-10-04 | Toppan Forms Co Ltd | How to make a luggage tag |
| WO2003012863A1 (en) * | 2001-07-31 | 2003-02-13 | Renesas Technology Corp. | Semiconductor device and its manufacturing method |
| JP4059497B2 (en) * | 2003-06-24 | 2008-03-12 | 日東電工株式会社 | Die bonding adhesive film, dicing die bonding adhesive film, and semiconductor device |
-
2005
- 2005-11-24 KR KR1020050113105A patent/KR100746330B1/en not_active Expired - Lifetime
-
2006
- 2006-11-22 DE DE112006003181T patent/DE112006003181T5/en not_active Ceased
- 2006-11-22 CN CN2006800438289A patent/CN101322233B/en active Active
- 2006-11-22 WO PCT/KR2006/004912 patent/WO2007061216A1/en not_active Ceased
- 2006-11-22 TW TW095143148A patent/TWI306423B/en active
- 2006-11-22 JP JP2008542234A patent/JP2009517861A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI492342B (en) * | 2011-10-12 | 2015-07-11 | 聯詠科技股份有限公司 | Integrated circuit chip package and application glass flip chip substrate structure |
| US9236360B2 (en) | 2011-10-12 | 2016-01-12 | Novatek Microelectronics Corp. | IC chip package and chip-on-glass structure using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070025889A (en) | 2007-03-08 |
| DE112006003181T5 (en) | 2008-11-06 |
| KR100746330B1 (en) | 2007-08-03 |
| CN101322233A (en) | 2008-12-10 |
| WO2007061216A1 (en) | 2007-05-31 |
| TWI306423B (en) | 2009-02-21 |
| CN101322233B (en) | 2011-04-20 |
| JP2009517861A (en) | 2009-04-30 |
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