TW200741237A - Calibration device, calibration method, test apparatus and test method - Google Patents

Calibration device, calibration method, test apparatus and test method

Info

Publication number
TW200741237A
TW200741237A TW096113773A TW96113773A TW200741237A TW 200741237 A TW200741237 A TW 200741237A TW 096113773 A TW096113773 A TW 096113773A TW 96113773 A TW96113773 A TW 96113773A TW 200741237 A TW200741237 A TW 200741237A
Authority
TW
Taiwan
Prior art keywords
jitter
calibration
test
input signal
calibration device
Prior art date
Application number
TW096113773A
Other languages
English (en)
Other versions
TWI401458B (zh
Inventor
Masahiro Ishida
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200741237A publication Critical patent/TW200741237A/zh
Application granted granted Critical
Publication of TWI401458B publication Critical patent/TWI401458B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Dc Digital Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Circuits Of Receivers In General (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
TW096113773A 2006-04-20 2007-04-19 校正裝置、校正方法、測試裝置，以及測試方法 TWI401458B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/407,588 US7409307B2 (en) 2006-04-20 2006-04-20 Calibration apparatus, calibration method, testing apparatus, and testing method

Publications (2)

Publication Number Publication Date
TW200741237A true TW200741237A (en) 2007-11-01
TWI401458B TWI401458B (zh) 2013-07-11

Family

ID=38620533

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096113773A TWI401458B (zh) 2006-04-20 2007-04-19 校正裝置、校正方法、測試裝置，以及測試方法

Country Status (4)

Country Link
US (1) US7409307B2 (zh)
JP (1) JP5008661B2 (zh)
TW (1) TWI401458B (zh)
WO (1) WO2007123054A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7991046B2 (en) * 2007-05-18 2011-08-02 Teradyne, Inc. Calibrating jitter
CN102590732B (zh) * 2012-02-24 2014-07-23 中国科学院上海应用物理研究所 一种多通道电路不对称性的校准方法
US9859900B2 (en) * 2015-06-05 2018-01-02 Mediatek Inc. Jitter control circuit within chip and associated jitter control method
CN120064954B (zh) * 2025-04-29 2025-07-22 杭州长川科技股份有限公司 校准对齐判断方法、装置、测试机和电子设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2999668B2 (ja) * 1994-05-23 2000-01-17 菊水電子工業株式会社 ジッタメータ用校正信号発生方法および装置
TW528875B (en) * 2001-12-26 2003-04-21 Chipmos Technologies Inc Method and device for adjusting timing of a semiconductor tester
WO2003073280A1 (en) * 2002-02-26 2003-09-04 Advantest Corporation Measuring apparatus and measuring method
US7054358B2 (en) * 2002-04-29 2006-05-30 Advantest Corporation Measuring apparatus and measuring method
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method

Also Published As

Publication number Publication date
TWI401458B (zh) 2013-07-11
US20070250281A1 (en) 2007-10-25
US7409307B2 (en) 2008-08-05
JP5008661B2 (ja) 2012-08-22
JPWO2007123054A1 (ja) 2009-09-03
WO2007123054A1 (ja) 2007-11-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees